TW200825432A - Electronic component testing equipment - Google Patents

Electronic component testing equipment Download PDF

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Publication number
TW200825432A
TW200825432A TW096139625A TW96139625A TW200825432A TW 200825432 A TW200825432 A TW 200825432A TW 096139625 A TW096139625 A TW 096139625A TW 96139625 A TW96139625 A TW 96139625A TW 200825432 A TW200825432 A TW 200825432A
Authority
TW
Taiwan
Prior art keywords
test
electronic component
bracket
tst
plate
Prior art date
Application number
TW096139625A
Other languages
English (en)
Chinese (zh)
Other versions
TWI349108B (ja
Inventor
Yoshiyuki Masuo
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200825432A publication Critical patent/TW200825432A/zh
Application granted granted Critical
Publication of TWI349108B publication Critical patent/TWI349108B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851—Testing of integrated circuits [IC]
    • G01R31/2893—Handling, conveying or loading, e.g. belts, boats, vacuum fingers

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
TW096139625A 2006-12-07 2007-10-23 Electronic component testing equipment TW200825432A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
PCT/JP2006/324482 WO2008068869A1 (ja) 2006-12-07 2006-12-07 電子部品試験装置

Publications (2)

Publication Number Publication Date
TW200825432A true TW200825432A (en) 2008-06-16
TWI349108B TWI349108B (ja) 2011-09-21

Family

ID=39491788

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096139625A TW200825432A (en) 2006-12-07 2007-10-23 Electronic component testing equipment

Country Status (2)

Country Link
TW (1) TW200825432A (ja)
WO (1) WO2008068869A1 (ja)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN114123008B (zh) * 2021-12-09 2024-05-17 国网宁夏电力有限公司银川供电公司 10kV中置开关柜通用型智能验电小车

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH11183567A (ja) * 1997-12-24 1999-07-09 Ando Electric Co Ltd キャリア搬送機構
JP2001235512A (ja) * 2000-06-13 2001-08-31 Advantest Corp 電子部品試験装置

Also Published As

Publication number Publication date
TWI349108B (ja) 2011-09-21
WO2008068869A1 (ja) 2008-06-12

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