200842373 九、發明說明： 【發明所屬之技術領域】 取像本種可對移载取放器上之待測電子元件 =亚线輯運异後，對待測電子元件作位置 巧父正’以準確將電子元件移载於測試站 ^之 可校正對位之電子元件移餘置。 逆仃^貝Μ作業之 【先前技術】 以封測作業而言，目前所泛用之測試分 機械手臂對電子元件進行移载及置入測試動= 行測試作業，由於雷早士姓式座内，以進 置入測試座日守，其接點必須與測試 電子元件正積極朝向小巧輕薄^體連結；2 ，的電子元件置入測試座乂因= ，而降低峨的^子轉與峨座無法財效的電性接觸 號『1C檢』ί i(二2)二，幸台灣專利申請第93110783 第一、二取料機^』〇專1#◦及該人檢义置包含有測試台1 〇、 中’該測試台1 〇之兩側設^ :出：”、5 0，其 各取料機構均設有相互岭H :㈣機構2 0、3 0 ’ 構係於機架上設有樺向滑執^移「構及升降結構，各橫移結 而橫向螺桿22、32由馬達2 33 ^^螺桿22、32’ 24 1、34 1及橫向滑座2 ^3驅動，一具有螺套 3 4，係滑置且螺合於横 2、3^ 2之滑動件2 4、 3 2上’並於另面設有縱向滑=1 J 1及橫向螺桿2 2、 係於-底面具吸嘴之取 ς 3 4 3，而升降結構 2 51、3 51，以滑署二、=、3 5侧面設有縱向滑軌 ^於滑動件24、34之縱向滑座 5 200842373 HU 2 2，該冓另於取料器2 5、3 5之頂面設 ^ 以滑置於-支架2 6、3 6之橫 月61、3 β1上，而升降結構並於該支架2 6、3 6之 縱向滑座2 6 2、3 6 2及-螺套2 6、3、3 6 3， Ϊ 2Ϊ於機架之縱向滑執2 7、3 7及縱向螺桿2 8、3 8 ί移= ΐ12 8、^ 8由一馬達2 9、3 9驅動，進而當各 滑動：馬I2 3、彡3驅動橫向螺桿2 2、3 2時’即帶動 3 5之^之核向滑座2 4 2、3 4 2及取料器2 5、 滑f 52、3 5 2 ’於機架之橫向滑軌”^ 及支木2 6、3 6之橫向滑執2 61、q β彳μ你^/200842373 Nine, invention description: [Technical field of invention] The image can be tested on the electronic component to be tested on the transfer picker = sub-line after the difference, the electronic component to be tested is positionally accurate The electronic component is transferred to the test station to correct the alignment of the electronic component shifting. [Previous technique] for the operation of the 仃 Μ Μ Μ 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以 以Inside, to enter the test stand, the contact must be connected with the test electronic components to the small and light body; 2, the electronic components placed in the test seat 乂 =, and reduce the 子 子 转 峨The electric contact number "1C inspection" ί i (2 2) 2, fortunately, Taiwan patent application No. 93110783 First and second reclaimer ^ 〇 〇 1# ◦ and the person's 义 置 Included test Table 1 〇, 中 'The test bench 1 〇 is set on both sides of the ^: out:", 50, each of the reclaiming mechanisms are provided with each other H: (four) mechanism 2 0, 3 0 ' The bifurcated slide is provided with a "construction and lifting structure, and the transversely-transformed nodes 22, 32 are driven by the motor 2 33 ^^ screw 22, 32' 24 1 , 34 1 and the transverse slide 2 ^ 3 , one The utility model has a screw sleeve 34, which is slid and screwed on the sliding parts 2 4 and 3 2 of the horizontal 2, 3^ 2 and is provided with a longitudinal sliding=1 J 1 and a transverse screw 2 2 on the other side. Bottom The suction nozzle is ς 3 4 3, and the lifting structure 2 51, 3 51 is provided with a longitudinal sliding rail on the side of the sliding section 2, =, 3 5, and a longitudinal sliding seat 5 of the sliding members 24, 34 200842373 HU 2 2, The top surface of the reclaimer 2 5, 3 5 is disposed on the transverse moon 61, 3 β1 of the brackets 26, 36, and the lifting structure is disposed on the brackets 26, 36 Longitudinal slide 2 6 2, 3 6 2 and - screw sleeve 2 6 , 3, 3 6 3, Ϊ 2 纵向 longitudinal slide on the frame 2 7 , 3 7 and longitudinal screw 2 8 , 3 8 ί shift = ΐ 12 8 , ^ 8 is driven by a motor 2 9 , 3 9 , and then when each sliding: horse I 2 3, 彡 3 drive the transverse screw 2 2, 3 2 'that drives the 3 5 of the nuclear slide 2 4 2, 3 4 2 and the reclaimer 2 5, slide f 52, 3 5 2 'horizontal slide rails in the rack' ^ and the branches 2 6, 3 6 lateral slip 2 61, q β彳μ you ^ /
