TW200730808A - Polarizing film inspecting apparatus and method thereof - Google Patents

Polarizing film inspecting apparatus and method thereof

Info

Publication number
TW200730808A
TW200730808A TW095144950A TW95144950A TW200730808A TW 200730808 A TW200730808 A TW 200730808A TW 095144950 A TW095144950 A TW 095144950A TW 95144950 A TW95144950 A TW 95144950A TW 200730808 A TW200730808 A TW 200730808A
Authority
TW
Taiwan
Prior art keywords
polarizing film
unit
main frame
inspecting apparatus
defective
Prior art date
Application number
TW095144950A
Other languages
Chinese (zh)
Other versions
TWI324680B (en
Inventor
Min-Seok Jang
Original Assignee
Evertechno Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Evertechno Co Ltd filed Critical Evertechno Co Ltd
Publication of TW200730808A publication Critical patent/TW200730808A/en
Application granted granted Critical
Publication of TWI324680B publication Critical patent/TWI324680B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01M—TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00—Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G02—OPTICS
    • G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
    • G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
    • G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour 
    • G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour  based on liquid crystals, e.g. single liquid crystal display cells
    • G02F1/1306—Details
    • G02F1/1309—Repairing; Testing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N2021/9513—Liquid crystal panels

Abstract

The present invention relates to a polarizing film inspecting apparatus and method for determining if the polarizing film for LCD is defective to improve the performance of the inspection process. The polarizing film inspecting apparatus includes a first inspection unit installed in a main frame, and the invention can be also used to inspect if the polarizing film held on a transport carrier is defective; a second inspection unit installed in the main frame and connected next to the first inspection unit, and the invention can be also used to inspect if the polarizing film held on a transport carrier is defective; a first film transport device installed in the main frame and disposed on one side of the first and the second unit that carries the polarizing film to be washed and through a washing unit and optionally loaded into the first and the second inspection unit; and a second film transport device installed in the main frame and disposed on another side of the first and the second unit carries the polarizing film to be inspected and unloaded into a sorting unit.
TW095144950A 2005-12-05 2006-12-04 Polarizing film inspecting apparatus and method TWI324680B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050117595A KR100788734B1 (en) 2005-12-05 2005-12-05 Polarizing Film Inspecting Apparatus and Method

Publications (2)

Publication Number Publication Date
TW200730808A true TW200730808A (en) 2007-08-16
TWI324680B TWI324680B (en) 2010-05-11

Family

ID=38130485

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095144950A TWI324680B (en) 2005-12-05 2006-12-04 Polarizing film inspecting apparatus and method

Country Status (4)

Country Link
JP (1) JP4463797B2 (en)
KR (1) KR100788734B1 (en)
CN (1) CN100462778C (en)
TW (1) TWI324680B (en)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2039513B1 (en) * 2007-09-21 2010-12-29 Bobst S.A. Method for determining the surface quality of a support and machine for transforming the associated support
KR100921154B1 (en) * 2008-03-05 2009-10-12 주식회사 엘지화학 caririer box for polarizer
KR102025704B1 (en) * 2012-09-14 2019-09-27 삼성디스플레이 주식회사 Apparatus for inspecting film
KR101435750B1 (en) 2013-04-25 2014-08-28 주식회사 케이엘티 Automatic vision testing device for reducing lcd panel movement and checking time
KR101496991B1 (en) * 2013-10-29 2015-03-02 (주) 인텍플러스 apparatus for inspecting parts of mobile
KR20170002220A (en) 2015-06-29 2017-01-06 (주) 인텍플러스 uneveness inspection apparatus for polaroid film
JP6604805B2 (en) * 2015-09-30 2019-11-13 日東電工株式会社 Polarizer inspection method and polarizing plate manufacturing method
KR102409426B1 (en) * 2021-09-24 2022-06-17 표준머신비전 주식회사 Inspection apparatus and method for appearance of optically clear adhesive film

Family Cites Families (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3312748B2 (en) * 1992-06-05 2002-08-12 株式会社東京精密 Wafer inspection apparatus and wafer inspection method
JP2677981B2 (en) * 1996-01-26 1997-11-17 株式会社日立製作所 Exposure equipment
JPH09329774A (en) * 1996-06-11 1997-12-22 Hitachi Ltd Appearance inspecting device for liquid crystal display substrate
JP3677885B2 (en) * 1996-08-26 2005-08-03 住友化学株式会社 Sheet inspection equipment
KR100567224B1 (en) * 1999-02-22 2006-04-04 삼성전자주식회사 Semiconductor manufacture test equipment
JP2001056270A (en) * 1999-08-18 2001-02-27 Sumitomo Chem Co Ltd Linear polarizing plate inspection method and linear polarizing plate inspection device
KR20020083742A (en) * 2001-04-30 2002-11-04 삼성전자 주식회사 Semiconductor device tester
KR100420244B1 (en) * 2002-05-11 2004-03-02 주식회사 이오테크닉스 The film marker system and its control method
JP2003344302A (en) * 2002-05-31 2003-12-03 Sumitomo Chem Co Ltd Method and equipment for inspecting polarization film
JP2004198163A (en) * 2002-12-17 2004-07-15 Sumitomo Chem Co Ltd Defect inspection method for protective film adhered polarizing plate
KR20040059616A (en) * 2002-12-27 2004-07-06 삼성중공업 주식회사 Apparatus for inspecting welding part
CH696527A5 (en) * 2003-05-16 2007-07-31 Bobst Sa A method of quality control of flat elements and device for implementing this method.
KR20050013491A (en) * 2003-07-28 2005-02-04 닛토덴코 가부시키가이샤 Inspection method and inspection system of sheet type product
CN1590990A (en) * 2003-08-26 2005-03-09 碧悠国际光电股份有限公司 Glass base plate detecting system and its operation method

Also Published As

Publication number Publication date
KR20070058830A (en) 2007-06-11
JP2007156487A (en) 2007-06-21
CN100462778C (en) 2009-02-18
CN1979262A (en) 2007-06-13
JP4463797B2 (en) 2010-05-19
KR100788734B1 (en) 2008-01-02
TWI324680B (en) 2010-05-11

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees