TWM387342U - Array substrate having testing circuit layout - Google Patents

Array substrate having testing circuit layout

Info

Publication number
TWM387342U
TWM387342U TW99202125U TW99202125U TWM387342U TW M387342 U TWM387342 U TW M387342U TW 99202125 U TW99202125 U TW 99202125U TW 99202125 U TW99202125 U TW 99202125U TW M387342 U TWM387342 U TW M387342U
Authority
TW
Taiwan
Prior art keywords
substrate
test region
panel test
array substrate
testing circuit
Prior art date
Application number
TW99202125U
Other languages
Chinese (zh)
Inventor
Chien-Hai Yang
Ming-Chuan Lee
Chi-Wen Wu
Original Assignee
Chunghwa Picture Tubes Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chunghwa Picture Tubes Co filed Critical Chunghwa Picture Tubes Co
Priority to TW99202125U priority Critical patent/TWM387342U/en
Publication of TWM387342U publication Critical patent/TWM387342U/en

Links

Landscapes

  • Liquid Crystal (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)

Abstract

The present invention provides an array substrate having a testing circuit layout. The array substrate includes a substrate, at least two shorting bars, a test pad and a connecting line. The substrate has a first panel test region and at least one second panel test region. The shorting bars are respectively disposed on the substrate in the first panel test region and in the second panel test region, and the test pad is disposed in the first panel test region and electrically connected the shorting bar in the first panel test region. The connecting line is electrically connected to each shorting bar. The substrate in the second panel test region has one less test pad disposed thereon than the substrate in the second panel test region.
TW99202125U 2010-02-02 2010-02-02 Array substrate having testing circuit layout TWM387342U (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW99202125U TWM387342U (en) 2010-02-02 2010-02-02 Array substrate having testing circuit layout

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW99202125U TWM387342U (en) 2010-02-02 2010-02-02 Array substrate having testing circuit layout

Publications (1)

Publication Number Publication Date
TWM387342U true TWM387342U (en) 2010-08-21

Family

ID=50604040

Family Applications (1)

Application Number Title Priority Date Filing Date
TW99202125U TWM387342U (en) 2010-02-02 2010-02-02 Array substrate having testing circuit layout

Country Status (1)

Country Link
TW (1) TWM387342U (en)

Cited By (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8692558B2 (en) 2011-04-14 2014-04-08 Au Optronics Corporation Display panel and testing method thereof
US8754914B2 (en) 2011-06-30 2014-06-17 Hannstar Display Corporation Testing circuit of dual gate cell panel and color display method for dual gate cell panel
TWI449988B (en) * 2011-08-12 2014-08-21 Au Optronics Corp Liquid crystal display having an array test pad and a source driving circuit disposed at opposite ends
TWI741721B (en) * 2020-07-31 2021-10-01 大陸商深超光電（深圳）有限公司 Conductivity test structure, thin film transistor substrate and display panel

Cited By (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8692558B2 (en) 2011-04-14 2014-04-08 Au Optronics Corporation Display panel and testing method thereof
TWI480655B (en) * 2011-04-14 2015-04-11 Au Optronics Corp Display panel and testing method thereof
US9214105B2 (en) 2011-04-14 2015-12-15 Au Optronics Corporation Display panel and testing method thereof
US8754914B2 (en) 2011-06-30 2014-06-17 Hannstar Display Corporation Testing circuit of dual gate cell panel and color display method for dual gate cell panel
TWI449988B (en) * 2011-08-12 2014-08-21 Au Optronics Corp Liquid crystal display having an array test pad and a source driving circuit disposed at opposite ends
TWI741721B (en) * 2020-07-31 2021-10-01 大陸商深超光電（深圳）有限公司 Conductivity test structure, thin film transistor substrate and display panel

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Legal Events

Date Code Title Description
MK4K Expiration of patent term of a granted utility model