TWI406353B - - Google Patents
Info
- Publication number
- TWI406353B TWI406353B TW99108342A TW99108342A TWI406353B TW I406353 B TWI406353 B TW I406353B TW 99108342 A TW99108342 A TW 99108342A TW 99108342 A TW99108342 A TW 99108342A TW I406353 B TWI406353 B TW I406353B
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- unit
- dies
- probe
- elevating unit
- Prior art date
Links
- 230000003028 elevating effect Effects 0.000 abstract 3
- 239000000523 sample Substances 0.000 abstract 2
- 230000000694 effects Effects 0.000 abstract 1
- 238000000034 method Methods 0.000 abstract 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW99108342A TW201133677A (en) | 2010-03-22 | 2010-03-22 | Chip test device |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW99108342A TW201133677A (en) | 2010-03-22 | 2010-03-22 | Chip test device |
Publications (2)
Publication Number | Publication Date |
---|---|
TW201133677A TW201133677A (en) | 2011-10-01 |
TWI406353B true TWI406353B (enrdf_load_stackoverflow) | 2013-08-21 |
Family
ID=46751284
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW99108342A TW201133677A (en) | 2010-03-22 | 2010-03-22 | Chip test device |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW201133677A (enrdf_load_stackoverflow) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US9588142B2 (en) | 2014-10-24 | 2017-03-07 | Advantest Corporation | Electronic device handling apparatus and electronic device testing apparatus |
TWI681495B (zh) * | 2018-08-15 | 2020-01-01 | 致茂電子股份有限公司 | 晶片旋轉暫置台 |
Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4644269A (en) * | 1983-05-31 | 1987-02-17 | Pylon Company | Test fixture having full surface contact hinged lid |
TW501215B (en) * | 2000-10-18 | 2002-09-01 | Scs Hightech Inc | Method and apparatus for multiple known good die processing |
TW200925620A (en) * | 2007-12-06 | 2009-06-16 | Global Master Tech Co Ltd | Chip testing device |
TW200949968A (en) * | 2008-05-16 | 2009-12-01 | Hon Tech Inc | Testing device for use in testing a chip |
-
2010
- 2010-03-22 TW TW99108342A patent/TW201133677A/zh not_active IP Right Cessation
Patent Citations (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4644269A (en) * | 1983-05-31 | 1987-02-17 | Pylon Company | Test fixture having full surface contact hinged lid |
TW501215B (en) * | 2000-10-18 | 2002-09-01 | Scs Hightech Inc | Method and apparatus for multiple known good die processing |
TW200925620A (en) * | 2007-12-06 | 2009-06-16 | Global Master Tech Co Ltd | Chip testing device |
TW200949968A (en) * | 2008-05-16 | 2009-12-01 | Hon Tech Inc | Testing device for use in testing a chip |
Also Published As
Publication number | Publication date |
---|---|
TW201133677A (en) | 2011-10-01 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |