200928385 九、發明說明： 【發明所屬之技術領域】 本發明尤指其提供-種供料載具可減移載制電子元 取像機構取像’並對承置之制電子元件娜置及肖度之補 ’而供第一、二移載取放器依序取出電子元件，以準確 =200928385 IX. Description of the invention: [Technical field to which the invention pertains] The present invention particularly relates to a supply carrier capable of reducing the loading of an electronic component image taking mechanism and for mounting electronic components. And the first and second transfer pickers are used to take out the electronic components in order to be accurate =
縣狀錄物測品R 【先前技術】 此 ❹ ^電子70件正積極朝向小巧姉的小體積微接 性的ΓΓ電子祕細試絲法作有效的電 臂第11^1、2、3圖’其係為本發明人申請之台灣專利申 4 0、5 0 ’其ί料^構2 ◦、3 0及入、出料機構 2 〇、3 0，各取料‘槿;二i 0之兩侧設有第一、二取料機構 ，各橫移轉目^狀赫結觀升降結構 2 2、3 2 橫=^2 1、3 1及橫向螺桿 具有螺套24卜341/—32馬達23、33驅動，一 2 4、3 4 US!向滑座2 4 2、3 4 2之滑動件 22、32上^於橫向滑執21、31及橫向螺桿 2 5 !、3 ίΓ具器2 5、3 5側面财縱向滑軌 、3 4^ “^=，件24、34之縱向滑座243 向滑座2 5 2、3 5 2，料器2 5、3 5之頂面設有一橫 26 1、36 1上5 置於一支架26、3 6之橫向滑軌 有二縱4: ^ 構並於該支架26、36之另二 ⑴362及一螺套263、363，以分別 6 200928385 組裝於機架之縱向滑轨2 7、3 7及縱向螺桿2 8、3 « V 縱向螺桿28、38由-馬達29、39驅動，進而當各播敕= 構之馬達2 3、3 3驅動橫向螺桿2 2、3 2時，即帶動淋叙二 2 4、3 4之橫向滑座2 4 2、3 4 2及取料器2 向滑座2 5 2、3 5 2，於機架之橫向滑軌21、31及支^ ❹ 向滑軌2 6 1、3 6 1上作X方向往復位移，而 田谷升降結構之馬達2 9、3 9驅動縱向螺桿2 8、3 b主 帶動支架26、36之縱向滑座2 62、2 6 2及取料器2^即 35之縱向滑執251、351，於機架之縱向滑執27、q; ^骨動件24、34之縱向滑座2 4 3、3 4 3上作z方向往= 位移，另該入料機構4 〇及出料機構5 〇係分別設於測試么= ί方且t設有一具載台4 1、5 1之載台結構，“載送 it及-具有吸嘴42、52之取放結構，用以取放 5 =機構40之吸嘴4 2係將待測I C放置於载台4丄上，以2 二摇ί Ϊ送至第一取料機構2 0之取料器2 5下方，該第-取* 機構20令取料器25之吸嘴於載台4 取料 測試台1 〇中推y ^ 1 c並置入於 下一待制^進二測_# ’而载台4 1再反向位移復位以承載 ;當入料機構4。之载台41再載送另-待測2 二之侧方時，第二取料機構3 Q之取料器3 5作X太 =移=取料器3 5位於人料機構4 ◦之載台4 田第取料機構2〇之IC檢測完畢後，卽帶叙说士 2 5橫向位移至出料機構$ 〇之載Α 料器 3之取料器3 5作X-Z方向位移，將取料^；^枓， 動’而再次於入料機構4 〇之载=:附位移作 第二取料機構3 0之取料器3 5將測試完之I c放置二二| 7 200928385 3 0依序迅速載送ί c進行職 $ -取枓機構2 0、 要求然=體電;广試座間之高精準度對位 整位移之效用亦必祕^^可對電子树作高精度調 進行測試作f S法位移將1 C置入於測試台1 〇中 之準度將小體積的整’導致很難以高精確 Ο Ο 電;“Si:生=’裝置無法應用於小體積 面上僅能作X軸向的位移調整，因 f = 2 ^鑑於此，本發明人為因應小體積電子 ，此品f，並可節錢備穌之移載裝置 【發明内容】 裝置本要目的係提供-種可使電子元件精準對位之移載 πW识j之弟一、一收枓載具及第一、二移 =具係承置待測電子元件，而第-、二移載取放器係用以 具上之待測電子元件移載及置入於測試站 “ ς 於=測試後，再將完測電子祕移載至第―、二 座於具係設有可雜置及角度難之承座，並以承 供贼承置辆電子元件，且概至取賴構處取像，而經 8 200928385 ===電爾繩站執=== 裝^其卜該供有? 子元移於供料處及取像機構間執行载i及取像i 設====構《達到節 夕槪制電子元件，讀麻座作位u =刪兩次取像及校對作業，達到更加有效 本=之次一目的係提供一種可使電子元件精準對位之移 it 該供料載具之下方係設有滑執組，而可於供料 取像機構間往復位移，並於上方設有可承置電子元件之&处 料載具可使祕作Μ _向及Θ狀麵独=第f而供 g取放n取岐賴電子元件，且準確置人於測觀^行^ 【實施方式】 二例==::進一步之深入瞭解’兹例舉-麵======= 200928385 9 〇及收料裝置1 0 0 ;輪入端輸送 8 0内之供料載具1 1，作業區8 0内之第-、第County-level recorded product R [Prior Art] This ❹ ^Electronic 70 pieces are actively moving toward the compact small-sized micro-connected ΓΓ electronic secret test method for effective electric arm 11^1, 2, 3 'It is the Taiwan patent application for the inventor's application 40, 50 '' its material ^ structure 2 ◦, 30 and the input and discharge mechanism 2 〇, 30, each reclaim '槿; two i 0 There are first and second reclaiming mechanisms on both sides, and each traverse is turned into a shape. The lifting structure is 2, 3 2 horizontal = ^ 2 1, 3 1 and the transverse screw has a screw sleeve 24 341 / - 32 motor 23, 33 drive, one 2 4, 3 4 US! slides 2 4 2, 3 4 2 slides 22, 32 on the lateral slide 21, 31 and the transverse screw 2 5 !, 3 ί 器 2 5, 3 5 side longitudinal longitudinal rails, 3 4^ "^=, longitudinal slides 243 of pieces 24, 34 to the slides 2 5 2, 3 5 2, the top surface of the feeders 2 5, 3 5 is provided with a horizontal 26 1, 36 1 upper 5 placed on a bracket 26, 3 6 of the horizontal slide rails have two vertical 4: ^ and the other two (1) 362 of the brackets 26, 36 and a threaded sleeve 263, 363, respectively, assembled 6 200928385 Longitudinal slides 2 7 , 3 7 and longitudinal screws 2 8 , 3 « V longitudinal screws 28 , 38 by - motor 29 39 drive, and then when each of the broadcasts = the motor 2 3, 3 3 drive the transverse screw 2 2, 3 2, that is, drive the two slides 2 2, 3 4 and 2 4, 3 4 2 and take The hopper 2 is reciprocally displaced in the X direction to the slides 2 5 2, 3 5 2 on the lateral slide rails 21, 31 of the frame and the support rails 6 6 1 and 3 6 1 , and the Tiangu lifting structure is The motor 2 9 , 3 9 drives the longitudinal screw 2 8 , 3 b to drive the longitudinal slides 2 62 , 2 6 2 of the brackets 26 , 36 and the longitudinal slides 251 , 351 of the reclaimer 2 , 35 , in the frame Longitudinal slip 27, q; ^ The longitudinal slides of the bone moving parts 24, 34 2 4 3, 3 4 3 are displaced in the z direction, and the feeding mechanism 4 〇 and the discharging mechanism 5 are respectively set in Test? = ί square and t is provided with a stage structure of the stage 4 1 , 5 1 , "carrying it and - pick and place structure with nozzles 42 , 52 for pick and place 5 = nozzle of mechanism 40 4 2 The IC to be tested is placed on the stage 4, and sent to the bottom of the reclaimer 2 5 of the first reclaiming mechanism 20 by 2 2 shakes, the first fetching mechanism 20 makes the reclaimer 25 The nozzle is pushed on the loading table 4 of the loading platform 1 to push y ^ 1 c and placed in the next to be processed into the second test _# ' and the stage 4 1 then reverse displacement reset to carry; when the feeding mechanism 4. When the stage 41 is further loaded to the side of the other to be tested 2, the reclaimer 3 5 of the second reclaiming mechanism 3 Q is X too = shift = the reclaimer 3 5 is located in the human body mechanism 4 ◦ After the detection of the IC of the 4th picking mechanism of the station 4 is completed, the lateral displacement of the slinger 2 5 is shifted to the discharge mechanism of the discharge mechanism. The picker 3 of the loader 3 is displaced in the XZ direction, and the material is taken. ;^枓, 动' and again in the loading mechanism 4 = load =: with the displacement as the second reclaiming mechanism 3 0 reclaimer 3 5 put the test I c placed two two | 7 200928385 3 0 in order Quickly carry ί c to carry out the job $ - take the organization 2 0, demand = body power; the high precision of the wide test room is also necessary for the effect of the whole displacement ^ ^ can be tested on the electronic tree for high-precision adjustment The f S method displacement puts 1 C into the accuracy of the test bench 1 将. The small volume of the whole 'causes it is difficult to achieve high precision ; ;; "Si: raw = ' device can not be applied to small volume surface can only be used X-axis displacement adjustment, because f = 2 ^ In view of this, the inventor of the present invention responds to small-volume electrons, this product f, and can save money for the transfer device [invention] The purpose of the device is to provide Electronic element A precise alignment of the transfer πW knows the brother of the first one, a receiving vehicle and the first and second shifts = the electronic components to be tested, and the first and second transfer pickers are used to The electronic components to be tested are transferred and placed in the test station. ς = = 测试 测试 测试 测试 测试 = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = = Take the thief to take the electronic components, and take the image to take care of it, and the 8 200928385 === electric rope station station === install it ^ 卜 该 供 子 子 子 子 子 子 子And the image-taking mechanism performs the i-loading and image-taking i setting ==== constituting the "achieving the electronic components of the festival, reading the numbness u = deleting the two images and correcting the work, achieving a more effective copy of the A purpose is to provide a precise alignment of the electronic components. The feeding carrier is provided with a sliding group below, and can be reciprocally displaced between the feeding and imaging mechanisms, and can be placed on the upper side. The component & material carrier can make the secret Μ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Example ==:: into one In-depth understanding of 'examples - face ======= 200928385 9 〇 and receiving device 1 0 0; wheel feeders within 8 0 of the feeding carrier 1 1, the operating area within the first 80 - First
檢測結果由輸出端輸S 試站8 4另侧之供料载具8 1及第二收料載於測 放器8 6及第二移載取放器8 7 ;其中，該供料 移载取 ❹ 係設有複數個底面具鏤空孔且用承寺測^、之上方 3 lt^3#88 ； $。處供輸人端輸送裝置將待測電子 久= ❹The detection result is transmitted from the output terminal to the test station 8 4, the other side of the feeding carrier 8 1 and the second receiving material are carried in the measuring device 8 6 and the second transfer pick-and-place device 8 7; wherein the feeding is transferred Take the ❹ system with a number of bottom mask hollow holes and use the temple to measure ^, above the 3 lt ^ 3 # 88; $. For the input end of the conveyor, the electron to be tested will be tested for a long time.
Kiii ’ ,_組815將待測電子元件移ίΐΐίϊί 8 8 1 3 ' 8 1 元件之掘置，第-、二^^^調整待測電子 的第==方式定位 動的2出端輸送裝置進行收料作業，或以各自獨立尤！8 6、 8 r:r測試站8 4的相關位=以移骨 設置於機台之透像m係可為ccd取像器，並 以提供供料載I 8 1 >、、，連接訊號至中央控制器， 1 7 1架置於二6、8 7係分別以滑執組8 6 1、 置於測4站8 4上方之機架，而可分別作二^ 200928385 ^移”’錢有可升降作動 第-、二移載取放器8 、8 72 ’進而 取置頭8 6 2、8 72移約滑軌組8 6 1、8 7 1及 並將待測電子元件準挪機構8 5取像， 請參閱第6圖，本發明之電子試作業。 上方壓抵電子元件i工〇執^8 7 2係位於測試站8 4 之各承座8 1 1則位於作奸=作業’同時，該供料载具8 1 件⑴，·請作======測之電子元 Ο 元件i 5載送待測之電子 方向上對供料載具8 i各承座係由機台下 像而ίΪ:ί訊號傳輸至中央控制器，===: 而運算出其偏差量，進而命令供 巧徑制器之比對 位置或角度之補償校正，該供▲ f = 1 1作 配置之調整件8 ! 2、8 ” Q戟，1之各承座8 1 1即利用 之補償校正，使電子元以! ;8精1 準 8 1 ?