TWI406353B - - Google Patents

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Publication number
TWI406353B
TWI406353B TW99108342A TW99108342A TWI406353B TW I406353 B TWI406353 B TW I406353B TW 99108342 A TW99108342 A TW 99108342A TW 99108342 A TW99108342 A TW 99108342A TW I406353 B TWI406353 B TW I406353B
Authority
TW
Taiwan
Prior art keywords
test
unit
dies
probe
elevating unit
Prior art date
Application number
TW99108342A
Other languages
English (en)
Chinese (zh)
Other versions
TW201133677A (en
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to TW99108342A priority Critical patent/TW201133677A/zh
Publication of TW201133677A publication Critical patent/TW201133677A/zh
Application granted granted Critical
Publication of TWI406353B publication Critical patent/TWI406353B/zh

Links

Landscapes

  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
TW99108342A 2010-03-22 2010-03-22 Chip test device TW201133677A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW99108342A TW201133677A (en) 2010-03-22 2010-03-22 Chip test device

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW99108342A TW201133677A (en) 2010-03-22 2010-03-22 Chip test device

Publications (2)

Publication Number Publication Date
TW201133677A TW201133677A (en) 2011-10-01
TWI406353B true TWI406353B (enrdf_load_stackoverflow) 2013-08-21

Family

ID=46751284

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99108342A TW201133677A (en) 2010-03-22 2010-03-22 Chip test device

Country Status (1)

Country Link
TW (1) TW201133677A (enrdf_load_stackoverflow)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9588142B2 (en) * 2014-10-24 2017-03-07 Advantest Corporation Electronic device handling apparatus and electronic device testing apparatus
TWI681495B (zh) * 2018-08-15 2020-01-01 致茂電子股份有限公司 晶片旋轉暫置台

Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4644269A (en) * 1983-05-31 1987-02-17 Pylon Company Test fixture having full surface contact hinged lid
TW501215B (en) * 2000-10-18 2002-09-01 Scs Hightech Inc Method and apparatus for multiple known good die processing
TW200925620A (en) * 2007-12-06 2009-06-16 Global Master Tech Co Ltd Chip testing device
TW200949968A (en) * 2008-05-16 2009-12-01 Hon Tech Inc Testing device for use in testing a chip

Patent Citations (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4644269A (en) * 1983-05-31 1987-02-17 Pylon Company Test fixture having full surface contact hinged lid
TW501215B (en) * 2000-10-18 2002-09-01 Scs Hightech Inc Method and apparatus for multiple known good die processing
TW200925620A (en) * 2007-12-06 2009-06-16 Global Master Tech Co Ltd Chip testing device
TW200949968A (en) * 2008-05-16 2009-12-01 Hon Tech Inc Testing device for use in testing a chip

Also Published As

Publication number Publication date
TW201133677A (en) 2011-10-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees