TW201133677A - Chip test device - Google Patents
Chip test device Download PDFInfo
- Publication number
- TW201133677A TW201133677A TW99108342A TW99108342A TW201133677A TW 201133677 A TW201133677 A TW 201133677A TW 99108342 A TW99108342 A TW 99108342A TW 99108342 A TW99108342 A TW 99108342A TW 201133677 A TW201133677 A TW 201133677A
- Authority
- TW
- Taiwan
- Prior art keywords
- test
- seat
- detecting
- wafer
- testing device
- Prior art date
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 88
- 239000013078 crystal Substances 0.000 claims description 23
- 238000001514 detection method Methods 0.000 claims description 7
- 239000000463 material Substances 0.000 claims 2
- 206010036790 Productive cough Diseases 0.000 claims 1
- 210000003298 dental enamel Anatomy 0.000 claims 1
- 210000003802 sputum Anatomy 0.000 claims 1
- 208000024794 sputum Diseases 0.000 claims 1
- 239000000523 sample Substances 0.000 abstract description 7
- 230000000694 effects Effects 0.000 abstract description 5
- 238000000034 method Methods 0.000 abstract description 5
- 230000003028 elevating effect Effects 0.000 abstract 3
- 238000004519 manufacturing process Methods 0.000 description 5
- 239000004065 semiconductor Substances 0.000 description 4
- 238000012858 packaging process Methods 0.000 description 3
- 238000006073 displacement reaction Methods 0.000 description 2
- 238000004806 packaging method and process Methods 0.000 description 2
- 238000013459 approach Methods 0.000 description 1
- 238000011109 contamination Methods 0.000 description 1
- 230000000994 depressogenic effect Effects 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 230000007613 environmental effect Effects 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000002245 particle Substances 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW99108342A TW201133677A (en) | 2010-03-22 | 2010-03-22 | Chip test device |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW99108342A TW201133677A (en) | 2010-03-22 | 2010-03-22 | Chip test device |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW201133677A true TW201133677A (en) | 2011-10-01 |
| TWI406353B TWI406353B (enrdf_load_stackoverflow) | 2013-08-21 |
Family
ID=46751284
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW99108342A TW201133677A (en) | 2010-03-22 | 2010-03-22 | Chip test device |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW201133677A (enrdf_load_stackoverflow) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI560457B (enrdf_load_stackoverflow) * | 2014-10-24 | 2016-12-01 | Advantest Corp | |
| TWI681495B (zh) * | 2018-08-15 | 2020-01-01 | 致茂電子股份有限公司 | 晶片旋轉暫置台 |
Family Cites Families (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4644269A (en) * | 1983-05-31 | 1987-02-17 | Pylon Company | Test fixture having full surface contact hinged lid |
| TW501215B (en) * | 2000-10-18 | 2002-09-01 | Scs Hightech Inc | Method and apparatus for multiple known good die processing |
| TW200925620A (en) * | 2007-12-06 | 2009-06-16 | Global Master Tech Co Ltd | Chip testing device |
| TWI375291B (en) * | 2008-05-16 | 2012-10-21 | Hon Tech Inc | Testing device for use in testing a chip |
-
2010
- 2010-03-22 TW TW99108342A patent/TW201133677A/zh not_active IP Right Cessation
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI560457B (enrdf_load_stackoverflow) * | 2014-10-24 | 2016-12-01 | Advantest Corp | |
| US9588142B2 (en) | 2014-10-24 | 2017-03-07 | Advantest Corporation | Electronic device handling apparatus and electronic device testing apparatus |
| TWI681495B (zh) * | 2018-08-15 | 2020-01-01 | 致茂電子股份有限公司 | 晶片旋轉暫置台 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI406353B (enrdf_load_stackoverflow) | 2013-08-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |