SG140520A1 - Vertical type high frequency probe card - Google Patents
Vertical type high frequency probe cardInfo
- Publication number
- SG140520A1 SG140520A1 SG200702127-2A SG2007021272A SG140520A1 SG 140520 A1 SG140520 A1 SG 140520A1 SG 2007021272 A SG2007021272 A SG 2007021272A SG 140520 A1 SG140520 A1 SG 140520A1
- Authority
- SG
- Singapore
- Prior art keywords
- grounding
- probe
- signal
- circuits
- probe card
- Prior art date
Links
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
Abstract
VERTICAL TYPE HIGH FREQUENCY PROBE CARD A vertical-type probe card includes a circuit board, which has signal circuits and grounding circuits arranged in such a manner that each signal circuit is disposed in parallel and adjacent to one grounding circuit and kept a predetermined distance from the grounding circuit, and a probe assembly, which is arranged at the bottom side of the circuit board and has an upper guide plate, a lower guide plate, a conducting layer provided on the lower guide plate, a plurality of signal probes respectively electrically connected to the signal circuits and adjacent to a plurality of compensation probes, and at least one grounding probe electrically connected to the grounding circuits in a manner that the signal, compensation and grounding probes are vertically inserted through the upper and lower guide plates, and the conducting layer is conducted with the compensation probe and the grounding probe while electrically insulated to the signal probe.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95130518A TW200811444A (en) | 2006-08-18 | 2006-08-18 | Vertical high frequency probe card |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG140520A1 true SG140520A1 (en) | 2008-03-28 |
Family
ID=39205053
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG200702127-2A SG140520A1 (en) | 2006-08-18 | 2007-03-22 | Vertical type high frequency probe card |
Country Status (2)
| Country | Link |
|---|---|
| SG (1) | SG140520A1 (en) |
| TW (1) | TW200811444A (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI385392B (en) * | 2008-12-12 | 2013-02-11 | High-frequency vertical probe device and its application of high-speed test card | |
| TWI416121B (en) * | 2009-11-04 | 2013-11-21 | Mjc Probe Inc | Probe card |
| TW201239365A (en) * | 2011-03-22 | 2012-10-01 | Mpi Corp | High frequency coupling signal adjustment manner and test device thereof |
| KR102682284B1 (en) * | 2018-08-29 | 2024-07-10 | 삼성디스플레이 주식회사 | Probe card and test device including the same |
| TW202035995A (en) * | 2019-03-18 | 2020-10-01 | 旺矽科技股份有限公司 | Probe device |
| CN112710878B (en) * | 2019-10-24 | 2024-02-27 | 台湾中华精测科技股份有限公司 | Detachable high-frequency testing device and vertical probe head thereof |
-
2006
- 2006-08-18 TW TW95130518A patent/TW200811444A/en not_active IP Right Cessation
-
2007
- 2007-03-22 SG SG200702127-2A patent/SG140520A1/en unknown
Also Published As
| Publication number | Publication date |
|---|---|
| TWI301543B (en) | 2008-10-01 |
| TW200811444A (en) | 2008-03-01 |
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