TW200732648A - Device and method for inspecting tape product - Google Patents

Device and method for inspecting tape product

Info

Publication number
TW200732648A
TW200732648A TW095140550A TW95140550A TW200732648A TW 200732648 A TW200732648 A TW 200732648A TW 095140550 A TW095140550 A TW 095140550A TW 95140550 A TW95140550 A TW 95140550A TW 200732648 A TW200732648 A TW 200732648A
Authority
TW
Taiwan
Prior art keywords
tape product
light transmission
transmission roller
inspecting
inspection device
Prior art date
Application number
TW095140550A
Other languages
English (en)
Chinese (zh)
Inventor
Hyun-Gon Kim
Cheol-Woo Kim
Dae-Hwa Jeong
Original Assignee
Lg Electronics Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Lg Electronics Inc filed Critical Lg Electronics Inc
Publication of TW200732648A publication Critical patent/TW200732648A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
    • G06T7/00—Image analysis
    • G06T7/0002—Inspection of images, e.g. flaw detection
    • G06T7/0004—Industrial image inspection
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

Landscapes

  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Theoretical Computer Science (AREA)
  • Signal Processing (AREA)
  • Health & Medical Sciences (AREA)
  • Quality & Reliability (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
TW095140550A 2005-11-03 2006-11-02 Device and method for inspecting tape product TW200732648A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050105018A KR20070048034A (ko) 2005-11-03 2005-11-03 테이프 제품의 검사장치

Publications (1)

Publication Number Publication Date
TW200732648A true TW200732648A (en) 2007-09-01

Family

ID=38071185

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095140550A TW200732648A (en) 2005-11-03 2006-11-02 Device and method for inspecting tape product

Country Status (4)

Country Link
JP (1) JP5089958B2 (ja)
KR (1) KR20070048034A (ja)
CN (1) CN1959385B (ja)
TW (1) TW200732648A (ja)

Families Citing this family (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2009115532A (ja) * 2007-11-05 2009-05-28 Nippon Avionics Co Ltd パターン検査装置
JP5278905B2 (ja) * 2009-04-13 2013-09-04 独立行政法人 国立印刷局 品質検査装置
TWI464391B (zh) * 2011-08-26 2014-12-11 Machvision Inc Optical detection system
JP2014157086A (ja) * 2013-02-15 2014-08-28 Dainippon Screen Mfg Co Ltd パターン検査装置
KR101638369B1 (ko) * 2013-09-30 2016-07-11 주식회사 엘지화학 편광필름 정렬 시스템 및 이를 이용한 편광필름 정렬 방법
CN103558226B (zh) * 2013-11-15 2016-01-20 深圳市凯柏精密技术有限公司 用于柔性片材的滚筒式检测装置
CN105021612B (zh) * 2014-04-24 2018-10-23 奥蒂玛光学科技（深圳）有限公司 电路板双面检测设备
CN105635662A (zh) * 2014-11-08 2016-06-01 智比特信息技术（镇江）有限公司 一种检测用载带重封机的监视系统及其计算机监视方法
CN105466479A (zh) * 2015-11-20 2016-04-06 浙江维涅斯装饰材料股份有限公司 一种用于检测圆网网孔的装置
JP6506717B2 (ja) * 2016-03-30 2019-04-24 Ｔｏｗａ株式会社 樹脂成形装置、樹脂成形方法、フィルム搬送用ローラ及び樹脂成形装置用フィルム供給装置
CN106198564B (zh) * 2016-08-24 2018-08-07 浙江维涅斯装饰材料股份有限公司 一种检测圆网网孔的装置
KR101834569B1 (ko) * 2017-03-31 2018-03-05 주식회사 토비스 곡면패널의 균일도 측정장치 및 곡면패널의 균일도 측정방법
CN110039756A (zh) * 2019-03-26 2019-07-23 宁波太古新材料科技有限公司 一种智能化保护膜电晕处理装置
GB202002208D0 (en) 2020-02-18 2020-04-01 Ricoh Co Ltd Test Apparatus
CN113376168A (zh) * 2021-06-09 2021-09-10 深圳技术大学 一种检修一体化设备

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4040748A (en) * 1975-06-30 1977-08-09 International Business Machines Corporation Inspection tool
JPH1087133A (ja) * 1996-09-09 1998-04-07 Shikoku Kakoki Co Ltd ウェッブ巻き戻し装置
JP3928166B2 (ja) * 1998-06-30 2007-06-13 国際技術開発株式会社 画像処理検査用テープ搬送装置
EP1181569B1 (en) * 1999-05-14 2004-04-07 MV Research Limited A microvia inspection system
US7215427B2 (en) * 2001-12-18 2007-05-08 Kba-Giori S.A. Device for controlling material
JP4228778B2 (ja) * 2003-05-21 2009-02-25 ウシオ電機株式会社 パターン検査装置
JP2005003645A (ja) * 2003-06-16 2005-01-06 Inspeck Kk パターン検査装置
JP2005003646A (ja) * 2003-06-16 2005-01-06 Inspeck Kk パターン検査装置
CN100394166C (zh) * 2004-12-20 2008-06-11 华中科技大学 一种印刷品质量在线检测装置

Also Published As

Publication number Publication date
KR20070048034A (ko) 2007-05-08
CN1959385B (zh) 2011-07-20
CN1959385A (zh) 2007-05-09
JP2007127651A (ja) 2007-05-24
JP5089958B2 (ja) 2012-12-05

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