Γ 升降結構之馬達2 9、3 9驅動縱向螺桿2 S =口：向2滑6軌2356r3Tf2 6 2、2 6 2及取料器 / t丄351 ’於機架之縱向滑軌2 7、 載送I c，及-具有吸嘴4 2載5 24A；^之^結構’用以 該入料機構4 0之吸嘴4 2係將待測工^置於載&放」C ; 取料機構2 〇之取料器2 5 5 ，:冓2 0令取料器2 5之吸嘴於载台4丄上吸取工c取 於測试台1 〇中進行測試作業载 置入 載下一待測丨c ;當人料機構4 位以承 =移當===40之載台4Γ= 戍不筹z U之I C檢測完畢德，gp册 器2 5橫向位移至出料機構5 〇 f 即:動取料 25下降將1C放置於载台51旯口51上1心取料器 構3 0之取料器3 ，在同時，第二取料機 μΑ /方向位移，將取料器3 5上另一待 200842373 fi 武台1 〇中進行泪4試作業，當第二取料機構3 ◦ 作動，而再構2 0之取料器2 5即反向位移 者坌-抱极协城枓機構4 0之载台41上吸附又一待測I c， ^[之心^⑽之取料器^將測試完之^放置於出料機 置入於測試:i =出第—取料機構2 0即可將待測1 C 30依序迅，?：：由第-、二取料機構2〇、 3 後,m、3 0具吸嘴之取料器2 5、 台1 0中進行_作二f : 2兩軸向的位移將1 c置入於測試 件而言，其將很難作業方式，於小體積的電子元 即使得電子元件J ’以準確的置入測試台内，此 置無法應用於t體ϋ無效的電性接觸，導致該檢測裝 2 5、3 5於二;:=f作業。此外，由於取料器 測試台1 〇間之對位即便的位移調整，因此I C與 而無法提供完整之校正功能。、’、热法γ軸向的補償校正， 以其相子=的發展趨勢，遂 待測電子元件取像長終究研創出一種可對 ，，子元件移载置人進行 ^ 餘置，以準 質，此即為本發明之設計宗匕。飞作系進而達到有效提升檢测品 【發明内容】 下曰 ^其^ϊί = 電子元件移载裝 及第二移載取放器;以=^收料載具、第一 f承置有待测試電子元件，以分別供第_、^弟―、二供料载具 载置入測試站進行测試作業，並於^成顯^移^放器吸取移 •, 由弟 -__一多容-4b 7 200842373 取放器吸取移載置人第-、二收料载具出料； — 供料载具及測試站間係設有連接訊號至中央 哭 '、 〜 以對第-、二移載取放器吸取移載之取像裝置， 控制器之比對運算後，命令第―、二並經由中夫 補償校正，以準確將電子元件移·置^_心t立置^角度之 進而達到核提升制品f之目的。“進仃測試作業’ 2明之另一目的係提供_種可校正對位 置’其中’該第一、二移載取放器係分別以滑軌 =^機架，而其裝設取置歡升降制可降及站 進而弟-、二移載取放料分職χ_γ平面u動’ 角的補償校正，制Ζ軸向的升降位移，轴向及0 入於測試站進行測試作業。 將包子碰準確移载置 【實施方式】 較佳^例步之深场解，兹例舉- 娜lif ί 4圖’本發明配置_試分類機使科，該測試八 清參閱第5、6圖，本發明之作業區8 〇包括有 2=站8 5严則之第二供料载具8 2及第二收以具匕 移，取放1§8 6及第二移載取放器87 ;第— 裁 ^、8 2係承置待檢測之電子树，第―、二收料具 ，承置j之電子元件，該第一、二供料載具8丄、 一、一收料載具8 3、8 4係關定的方式定位於相對測試 200842373 站8 5的相關位置 极 、 端輸送機構、輪出端於、1、二、二移載取放器8 β ' 8 7及輸入 4左右往復滑動輪^機構進行供、收料作業，或以各自獨立 .第-、二移载取放^ 8 J立3對測試站8 5的相關位置，以供 與測試站8 5間中’於第一、二供料載具8 1、8 2 該取像裝置8 訊號至中央控制器之取像裝置8 8， 8 6、8 7移载带=_杜5取像盗，以提供第一、二移載取放器 載取放器8 6、八則取像裝置8 8處取像’另第一、二移 站8 5上方之機架，而滑軌組8 6 1、8 7 1架置於測試 •-、二移載取放^ 8 =作二軸向（X-Y)的滑移作動，該第 滑執組8 6 1、°8°7 Hi之升降桿8 6 2、8 7 2，係可於 頭8 6 3、8 7 2，Ιίί升降及旋轉運動，其頭端並裝設取置 滑軌組8 6 1、s 7 1 、一移載取放器8 6、8 7可利用 8 6 3、873於x-v巫及升降桿8 6 2、8 7 2帶動取置頭 再以Z軸向的升^位jmX—¥兩轴向及Θ角的補償校正’ 進行測試作^升 將％子元解確移餘人於測試站8 5 *時請=第:之電子元件於作業區8 0執行測試作 ^ = 8 7之取置頭8 7 3係位於測試站8 5 籲之取置頭8 6 ? gu 1 2執仃職作業，而第一移載取放器8 6 供，具8 1處準備取置待測之電子 二移載取i器巧;益;811 〇完_ ^ 至第二收料做8 7 3將調之電子元件11 0移載 送至收料機構^ ’以供輸出端輸送機構依據測試結果輸 置’同時第—移載取放器8 6之取置頭 取像元ί1 1 1吸取移載至取像裝置8 8處，該 控制器，並經由中央；傳輸至中央 八望一銘.雨#抑:控制之比對，而運鼻出其偏差量，進而命 7弟移载取放益86作位置或角度之補償校正。請參閱第㈣ 9 200842373 ，當第一移載取放器8 6完成位置或角度之補償校正後，即準確 將電子元件111移載置入於測試站8 5上，並以取置頭8 6 3 下壓壓抵電子元件1 1 1執行檢測作業，此時第二移载取放哭 ^7之取置頭8 7 3將糾之電子元件i成放置後，將;； 平=移動至第二供料載具8 2處’由於輸人端輸送機構已將待^ =子讀1 12輸送至第二供料载具8 2上，因此第二移】取 =8 7之取置頭8 7 3可於第二供料載具8 2上準備取置_ =測之電子元件！i 2 ;請參閱第i◦圖，於電子元件^ 一?載取放器8 6之取置頭8 6 3將完測之i子 佐壚別至第—收料載具8 3放置’以供輸出端輸送機構 8ϋίί7送機構分類放置，同時第二移載取放器 7 3將制之電子元件112吸取移載至取健 中央控制器，並經由中央控制器之比對 ^閱第:移載取放器8 7作位置或角度之補償校：。 校正後，即準確將電子元件i i 位置或角度之補償 以取置頭8 7 3下=巧言⑽5上，並 ;JJ取放器8 6之取置頭8 6 3將完測之;f ίϋι將會平行移動至第一供料载具81處，由於於入iii ，一移载取放器86可於第—供料^ 上，因 待測之電子元件〗Ί ^，、#二|贫了戟丄上準備取置下一組 取放器8 7分別由測試站85兩侧2^=^及第二移載 執行檢測作業。 *曰的將電子元件移載並 請參閱第12圖，本發明之第—爲 取放器8 7由於可將待測 6及第二移載 ，並經由中央控制器之比對及運算至^裝置處取像 Θ角的補償校正，而於執賴物 200842373 8 7 2頭端之取置頭8 6 3、8 7 3可準確於測試站8 5正上方 置入電子元件，達到提升作業品質之目的。 【圖式簡單說明】 第1圖：係為台灣專利申請第93110783號『1C檢测裝置（二）』專 利案之配置示意圖。 第2圖：係為台灣專利申請第93110783號『1C檢測裝置（二）』專 利案弟一取料機構之不意圖。 第3圖：係為台灣專利申請第93110783號『1C檢測裝置（二）』專 利案第二取料機構之示意圖。 第4圖：本發明配置於測試分類機之配置示意圖。马达 Lifting structure motor 2 9, 3 9 drive longitudinal screw 2 S = port: 2 slide 6 rail 2356r3Tf2 6 2, 2 6 2 and reclaimer / t丄351 'longitudinal slide rails on the rack 2 7 Send I c, and - have a nozzle 4 2 load 5 24A; ^ structure ^ for the feeding mechanism 40 nozzle 4 2 is to be placed in the load & put C; Mechanism 2 取Reclaimer 2 5 5 ,: 冓 2 0 The retractor 2 5 nozzle is sucked on the stage 4 吸 and taken from the test rig 1 进行 to carry out the test operation.待c; when the human body mechanism is 4, the load is shifted ===40, the stage 4Γ= 戍 does not raise the z, the IC detection is completed, the gp register 2 5 is laterally displaced to the discharge mechanism 5 〇f That is, the moving material 25 is lowered, and 1C is placed on the loading port 51 of the loading table 51, and the reclaimer 3 of the 1st reclaimer structure 3 is at the same time, and the second reclaimer is displaced in the direction / direction, and the reclaimer 3 is 5 on the other 200842373 fi Wutai 1 〇 进行 进行 进行 4 4 试 试 试 , , , , , , , , , , , , 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 2008 On the stage 41 of the 枓 mechanism 40, another I c is to be tested, ^[The heart ^(10) reclaimer ^ will be tested Placed in the discharge machine and placed in the test: i = the first - reclaiming mechanism 2 0 will be able to measure 1 C 30 in order, ?:: by the first - and second reclaiming mechanism 2 〇, 3, m 30, the nozzle retractor 2 5, the stage 10 is carried out _ for two f: 2 two axial displacements put 1 c into the test piece, it will be difficult to work, in small volume The electronic component allows the electronic component J' to be accurately placed in the test bench. This device cannot be applied to the inactive electrical contact of the t-body, resulting in the detection device 2 5, 3 5 in two;: = f operation. In addition, due to the displacement adjustment of the alignment of the reclaimer test station 1, the I C does not provide a complete correction function. , ', thermal method γ axial compensation correction, with the development trend of its phase = 遂 遂 遂 遂 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子Quality, this is the design of the invention. Flying system to achieve effective improvement of inspection products [invention content] 曰 ^ ^ ^ ^ ^ = electronic components transfer and second transfer pick and place; = ^ receiving vehicle, the first f is to be placed Test the electronic components for the first _, ^ brother, and two feeding vehicles to be placed in the test station for testing, and in the ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ Multi-capacity-4b 7 200842373 Pick-and-place pick-up and transfer of the first and second receiving vehicle discharges; - Connection signal to the test station to the central crying, ~ to the first -, The second transfer pick-and-place device picks up the image capture device for transfer, and after the comparison operation of the controller, the command first and second are compensated by the medium compensation, so as to accurately move the electronic component to the heart. In turn, the purpose of the nuclear lifting product f is achieved. Another purpose of the "injection test operation" is to provide a calibratable pair of positions, where the first and second transfer pickers are respectively equipped with slide rails = ^ racks, and their installations are loaded and lowered. The system can be lowered to the station and then the younger-, second-shifting and loading-distributing 分 γ-plane u-moving angle compensation correction, the axial movement of the ramming axis, the axial direction and 0 into the test station for testing operations. Accurate shifting [Embodiment] The deep field solution of the preferred example step, for example - Nali ί 4 diagram 'The configuration of the invention _ trial classification machine, the test eight clear, see Figure 5, 6, this The working area 8 of the invention includes 2 = station 8 5 strict second feeding carrier 8 2 and second receiving device with shifting, picking and placing 1 § 8 6 and second transfer picker 87; — 裁 ^, 8 2 is the electronic tree to be tested, the first and second receiving tools, the electronic components of the j, the first and second feeding vehicles 8 丄, one, one receiving vehicle 8 3, 8 4 is determined in the relative position of the test 200842373 station 8 5 related position pole, end transport mechanism, wheel end in, 1, 2, 2 transfer pick and place device 8 β ' 8 7 and input 4 or so to The multi-sliding wheel mechanism is used for feeding and receiving operations, or the respective positions of the test stations 8 5 are separated by the first and second transfer, and the relevant positions of the test stations 8 5 are provided for First and second feeding carriers 8 1 , 8 2 The image capturing device 8 signals to the central controller of the image capturing device 8 8, 8 6 , 8 7 transfer tape = _ Du 5 take the image stealing to provide the first 2, the transfer device and the pick and place device 8 6 , the eight image capture device 8 8 take the image of the frame above the other first and second transfer stations 8 5 , and the slide track group 8 6 1 , 8 7 1 The rack is placed in the test •-, the second transfer pick and place ^ 8 = for the two-axis (XY) slip actuation, the first slip group 8 6 1 , ° 8 ° 7 Hi lifting rod 8 6 2, 8 7 2, can be lifted and rotated in the head 8 6 3, 8 7 2, Ιίί, and the head end is equipped with the take-up rail group 8 6 1 , s 7 1 , a transfer pick-and-place picker 8 6 , 8 7 It can be tested by using 8 6 3, 873 on xv witch and lifting rod 8 6 2, 8 7 2 to take the head and then using the Z-axis up position jmX-¥ two-axis and the angle compensation compensation'升 % 子 % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % % The pick-up head 8 7 3 is located at the test station 8 5 and the pick-up head 8 6 gu 1 2 performs the job, and the first transfer pick-and-place unit 8 6 provides, and 8 1 is ready to take the test. Electronic second transfer to take the i device skill; benefit; 811 〇 _ ^ to the second receipt to do 8 7 3 transfer the electronic component 11 0 transfer to the receiving mechanism ^ 'for the output end delivery mechanism according to the test results The input 'simultaneous first-loading pick-and-place device 8 6 takes the head to take the picture element ί1 1 1 pick up and transfer to the image capturing device 8 8 , the controller, and through the center; transmission to the central eight Wang Yiming. Rain #抑: Control the comparison, and the nose is out of its deviation, and then the 7 brothers move to take the benefit 86 for position or angle compensation correction. Referring to (4) 9 200842373, when the first transfer picker 8 6 completes the position or angle compensation correction, the electronic component 111 is accurately placed on the test station 8 5 and the take-up head 8 6 3 Pressing and pressing the electronic component 1 1 1 to perform the detecting operation, at this time, the second transfer picking and dropping, the picking head 8 7 3 will place the correcting electronic component i, and then; The second feeding carrier 8 2 'because the input end conveying mechanism has sent the sub-reading 1 12 to the second feeding carrier 8 2, so the second shifting is taken = 8 7 of the take-up head 8 7 3 can be placed on the second feeding carrier 8 2 to take the _ = measured electronic components! i 2 ; Please refer to the figure i, in the electronic component ^ a pick-and-place picker 8 6 take-up head 8 6 3 will be measured to the first - receiving vehicle 8 3 placed 'to The output end conveying mechanism 8ϋίί7 is sent to the mechanism for sorting, and the second transfer picker 7 3 picks up the electronic component 112 and transfers it to the central controller, and compares it with the central controller. The loader 8 7 is used as a compensation for position or angle: After the correction, the compensation of the position or angle of the electronic component ii is accurately taken to take the head 8 7 3 = Qiao (10) 5, and the JJ pick-and-placer 8 6 pick-up head 8 6 3 will be completed; f ϋ ϋ It will move parallel to the first feeding carrier 81. As a result of entering iii, a transfer pick-and-place device 86 can be placed on the first supply, because the electronic components to be tested are Ί ^, #二| The 一组 is prepared to take the next set of pick and place devices 8 7 and the detection operations are performed by the two sides of the test station 85 2^=^ and the second transfer. * Transfer the electronic components 曰 and refer to Figure 12, the first part of the present invention - for the pick-and-place device 8 7 can be compared to the 6 and the second transfer At the device, the compensation correction of the corner is taken, and the pick-up head 8 6 3, 8 7 3 at the head end of the 200842373 8 7 2 can accurately insert the electronic components directly above the test station 8 5 to improve the quality of the work. The purpose. [Simple description of the drawing] Fig. 1 is a schematic diagram of the configuration of the patent of "1C detecting device (2)" of Taiwan Patent Application No. 93110783. Fig. 2: It is the intention of the patent application No. 93110783 of the Taiwan Patent Application No. 93110783. Fig. 3 is a schematic diagram of the second reclaiming mechanism of the patent of "1C detecting device (2)" of Taiwan Patent Application No. 93110783. Figure 4: Schematic diagram of the configuration of the present invention configured on a test sorter.
第5圖：本發明之架構圖。 第6圖：本發明移載取放器之示意圖。 第7圖：本發明移載之動作示意圖（一）。 第8圖：本發明移載之動作示意圖（二）。 第9圖：本發明移載之動作示意圖（三）。 第1 0圖：本發明移載之動作示意圖（四）。 第11圖：本發明移載之動作示意圖（五）。 第12圖：本發明移載取放器下壓執行測試作業之示意圖。 【主要元件符號說明】 習式部份： 10:測試台 2 3 :馬達 2 4 3 :縱向滑座 2 5 3 :下壓取置頭 2 6 3 :螺套 2 0 :第一取料機構 21 :橫向滑執 2 2 :橫向螺桿 2 4 :滑動件 2 4 1 ··螺套 2 4 2 ·•橫向滑座 2 5 :取料器 2 51 :縱向滑軌2 5 2 :橫向滑座 2 6 :支架 2 61 :橫向滑執2 6 2 :縱向滑座 11 200842373Figure 5: Architecture diagram of the present invention. Figure 6 is a schematic view of the transfer handler of the present invention. Figure 7: Schematic diagram of the action of the transfer of the present invention (1). Figure 8: Schematic diagram of the action of the transfer of the present invention (2). Figure 9: Schematic diagram of the action of the transfer of the present invention (3). Figure 10: Schematic diagram of the action of the transfer of the present invention (4). Figure 11: Schematic diagram of the action of the transfer of the present invention (5). Fig. 12 is a schematic view showing the test operation of the transfer pick-and-place device of the present invention. [Main component symbol description] Part of the formula: 10: Test bench 2 3 : Motor 2 4 3 : Longitudinal slide 2 5 3 : Lower presser head 2 6 3 : Screw sleeve 2 0 : First reclaim mechanism 21 : Horizontal slide 2 2 : Transverse screw 2 4 : Slide 2 4 1 · Screw 2 2 2 ·• Lateral slide 2 5 : Reclaimer 2 51 : Longitudinal slide 2 5 2 : Lateral slide 2 6 : bracket 2 61 : lateral slip 2 6 2 : longitudinal slide 11 200842373
2 7 :縱向滑軌 2 8 ··縱向螺桿 3 0 :第二取料機構 31:橫向滑執 3 2 :橫向螺桿 3 4 :滑動件 3 4 1 _·螺套 3 4 2 :橫向滑座 3 5 :取料器 3 51 :縱向滑軌 3 5 2 :橫向滑座 3 6 :支架 3 61 :橫向滑轨 3 6 2 :縱向滑座 3 7 :縱向滑軌 3 8 :縱向螺桿 4 0 :入料機構 4 1 :載台 5 0 :出料機構 5 1 :載台 本發明部份： 2 9 ·· 3 3·· 343 3 5 3 3 6 3 3 9: 42 : 5 2: 馬達 馬達 :縱向滑座 :下壓取置頭 :螺套 馬達 取置頭 取置頭2 7 : Longitudinal slide rail 2 8 · Longitudinal screw 3 0 : Second take-up mechanism 31 : Lateral slip 3 2 : Lateral screw 3 4 : Slide 3 4 1 _· Screw sleeve 3 4 2 : Lateral slide 3 5: Reclaimer 3 51: longitudinal rail 3 5 2 : transverse carriage 3 6 : bracket 3 61 : transverse rail 3 6 2 : longitudinal carriage 3 7 : longitudinal rail 3 8 : longitudinal screw 4 0 : Material mechanism 4 1 : Stage 5 0 : Discharge mechanism 5 1 : Stages Part of the invention: 2 9 ·· 3 3·· 343 3 5 3 3 6 3 3 9: 42 : 5 2: Motor motor: longitudinal sliding Seat: lower pressure take-up head: threaded motor take-up head
6 0 :供料機構 8 0 :作業區 81:第一供料载具 8 3 :第一收料載具 8 5 :測試站 8 6 :第一移載取放器 8 61 ·滑執組 8 6 3 ·取置頭 8 7 :第二移载取放器 8 71 :滑軌組 8 7 3 :取置頭 88:取像裝置 9 〇 :輸出端輪送機構 10 0 :收料機構 110·電子元件 112·電子元件 7 0 :輸入端輸送機構 8 2 :第二供料载具 8 4 :第二收料载具 8 6 2 :升降桿 8 7 2 :升降桿 111•電子元件 113·電子元件 126 0 : Feeding mechanism 80 : Working area 81 : First feeding carrier 8 3 : First receiving carrier 8 5 : Test station 8 6 : First transfer picker 8 61 · Slip group 8 6 3 · Pickup head 8 7 : Second transfer picker 8 71 : Slide set 8 7 3 : Take-up head 88: Image taking device 9 〇: Output wheel transfer mechanism 10 0 : Receiving mechanism 110· Electronic component 112·electronic component 7 0 : input end conveying mechanism 8 2 : second feeding carrier 8 4 : second receiving carrier 8 6 2 : lifting rod 8 7 2 : lifting rod 111 • electronic component 113 · electronic Component 12