TWI324257B - Alignable carrying device for use in electronic element - Google Patents

Description

IX. Description of the invention: [Technical field to which the invention pertains] The present invention particularly provides an electronic component displacing person that can correct the alignment of the electronic component to be tested after the accommodating [Previous technology] In the case of the test operation, in the case of the sealing and measuring operation, the electronic components of the current and the multiple-connected micro-contacts are placed in the lazy joint development, so the small body :=Try::?Electronic element; In the heart, there are J death and 〇5 on both sides of the test bench. It ==£== 螺二=3 and = on the slide 2 4 2, 3 4 2 on the slide 2 4, 32: and on the other:; == work 3 = to the screw 22, = = === = 351 (4) f placed on the longitudinal slide of the sliders 24, 34

S 5 has - lateral, π in the 'the traverse structure and the top surface of the reclaimer 2 5, 3 5 is set to the slide rails 2 β1, ^ 2, 3 5 2 to slide on a bracket 2 6 , 3 6 across the other side is provided with 3 61, and the lifting structure is respectively set in the brackets 2 6 , 3 δ; in the machine = two rails g, - screw sleeves 2 6 3, 3 6 3, on the 'longitudinal The screw; 3 7 and the longitudinal screw 2 8 , 3 8 drive the motor 29 , 39 of the traverse structure, and when the sliding parts 2 4, / 3, 3 3 drive the transverse screw 2 2, 3 2, that is, drive 3 5 The lateral slides of the lateral direction 2 4 2, 3 4 2 and the reclaimer 2 5, and the bracket 2 6% 5 5 2, 3 5 2 'the lateral sliding of the rack 2 1 , 3 1 shift, and When each liter 6 JQ 3 6 1 is in the X direction reciprocating position, the longitudinal sliding rods 28, 38 2 5, 3 2 longitudinal sliding seats 2 6 2, 2 6 2 and _ 3 π and sliding 侔 9 ° π are driven. , 3 5 1, longitudinal slides on the frame 2 7 , ^ 4, 3 4 longitudinal slides 2 4 3, 3 4 3 before z square 6 1 〇, [ί, ϊί 2 4 mechanism 5 0 system respectively For testing: The carrier Κi has a carrier structure for testing in the test bench 10, and loading ^ = = : and placing the carrier - the IC to be tested, Mechanism 4: Load and reverse:: When the two places take the I c to the side of the test bench i ,, the second take the X-direction displacement, so that the reclaimer 3 5 is located at the 乍 1 C, when the first A department 2. It! 〇; check ^3\4 upper suction device 2 5 lateral displacement to the discharge mechanism 5 〇 load; Guang Bi ^, that is to drive the reclaimed material 2 5 drop the IC placed on the stage 5 ^ send ^ =, ^ Let the picker 3 5 of the device structure 30 act as a χ-ζ displacement, which will take:

6 S

The test IC is placed in the test bench for the test operation. When the second take S c for the test, the first take-up mechanism 2 取 the reclaimer 2 5 is the reverse two: the 4 〇 on the stage 4 1 Adsorption-test 1 C is placed in the test bench i 进行 to carry out the second formula and raise the 2 0, then the 1 C 3 待 to be tested can be quickly carried in order. c: into the first and second reclaiming mechanism 2 〇 , qr / one, material mechanism 2 Q, 3 cooker retractor 2 5, station 1 0 'in the I, X - Z two axial displacement of the 1 C placed in the test ΐ For the small volume of the electronic element can not make effective electrical contact, g method is applied to the test operation of the H electronic component. In addition, since the retractor measures Vinp^#+, the surface can only be adjusted for X-axis displacement, so Ic and edit, 槪w, with its phase:: ϊ 趋势 ' 遂 将 电子 电子 电子 电子 电子 电子 电子 电子 电子 电子The placement of the transfer device by the installer is accurate, which is the design principle of the invention. 〃 'In order to achieve effective improvement of the test article [invention content] ^ The main purpose of the invention is to provide a calibratable 'which includes a test station, located at the test station - side loading vehicle, the second side of the test station Material and the first receiver and the second transfer pick-and-place device, load; the material is to be tested to be tested for the first ___ a supply vehicle to be placed in the test station for testing operation, and completed Test;, take the state to absorb the transfer m, the second to receive the signal to the central control to: After the comparison operation, command the first and second transfer pickers to position to accurately transfer the electronic components to test In addition, g achieves the purpose of effectively improving the quality of detection. Example of carving, clear purpose = supply - correctable alignment of electronic components

Si ιΐΐΐϋΐ's lifting system can be used for lifting and _ movement, = carrier can be made on the χ'γ plane for w two-axis and θ input = 丨 杈 杈 positive and then ζ axial lifting displacement, the electronic components are accurate The transfer is placed in the test station for testing. Trenches [Implementation] It is expected that the review committee will have a deeper understanding of the invention, and that it will be followed by a dispute and a good example, and with the following description: Ship ί Figure 4 'The invention is configured The duty division (4) includes the feeding mechanism 6 〇, the input conveying mechanism 70, the working area 80, the 丄 mechanism 9 ◦, and the receiving mechanism 1. . The input end transport mechanism 7 0 system = the supply mechanism 6 The electronic components to be detected are respectively transported to one of the dragon 8 、, the second supply carrier 81, 8 2, and the working area 80 First, the second receiving ϋϊ8, 8 4 on the finished electronic components, according to the test results from the output end of the transport structure 9 〇 transport to the receiving mechanism 1 〇〇 sorting. Please refer to FIGS. 5 and 6 , the working area 80 of the present invention includes a test station 8 5 , a first supply carrier 8 1 and a first receiving carrier 8 3 located at the side of the f* station 8 5 . , the second feeding carrier 8 2 and the second receiving carrier 8 4 on the other side of the test station 8 5, a transfer pick-and-place device 8 6 and a second transfer pick-and-place device 8 7; first and second The feeding carriers 81, 8 2 are for holding the electronic components to be inspected, and the first and second receiving carriers 83, 8 are for carrying out the tested electronic components, and the first and second feeding carriers 81 , 8 2 and the first and second receiving carriers 8 3, 8 4 are fixed in a fixed manner to the relative test 10 Δ gas Δ:) f off 2 ' for the first and second transfer pickers 8 6 , 8 7 and the wheel in the moving wheel to send the Lin to supply and receive the work, or in the way of their respective ΐ ^ u, positioned relative to the relevant position of the test station 8 5, ̄ ̄ ̄================= The image capturing device 8 of the controller is provided with an image picker 'to provide the first and second transfer pickers f6 8 7 to transfer the electronic components to the image capturing device 8 8 to take images, and the first and second

The H87 series is placed in the frame of the -8 and 871 sets of the slide rails, respectively, and can be divided into the sliding movement of the 轴向-axis (χ-γ). The first and the kidney rails are placed at 6, 8 7 The lifting rod 8 6 2, 8 7 2 can be lifted and rotated in the head 16 LU 1隹's head end _ set to set μq 71 lifting cup 8 6 2, 8 7 2 to drive the head mi jl Compensation correction for χ-γ two-axis and θ angle on the χ-γ plane, i-line measurement shifts the electronic components accurately to the test station 8 5

Please refer to Figure 1 for the purple enamel. The electronic component of the present invention performs the test on the Dragon 8 Q; 2, the second transfer pick and place 11 8 7 take the head 8 7 3 mixed with the test station 8 5 version ίΐϊΤί The component 1 1◦ performs the test for *, and the first-loader pick-and-placer 8 6 = the master 8 6 3 is located at the first - the fiber supplying device 8 is ready to take the electron 11 to be tested; Referring to FIG. 8, after the electronic component 1 1 ◦ is tested, the 7th flute, the pick-up unit 8 7 of the pick-and-placer 8 7 places the finished electronic component 110 on the receiving carrier 8 4 to The output mechanism for the output end is placed in accordance with the result of the test, and the first transfer device picks up and removes the electronic component 111 to be tested and transfers it to the image capturing device 88. Material: After setting 8 8 to take the electronic component 1 1 1 image, the image signal is transmitted to the center = profit, and the deviation is calculated by the central controller, and then the 9 1 - transfer pick and place The device 8 6 compensates for the position or angle. Referring to Figure 9 and Figure 1324257, after the compensation of the position or angle of the 8 6 is corrected, the sub-assembly 11i is accurately placed on the test station 85, and the pressing is performed on the electronic component 1 1 1 to perform the detection. Homework, at this time the second (four) defeat ^ :?-ίϊίΞ 8 7 3 will complete the measurement of the electronic components 1 1 0 complete the placement 2 ίί with 8 2 'because the input end transport mechanism has been to be ^ ii tii second offer The material carrier 8 2 is so that the second transfer device 8 7 3 can be used to mount the electronic component 1 1 2 to be tested on the second supply carrier 8 2; see Figure 1 for After the electric component is tested, the first transfer picker 8 6 is placed to the first receiving receiver 8 3 for rounding = to the age of the job, and the second shift is 8: ΐ The head 8 7 3 picks up the electronic component 112 and transfers it to the stupid one. At the 8th position, the image is taken. The image is taken by the electronic component 112 and then transferred to the central controller. Comparison of the central controllers, * ϋ ϋ 第 第 Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ Ϊ 8 8 8 8 8 8 8 8 8 = head = the electronic component 112 is placed in the pressure-measuring pressure-corresponding electronic component 112 to perform the detecting operation, and at this time, the first loading and unloading of the semiconductor device 8 6 6 will complete the measured electronic component *1 * After being placed, it will be moved in parallel to the first feeding carrier 81, because the wheeled end =, the electronic component 1 13 is transported to the first feeding carrier 8 1 , and the first feeding carrier The electronic component is transferred and picked up by the first component 113 ' and the second transfer carrier 8 6 and the second transfer carrier are alternately rotated by the two sides of the test station 8 5 . The first transfer pick-and-place device 8 6 and the second transfer load of the invention transfer and transfer the electronic component to the image capturing device to take the image θ angle f and calculate the deviation amount thereof. Or the correction of the corners of the 贝 贝 ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” ” The electronic components are placed above to improve the quality of the work. [Simple description of the drawing] Fig. 1 is a schematic diagram of the configuration of the patent of "1C detecting device (2)" of Taiwan Patent Application No. 93110783. Fig. 2 is a schematic diagram of the first reclaiming mechanism of the patent of "1C detecting device (2)" of Taiwan Patent Application No. 93110783. Fig. 3 is a schematic diagram of the second reclaiming mechanism of the patent of "1C detecting device (2)" of Taiwan Patent Application No. 93110783.

Figure 4: Schematic diagram of the configuration of the present invention configured on a test sorter. Figure 5: Architecture diagram of the present invention. Figure 6 is a schematic view of the transfer handler of the present invention. Figure 7: Schematic diagram of the action of the transfer of the present invention (1). Figure 8: Schematic diagram of the action of the transfer of the present invention (2). Figure 9: Schematic diagram of the action of the transfer of the present invention (3). Figure 10: Schematic diagram of the action of the transfer of the present invention (4). Figure 11: Schematic diagram of the action of the transfer of the present invention (5). Fig. 12 is a schematic view showing the test operation of the transfer pick-and-place device of the present invention. [Main component symbol description] Part of the formula: 10: Test bench 2 3 : Motor 2 4 3 : Longitudinal slide 2 5 3 : Lower presser head 2 6 3 : Screw sleeve 2 0 : First reclaim mechanism 21 : Horizontal slide 2 2 : Transverse screw 2 4 : Slide 2 41 : Screw sleeve 2 4 2 : Lateral slide 2 5 : Reclaimer 2 51 : Longitudinal slide 2 5 2 : Lateral slide 2 6 : Bracket 2 61: Horizontal slide 2 6 2 : Longitudinal slide 1324257

2 7: Longitudinal slide rail 2 8 : Longitudinal screw 3 0 : Second take-up mechanism 31 : Horizontal slide rail 3 4 : Slider 3 41 : Screw sleeve 3 5 : Reclaimer 3 51 : Longitudinal slide rail 3 6 : Bracket 3 61 : transverse rail 3 7 : longitudinal slip 4 0 : feeding mechanism 5 0 : discharge mechanism part of the invention: 3 2 · transverse screw 3 4 2 : transverse slide 3 5 2 : transverse slide 3 6 2: longitudinal slide 3 8 : longitudinal screw 4 1 : stage 5 1 : stage 2 9 : motor 3 3 : motor 3 4 3 : longitudinal slide 3 5 3 : lower press head 3 6 3 : screw sleeve 3 9 : Motor 4 2 : Take-up head 5 2 : Take-up head

6 0 : Feeding mechanism 80 : Working area 81 : First feeding carrier 8 3 : First receiving carrier 8 5 . Test station 8 6 : First transfer picker 8 61 : Slide group 8 6 3 : take-up head 8 7 . second transfer pick-and-place device 8 71 : slide rail group 8 7 3 : take-up head 8 8 : take-up image set 9 0 : output end transport mechanism 1 收: receiving mechanism 110: electronic component 112: electronic component 7 0 · input end wheel adaptive mechanism 8 2 . second supply carrier summer 8 4 : second receiving carrier 8 6 2 : lifting bar 8 7 2 : lifting bar 111: electronic component 113: Electronic components

:_Q 12

Claims (1)

Scope of application: __ • ΐϊίϊΐίίίί ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ ̄ Transfer the pick and place device to absorb the transfer electronic components ', ^ system for the shifting of the remaining position of the remaining device ==: 5iTrrr is equipped with = command to transfer the fine central fiber after the conversion operation, •, = The tamperable device according to the first aspect of the invention, wherein the transferable electronic component is transferred and the image capturing device and the receiving carrier are disposed. Alignment of the alignable alignment electronic component described in item 1 - the image capture device is a ccd imager. , can be aligned with the electronic component transfer device, and is the main. , a test station: for the electronic components to be tested to move;:, with 3 sub-pieces of test operations; Hu '仃 1: sub- 7L first supply charm · · miscellaneous station - side, can be placed To be tested as a mine ~ ^ type supply vehicle, second supply vehicle: is located in the test station, 'electronic equipment can be placed in the test to be tested, the first receiving load With: r first; second receiving vehicle: is located in the second supply == two = piece to receive the first transfer to take the correction material to complete the test operation of the electronic element ^ war pick and place. fine miscellaneous set rack placed The ^ X can be slipped and tilted on the top of the station and the touch correction is made on the χ'γ flat ^, called the remaining sub-component shifting pick-and-place device: the slide rail assembly is placed on the test station on the m-axis Sliding actuation and position compensation on the t + surface for the χ-γ two-axis position compensation protection image device · · II, ^ transfer 1 sub-components to perform operations; 7 , ° fish ^ first, one for Between the material carrier and the test station, and according to the patent scope of the ten central controller. 8. According to the application of the scope of the patent application, wherein the child is the right electronic component shifting rod, and the θ angle compensation correction benefit system is provided with a rotatable motion electronic component. Move 1 11 down the rod, and the compensation corrector that can be used as (1) is equipped with a rotatable movement. The calibratable alignment of the electronic components described in item 6 is provided with a take-up head: The material carrier, the lower test station, the image capturing device, and the second embodiment of the invention, the movable component described in item 6 of the patent application scope U24257, March 5, 1999, the replacement page cutting device, wherein the second transfer The pick and place system is provided with a pick-up head, and the electronic components on the carrier can be transferred to the test station, the image taking device and the 13-electron electronic component to perform the test operation. The alignable alignment electronic component is carried by the carrier device 6, and the image capturing device is (10) an image capture device. Cow shift 15 ^ j