TWI445978B - Electronic component conveying device and its application testing equipment - Google Patents

Description

Electronic component conveying device and application test device thereof

The invention provides a conveying device which is simple in design of the mechanism, can quickly transfer the electronic components, and the average stress measurement of the electronic components, thereby improving test performance and saving cost.

Please refer to FIG. 1 , which is a patent application of Taiwan Invention No. I233997 "IC detecting device (2)" previously filed by the applicant, which is provided with a first reclaiming mechanism on the first and second frames 11 and 12 respectively. 13 and the second reclaiming mechanism 14, the first and second reclaiming mechanisms 13 and 14 each have a lifting structure and a traverse structure, wherein each lifting structure is respectively provided on the first and second frames 11 and 12 respectively. Two Z-axis motors 131, 141 for driving the first and second pulley sets 132, 142, and the first and second pulley sets 132, 142 respectively driving the first and second Z-axis screw drive sets 133, 143, The first and second brackets 134 and 144 are respectively driven by the first and second brackets 134 and 144 for the Z-axis displacement, and the first and second brackets 134 and 144 are respectively the first and second X-axis slide rails 1341. The first and second X-axis slides 1351 and 1451 of the first and second L-shaped cantilever 135, 145 are assembled and assembled, and the first and second pick-up members are respectively arranged at the bottom of the first and second L-shaped cantilever 135, 145. 1352 and 1452 are used for picking up and pressing the electronic components, and each of the traverse structures is respectively provided with first and second X-axis motors 136 on the first and second frames 11 and 12. 146, for driving the first and second X-axis screw transmission groups 137, 147, the first and second X-axis screw transmission groups 137, 147 are connected to drive the first and second sliding frames 138, 148 for X-axis displacement, The first and second sliding frames 138, 148 and the first and second L-shaped cantilever 135, 145 are respectively provided with first and second Z axial sliding seats 1381, 1481 and first and second Z axial sliding rails. 1353, 1453; when performing the operation of the test electronic component, taking the first reclaiming mechanism 13 as an example, the first X-axis motor 136 can be controlled to be driven by the first X-axis screw drive set 137 and the first sliding frame 138. The first L-shaped cantilever 135 is X-axis displaced, so that the first pick-up 1352 of the first L-shaped cantilever 135 will be the electronic component 15 to be tested. Transfer to the top of the test stand 16, and then control the first Z-axis motor 131 to drive the first bracket 134 for Z-axis displacement via the first pulley set 132 and the first Z-axis screw drive set 133, the first bracket 134 The first X-shaped cantilever 135 is driven by the first X-axis slide rail 1341 and the first X-axis slide rail 1351 for the Z-axis displacement, and the first L-shaped cantilever 135 is the first Z-axis slide rail 1353 along the first The first Z-axis slide 1381 of a carriage 138 is displaced and pressed against the electronic component 15 to be tested to perform a test operation; however, since the first and second reclaiming mechanisms 13, 14 are respectively in the first and second frames 11 12, equipped with an independent lifting structure, each lifting structure is provided with first and second Z axial motors 131, 141 and first and second pulley sets 132, 142 and first and second Z axial screw drive sets 133, 143 and the first and second brackets 134, 144 and the like, and then the first and second L-type cantilever 135, 145 and the first and second sliding frames 138, 148 are respectively provided with the first and second Z axial sliding The seats 1381, 1481 and the first and second Z axial slides 1353, 1453 can cause the first and second L-shaped cantilever 135, 145 to drive the first and second pick-up members 1352, 1452 for Z-axis displacement. The load-carrying and measuring electronic component 15 not only has a complicated design of the component arrangement and the interlocking relationship between the first and second reclaiming mechanisms 13 and 14, but also increases the inconvenience in assembly work, and the first and second reclaiming mechanisms 13 and 14 must Independently equipped with a lifting structure with components such as a Z-axis motor and a Z-axis screw drive group, the equipment cost is also increased, and the first and second reclaiming mechanisms 13 and 14 are increased in size due to the configuration of the lifting structure, which is not conducive to testing. The machine space configuration of the device, in addition, since the pressure of each of the first and second pick-up members 1352, 1452 against the electronic component 15 under test directly affects the test quality, the first and second pick-up members 1352, 1452 must be made. The same lower pressure is pressed against the electronic component 15 to ensure the test quality of each electronic component 15, but the first and second L-shaped cantilevers 135, 145 are not easily adapted to the first and second pickups due to factors such as deformation or assembly tolerances. When the horizontal plates of the members 1352 and 1452 are kept horizontal, respectively, when the first and second pickup members 1352, 1452 are respectively pressed against the electronic component 15, the first and second pickup members 1352, 1452 cannot be ensured to be pressed by the same pressure. Power to be tested The sub-element 15 is such that the electronic component 15 to be tested is not evenly stressed, thereby affecting the test quality.

An object of the present invention is to provide an electronic component conveying device, which is provided with at least one transfer unit, the transfer unit includes at least one transfer mechanism and a compression mechanism, and the transfer mechanism is provided with at least one drive source. a shifting device for driving displacement, the feeder is provided with a frame with a bearing plate, and at least one picking member for picking up and transferring electronic components is disposed under the bearing plate, and the pressing mechanism is located at the material feeding mechanism Above, there is at least one pressure device driven by a power source to provide the pressure required for the electronic component to be pressed for testing; thereby, the electronic component can be moved into the test by using a simple and small size shifter. The seat and the pressing mechanism make the electronic components receive the average force and actually contact the test socket, which not only can evenly press the electronic components, but also quickly transfer and take the electronic components, thereby achieving the practical benefit of improving test performance and saving cost.

A second object of the present invention is to provide an electronic component conveying device, wherein the pressing mechanism of the transfer unit can perform the operation of the pressure measuring electronic component with a plurality of material feeding mechanisms, and the Z axis is not required to be disposed on each of the material moving mechanisms. The lifting structure of the components such as the motor and the Z-axis screw drive group achieves the practical benefit of effective cost saving.

The third object of the present invention is to provide an electronic component conveying device, wherein the moving mechanism of the transfer unit does not need to be connected to the lifting structure of the Z-axis motor, the Z-axis screw transmission group, and the like, and can not be greatly reduced. The volume is also easy to assemble, which is beneficial to the space configuration of the test equipment machine and the convenience of assembly work.

A fourth object of the present invention is to provide an electronic component conveying device, wherein the transfer unit is provided with a secondary pressure-reducing structure for making the electronic component more evenly pressed, and the utility model can improve the test performance. benefit.

A fifth object of the present invention is to provide a testing device for applying a conveying device, which is provided with a feeding device, a receiving device, a testing device, a conveying device and a central control device, and the feeding device is adapted to accommodate at least An electronic component to be tested, the receiving device is for accommodating at least one electronic component to be tested, and the testing device is provided with a test circuit board with a test socket for testing electronic components, and the central control device is used for control and integration. Each device is actuated to perform an automated operation, and the conveying device is provided with at least one transfer unit and a transfer unit of the pressing mechanism for transferring the pressing electrons To achieve practical benefits of improved test performance and cost savings.

In order to make the present invention further understand the present invention, a preferred embodiment will be described in conjunction with the drawings, which will be described in detail later. Referring to Figures 2 and 3, the transport device 20 of the present invention is provided with at least one transfer. a unit, the transfer unit includes at least one of a transfer mechanism and a compression mechanism, and the transfer mechanism is provided with at least one shifter driven by a drive source, and the drive source includes at least one driver for driving the shifter for at least one The directional displacement, the hopper is provided with a carrier with a pickup member at the bottom, and the pickup member is used for picking up the transfer electronic component. In this embodiment, the first hopper mechanism 21 and the second hopper mechanism 22 are provided. The first moving mechanism 21 is provided with a first frame 211 on the machine table, and a first driving source is disposed on the side of the first frame 211, and the first driving source includes a first driver and a second driver, A driver is provided with a first motor 212 for driving a first transmission group that is mounted on the first frame 211 and disposed in a first direction (such as the Y direction). The first transmission group is the first pulley group 213. The first pulley set 213 is coupled to drive the first activity of the second drive The first auxiliary frame 214 is disposed between the first movable frame 214 and the first frame 211 to assist the first movable frame 214 to be smoothly displaced. The first auxiliary sliding structure is coupled to the first frame 211 and The first movable frame 214 is provided with a first sliding rail 2111 and a first sliding seat 2141. The second driving device is a first pressure cylinder 215 disposed in a second direction (such as the Z direction), and is first. The pressure cylinder 215 is coupled to drive the first shifter for the second direction displacement, and the first shifter can be driven by the first motor 212 and the first pressure cylinder 215 for the first and second directions, and the first shifter is provided. a first carrier 216 having a first bearing plate and a first bearing plate, and a first picking member for picking up the transferable electronic component at the bottom of the first bearing plate, the first carrier 216 being L-shaped or T-shaped, the first pick-up member can be a suction head or a clamp, etc. In this embodiment, the first carrier 216 is L-shaped, and is provided with a first bearing plate 2161 which is horizontally placed, A bottom of the bearing plate 2161 is provided with a plurality of first picking members 217 which can be a suction head, and a second between the first receiving frame 216 and the first movable frame 214. Co-slip structure, to assist smooth displacement of the first rack 216, the second auxiliary slide The structure is disposed between the first movable frame 214 and the first frame 216 with a second sliding rail 2142 and a second sliding seat 2162. The second moving mechanism 22 is provided with a second frame 221 on the machine table. And a second driving source is disposed on a side of the second frame 221, the second driving source includes a third driver and a fourth driver, and the third driver is provided with a second motor 222 for driving and assembling the second frame a second transmission group 221 disposed in a first direction, the second transmission group may be a second pulley set 223, and the second pulley set 223 is coupled to drive a second movable frame 224 capable of receiving the fourth drive, and second A third auxiliary sliding structure is disposed between the movable frame 224 and the second frame 221 for assisting the smooth displacement of the second movable frame 224, and the third auxiliary sliding structure is attached to the second frame 221 and the second movable frame 224. A third sliding rail 2211 and a third sliding seat 2241 are interposed. The fourth actuator is a second cylinder 225 placed in a second direction, and the second cylinder 225 is coupled to drive the second feeder. Displacement in the second direction, and the second shifter can be driven by the second motor 222 and the second pressure cylinder 225 as the first and second sides Displacement, the second shifter is provided with a second bracket 226 coupled to the second driving source and having a second bearing plate, and at least a second pick-up and transfer electronic component is disposed at the bottom of the second bearing plate The second carrier 226 can be an L-shaped or a T-shaped member, and the second pick-up member can be a suction head or a clamp. In this embodiment, the second carrier 226 is L-shaped and has a horizontal pendulum. The second bearing plate 2261 is disposed at the bottom of the second bearing plate 2261, and is provided with a plurality of second picking members 227 which can be the suction heads, and is disposed between the second receiving frame 226 and the second movable frame 224. The fourth auxiliary sliding structure is configured to assist the second frame 226 to be smoothly displaced. The fourth auxiliary sliding structure is disposed between the second movable frame 224 and the second frame 226, and the fourth sliding rail 2242 and the second portion are matched with each other. a four-slider 2262, the compression mechanism 23 is located above the material-feeding mechanism, and is provided with at least one pressure device driven by the power source to provide the pressure required for the electronic component to be subjected to the pressure measurement operation, in this embodiment A fixing frame 231 capable of erecting a power source is disposed above the first and second material moving mechanisms 21 and 22, and the power source is provided with a pressure cylinder 232. The piston rod of the cylinder 232 is coupled to drive at least one presser 233 for displacement in the second direction, so that the presser 233 is pressed against the bearing plate 2161 of the first and second carriers 216 and 226 of the first and second transfer mechanisms 21 and 22. 2261, further, transfer The unit is provided with a secondary pressure structure which can further press the electronic components evenly in the material transfer mechanism or the compression mechanism. In this embodiment, the auxiliary pressure structure is installed on the compression mechanism 23 and on the side of the pressure cylinder 232. The side is provided with at least one side pressure cylinder 234 for assisting pressing against the circumferential sides of the pressure receiving plates 2161, 2261 of the first and second frames 216, 226.

Referring to Figures 4 and 5, the transfer unit of the transport device 20 of the present invention can be disposed on the machine table 30 with the test device 40, and further includes a temporary side for the temporary electronic component 50 disposed on the side of the test device 40. The electronic component 50 can be a packaged electronic component (such as an IC with a solder ball) or an unpackaged electronic component (such as a strip or a substrate), and the test device 40 is provided with a test circuit board with a test socket 42. 41, for testing the electronic component 50, the first and second transfer mechanisms 21, 22 of the transfer unit are disposed on both sides of the test seat 42, and the compression mechanism 23 is located at the first and second transfer mechanisms 21, 22 Above the first test frame 214, the first transfer mechanism 21 can control the first motor 212 to drive the first movable frame 214 via the first pulley set 213 when the temporary component 24 temporarily positions the electronic component 50 to be tested. Displacement in the first direction, the first movable frame 214 drives the first frame 216 with the plurality of first picking members 217 to be displaced to the temporary area 24, and then controls the first pressure cylinder 215 to drive the first frame 216 to be the second. The direction is downwardly displaced, so that each of the first pick-up members 217 sucks the electronic component 50 to be tested in the temporary region 24; see the sixth 7 , the first moving mechanism 21 can control the first cylinder 215 to drive the first carrier 216 and the first picking member 217 to move upward in the second direction, so that each of the first picking members 217 takes out the electronic component 50 to be tested. The first motor 212 drives the first movable frame 214 and the first carrier 216 to be displaced in the first direction via the first pulley set 213, so that the plurality of first picking members 217 transfer the electronic component 50 to be tested to the test stand 42. Then, the first pressure cylinder 215 is controlled to drive the first frame 216 to be displaced in the second direction, and the electronic component 50 to be tested is placed in the test socket 42 so that the contacts of the electronic component 50 to be tested can be confirmed. In contact with the probe of the test seat 42, the transfer unit controls the pressure cylinder 232 of the compression mechanism 23 to drive the presser 233 to be displaced downward in the second direction to be pressed against the first bearing plate 2161 of the first carrier 216. And the piston rod of the side pressure cylinder 234 is pressed against the two sides of the pressure tool 233, and the auxiliary pressure is pressed against the two sides of the first pressure receiving plate 2161 so as to be located at the bottom of the first bearing frame 216. The electronic component 50 to be tested in the intermediate position and the peripheral position is subjected to an average force and does contact the probe of the test socket 42 to perform a test operation. When the temporary area 24 has been placed on the next electronic component 51 to be tested, the second shift The material mechanism 22 can control the second motor 222 to drive the second movable frame 224 to be displaced in the first direction via the second pulley set 223, so that the second movable frame 224 drives the second carrier 226 with the plurality of second picking members 227 to be displaced to At the temporary area 24, the second pressure cylinder 225 is controlled to drive the second frame 226 to be displaced downward in the second direction, so that the second pick-up members 227 pick up the next electronic component 51 to be tested in the temporary area 24; Referring to Figures 8 and 9, after the electronic component 50 is tested, the pressure cylinder 232 of the compression mechanism 23 drives the presser 233 to be displaced upwardly in the second direction, and the piston rods of the respective side cylinders 234 are simultaneously retracted and reset. A moving mechanism 21 controls the first cylinder 215 to drive the first carrier 216 to move upward in the second direction, so that each of the first picking members 217 takes out the tested electronic component 50 in the test socket 42 and then controls the first motor. 212 driving the first movable frame 214 with the first pulley set 213 and connecting to the first The second loading mechanism 22 controls the second pressure cylinder 225 to drive the second frame 226 and the second picking member 227 to move upward in the second direction, so that the second picking members 227 The next electronic component 51 to be tested is taken out in the temporary area 24, and the second bearing frame 226 is driven by the second pressure cylinder 225 to be displaced in the second direction, and the first carrier 216 is caused to have a high level difference, and the second material is moved. The mechanism 22 can control the second motor 222 to drive the second movable frame 224 and the second frame 226 to be displaced in the first direction via the second pulley set 223, so that the second frame 226 and the first frame 216 are alternately displaced, the first shift The first carrier 216 and the first pick-up members 217 of the material mechanism 21 can transfer the completed electronic component 50 to the temporary area 24, and drive the first carrier 216 and the first pick-up member with the first pressure cylinder 215. 217, the second direction is downwardly displaced, so that each of the first pick-up members 217 places the completed electronic component 50 into the temporary area 24, and the second carrier 226 of the second transfer mechanism 22 and each of the second pick-up members 227 can be Transferring the next electronic component 51 to be tested to the test socket 42 and driving the second carrier 226 to the second direction downward by the second cylinder 225, The second pick-up member 227 of the next test of the electronic component 51 placed in the 42 subsequent test blocks execute the test job.

Please refer to Figures 10, 11, and 12, which are test sorting machines for applying the above-mentioned conveying device 20, which includes a conveying device 20, a machine table 30, a testing device 40, a feeding device 60, a receiving device 70, and The central control device is disposed on the machine 30 for accommodating at least one electronic component to be tested. In this embodiment, a plurality of layer bearing mechanisms 61 are provided for respectively The electronic component 匣62 and the empty material 匣62 are loaded, and the carrier 匣62 is displaced in the third direction (such as the X direction), and each of the supporting mechanisms 61 is provided with at least one movable side plate. In this embodiment, The utility model is provided with a fixed side plate 611 and a movable side plate 612, and is provided with a positioner 613 for controlling the displacement of the movable side plate 612 for adjusting the distance between the two side plates 611 and 612, and is suitable for different sizes of the material 62; The material device 70 is disposed on the machine table 30 for accommodating at least one electronic component that is inspected. In this embodiment, a plurality of layer bearing mechanisms 71 are provided for respectively holding the empty magazine 72 and completing Measuring the material 匣 72 of the electronic component, and carrying the material 匣 72 for the third direction displacement, Each of the supporting mechanisms 71 is provided with at least one movable side plate. In the embodiment, a fixed side plate 711 and a movable side plate 712 are disposed, and a positioner 713 for controlling the displacement of the movable side plate 712 is provided. Adjusting the distance between the two side plates 711 and 712, and applying different sizes of the material 72; the testing device 40 is disposed on the machine table 30, and is provided with a test circuit board 41 having at least one test seat 42 for testing electronic components. And the test result is transmitted to the central control device (not shown) by a tester (not shown), and the central control device controls the operation of each device. Further, the test device 40 is provided with an externally pumpable device. 43. A rotatably oscillating socket 44 is disposed above the carrier 43 for receiving the test circuit board 41 with the test socket 42 and other related test components, etc., and a controller is disposed on the side of the socket 44. 45, for controlling the use state of the socket 44 (such as swinging or positioning), because the socket 44 is assembled with a plurality of components and the weight is heavy, the testing device 40 is disposed between the bearing 44 and the carrier 43 as a pressure cylinder. 46 driving source for driving the bearing 44 for the second direction displacement, During the test, the control cylinder 46 drives the socket 44 to move upward in the second direction, so that the test socket 42 carries the electronic component to be tested to perform the test operation. During the repair, the pressure cylinder 46 can be used to drive the socket 44. The second direction is displaced downward and is controlled by controller 4 5 control the socket 44 to swing, so that the test seat 42 is facing outward, so as to facilitate the maintenance work by the staff; the transport device 20 is disposed on the machine table 30, and is provided with at least one transfer unit that is identical to the transfer unit (please Referring to FIGS. 2 and 3), in the embodiment, the transfer unit includes first and second transfer mechanisms 21 and 22 and a compression mechanism 23, and one of the test devices 40 is provided with a temporary electronic component. The temporary area 24, the first and second transfer mechanisms 21, 22 are respectively provided with first and second shifters for alternately transferring electronic components between the test seat 42 and the temporary area 24, and the compression mechanism 23 is The electronic components for pressing the first and second shifters to transfer the first and second shifters can receive the average force and actually contact the test seat 42. The conveying device 20 further includes a first transfer mechanism. 25, the second transfer mechanism 26 and the pick-and-place mechanism 27, and the machine 30 is provided with a first loading area 28 for temporarily holding the electronic component to be tested and a second loading area for temporarily disposing the electronic component 29, the first transfer mechanism 25 is provided with a first transfer device 251, a first pusher 252 and a first clamp 253, the first transfer device 251 can be The second and third directions are used to transfer the magazine 62 at each of the supporting mechanisms 61 of the feeding device 60, and the first ejector 252 can be displaced in the first direction for the first moving device 251. The electronic component to be tested in the material 62 is pushed out, and the first clamp 253 can be displaced in the first direction for moving the electronic component to be tested to the first loading area 28, and the second transfer mechanism 26 A second shifter 261 and a second pusher 262 are provided. The second shifter 261 can be displaced in the second and third directions for transferring the magazine 72 at each of the carrying mechanisms 71 of the receiving device 70. The second pusher 262 is configured to be displaced in the first direction, and the measuring electronic component on the second loading area 29 is pushed into the empty magazine 72 on the second moving device 261 for pick-and-place operation. The mechanism 27 is provided with at least one pick-and-placer 271 for the second and third directions for transferring between the temporary area 24 of each transfer unit and the first and second loading areas 28 and 29 to be tested/ Complete the electronic components.

Referring to FIG. 13 , the conveying device 20 controls the first transfer device 251 of the first transfer mechanism 25 to perform second and third displacements to take out the electronic component to be tested at the bearing mechanism 61 of the feeding device 60. After the first directional shifter 252 is controlled to perform the first direction displacement, the electronic component 50 to be tested in the magazine 62 is pushed out by an appropriate distance, and then the first clamper 253 can be used for the first direction displacement clamping. The electronic component 50 to be tested is transferred to the first loading area 28, and the pick-and-place mechanism 27 controls the pick-and-placer 271 to be displaced in the second and third directions in the first loading area 28 to take out the electronic component 50 to be tested. Transfer to the temporary area 24 of the transfer unit; please refer to Figures 4 to 9, after the electronic component 50 to be tested is placed in the temporary area 24 of the transfer unit, the first transfer mechanism 21 can control the first The motor 212 and the first pressure cylinder 215 drive the first movable frame 214 and the first frame 216 to be displaced in the first and second directions respectively, so that the first frame 216 is displaced to the temporary area 24, and the first picking parts are respectively The electronic component 50 to be tested is taken out in the temporary area 24, and then placed in the test seat 42. The pressing mechanism 23 controls the pressure cylinder 232 to drive the pressing tool 233 to be pressed in the second direction to the first carrier 216. The first bearing plate 2161 is pressed against the two sides of the pressing tool 233 by the piston rod of the side pressure cylinder 234, and is assisted against the two sides of the first bearing plate 2161 so that the bottom of the first receiving frame 216 is The electronic component 50 to be tested is subjected to an average force and does contact the test socket 42 to perform a test operation, and the second material transfer mechanism 22 controls the second motor 222 and the second cylinder 225. The second movable frame 224 and the second receiving frame 226 are driven to be displaced in the first and second directions, so that the second picking member 227 on the second receiving frame 226 is connected to the temporary area 24 to take out the next electronic component 51 to be tested. After the electronic component 50 is tested, the pressure cylinder 232 of the compression mechanism 23 drives the pressure tool 233 to perform a second direction displacement reset, and the first material transfer mechanism 21 controls the first pickup members 217 on the first carrier 216 to be completed. The electronic component 50 is transferred out of the test seat 42 and carried to the temporary area 24, and the second transfer mechanism 22 controls the second carrier 226 to alternately move with the first frame 216 to make the second frame 226 Each of the second pick-up members 227 moves the next electronic component 51 to be tested into the test socket 42 by the temporary storage area 24 to perform the test operation; referring to FIG. 14, the transport device 20 can control the pick-and-place mechanism 27 The pick-and-place device 271 takes out the measured electronic component 50 in the temporary area 24 and carries it to the second loading area 29, and the second shifting device 261 of the second transfer mechanism 26 is used for the second and third direction displacement. And the empty magazine 72 is taken out at the bearing mechanism 71 of the upper layer of the receiving device 70, and the second ejector 262 is used for the first direction displacement. 50 accommodating the electronic component 72 facing the second feed zone 29 to push the magazine to move from the empty, when the magazine 72 filled with electronic components 50, a second shifter cassette 261 to line The magazine 72 is transferred to the lower carrier mechanism 71 for storage.

[study]

11‧‧‧First rack

12‧‧‧Second rack

13‧‧‧First reclaiming agency

131‧‧‧First Z-axis motor

132‧‧‧First pulley set

133‧‧‧First Z-Axial Screw Drive Set

134‧‧‧First bracket

1341‧‧‧First X-axis slide

135‧‧‧First L-shaped cantilever

1351‧‧‧First X-axis slide

1352‧‧‧First pickup

1353‧‧‧First Z-axis slide

136‧‧‧First X-axis motor

137‧‧‧First X-Axial Screw Drive Set

138‧‧‧First carriage

1381‧‧‧First Z-axis slide

14‧‧‧Second reclaiming agency

141‧‧‧Second Z-axis motor

142‧‧‧Second pulley set

143‧‧‧Second Z-axis screw drive set

144‧‧‧second bracket

1441‧‧‧Second X axial slide

145‧‧‧Second L-shaped cantilever

1451‧‧‧Second X-axis slide

1452‧‧‧Second pickup

1453‧‧‧Second Z-axis slide

146‧‧‧Second X-axis motor

147‧‧‧Second X-axis screw drive set

148‧‧‧Second carriage

1481‧‧‧Second Z-axis slide

15‧‧‧Electronic components

16‧‧‧ test seat

〔this invention〕

20‧‧‧Conveyor

21‧‧‧First Transfer Mechanism

211‧‧‧First rack

2111‧‧‧First slide rail

212‧‧‧First motor

213‧‧‧First pulley set

214‧‧‧First movable frame

2141‧‧‧First slide

2142‧‧‧Second slide

215‧‧‧First pressure cylinder

216‧‧‧First Shelf

2161‧‧‧First bearing plate

2162‧‧‧Second slide

217‧‧‧First pickup

22‧‧‧Second transfer mechanism

221‧‧‧ second rack

2211‧‧‧ third slide

222‧‧‧second motor

223‧‧‧Second pulley set

224‧‧‧Second movable frame

2241‧‧‧ Third slide

2242‧‧‧fourth rail

225‧‧‧Second pressure cylinder

226‧‧‧Second carrier

2261‧‧‧Second bearing plate

2262‧‧‧4th slide

227‧‧‧Second pickup

23‧‧‧掣掣机构

231‧‧‧ Fixing frame

232‧‧‧pressure cylinder

233‧‧‧

234‧‧‧ lateral pressure cylinder

24‧‧‧ temporary area

25‧‧‧First transfer mechanism

251‧‧‧First mobile device

252‧‧‧First pusher

253‧‧‧First clamp

26‧‧‧Second transfer mechanism

261‧‧‧Second mobile device

262‧‧‧Second pusher

27‧‧‧ pick-and-place mechanism

28‧‧‧First loading area

29‧‧‧Second storage area

30‧‧‧ machine

40‧‧‧Testing device

41‧‧‧Test circuit board

42‧‧‧ test seat

43‧‧‧ Vehicles

44‧‧‧ seat

45‧‧‧ Controller

46‧‧‧pressure cylinder

50, 51‧‧‧ Electronic components

60‧‧‧Feeding device

61‧‧‧Loading mechanism

611, 612‧‧‧ side panels

613‧‧‧ Locator

62‧‧‧materials

70‧‧‧Receiving device

71‧‧‧Loading mechanism

711, 712‧‧‧ side panels

713‧‧‧ Locator

72‧‧‧materials

Fig. 1 is a schematic view of a conventional Taiwan invention No. I233997.

Fig. 2 is an external view of the conveying device of the present invention.

Figure 3: plan view of the delivery device of the present invention.

Figure 4: Top view of the use of the first transfer mechanism.

Figure 5: Side view of the use of the first transfer mechanism.

Figure 6: Top view of the use of the first and second transfer mechanisms and the compression mechanism (1).

Figure 7: Side view of the use of the first and second transfer mechanisms and the compression mechanism (1).

Figure 8: Top view of the use of the first and second transfer mechanisms and the compression mechanism (2).

Figure 9: Side view of the use of the first and second transfer mechanisms and the compression mechanism (2).

Figure 10: Appearance diagram of the transport device of the present invention applied to a test sorter.

Figure 11: Top view of the transport device of the present invention applied to a test sorter.

Figure 12: Appearance of the test device of the present invention.

Figure 13: Schematic diagram of the use of the test sorter of the present invention (1).

Figure 14: Schematic diagram of the use of the test sorter of the present invention (2).

20‧‧‧Conveyor

21‧‧‧First Transfer Mechanism

211‧‧‧First rack

2111‧‧‧First slide rail

212‧‧‧First motor

213‧‧‧First pulley set

214‧‧‧First movable frame

2141‧‧‧First slide

2142‧‧‧Second slide

215‧‧‧First pressure cylinder

216‧‧‧First Shelf

2161‧‧‧First bearing plate

2162‧‧‧Second slide

217‧‧‧First pickup

22‧‧‧Second transfer mechanism

221‧‧‧ second rack

222‧‧‧second motor

223‧‧‧Second pulley set

224‧‧‧Second movable frame

2242‧‧‧fourth rail

225‧‧‧Second pressure cylinder

226‧‧‧Second carrier

2261‧‧‧Second bearing plate

2262‧‧‧4th slide

23‧‧‧掣掣机构

231‧‧‧ Fixing frame

232‧‧‧pressure cylinder

233‧‧‧

234‧‧‧ lateral pressure cylinder

Claims (9)

An electronic component conveying device is provided with at least one transfer unit that can be transferred to the electronic component, and the transfer unit comprises: at least one moving mechanism: at least one moving material driven by the driving source The feeder is provided with a carrier having a pickup member at the bottom, and the pickup member is used for picking up the transfer electronic component; the compression mechanism is located above the material transfer mechanism and is provided with at least one pressure driven by the power source. The pressure tool is pressed against the carrier of the material transfer mechanism to provide the pressure required for the electronic component to perform the pressure measurement operation. The electronic component conveying device of claim 1, wherein the driving source of the moving mechanism is provided with at least one driver for driving the shifter to be displaced in at least one direction. The electronic component conveying device according to claim 2, wherein the loading mechanism is provided with a frame, and a driving source having a first driver and a second driver is disposed on a side of the frame, the first driver The movable frame capable of receiving the second drive is displaced in the first direction, and the second drive drives the carrier to be displaced in the second direction. The electronic component conveying device of claim 1, wherein the carrier of the material transfer mechanism is provided with at least one pressure receiving plate with a picking member at the bottom for pressing by the pressing device of the pressing mechanism. The electronic component conveying device according to claim 1, further comprising a transfer unit having a secondary pressure structure in which the electronic component is more evenly pressed in the material transfer mechanism or the compression mechanism. The electronic component conveying device according to claim 5, wherein the auxiliary pressure structure is provided with at least one pressure cylinder on the side of the power source of the compression mechanism for assisting pressing against the circumferential side of the carrier. A testing device for applying an electronic component conveying device, comprising: a machine; a feeding device, configured on the machine, for accommodating at least one electronic component to be tested a receiving device disposed on the machine for accommodating at least one completed electronic component; a testing device disposed on the machine and having at least one test circuit board for testing Electronic component; the electronic component conveying device according to claim 1 of the patent application, which is arranged on the machine platform for transferring electronic components; and the central control device is used for controlling and integrating the operations of the devices to perform automation operations. . The test device for applying the electronic component conveying device according to claim 7, wherein the testing device is provided with a rotatably oscillating bearing for supporting the test circuit board with the test socket, the side of the bearing seat The controller is provided with a controller for controlling the state of use of the seat. The test device for applying an electronic component conveying device according to the seventh aspect of the invention, wherein the feeding device or the receiving device is provided with at least one bearing mechanism capable of receiving the magazine, the carrier mechanism having at least one The side plate of the displacement actuation.