KR200449174Y1 - 프로브카드 검사장치의 마더보드 고정부 - Google Patents
프로브카드 검사장치의 마더보드 고정부 Download PDFInfo
- Publication number
- KR200449174Y1 KR200449174Y1 KR2020070020642U KR20070020642U KR200449174Y1 KR 200449174 Y1 KR200449174 Y1 KR 200449174Y1 KR 2020070020642 U KR2020070020642 U KR 2020070020642U KR 20070020642 U KR20070020642 U KR 20070020642U KR 200449174 Y1 KR200449174 Y1 KR 200449174Y1
- Authority
- KR
- South Korea
- Prior art keywords
- probe card
- motherboard
- motherboard fixing
- base frame
- counterweight
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0491—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets for testing integrated circuits on wafers, e.g. wafer-level test cartridge
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/06—Measuring leads; Measuring probes
- G01R1/067—Measuring probes
- G01R1/073—Multiple probes
- G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/26—Testing of individual semiconductor devices
- G01R31/2601—Apparatus or methods therefor
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- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
Description
Claims (4)
- 메인프레임을 구비한 프로브 카드의 검사장치에 사용되는 마더보드 고정부에 있어서,상기 메인프레임의 일측에 힌지 결합 되는 마더보드 고정플레이트;상기 마더보드 고정플레이트와 축 연결되며, 내설 된 리드스크류에 의해 이동되는 이동블록을 구비한 베이스프레임;상기 베이스프레임의 이동블록에 고정되는 균형추; 및상기 베이스프레임의 일측에 결합 되어 상기 리드스크류를 회전시키는 구동모터를 포함하여 이루어지는 것을 특징으로 하는 프로브카드 검사장치의 마더보드 고정부.
- 제 1 항에 있어서,상기 베이스프레임의 일측에는 상기 구동모터의 회전 위치를 파악하는 리미트 센서가 설치된 것을 특징으로 하는 프로브카드 검사장치의 마더보드 고정부.
- 제 2 항에 있어서,상기 베이스프레임의 일측에는 균형추의 위치를 파악하는 홈센서가 설치된 것을 특징으로 하는 프로브카드 검사장치의 마더보드 고정부.
- 제 1 항 내지 제 3 항 중 어느 한 항에 있어서,상기 마더보드 고정플레이트의 일측에는 후크가 형성된 것을 특징으로 하는 프로브카드 검사장치의 마더보드 고정부.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2020070020642U KR200449174Y1 (ko) | 2007-12-24 | 2007-12-24 | 프로브카드 검사장치의 마더보드 고정부 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR2020070020642U KR200449174Y1 (ko) | 2007-12-24 | 2007-12-24 | 프로브카드 검사장치의 마더보드 고정부 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| KR20090006432U KR20090006432U (ko) | 2009-06-29 |
| KR200449174Y1 true KR200449174Y1 (ko) | 2010-06-22 |
Family
ID=41323165
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| KR2020070020642U Expired - Fee Related KR200449174Y1 (ko) | 2007-12-24 | 2007-12-24 | 프로브카드 검사장치의 마더보드 고정부 |
Country Status (1)
| Country | Link |
|---|---|
| KR (1) | KR200449174Y1 (ko) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102152154B (zh) * | 2011-05-03 | 2013-02-06 | 苏州工业园区高登威科技有限公司 | 具有初始位置判断功能的加工治具 |
| CN115265623A (zh) * | 2022-08-08 | 2022-11-01 | 上海泽丰半导体科技有限公司 | 一种存储针卡定位装置及定位系统 |
-
2007
- 2007-12-24 KR KR2020070020642U patent/KR200449174Y1/ko not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| KR20090006432U (ko) | 2009-06-29 |
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