TW200739890A - Method and apparatus for programming non-volatile memory with reduced program disturb using modified pass voltages - Google Patents

Method and apparatus for programming non-volatile memory with reduced program disturb using modified pass voltages

Info

Publication number
TW200739890A
TW200739890A TW095147491A TW95147491A TW200739890A TW 200739890 A TW200739890 A TW 200739890A TW 095147491 A TW095147491 A TW 095147491A TW 95147491 A TW95147491 A TW 95147491A TW 200739890 A TW200739890 A TW 200739890A
Authority
TW
Taiwan
Prior art keywords
word lines
program disturb
volatile storage
storage elements
volatile memory
Prior art date
Application number
TW095147491A
Other languages
English (en)
Other versions
TWI326487B (en
Inventor
Gerrit Jan Hemink
Ken Oowada
Original Assignee
Sandisk Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/312,925 external-priority patent/US7355888B2/en
Priority claimed from US11/313,023 external-priority patent/US7355889B2/en
Application filed by Sandisk Corp filed Critical Sandisk Corp
Publication of TW200739890A publication Critical patent/TW200739890A/zh
Application granted granted Critical
Publication of TWI326487B publication Critical patent/TWI326487B/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5621—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using charge storage in a floating gate
    • G11C11/5628—Programming or writing circuits; Data input circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G11C16/0483—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS comprising cells having several storage transistors connected in series
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/10—Programming or data input circuits
    • G11C16/12—Programming voltage switching circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G11C16/3418—Disturbance prevention or evaluation; Refreshing of disturbed memory data
    • G11C16/3427—Circuits or methods to prevent or reduce disturbance of the state of a memory cell when neighbouring cells are read or written
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C2211/00—Indexing scheme relating to digital stores characterized by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C2211/56—Indexing scheme relating to G11C11/56 and sub-groups for features not covered by these groups
    • G11C2211/562—Multilevel memory programming aspects

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Read Only Memory (AREA)
  • Non-Volatile Memory (AREA)
  • Semiconductor Memories (AREA)
TW095147491A 2005-12-19 2006-12-18 Non-volatile storage system and method for programming non-volatile storage TWI326487B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/312,925 US7355888B2 (en) 2005-12-19 2005-12-19 Apparatus for programming non-volatile memory with reduced program disturb using modified pass voltages
US11/313,023 US7355889B2 (en) 2005-12-19 2005-12-19 Method for programming non-volatile memory with reduced program disturb using modified pass voltages

Publications (2)

Publication Number Publication Date
TW200739890A true TW200739890A (en) 2007-10-16
TWI326487B TWI326487B (en) 2010-06-21

Family

ID=38019131

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095147491A TWI326487B (en) 2005-12-19 2006-12-18 Non-volatile storage system and method for programming non-volatile storage

Country Status (7)

Country Link
EP (1) EP1964127B1 (zh)
JP (1) JP4808784B2 (zh)
KR (1) KR100966357B1 (zh)
AT (1) ATE450043T1 (zh)
DE (1) DE602006010742D1 (zh)
TW (1) TWI326487B (zh)
WO (1) WO2007078793A1 (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101471137B (zh) * 2007-12-27 2012-07-18 海力士半导体有限公司 操作非易失性存储器件的方法

Families Citing this family (21)

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US7466590B2 (en) * 2004-02-06 2008-12-16 Sandisk Corporation Self-boosting method for flash memory cells
US7161833B2 (en) 2004-02-06 2007-01-09 Sandisk Corporation Self-boosting system for flash memory cells
US7499319B2 (en) 2006-03-03 2009-03-03 Sandisk Corporation Read operation for non-volatile storage with compensation for coupling
US7436733B2 (en) 2006-03-03 2008-10-14 Sandisk Corporation System for performing read operation on non-volatile storage with compensation for coupling
US7511995B2 (en) 2006-03-30 2009-03-31 Sandisk Corporation Self-boosting system with suppression of high lateral electric fields
US7428165B2 (en) 2006-03-30 2008-09-23 Sandisk Corporation Self-boosting method with suppression of high lateral electric fields
US7450421B2 (en) 2006-06-02 2008-11-11 Sandisk Corporation Data pattern sensitivity compensation using different voltage
US8184478B2 (en) 2006-09-27 2012-05-22 Sandisk Technologies Inc. Apparatus with reduced program disturb in non-volatile storage
WO2008039667A2 (en) * 2006-09-27 2008-04-03 Sandisk Corporation Reducing program disturb in non-volatile storage
US8189378B2 (en) 2006-09-27 2012-05-29 Sandisk Technologies Inc. Reducing program disturb in non-volatile storage
US7606070B2 (en) 2006-12-29 2009-10-20 Sandisk Corporation Systems for margined neighbor reading for non-volatile memory read operations including coupling compensation
US7440324B2 (en) 2006-12-29 2008-10-21 Sandisk Corporation Apparatus with alternating read mode
US7518923B2 (en) 2006-12-29 2009-04-14 Sandisk Corporation Margined neighbor reading for non-volatile memory read operations including coupling compensation
US7495962B2 (en) 2006-12-29 2009-02-24 Sandisk Corporation Alternating read mode
KR101407361B1 (ko) * 2008-04-14 2014-06-13 삼성전자주식회사 불휘발성 메모리 장치 및 그것의 프로그램 방법
US7916533B2 (en) 2009-06-24 2011-03-29 Sandisk Corporation Forecasting program disturb in memory by detecting natural threshold voltage distribution
US8134871B2 (en) 2009-08-05 2012-03-13 Sandisk Technologies Inc. Programming memory with reduced pass voltage disturb and floating gate-to-control gate leakage
KR101561270B1 (ko) 2009-10-15 2015-10-19 삼성전자주식회사 플래시 메모리 장치 그리고 그것의 채널 프리챠지 및 프로그램 방법들
JP5238741B2 (ja) 2010-03-19 2013-07-17 株式会社東芝 不揮発性半導体記憶装置
KR102062314B1 (ko) * 2013-03-15 2020-01-03 삼성전자주식회사 불휘발성 메모리 장치 및 프로그램 방법
WO2023068833A1 (ko) * 2021-10-20 2023-04-27 한양대학교 산학협력단 3차원 플래시 메모리 및 그 동작 방법

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5715194A (en) * 1996-07-24 1998-02-03 Advanced Micro Devices, Inc. Bias scheme of program inhibit for random programming in a nand flash memory
KR100385230B1 (ko) * 2000-12-28 2003-05-27 삼성전자주식회사 불휘발성 반도체 메모리 장치의 프로그램 방법
JP3957985B2 (ja) * 2001-03-06 2007-08-15 株式会社東芝 不揮発性半導体記憶装置
JP3863485B2 (ja) * 2002-11-29 2006-12-27 株式会社東芝 不揮発性半導体記憶装置
US6888758B1 (en) * 2004-01-21 2005-05-03 Sandisk Corporation Programming non-volatile memory
US7161833B2 (en) * 2004-02-06 2007-01-09 Sandisk Corporation Self-boosting system for flash memory cells

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101471137B (zh) * 2007-12-27 2012-07-18 海力士半导体有限公司 操作非易失性存储器件的方法

Also Published As

Publication number Publication date
WO2007078793A1 (en) 2007-07-12
KR20080089426A (ko) 2008-10-06
JP4808784B2 (ja) 2011-11-02
DE602006010742D1 (de) 2010-01-07
KR100966357B1 (ko) 2010-06-28
ATE450043T1 (de) 2009-12-15
EP1964127B1 (en) 2009-11-25
JP2009520314A (ja) 2009-05-21
EP1964127A1 (en) 2008-09-03
TWI326487B (en) 2010-06-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees