TW200925620A - Chip testing device - Google Patents
Chip testing device Download PDFInfo
- Publication number
- TW200925620A TW200925620A TW96146526A TW96146526A TW200925620A TW 200925620 A TW200925620 A TW 200925620A TW 96146526 A TW96146526 A TW 96146526A TW 96146526 A TW96146526 A TW 96146526A TW 200925620 A TW200925620 A TW 200925620A
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- probes
- wafer
- testing
- die
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 168
- 239000000523 sample Substances 0.000 claims abstract description 59
- 239000013078 crystal Substances 0.000 claims description 35
- 235000012431 wafers Nutrition 0.000 claims description 33
- 238000001179 sorption measurement Methods 0.000 claims description 14
- 238000003825 pressing Methods 0.000 claims description 9
- 238000005520 cutting process Methods 0.000 claims description 2
- 238000004519 manufacturing process Methods 0.000 description 8
- 238000004806 packaging method and process Methods 0.000 description 7
- 239000004065 semiconductor Substances 0.000 description 5
- 238000000034 method Methods 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 238000003908 quality control method Methods 0.000 description 3
- 238000013461 design Methods 0.000 description 2
- 238000011161 development Methods 0.000 description 2
- 239000002184 metal Substances 0.000 description 2
- 238000000354 decomposition reaction Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 230000002349 favourable effect Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 230000007774 longterm Effects 0.000 description 1
- 239000000463 material Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 238000012858 packaging process Methods 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000012545 processing Methods 0.000 description 1
- 238000009781 safety test method Methods 0.000 description 1
- 229940095676 wafer product Drugs 0.000 description 1
Landscapes
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96146526A TW200925620A (en) | 2007-12-06 | 2007-12-06 | Chip testing device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW96146526A TW200925620A (en) | 2007-12-06 | 2007-12-06 | Chip testing device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200925620A true TW200925620A (en) | 2009-06-16 |
| TWI344546B TWI344546B (enrdf_load_stackoverflow) | 2011-07-01 |
Family
ID=44729427
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW96146526A TW200925620A (en) | 2007-12-06 | 2007-12-06 | Chip testing device |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200925620A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI406353B (enrdf_load_stackoverflow) * | 2010-03-22 | 2013-08-21 | ||
| TWI560457B (enrdf_load_stackoverflow) * | 2014-10-24 | 2016-12-01 | Advantest Corp |
-
2007
- 2007-12-06 TW TW96146526A patent/TW200925620A/zh not_active IP Right Cessation
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI406353B (enrdf_load_stackoverflow) * | 2010-03-22 | 2013-08-21 | ||
| TWI560457B (enrdf_load_stackoverflow) * | 2014-10-24 | 2016-12-01 | Advantest Corp | |
| US9588142B2 (en) | 2014-10-24 | 2017-03-07 | Advantest Corporation | Electronic device handling apparatus and electronic device testing apparatus |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI344546B (enrdf_load_stackoverflow) | 2011-07-01 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |