TW200940705A - Copper CMP polishing pad cleaning composition comprising of amidoxime compounds - Google Patents
Copper CMP polishing pad cleaning composition comprising of amidoxime compounds Download PDFInfo
- Publication number
- TW200940705A TW200940705A TW097141618A TW97141618A TW200940705A TW 200940705 A TW200940705 A TW 200940705A TW 097141618 A TW097141618 A TW 097141618A TW 97141618 A TW97141618 A TW 97141618A TW 200940705 A TW200940705 A TW 200940705A
- Authority
- TW
- Taiwan
- Prior art keywords
- polishing pad
- cleaning composition
- cmp polishing
- copper cmp
- pad cleaning
- Prior art date
Links
- 238000005498 polishing Methods 0.000 title abstract 5
- 239000000203 mixture Substances 0.000 title abstract 3
- SFZULDYEOVSIKM-UHFFFAOYSA-N chembl321317 Chemical class C1=CC(C(=N)NO)=CC=C1C1=CC=C(C=2C=CC(=CC=2)C(=N)NO)O1 SFZULDYEOVSIKM-UHFFFAOYSA-N 0.000 title abstract 2
- 238000004140 cleaning Methods 0.000 title abstract 2
- -1 amidoxime compound Chemical class 0.000 abstract 1
- 239000006227 byproduct Substances 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
- 239000000126 substance Substances 0.000 abstract 1
- XLYOFNOQVPJJNP-UHFFFAOYSA-N water Substances O XLYOFNOQVPJJNP-UHFFFAOYSA-N 0.000 abstract 1
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B53/00—Devices or means for dressing or conditioning abrasive surfaces
- B24B53/017—Devices or means for dressing, cleaning or otherwise conditioning lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/50—Cleaning by methods involving the use of tools involving cleaning of the cleaning members
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B1/00—Cleaning by methods involving the use of tools
- B08B1/50—Cleaning by methods involving the use of tools involving cleaning of the cleaning members
- B08B1/52—Cleaning by methods involving the use of tools involving cleaning of the cleaning members using fluids
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D3/00—Other compounding ingredients of detergent compositions covered in group C11D1/00
- C11D3/16—Organic compounds
- C11D3/26—Organic compounds containing nitrogen
- C11D3/32—Amides; Substituted amides
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D7/00—Compositions of detergents based essentially on non-surface-active compounds
- C11D7/22—Organic compounds
- C11D7/32—Organic compounds containing nitrogen
- C11D7/3263—Amides or imides
-
- C—CHEMISTRY; METALLURGY
- C11—ANIMAL OR VEGETABLE OILS, FATS, FATTY SUBSTANCES OR WAXES; FATTY ACIDS THEREFROM; DETERGENTS; CANDLES
- C11D—DETERGENT COMPOSITIONS; USE OF SINGLE SUBSTANCES AS DETERGENTS; SOAP OR SOAP-MAKING; RESIN SOAPS; RECOVERY OF GLYCEROL
- C11D2111/00—Cleaning compositions characterised by the objects to be cleaned; Cleaning compositions characterised by non-standard cleaning or washing processes
- C11D2111/10—Objects to be cleaned
- C11D2111/14—Hard surfaces
- C11D2111/20—Industrial or commercial equipment, e.g. reactors, tubes or engines
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Oil, Petroleum & Natural Gas (AREA)
- Wood Science & Technology (AREA)
- Organic Chemistry (AREA)
- Mechanical Engineering (AREA)
- Mechanical Treatment Of Semiconductor (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US72707P | 2007-10-29 | 2007-10-29 | |
US622707P | 2007-12-31 | 2007-12-31 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200940705A true TW200940705A (en) | 2009-10-01 |
Family
ID=40257334
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW097141618A TW200940705A (en) | 2007-10-29 | 2008-10-29 | Copper CMP polishing pad cleaning composition comprising of amidoxime compounds |
Country Status (3)
Country | Link |
---|---|
US (1) | US20090137191A1 (zh) |
TW (1) | TW200940705A (zh) |
WO (1) | WO2009058272A1 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110088881A (zh) * | 2016-12-14 | 2019-08-02 | 嘉柏微电子材料股份公司 | 自化学机械平坦化基板移除残留物的组合物及方法 |
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US8372792B2 (en) * | 2007-08-08 | 2013-02-12 | Arakawa Chemical Industries, Ltd. | Cleaner composition for removing lead-free soldering flux, and method for removing lead-free soldering flux |
KR101537831B1 (ko) * | 2007-10-29 | 2015-07-17 | 이케이씨 테크놀로지, 인코포레이티드 | 신규한 니트릴 및 아미드옥심 화합물 및 제조 방법 |
US8802609B2 (en) | 2007-10-29 | 2014-08-12 | Ekc Technology Inc | Nitrile and amidoxime compounds and methods of preparation for semiconductor processing |
WO2009058274A1 (en) * | 2007-10-29 | 2009-05-07 | Ekc Technology, Inc. | Chemical mechanical polishing and wafer cleaning composition comprising amidoxime compounds and associated method for use |
WO2009058278A1 (en) | 2007-10-29 | 2009-05-07 | Ekc Technology, Inc | Methods of cleaning semiconductor devices at the back end of line using amidoxime compositions |
TWI460557B (zh) * | 2008-03-07 | 2014-11-11 | Wako Pure Chem Ind Ltd | 半導體表面用處理劑組成物及使用半導體表面用處理劑組成物之半導體表面處理方法 |
US7825079B2 (en) * | 2008-05-12 | 2010-11-02 | Ekc Technology, Inc. | Cleaning composition comprising a chelant and quaternary ammonium hydroxide mixture |
US9691622B2 (en) | 2008-09-07 | 2017-06-27 | Lam Research Corporation | Pre-fill wafer cleaning formulation |
US7838483B2 (en) | 2008-10-29 | 2010-11-23 | Ekc Technology, Inc. | Process of purification of amidoxime containing cleaning solutions and their use |
US20100105595A1 (en) * | 2008-10-29 | 2010-04-29 | Wai Mun Lee | Composition comprising chelating agents containing amidoxime compounds |
JP2010226089A (ja) * | 2009-01-14 | 2010-10-07 | Rohm & Haas Electronic Materials Llc | 半導体ウェハをクリーニングする方法 |
US8754021B2 (en) * | 2009-02-27 | 2014-06-17 | Advanced Technology Materials, Inc. | Non-amine post-CMP composition and method of use |
US7947130B2 (en) | 2009-10-24 | 2011-05-24 | Wai Mun Lee | Troika acid semiconductor cleaning compositions and methods of use |
KR101801413B1 (ko) | 2009-12-23 | 2017-12-20 | 램 리써치 코포레이션 | 퇴적 후 웨이퍼 세정 포뮬레이션 |
KR101829399B1 (ko) * | 2010-03-04 | 2018-03-30 | 삼성전자주식회사 | 감광성 수지 제거제 조성물 및 이를 이용하는 반도체 제조 공정 |
CN101908503A (zh) * | 2010-07-21 | 2010-12-08 | 河北工业大学 | 超大规模集成电路多层铜布线化学机械抛光后的洁净方法 |
CN102554783B (zh) * | 2010-12-23 | 2014-12-03 | 中芯国际集成电路制造(上海)有限公司 | 研磨垫清洗方法 |
WO2013042507A1 (ja) * | 2011-09-22 | 2013-03-28 | 東洋ゴム工業株式会社 | 研磨パッド |
US9138861B2 (en) * | 2012-02-15 | 2015-09-22 | Taiwan Semiconductor Manufacturing Co., Ltd. | CMP pad cleaning apparatus |
US8647445B1 (en) * | 2012-11-06 | 2014-02-11 | International Business Machines Corporation | Process for cleaning semiconductor devices and/or tooling during manufacturing thereof |
US9058976B2 (en) * | 2012-11-06 | 2015-06-16 | International Business Machines Corporation | Cleaning composition and process for cleaning semiconductor devices and/or tooling during manufacturing thereof |
JP6110814B2 (ja) * | 2013-06-04 | 2017-04-05 | 富士フイルム株式会社 | エッチング液およびそのキット、これらを用いたエッチング方法、半導体基板製品の製造方法および半導体素子の製造方法 |
JP6065802B2 (ja) * | 2013-10-03 | 2017-01-25 | 信越半導体株式会社 | 研磨布の洗浄方法及びウェーハの研磨方法 |
US9957469B2 (en) | 2014-07-14 | 2018-05-01 | Versum Materials Us, Llc | Copper corrosion inhibition system |
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US11085011B2 (en) * | 2018-08-28 | 2021-08-10 | Entegris, Inc. | Post CMP cleaning compositions for ceria particles |
WO2020120522A1 (en) * | 2018-12-12 | 2020-06-18 | Basf Se | Chemical mechanical polishing of substrates containing copper and ruthenium |
CN110479213A (zh) * | 2019-08-29 | 2019-11-22 | 西南科技大学 | 偕胺肟基修饰mof材料及其制备方法 |
CN115870867A (zh) * | 2022-12-26 | 2023-03-31 | 西安奕斯伟材料科技有限公司 | 抛光装置及抛光方法 |
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WO2009058278A1 (en) * | 2007-10-29 | 2009-05-07 | Ekc Technology, Inc | Methods of cleaning semiconductor devices at the back end of line using amidoxime compositions |
WO2009058274A1 (en) * | 2007-10-29 | 2009-05-07 | Ekc Technology, Inc. | Chemical mechanical polishing and wafer cleaning composition comprising amidoxime compounds and associated method for use |
US20090133716A1 (en) * | 2007-10-29 | 2009-05-28 | Wai Mun Lee | Methods of post chemical mechanical polishing and wafer cleaning using amidoxime compositions |
-
2008
- 2008-10-29 US US12/260,602 patent/US20090137191A1/en not_active Abandoned
- 2008-10-29 TW TW097141618A patent/TW200940705A/zh unknown
- 2008-10-29 WO PCT/US2008/012234 patent/WO2009058272A1/en active Application Filing
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN110088881A (zh) * | 2016-12-14 | 2019-08-02 | 嘉柏微电子材料股份公司 | 自化学机械平坦化基板移除残留物的组合物及方法 |
CN110088881B (zh) * | 2016-12-14 | 2023-09-26 | Cmc材料股份有限公司 | 自化学机械平坦化基板移除残留物的组合物及方法 |
Also Published As
Publication number | Publication date |
---|---|
WO2009058272A1 (en) | 2009-05-07 |
US20090137191A1 (en) | 2009-05-28 |
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