SG140520A1 - Vertical type high frequency probe card - Google Patents

Vertical type high frequency probe card

Info

Publication number
SG140520A1
SG140520A1 SG200702127-2A SG2007021272A SG140520A1 SG 140520 A1 SG140520 A1 SG 140520A1 SG 2007021272 A SG2007021272 A SG 2007021272A SG 140520 A1 SG140520 A1 SG 140520A1
Authority
SG
Singapore
Prior art keywords
grounding
probe
signal
circuits
probe card
Prior art date
Application number
SG200702127-2A
Other languages
English (en)
Inventor
Hsin-Hung Lin
Wei-Cheng Ku
Chien-Liang Chen
Shih-Cheng Wu
Ming-Chi Chen
Hendra Sudin
Original Assignee
Mjc Probe Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mjc Probe Inc filed Critical Mjc Probe Inc
Publication of SG140520A1 publication Critical patent/SG140520A1/en

Links

Landscapes

  • Measuring Leads Or Probes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
SG200702127-2A 2006-08-18 2007-03-22 Vertical type high frequency probe card SG140520A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW95130518A TW200811444A (en) 2006-08-18 2006-08-18 Vertical high frequency probe card

Publications (1)

Publication Number Publication Date
SG140520A1 true SG140520A1 (en) 2008-03-28

Family

ID=39205053

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200702127-2A SG140520A1 (en) 2006-08-18 2007-03-22 Vertical type high frequency probe card

Country Status (2)

Country Link
SG (1) SG140520A1 (enExample)
TW (1) TW200811444A (enExample)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI385392B (zh) * 2008-12-12 2013-02-11 High-frequency vertical probe device and its application of high-speed test card
TWI416121B (zh) * 2009-11-04 2013-11-21 Mjc Probe Inc 探針卡
TW201239365A (en) * 2011-03-22 2012-10-01 Mpi Corp High frequency coupling signal adjustment manner and test device thereof
KR102682284B1 (ko) * 2018-08-29 2024-07-10 삼성디스플레이 주식회사 프로브 카드 및 이를 포함하는 테스트 장치
TW202035995A (zh) * 2019-03-18 2020-10-01 旺矽科技股份有限公司 探針裝置
CN112710878B (zh) * 2019-10-24 2024-02-27 台湾中华精测科技股份有限公司 可拆式高频测试装置及其垂直式探针头

Also Published As

Publication number Publication date
TWI301543B (enExample) 2008-10-01
TW200811444A (en) 2008-03-01

Similar Documents

Publication Publication Date Title
SG140520A1 (en) Vertical type high frequency probe card
SG148104A1 (en) Probe card and method for fabricating the same
SG170718A1 (en) Probe card
TW200702674A (en) Apparatus, system and method for testing electronic elements
MY155882A (en) Electrically conductive pins for microcircuit tester
GB2484216A (en) Avionics chassis
WO2009011365A1 (ja) プローブカード
GB2488197A (en) Apparatus, system, and method for a compliant pin electrical connection for an area array device
WO2011087215A3 (ko) 프로브 카드
US8120450B2 (en) High frequency circuit module
TW200641377A (en) Apparatus and method for testing component built in circuit board
WO2011099801A3 (ko) 다중도체 접속장치 및 이를 이용한 배·분전반
WO2009011201A1 (ja) 検査用構造体
GB2487845A (en) Signal sensing devices and cicuit boards
CN101374382B (zh) 具空间转换的多层电路板以及探针卡
CN101557683A (zh) 多层电路板
CN101452062A (zh) 一种屏蔽电场的磁感应测量传感器屏蔽盒
NZ599934A (en) Antenna coupler for connecting an RF antenna to a high voltage appliance
TWI407105B (zh) 應用於探針卡的轉接板
TW200721339A (en) Manufacturing method of semiconductor integrated circuit device
TW200740030A (en) Dual-frequency by-circularly polarized antenna
KR20140110443A (ko) 프로브 카드
TWM387342U (en) Array substrate having testing circuit layout
SG169956A1 (en) High-frequency cantilever type probe card
US8554969B2 (en) Electronic device with expansion card