TW200804822A - High-frequency probe card and transmission line for high-frequency probe card - Google Patents
High-frequency probe card and transmission line for high-frequency probe card Download PDFInfo
- Publication number
- TW200804822A TW200804822A TW95124686A TW95124686A TW200804822A TW 200804822 A TW200804822 A TW 200804822A TW 95124686 A TW95124686 A TW 95124686A TW 95124686 A TW95124686 A TW 95124686A TW 200804822 A TW200804822 A TW 200804822A
- Authority
- TW
- Taiwan
- Prior art keywords
- signal
- probe
- wire
- grounding
- ground
- Prior art date
Links
- 239000000523 sample Substances 0.000 title claims abstract description 131
- 230000005540 biological transmission Effects 0.000 title claims abstract description 71
- 238000012360 testing method Methods 0.000 claims abstract description 33
- WABPQHHGFIMREM-UHFFFAOYSA-N lead(0) Chemical compound [Pb] WABPQHHGFIMREM-UHFFFAOYSA-N 0.000 claims abstract 3
- 229910000679 solder Inorganic materials 0.000 claims description 21
- 239000002184 metal Substances 0.000 claims description 15
- 229910052751 metal Inorganic materials 0.000 claims description 15
- 239000000463 material Substances 0.000 claims description 12
- 239000007769 metal material Substances 0.000 claims description 7
- 239000011810 insulating material Substances 0.000 claims description 5
- 238000005253 cladding Methods 0.000 claims description 3
- 230000035939 shock Effects 0.000 claims description 2
- 241000282376 Panthera tigris Species 0.000 claims 1
- PCHJSUWPFVWCPO-UHFFFAOYSA-N gold Chemical compound [Au] PCHJSUWPFVWCPO-UHFFFAOYSA-N 0.000 claims 1
- 239000010931 gold Substances 0.000 claims 1
- 229910052737 gold Inorganic materials 0.000 claims 1
- 210000004072 lung Anatomy 0.000 claims 1
- 239000000344 soap Substances 0.000 claims 1
- 230000008054 signal transmission Effects 0.000 abstract description 8
- 238000009434 installation Methods 0.000 abstract 1
- 239000004020 conductor Substances 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- 238000005259 measurement Methods 0.000 description 7
- 238000013461 design Methods 0.000 description 4
- 230000000694 effects Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 239000000919 ceramic Substances 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000003780 insertion Methods 0.000 description 2
- 230000037431 insertion Effects 0.000 description 2
- 238000009413 insulation Methods 0.000 description 2
- 238000005476 soldering Methods 0.000 description 2
- 239000000853 adhesive Substances 0.000 description 1
- 230000001070 adhesive effect Effects 0.000 description 1
- 238000006243 chemical reaction Methods 0.000 description 1
- 230000008602 contraction Effects 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000003822 epoxy resin Substances 0.000 description 1
- 239000000835 fiber Substances 0.000 description 1
- 239000011121 hardwood Substances 0.000 description 1
- 239000012535 impurity Substances 0.000 description 1
- 239000012774 insulation material Substances 0.000 description 1
- 230000002452 interceptive effect Effects 0.000 description 1
- 230000003071 parasitic effect Effects 0.000 description 1
- 229920000647 polyepoxide Polymers 0.000 description 1
- 239000004575 stone Substances 0.000 description 1
- 230000009747 swallowing Effects 0.000 description 1
- 238000012546 transfer Methods 0.000 description 1
Landscapes
- Measuring Leads Or Probes (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95124686A TW200804822A (en) | 2006-07-06 | 2006-07-06 | High-frequency probe card and transmission line for high-frequency probe card |
| SG200702176-9A SG138517A1 (en) | 2006-07-06 | 2007-03-23 | High-frequency probe card and transmission line for high-frequency probe card |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW95124686A TW200804822A (en) | 2006-07-06 | 2006-07-06 | High-frequency probe card and transmission line for high-frequency probe card |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200804822A true TW200804822A (en) | 2008-01-16 |
| TWI306154B TWI306154B (enExample) | 2009-02-11 |
Family
ID=39004448
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW95124686A TW200804822A (en) | 2006-07-06 | 2006-07-06 | High-frequency probe card and transmission line for high-frequency probe card |
Country Status (2)
| Country | Link |
|---|---|
| SG (1) | SG138517A1 (enExample) |
| TW (1) | TW200804822A (enExample) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI407106B (zh) * | 2009-09-17 | 2013-09-01 | Mpi Corp | High frequency cantilever probe card |
| US10145863B2 (en) | 2011-07-06 | 2018-12-04 | Celadon Systems, Inc. | Test systems with a probe apparatus and index mechanism |
| CN111707850A (zh) * | 2019-03-18 | 2020-09-25 | 旺矽科技股份有限公司 | 探针装置 |
| TWI707145B (zh) * | 2019-09-24 | 2020-10-11 | 松翰股份有限公司 | 用於影像感測晶片之探針卡的探針頭結構 |
Families Citing this family (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TW201305574A (zh) | 2011-07-22 | 2013-02-01 | Mpi Corp | 高頻訊號路徑調整方式及其測試裝置 |
| TWI512300B (zh) * | 2013-07-15 | 2015-12-11 | Mpi Corp | Cantilever high frequency probe card |
| TWI572867B (zh) * | 2015-06-05 | 2017-03-01 | Mpi Corp | Probe module with feedback test function (2) |
| TWI576590B (zh) * | 2015-07-03 | 2017-04-01 | Mpi Corp | Cantilever high frequency probe card |
| CN120610148B (zh) * | 2025-08-11 | 2025-10-28 | 广州广合科技股份有限公司 | 一种线路板插损测试方法 |
-
2006
- 2006-07-06 TW TW95124686A patent/TW200804822A/zh unknown
-
2007
- 2007-03-23 SG SG200702176-9A patent/SG138517A1/en unknown
Cited By (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI407106B (zh) * | 2009-09-17 | 2013-09-01 | Mpi Corp | High frequency cantilever probe card |
| US10145863B2 (en) | 2011-07-06 | 2018-12-04 | Celadon Systems, Inc. | Test systems with a probe apparatus and index mechanism |
| TWI645207B (zh) * | 2011-07-06 | 2018-12-21 | 美商色拉頓系統公司 | 具有一探針裝置之測試系統及轉位機構 |
| CN111707850A (zh) * | 2019-03-18 | 2020-09-25 | 旺矽科技股份有限公司 | 探针装置 |
| TWI707145B (zh) * | 2019-09-24 | 2020-10-11 | 松翰股份有限公司 | 用於影像感測晶片之探針卡的探針頭結構 |
Also Published As
| Publication number | Publication date |
|---|---|
| SG138517A1 (en) | 2008-01-28 |
| TWI306154B (enExample) | 2009-02-11 |
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