TW200813436A - High frequency cantilever probe card - Google Patents
High frequency cantilever probe card Download PDFInfo
- Publication number
- TW200813436A TW200813436A TW95133950A TW95133950A TW200813436A TW 200813436 A TW200813436 A TW 200813436A TW 95133950 A TW95133950 A TW 95133950A TW 95133950 A TW95133950 A TW 95133950A TW 200813436 A TW200813436 A TW 200813436A
- Authority
- TW
- Taiwan
- Prior art keywords
- probe
- grounding
- signal
- seat
- probes
- Prior art date
Links
- 239000000523 sample Substances 0.000 title claims abstract description 194
- 239000010410 layer Substances 0.000 claims description 23
- 230000005540 biological transmission Effects 0.000 claims description 18
- 239000002184 metal Substances 0.000 claims description 12
- 229910052751 metal Inorganic materials 0.000 claims description 12
- 239000007769 metal material Substances 0.000 claims description 10
- 210000000245 forearm Anatomy 0.000 claims description 9
- 238000006073 displacement reaction Methods 0.000 claims description 4
- 239000000463 material Substances 0.000 claims description 4
- 239000011241 protective layer Substances 0.000 claims description 4
- 241001136800 Anas acuta Species 0.000 claims description 2
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims description 2
- 239000010931 gold Substances 0.000 claims description 2
- 229910052737 gold Inorganic materials 0.000 claims description 2
- 241001409896 Hirundapus Species 0.000 claims 1
- 239000000725 suspension Substances 0.000 abstract 1
- 238000010586 diagram Methods 0.000 description 9
- 230000008054 signal transmission Effects 0.000 description 9
- 238000012360 testing method Methods 0.000 description 9
- 238000005259 measurement Methods 0.000 description 8
- 230000000694 effects Effects 0.000 description 7
- 235000012431 wafers Nutrition 0.000 description 7
- 230000003139 buffering effect Effects 0.000 description 4
- 238000006243 chemical reaction Methods 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 238000000034 method Methods 0.000 description 2
- 229910000679 solder Inorganic materials 0.000 description 2
- 241000251468 Actinopterygii Species 0.000 description 1
- 241000282376 Panthera tigris Species 0.000 description 1
- 239000011324 bead Substances 0.000 description 1
- 239000004020 conductor Substances 0.000 description 1
- 239000003989 dielectric material Substances 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95133950A TW200813436A (en) | 2006-09-13 | 2006-09-13 | High frequency cantilever probe card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95133950A TW200813436A (en) | 2006-09-13 | 2006-09-13 | High frequency cantilever probe card |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200813436A true TW200813436A (en) | 2008-03-16 |
| TWI303315B TWI303315B (https=) | 2008-11-21 |
Family
ID=44768313
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW95133950A TW200813436A (en) | 2006-09-13 | 2006-09-13 | High frequency cantilever probe card |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200813436A (https=) |
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI448708B (https=) * | 2012-02-02 | 2014-08-11 | ||
| TWI461698B (zh) * | 2010-09-30 | 2014-11-21 | Mpi Corp | Probe unit and its making method |
| CN111796153A (zh) * | 2020-06-29 | 2020-10-20 | 歌尔科技有限公司 | 一种天线射频测试装置 |
| TWI739592B (zh) * | 2020-09-09 | 2021-09-11 | 旺矽科技股份有限公司 | 探針組件 |
| TWI788970B (zh) * | 2020-10-14 | 2023-01-01 | 旺矽科技股份有限公司 | 整合不同電性測試之探針卡 |
| US12025637B2 (en) | 2020-10-14 | 2024-07-02 | Mpi Corporation | Probe card |
-
2006
- 2006-09-13 TW TW95133950A patent/TW200813436A/zh not_active IP Right Cessation
Cited By (9)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI461698B (zh) * | 2010-09-30 | 2014-11-21 | Mpi Corp | Probe unit and its making method |
| TWI448708B (https=) * | 2012-02-02 | 2014-08-11 | ||
| CN111796153A (zh) * | 2020-06-29 | 2020-10-20 | 歌尔科技有限公司 | 一种天线射频测试装置 |
| CN111796153B (zh) * | 2020-06-29 | 2023-10-17 | 歌尔科技有限公司 | 一种天线射频测试装置 |
| TWI739592B (zh) * | 2020-09-09 | 2021-09-11 | 旺矽科技股份有限公司 | 探針組件 |
| CN114236198A (zh) * | 2020-09-09 | 2022-03-25 | 旺矽科技股份有限公司 | 探针组件 |
| CN114236198B (zh) * | 2020-09-09 | 2024-04-02 | 旺矽科技股份有限公司 | 探针组件 |
| TWI788970B (zh) * | 2020-10-14 | 2023-01-01 | 旺矽科技股份有限公司 | 整合不同電性測試之探針卡 |
| US12025637B2 (en) | 2020-10-14 | 2024-07-02 | Mpi Corporation | Probe card |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI303315B (https=) | 2008-11-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |