TW200741228A - Jitter amplifier, jitter amplifying method, electronic device, test equipment and test method - Google Patents

Jitter amplifier, jitter amplifying method, electronic device, test equipment and test method

Info

Publication number
TW200741228A
TW200741228A TW096110724A TW96110724A TW200741228A TW 200741228 A TW200741228 A TW 200741228A TW 096110724 A TW096110724 A TW 096110724A TW 96110724 A TW96110724 A TW 96110724A TW 200741228 A TW200741228 A TW 200741228A
Authority
TW
Taiwan
Prior art keywords
jitter
input signals
test
amplifier
electronic device
Prior art date
Application number
TW096110724A
Other languages
English (en)
Chinese (zh)
Inventor
Kiyotaka Ichiyama
Masahiro Ishida
Takahiro Yamaguchi
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200741228A publication Critical patent/TW200741228A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31708—Analysis of signal quality
    • G01R31/31709—Jitter measurements; Jitter generators

Landscapes

  • Physics & Mathematics (AREA)
  • Nonlinear Science (AREA)
  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Amplifiers (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Dc Digital Transmission (AREA)
TW096110724A 2006-03-28 2007-03-28 Jitter amplifier, jitter amplifying method, electronic device, test equipment and test method TW200741228A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/390,340 US7412341B2 (en) 2006-03-28 2006-03-28 Jitter amplifier, jitter amplification method, electronic device, testing apparatus, and testing method

Publications (1)

Publication Number Publication Date
TW200741228A true TW200741228A (en) 2007-11-01

Family

ID=38563367

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096110724A TW200741228A (en) 2006-03-28 2007-03-28 Jitter amplifier, jitter amplifying method, electronic device, test equipment and test method

Country Status (5)

Country Link
US (1) US7412341B2 (ja)
JP (1) JP5022359B2 (ja)
DE (1) DE112007000795T5 (ja)
TW (1) TW200741228A (ja)
WO (1) WO2007114098A1 (ja)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI391692B (zh) * 2007-12-13 2013-04-01 Advantest Corp 測試裝置、測試方法、量測裝置以及量測方法
TWI412232B (zh) * 2010-09-30 2013-10-11 Analog Vision Technology Inc 具頻率抖動的頻率產生器

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE102006007617A1 (de) * 2005-02-14 2006-08-24 Advantest Corp. Jittermessvorrichtung, Jittermessverfahren, Prüfvorrichtung und Elektronische Vorrichtung
US7394277B2 (en) 2006-04-20 2008-07-01 Advantest Corporation Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method
US7501905B2 (en) * 2006-12-13 2009-03-10 Advantest Corporation Oscillator circuit, PLL circuit, semiconductor chip, and test apparatus

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS599484Y2 (ja) * 1979-10-04 1984-03-26 日本ビクター株式会社 信号ジツタ補正回路
JPS599484A (ja) 1982-07-09 1984-01-18 株式会社丸進 木材の乾燥方法
JPH0469863A (ja) 1990-07-09 1992-03-05 Sharp Corp 磁気記録再生装置のジッタ補正方法
JPH0850156A (ja) * 1994-08-05 1996-02-20 Anritsu Corp ジッタ耐力測定装置
JPH08248078A (ja) * 1995-03-07 1996-09-27 Anritsu Corp ジッタ伝達特性測定装置
US6591091B1 (en) * 1998-11-12 2003-07-08 Broadcom Corporation System and method for coarse/fine PLL adjustment
JP2001290555A (ja) 2000-04-07 2001-10-19 Fujitsu Ltd Ｄｌｌ回路の位相調整方法およびｄｌｌ回路を有する半導体集積回路
JP4002471B2 (ja) * 2002-05-30 2007-10-31 エルピーダメモリ株式会社 試験装置
JP3886941B2 (ja) * 2003-07-10 2007-02-28 アンリツ株式会社 ジッタ耐力測定装置
JP2006025131A (ja) 2004-07-07 2006-01-26 Renesas Technology Corp Ｐｌｌ回路およびｄｌｌ回路

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI391692B (zh) * 2007-12-13 2013-04-01 Advantest Corp 測試裝置、測試方法、量測裝置以及量測方法
TWI412232B (zh) * 2010-09-30 2013-10-11 Analog Vision Technology Inc 具頻率抖動的頻率產生器

Also Published As

Publication number Publication date
WO2007114098A1 (ja) 2007-10-11
DE112007000795T5 (de) 2009-05-07
US20070239388A1 (en) 2007-10-11
US7412341B2 (en) 2008-08-12
JP5022359B2 (ja) 2012-09-12
JPWO2007114098A1 (ja) 2009-08-13

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