、1 〇圖’當供料編1之各承座 ❹ 利用滑軌组86 1帶動取畢後’第一移載取放器86係 又為==6 置於待測之電子元件1 Η上， 之^^^^^^待測之電子元件“㈣’其待測 承座8 "上生位置偏移’係以取像機構8 5再次對 中麥㈣g π ^疋件111取像’並將取像訊號傳輸至 制器進行比對’若承座811上待測之 件111仍有置偏差時，其處理方式有二種，第-種方 ^ 1 1作X-Y兩軸向及0角之補償校正，使電子元件 準正確擺置，第二種方式則為發出警報，而通知工作人員處理 11 200928385 ’請參閱第1 1圖，當雷Λ 放器8 7之取置頭8 7 2將、夕^完^*測試後’第二移載取 料載具8 3放置，以1 0移載至第二收 裝置分類放置，同時，第—送至收料 準確將電子元件1 1 1移恭番 σ 8 6之取置碩8 6 2係可 8 6 2下壓壓抵電子元件：彳^測試站8 4上’並以取置頭 81係反向復位至作檢測作業，此時供料載具 人下-組待測之電言供!二閲端輸送裝置置 ❹ ❹ 1 1 2載送至取像機構8 5之】;電子元件 輸至中央控制器像訊號傳 •古主來關各承811作位置或角度之補償校正 角償料載具81之各承座811完成位置或 8 1夕μ古又^後，該第二移載取放器8 7係位移至供料載具 元# 1 L並於取置頭8 7 2吸附貼置於承座81 1上之電子 12時’該取像機構8 5即再次對承座8 i i之電子元件 丄^取像，並將取像訊號傳輸至中央控制器進行比對若承座 待測之電子元件1 1 2仍有位置偏差時，係可控制第一 ίϊί放器8 7釋放電子元件1 1 2，並控制承座8 1 1作Χ-Υ η及0角之補償校正，使電子元件1 1 2精準正確擺置， 報而通知I作人Μ處理；請參閱第i 4圖，當電子元 1，成測試後，第一移載取放器8 β之取置頭8 Θ 2將完 子元件1 1 1移載至第一收料載具8 2放置，以供輸出端 =廷裝置依據測試結果輸送至收料裝置分類放置，同時，第二移 載取放器8 7係準確將f子元件112移載置人於測試站84上 以取置頭8 7 2下壓壓抵電子元件112執行檢測作業，此 ^供料載具81係反向復位至作業區8 〇之供料處，以供輸入端 ]送襞置置入下一組待測之電子元件丄丄3，因此，該供料載具 12 200928385 8 1可往復於供料絲置制之電子元件Kiii ', _ group 815 moves the electronic components to be tested. 8 ϊ 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 8 Receipts, or separate from each other! 8 6 , 8 r: r test station 8 4 related bits = the transfer image set on the machine can be a ccd imager, and provide the supply load I 8 1 >,,, connect the signal To the central controller, 1 7 1 is placed in the 2, 8 7 series, respectively, with the slippery group 8 6 1 and placed in the rack above the 4 stations 8 4 , which can be used as two ^ 200928385 ^ shift " There are liftable and movable first- and second-shifting pick-and-place pickers 8, 8 72' and then take-up heads 8 6 2, 8 72 to shift the slide rail group 8 6 1 , 8 7 1 and the electronic component to be tested 8 5 image acquisition, please refer to Figure 6, the electronic test operation of the present invention. The upper pressure is pressed against the electronic component i. The work is carried out. 8 8 2 The system is located at the test station 8 4 and the respective seats 8 1 1 are located in the rape = homework 'At the same time, the feeding carrier 8 1 (1), please make ====== measured electronic element 元件 component i 5 carries the electron direction to be tested on the feeding carrier 8 i each bearing Under the machine, the ίΪ: ί signal is transmitted to the central controller, ===: and the deviation is calculated, and then the compensation for the position or angle of the matching path is commanded. The ▲ f = 1 1 As a configuration adjustment 8 ! 2, 8 ” Q戟, 1 of each seat 8 1 1 That is to use the compensation correction, so that the electronic element is! 8 precision 1 quasi 8 1 1 , 1 〇 ' 'When the carrier 1 of each supply ❹ 1 using the slide group 86 1 to take the first 'transfer The pick and place device 86 is again placed on the electronic component 1 待 to be tested, and ^^^^^^ the electronic component to be tested "(4) 'the socket to be tested 8 " the upper position offset' Taking the image taking mechanism 8 5 to image the middle wheat (four) g π ^疋 111 again and transmitting the image capturing signal to the controller for comparison, if the piece 111 to be tested on the socket 811 still has a deviation, There are two kinds of processing methods. The first type ^ 1 1 is used for the compensation correction of the XY two-axis and the zero-angle, so that the electronic components are correctly placed. The second method is to issue an alarm and notify the staff to handle 11 200928385 ' Please refer to Figure 1 1 . When the pick-up unit 8 7 2 of the lightning pick-up unit 8 7 will be placed, the second transfer-loading material carrier 8 3 will be placed, and the load will be transferred to 10 The two-receiving device is placed in the same position, and at the same time, the first-to-received material accurately shifts the electronic component 1 1 1 to the singularity of the singularity of the singularity of the singularity of the singularity of the singularity of the singularity of the singularity. 8 4 on 'and take the head 81 series Reverse reset to the test operation. At this time, the supply vehicle is powered by the next group of testers. The second read conveyor is set to ❹ 1 1 2 to the image pickup mechanism 8 5; electronic component transmission To the central controller, like the signal transmission, the old master, the 819, the position or angle of the compensation correction angle, the position of each of the seats 811 of the carrier 81, or the position of the 811, and the second transfer The pick-up device 8 7 is displaced to the feeding carrier element # 1 L and when the take-up head 8 7 2 adsorbs the electronic 12 attached to the socket 81 1 'the image taking mechanism 8 5 is again facing the socket 8 Ii's electronic component 丄 ^ image, and the image signal is transmitted to the central controller for comparison. If the position of the electronic component 1 1 2 to be tested still has a position deviation, it can control the first release. Electronic component 1 1 2, and control the socket 8 1 1 as the compensation correction of Χ-Υ η and 0 angle, so that the electronic component 1 1 2 is accurately and correctly placed, and the I is notified to handle it; see i 4 In the figure, when the electronic component 1 is tested, the first transfer carrier 8 β of the take-up head 8 Θ 2 transfers the finished component 11 1 to the first receiving carrier 8 2 for output. End = court According to the test result, it is sent to the receiving device for sorting, and at the same time, the second transfer picker and receiver 7 is used to accurately transfer the f-sub-element 112 to the test station 84 to take the head 8 7 2 and press it down. The electronic component 112 performs a detecting operation, and the feeding carrier 81 is reversely reset to the feeding point of the working area 8 for the input end to be placed in the next set of electronic components to be tested ,3, Therefore, the feeding carrier 12 200928385 8 1 can reciprocate the electronic components prepared by the feeding wire
取像機構8 5取像，且於調整電子元件位置子載J 載取放器8 6及第二移裁取放II只7仗皮取:更了供第一移 測試站8 5執行取放器8 7依序取出及移載電子元件至 作業區8 〇 承座81 :8, ^ ^而可利用各滑軌組815同步帶動各供“it .社ί 2業ί8 ◦之供料處及取像機構8 5間往復位移 壓抵電子元件110執行測試以= Ζϋ 1係可利用滑軌組815載送待測之電 象機構8 5處取像，該取像機構8 5係將取像 1至ί輸至中央控制1，且經由中央控制器之比對，而運算出其 ’進而命令各供料載具8 1之承座8 1 1作位置或角g 之正各具8 1之承座8 1 1即作Χ_Υ兩轴向及Θ角 Ο 放器si s/φ使電子70件1 1 1鮮擺置正域第—移載取 請參閱第1 7圖，當各供料載具8 1之承座 矛ΪΓ元件1 1 1位置完畢後，第一移載取放器8 6係 ，:軌、、且8 θ 1帶動取置頭8 6 2位移至供料載具8 1之上方 ’ ^使取置頭8 6 2下降吸附貼置於待測之電子元件工丄工上， ί if認取置頭8 6 2貼置於制之電子元件1 1 1時，其制 承;δ 件111是否產生位置偏移，係以取像機構8 5再次對 中央㈣i上Γΐ之電子元件1 1 1取像，並將取像訊號傳輸至 =控^器’經由中央控制器進行比對，若承座8 1 1上制之 13 1 仍有位置偏差時，其處理方式有二種，第一種方 式係可控制第一移載取放H8 6釋放電子元件1 !i，並控制承 200928385 座8 1 1作χ-γ兩軸向及0角之補合 精準正確顧m切為翻以，11 ，請參閱第18圖，當電子元件1 1 n ―士 乍人員處理 Ϊ器測之電子71 °移?取 ，同時，第-移載取放器8 6係準確4JJ 放置 於測試站8 4上，並以取置頭8 6 2下壓::以上，置入 行檢測作業，此時各供料載具8 i之承座$ 1執 Ο ❹ 子疋件1 1 2至取像機構8 5處取像，並之電 座8 1 1作位置或角度之補償校正;請之承 Τί ί ϋΐί試後，第一移載取放器8 6係將完測之 1 1 1移載至第一收料載具8 2放置’以供 件 測試結果輸送至收料裝置分類放置 、^具冗依據 f 8 i i於完成位置或角度之補償校 =各^載^七承 :巧，至供料載具8 i之上方以取出承座8第二= 且以^ ’並準確將電子疋件112移載置入於測試站84上， 2下壓壓抵電子元件1 1 2執行檢測作羋ΐ時 ίΐ复位至作業區8 ◦之供料處，以供輸入端2 ϋ可錢於供料處承置待測之電子元件 =8 5取像，且於調整電子元件:置=子 測試叫取放器8 7依序取出及移栽電子元件至 【圖式簡單說明】 第1圖.係為台灣專利申請第93110783號『1(：檢測裝置㈡』專 利案之配置示意圖。 第2囷.係為台灣專利申請第93110783號『1C檢測裳置(二）專 利案第一取料機構之示意圖。 一 3圖··係為台灣專利申請第93110783號『1C檢測裝置(二）專 200928385 利案第二取料機構之示意圖。 第4圖：本發明配置於測試分類機之配置示意圖。 第5圖：本發明之架構圖。 第6圖：本發明移載之動作示意圖（一）。 第7圖：本發明移載之動作示意圖（二）。 第8圖：本發明第7圖之使用侧視圖。 第9圖：本發明移載之動作示意圖（三）。 第10圖：本發明第9圖之使用侧視圖。 第1 1圖：本發明移載之動作示意圖（四）。 第12圖：本發明移載之動作示意圖（五）。The image taking mechanism 8 5 takes an image, and in the position of the adjustment electronic component, the J-loader 8 6 and the second pick-and-place II are only taken 7 times: the first shift test station 8 5 performs the pick-and-place operation. The device 8 7 sequentially takes out and transfers the electronic components to the working area 8 〇 socket 81 : 8, ^ ^, and each of the sliding rail groups 815 can be used to simultaneously drive the feeding centers of the "it. The image taking mechanism 85 reciprocates the pressure to the electronic component 110 to perform the test to = Ζϋ 1 system can use the slide group 815 to carry the image taken by the electrical image mechanism 8 to be tested, and the image capturing mechanism 8 5 will take images 1 to ί are input to the central control 1, and are compared by the central controller, and the '8' is calculated as the position or angle g of each of the supply carriers 8 1 The bearing 8 1 1 is used as the Χ Υ Υ Υ Υ Υ Υ Υ si si si si φ φ φ φ φ φ φ φ φ φ φ si si si si si si si si si si si 电子 si 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子After the position of the seat spear element 1 1 1 of the 81 is completed, the first transfer pick-and-place device 8 6 series, the rail, and the 8 θ 1 drive the take-up head 8 6 2 to the feeding carrier 8 1 Above ^ ^ make the pick-up head 8 6 2 drop adsorption stick to be tested When the electronic component is completed, ί if the occupant 8 6 2 is placed on the electronic component 1 1 1 , its bearing; δ 111 is displaced, and the image taking mechanism 8 5 is again The central (4) i upper electronic component 1 1 1 takes an image, and the image pickup signal is transmitted to the = control device' for comparison by the central controller. If the position 13 1 of the socket 8 1 1 still has a positional deviation, There are two ways to deal with it. The first method is to control the first transfer pick-and-place H8 6 release electronic component 1 !i, and control the 200928385 block 8 1 1 as the χ-γ two-axis and zero-angle complement. Accurate and correct, the m cut is turned over, 11 , please refer to Figure 18, when the electronic component 1 1 n - the gentry personnel handle the electronic measurement of the 71 ° shift, and the first - transfer picker 8 6 The accurate 4JJ is placed on the test station 8 4, and is pressed down by the take-up head 8 6 2 ::, and the line inspection operation is performed. At this time, the support of each feeding carrier 8 i is executed. The object 1 1 2 is taken to the image capturing mechanism 8 5 , and the electric seat 8 1 1 is used for position or angle compensation correction; please undertake ί ί ϋΐ 试, after the test, the first transfer pick-and-place device 8 6 will be finished 1 1 1 shift To the first receiving vehicle 8 2 placed 'to the test results of the delivery to the receiving device classification, ^ with redundancy based on f 8 ii in the completion position or angle of compensation = each ^ ^ ^ seven Cheng: Qiao, to Above the feeding carrier 8 i to take out the socket 8 second = and ^ ' and accurately transfer the electronic component 112 to the test station 84, 2 press down to the electronic component 1 1 2 to perform the test芈ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ ΐ The pick-and-place device 8 7 sequentially takes out and transplants the electronic components to the [simplified description of the drawing]. Fig. 1 is a schematic diagram of the configuration of the patent application No. 93110783 of the Taiwan Patent Application No. 93(1). The second is the schematic diagram of the first reclaiming mechanism of the 1C test skirt (2) patent of Taiwan Patent Application No. 93110783. A picture is a schematic diagram of the second reclaiming mechanism of the Taiwan Patent Application No. 93110783, "1C Detection Device (2) Specialized 200928385. Figure 4: Schematic diagram of the configuration of the present invention configured on a test sorter. Figure 5: Architecture diagram of the present invention. Figure 6: Schematic diagram of the action of the transfer of the present invention (1). Figure 7: Schematic diagram of the action of the transfer of the present invention (2). Fig. 8 is a side view showing the use of Fig. 7 of the present invention. Figure 9: Schematic diagram of the action of the transfer of the present invention (3). Fig. 10 is a side view showing the use of Fig. 9 of the present invention. Figure 11: Schematic diagram of the action of the transfer of the present invention (4). Figure 12: Schematic diagram of the action of the transfer of the present invention (5).
第1 3圖：本發明移載之動作示意圖（六）。 第1 4圖：本發明移載之動作示意圖（七）。 第15圖：本發明另一供料載具之結構示意圖。 第1 6圖：本發明另一供料載具之使用動作示意圖（一）。 第1 7圖：本發明另一供料載具之使用動作示意圖（二）。 第1 8圖：本發明另一供料載具之使用動作示意圖（三）。 第1 9圖：本發明另一供料載具之使用動作示意圖（四）。 【主要元件符號說明】 習式部份： 10:測試台 2 3 :馬達 2 4 3 :縱向滑座 2 5 3 :下壓取置頭 2 6 3 :螺套 2 9 =馬達 2 0 :第一取料機構 21 :橫向滑執 2 2 :橫向螺桿 2 4 :滑動件 2 41 :螺套 2 4 2 :橫向滑座 2 5 :取料器 2 51 :縱向滑軌2 5 2 :橫向滑座 2 6 :支架 2 61 :橫向滑軌 2 6 2 :縱向滑座 2 7 :縱向滑執 2 8 :縱向螺桿 15 200928385 3◦:第二取料機構 31 :橫向滑軌 3 2 :橫向螺桿 3 3 :馬達 3 4 :滑動件 3 41 :螺套 3 4 2 :橫向滑座 3 4 3 :縱向滑座 3 5 :取料器Figure 13: Schematic diagram of the action of the transfer of the present invention (6). Figure 14: Schematic diagram of the action of the transfer of the present invention (7). Figure 15 is a schematic view showing the structure of another feeding carrier of the present invention. Figure 16 is a schematic view showing the operation of another feeding carrier of the present invention (I). Figure 17 is a schematic view showing the operation of another feeding carrier of the present invention (2). Figure 18: Schematic diagram of the operation of another feeding carrier of the present invention (3). Figure 19: Schematic diagram of the operation of another feeding carrier of the present invention (4). [Main component symbol description] Part of the formula: 10: Test bench 2 3 : Motor 2 4 3 : Longitudinal slide 2 5 3 : Lower presser head 2 6 3 : Screw sleeve 2 9 = Motor 2 0 : First Reclaiming mechanism 21: transverse sliding 2 2 : transverse screw 2 4 : sliding member 2 41 : threaded sleeve 2 4 2 : transverse sliding seat 2 5 : reclaimer 2 51 : longitudinal sliding rail 2 5 2 : transverse sliding seat 2 6: bracket 2 61 : transverse rail 2 6 2 : longitudinal carriage 2 7 : longitudinal slip 2 8 : longitudinal screw 15 200928385 3◦: second reclaim mechanism 31 : transverse rail 3 2 : transverse screw 3 3 : Motor 3 4 : Slide 3 41 : Screw sleeve 3 4 2 : Lateral slide 3 4 3 : Longitudinal slide 3 5 : Reclaimer
3 5 2 :橫向滑座 3 6 2 :縱向滑座 3 8 :縱向螺桿 4 1 :載台 5 1 :載台 3 5 3 :下壓取置頭 3 6 3 :螺套 3 9 :馬達 4 2 :取置頭 5 2 :取置頭 3 51 :縱向滑執 3 6 :支架 3 61 :橫向滑執 3 7 :縱向滑執 4 0 :入料機構 5 0 :出料機構 本發明部份： 6 0 :供料裝置 8 0 :作業區 81:供料載具 812·調整件 8 1 4 :調整件 8 2 :第一收料載具 8 4 :測試站 8 6 :第一移載取放器 8 6 2 :取置頭 8 71 :滑執組 9 0 :輸出端輸送裝置 10 0 :收料裝置 1 1 0 .電子元件 1 1 2 .電子元件 7 0 :輸入端輸送裝置 811:承座 813:調整件 815:滑轨組 8 3 :第二收料載具 8 5 :取像機構 8 61 :滑軌組 87:第二移載取放器 8 7 2 :取置頭 111:電子元件 113:電子元件 163 5 2 : transverse slide 3 6 2 : longitudinal slide 3 8 : longitudinal screw 4 1 : stage 5 1 : stage 3 5 3 : lower press head 3 6 3 : screw sleeve 3 9 : motor 4 2 : take-up head 5 2 : take-up head 3 51 : longitudinal slip 3 6 : bracket 3 61 : transverse slip 3 7 : longitudinal slip 4 0 : feeding mechanism 5 0 : discharge mechanism part of the invention: 6 0: Feeding device 80: Working area 81: Feeding carrier 812·Adjustment 8 1 4 : Adjustment member 8 2 : First receiving carrier 8 4 : Test station 8 6 : First transfer pick-and-place device 8 6 2 : take-up head 8 71 : slipper group 9 0 : output end conveyor 10 0 : receiving device 1 1 0 . electronic component 1 1 2 . electronic component 7 0 : input conveyor 811: socket 813 : adjustment member 815: slide group 8 3 : second receiving carrier 8 5 : image taking mechanism 8 61 : slide group 87: second transfer picker 8 7 2 : take-up head 111: electronic component 113 : Electronic components 16