TW200811444A - Vertical high frequency probe card - Google Patents
Vertical high frequency probe card Download PDFInfo
- Publication number
- TW200811444A TW200811444A TW95130518A TW95130518A TW200811444A TW 200811444 A TW200811444 A TW 200811444A TW 95130518 A TW95130518 A TW 95130518A TW 95130518 A TW95130518 A TW 95130518A TW 200811444 A TW200811444 A TW 200811444A
- Authority
- TW
- Taiwan
- Prior art keywords
- probe
- signal
- grounding
- probes
- lines
- Prior art date
Links
- 239000000523 sample Substances 0.000 title claims abstract description 153
- 230000008054 signal transmission Effects 0.000 claims description 24
- 229910000679 solder Inorganic materials 0.000 claims description 7
- 239000007769 metal material Substances 0.000 claims description 4
- 230000004308 accommodation Effects 0.000 claims 1
- 230000011664 signaling Effects 0.000 abstract 3
- 238000012360 testing method Methods 0.000 description 18
- 230000005540 biological transmission Effects 0.000 description 16
- 238000010586 diagram Methods 0.000 description 9
- 239000000463 material Substances 0.000 description 6
- 239000002184 metal Substances 0.000 description 6
- 230000000694 effects Effects 0.000 description 3
- 238000003780 insertion Methods 0.000 description 3
- 230000037431 insertion Effects 0.000 description 3
- 238000005259 measurement Methods 0.000 description 3
- 238000000034 method Methods 0.000 description 3
- 230000000295 complement effect Effects 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- 238000005516 engineering process Methods 0.000 description 2
- 239000011159 matrix material Substances 0.000 description 2
- 238000012545 processing Methods 0.000 description 2
- 241000282376 Panthera tigris Species 0.000 description 1
- 239000000919 ceramic Substances 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000004870 electrical engineering Methods 0.000 description 1
- 230000005611 electricity Effects 0.000 description 1
- 239000004744 fabric Substances 0.000 description 1
- 239000008267 milk Substances 0.000 description 1
- 210000004080 milk Anatomy 0.000 description 1
- 235000013336 milk Nutrition 0.000 description 1
- 239000012811 non-conductive material Substances 0.000 description 1
- NJPPVKZQTLUDBO-UHFFFAOYSA-N novaluron Chemical compound C1=C(Cl)C(OC(F)(F)C(OC(F)(F)F)F)=CC=C1NC(=O)NC(=O)C1=C(F)C=CC=C1F NJPPVKZQTLUDBO-UHFFFAOYSA-N 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 239000004065 semiconductor Substances 0.000 description 1
- 230000001568 sexual effect Effects 0.000 description 1
- 239000002023 wood Substances 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95130518A TW200811444A (en) | 2006-08-18 | 2006-08-18 | Vertical high frequency probe card |
| SG200702127-2A SG140520A1 (en) | 2006-08-18 | 2007-03-22 | Vertical type high frequency probe card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95130518A TW200811444A (en) | 2006-08-18 | 2006-08-18 | Vertical high frequency probe card |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200811444A true TW200811444A (en) | 2008-03-01 |
| TWI301543B TWI301543B (enExample) | 2008-10-01 |
Family
ID=39205053
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW95130518A TW200811444A (en) | 2006-08-18 | 2006-08-18 | Vertical high frequency probe card |
Country Status (2)
| Country | Link |
|---|---|
| SG (1) | SG140520A1 (enExample) |
| TW (1) | TW200811444A (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI385392B (zh) * | 2008-12-12 | 2013-02-11 | High-frequency vertical probe device and its application of high-speed test card | |
| CN110873815A (zh) * | 2018-08-29 | 2020-03-10 | 三星显示有限公司 | 探针卡和包括探针卡的测试装置 |
| CN111707850A (zh) * | 2019-03-18 | 2020-09-25 | 旺矽科技股份有限公司 | 探针装置 |
| CN112710878A (zh) * | 2019-10-24 | 2021-04-27 | 中华精测科技股份有限公司 | 可拆式高频测试装置及其垂直式探针头 |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI416121B (zh) * | 2009-11-04 | 2013-11-21 | Mjc Probe Inc | 探針卡 |
| TW201239365A (en) * | 2011-03-22 | 2012-10-01 | Mpi Corp | High frequency coupling signal adjustment manner and test device thereof |
-
2006
- 2006-08-18 TW TW95130518A patent/TW200811444A/zh not_active IP Right Cessation
-
2007
- 2007-03-22 SG SG200702127-2A patent/SG140520A1/en unknown
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI385392B (zh) * | 2008-12-12 | 2013-02-11 | High-frequency vertical probe device and its application of high-speed test card | |
| CN110873815A (zh) * | 2018-08-29 | 2020-03-10 | 三星显示有限公司 | 探针卡和包括探针卡的测试装置 |
| CN111707850A (zh) * | 2019-03-18 | 2020-09-25 | 旺矽科技股份有限公司 | 探针装置 |
| CN112710878A (zh) * | 2019-10-24 | 2021-04-27 | 中华精测科技股份有限公司 | 可拆式高频测试装置及其垂直式探针头 |
| CN112710878B (zh) * | 2019-10-24 | 2024-02-27 | 台湾中华精测科技股份有限公司 | 可拆式高频测试装置及其垂直式探针头 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI301543B (enExample) | 2008-10-01 |
| SG140520A1 (en) | 2008-03-28 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |