JP3677885B2 - Sheet inspection equipment - Google Patents

Sheet inspection equipment Download PDF

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Publication number
JP3677885B2
JP3677885B2 JP22377796A JP22377796A JP3677885B2 JP 3677885 B2 JP3677885 B2 JP 3677885B2 JP 22377796 A JP22377796 A JP 22377796A JP 22377796 A JP22377796 A JP 22377796A JP 3677885 B2 JP3677885 B2 JP 3677885B2
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Japan
Prior art keywords
belt
sensor
sheet
top plate
inspection
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Expired - Fee Related
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JP22377796A
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JPH1062146A (en
Inventor
孝志 鈴木
敏雅 中井
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Sumitomo Chemical Co Ltd
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Sumitomo Chemical Co Ltd
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Priority to JP22377796A priority Critical patent/JP3677885B2/en
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Description

【0001】
【発明の属する技術分野】
本発明はガラス、樹脂、紙等のシート状被検査物に存在する異物、傷、ピンホール等の欠陥をCCDリニアイメージセンサーやレーザー式検査機等のセンサーを用いて電子的に検出する光学的検査装置に関するものである。
【0002】
【従来の技術】
従来より偏光フィルムやTFTカラーフィルター等の光学フィルムに存在する異物、傷、ピンホール等の欠陥は図6に示す如く光源1より光を照射し、シート状被検査物2よりの反射散乱光をCCDリニアイメージセンサー3で受光し、そのセンサーからの出力信号を図示しない検出手段で検出し、シートに存在する欠陥を光の明暗として判断・検出する方法が行われている。
これらを工業的に検査する場合には一連の製造工程の中で、一定方向に移動するベルト上にフィルム等のシート状被検査物を載置し、特定場所にセンサーの焦点を合わせて上記した方法により検査が行われているが、これらの検査方法はフィルム面上で反射する散乱光にセンサーの焦点距離を合わせていることより、ベルト上に載置されたフィルムに何らかの要因で撓みや凹凸等が生じる場合には欠陥として検出されるため、検査位置に於けるフィルムはセンサーと等距離に位置し焦点がずれないようにする必要がある。
【0003】
例えばベルトに通気性素材を用い、かつ検査位置を通過するベルト下部に真空吸引ボックスを配設し、検査位置を通過するフィルムをベルト下部より吸着し検査に供するフィルムをベルトに密着させ検査する方法が考えられる。この方法はベルトにフィルムを吸着させるため、フィルム周囲の巻き上がり等は防止し得るが、フィルム(シート)が大きい場合には真空吸引ボックスの中央部が周辺部よりも下方に撓んで、その反射画像波形は図5のようになり焦点距離が合い難いとの欠点を有する。
【0004】
【発明が解決しようとする課題】
上記欠点を改良する目的で本発明者等は図4に示すような真空吸引ボックスに2〜5mm径の丸孔を穿った厚み3mmの金属製ラス板を天板として配設し用いたが、検査に供するフィルムが薄い場合には、該丸孔中央部に於いて微妙にフィルムが下方に撓み、その反射画像波形は図4のようになり、欠陥が存在する場合との差異が不明確となり、上述した方法の欠点を完全には解決し得なかった。
かかる知見を基礎として本発明者等は、大きさ、厚みに影響されず、常に焦点距離に問題のない、廉価で操作性に優れ、かつ精度の高いシ−ト状物の欠陥検査装置を見出すべく鋭意検討した結果、該真空吸引ボックスに敷設する天板形状を工夫し、特定位置にセンサーを配設するという簡単な方法で上記問題点が全て解決し得ることを見出し、本発明を完成するに至った。
【0005】
【課題を解決するための手段】
即ち本発明は、一定方向に移動するベルト上にシート状被検査物を載置し、これに光源より光を照射して反射散乱光をセンサーで受光し、シート状被検査物に存在する欠陥を検出する装置に於いて、(1)ベルトに通気性素材を用いること、(2)検査位置を通過するベルト下部に、ベルトの走行方向に垂直に複数の孔またはスリットを複数列設けた天板を有する真空吸引機構を配設し、検査位置を通過するシート状被検査物をベルト下部より吸引すること、(3)該センサーの撮像部(焦点)が天板に穿った孔間またはスリット間になる如く光源とセンサーが配設されてること、(4)該センサーがCCDリニアイメージセンサーまたはレーザー式検査機であり、孔またはスリットのない天板上に存在するシート状被検査物を検査すること、を特徴とするシ−ト状物の欠陥検査装置を提供するにある。
【0006】
【発明の実施の形態】
以下、本発明を図面を用いてさらに詳細に説明する。図1は本発明のシ−ト状物の欠陥検査装置を示す概略図であり、図2〜図4はベルト4と接触する真空吸引機構の天板構造を示す概略図である。図1においてシート状被検査物である偏光フィルム2は走行するベルト上に載置され検査位置Aまで搬送される。検査位置Aはベルト下部に真空吸引ボックス5と天板6よりなる真空吸引機構Bを持ち、ベルトで搬送されてきた偏光フィルムをベルト下部より吸引しベルト上に密着させ、この状態に於いて光源1から照射された光を反射散乱光としてCCDリニアイメージセンサー或いはレーザー式検査機等のセンサー3で受光し、そのセンサーからの出力信号を図示しない検出手段で検出する構造となっている。この方法に於いて欠陥はその光の明暗として検出し判断する。
【0007】
本発明に於いては真空吸引機構Bの天板6の孔構造に特徴を有する。図2及び図3は本発明に用いる天板6を示すものである。図2に示す天板6に於いてはベルト4の走行方向面に垂直に丸孔を連続的に、且つ複数列有する例である。図3はベルトの走行方向面に垂直にスリットを複数列有する例である。該孔の数、孔径、孔の形状、スリットの幅、列数等はベルト上に載置されたフィルムがベルトに密着すればよく、特に制限されないが、通常孔径5mm〜20mm、孔間隔5mm〜15mm、各列の間隔5mm〜15mmの範囲で実施すればよい。またスリットの場合にはスリットの幅5mm〜15mm、各列の間隔5mm〜15mmの範囲で実施すればよい。
【0008】
本発明に於いては各孔又は各スリットの列間Yに常にセンサーの焦点がある状態で光源1及びセンサー3をベルト4の走行方向面に垂直なラインA上に設置することを必須とする。かかる構造とすることにより、検査位置Aは常に天板6の孔或いはスリットのない板上に存在するシート状被検査物を検査するため、検査位置Aのシート状被検査物には撓みや凹凸が生じ難く、図2、図3の反射画像波形に見られる如く、画像はフラットであるため、誤認が少なく検出精度が向上する。検査位置Aは天板に形成されるいずれのスリット間Y〜Yn'或いは孔間Y〜Yn'であってもよい。
【0009】
本発明に用いるベルト4は真空吸引機構よりの吸引能がベルト上のフィルム2に達し得るものであればよく、通常厚み約0.3mm〜0.5mmのポリエチレン製の多孔質ベルトが使用される。ベルトの色は特に制限されないが通常グレーが使用される。真空吸引ボックス5の天板6とベルト4の間に抵抗を少なくする目的で厚み約2mm〜4mmのポリエチレン製の多孔質シート9を配設してもよい。また天板6の素材はステンレス、合成樹脂成形体、セラミックス等いずれでもよく、特に制限されない。
真空吸引ボックス内の真空度は通常約70mmHg〜約90mmHgの範囲で実施される。
【0010】
【発明の効果】
以上詳述した本発明によれば真空吸引機構の天板を特殊構造とし、センサーの撮像部(焦点)を特定位置に配設するのみで、何ら操作を複雑化することなく、従来公知のCCDリニアイメージセンサー等を用いた光学的検査装置の検出精度を向上せしめ得るものであり、その産業上の効果はすこぶる大である。
【図面の簡単な説明】
【図1】CCDリニアイメージセンサーを用いた光学的検査装置の概略図である。
【図2】真空吸引機構の天板の孔構造を示す概略図およびこれを用いた反射画像波形を示す。
【図3】真空吸引機構の天板の孔構造を示す概略図およびこれを用いた反射画像波形を示す。
【図4】真空吸引機構の天板の孔構造を示す概略図およびこれを用いた反射画像波形を示す。
【図5】天板のない真空吸引機構を示す概略図およびこれを用いた反射画像波形を示す。
【図6】CCDリニアイメージセンサーを用いた光学的検査装置の概略図である。
【符号の説明】
1 光源
2 シート状被検査物
3 センサー
4 ベルト
5 真空吸引ボックス
6 天板
スリット
丸孔
[0001]
BACKGROUND OF THE INVENTION
The present invention optically detects defects such as foreign matter, scratches, pinholes, etc. present in a sheet-like inspection object such as glass, resin, paper, etc. using a sensor such as a CCD linear image sensor or a laser type inspection machine. The present invention relates to an inspection device.
[0002]
[Prior art]
Conventionally, defects such as foreign matter, scratches and pinholes existing in optical films such as polarizing films and TFT color filters are irradiated with light from the light source 1 as shown in FIG. There is a method in which a CCD linear image sensor 3 receives light, an output signal from the sensor is detected by a detection means (not shown), and a defect present on the sheet is determined and detected as light contrast.
When these are inspected industrially, in a series of manufacturing processes, a sheet-like inspection object such as a film is placed on a belt moving in a certain direction, and the sensor is focused on a specific place as described above. However, these inspection methods adjust the focal length of the sensor to the scattered light reflected on the film surface, so that the film placed on the belt is bent or uneven for some reason. When such a phenomenon occurs, it is detected as a defect. Therefore, the film at the inspection position must be located at the same distance from the sensor so as not to be out of focus.
[0003]
For example, a method using a breathable material for the belt and disposing a vacuum suction box below the belt passing through the inspection position, adsorbing the film passing through the inspection position from the lower belt, and injecting the film for inspection into close contact with the belt Can be considered. This method allows the belt to adsorb the film, so it can prevent the film from rolling up around the film. However, when the film (sheet) is large, the central part of the vacuum suction box bends downward from the peripheral part and reflects it. The image waveform is as shown in FIG. 5 and has a drawback that it is difficult to adjust the focal length.
[0004]
[Problems to be solved by the invention]
For the purpose of improving the above drawbacks, the present inventors used a 3 mm thick metal lath plate having a 2-5 mm diameter round hole in a vacuum suction box as shown in FIG. When the film to be inspected is thin, the film slightly bends downward in the center of the round hole, and the reflected image waveform is as shown in FIG. 4, and the difference from the case where there is a defect becomes unclear. However, the above-mentioned drawbacks of the method could not be solved completely.
Based on such knowledge, the present inventors find a sheet-type defect inspection apparatus that is inexpensive, excellent in operability, and highly accurate, which is always unaffected by size and thickness and has no problem with the focal length. As a result of intensive studies, the present inventors have found that the above problems can be solved by a simple method of devising the shape of the top plate laid in the vacuum suction box and disposing the sensor at a specific position, thereby completing the present invention. It came to.
[0005]
[Means for Solving the Problems]
That is, according to the present invention, a sheet-like inspection object is placed on a belt that moves in a certain direction, light is irradiated from the light source, and the reflected scattered light is received by the sensor. in the device for detecting, (1) the use of a breathable material to the belt, (2) the belt lower passing the inspection position, provided a plurality of rows with a plurality of holes or slits perpendicular to the traveling direction of the belt A vacuum suction mechanism having a top plate is provided, and a sheet-like inspection object passing through the inspection position is sucked from the lower part of the belt. (3) Between the holes formed in the top plate by the imaging unit (focal point) of the sensor or Rukoto is a light source and sensor are disposed as made between the slits, (4) the sensor is a CCD linear image sensor or laser type inspection apparatus, the sheet-like object to be inspected that is present on the top plate with no holes or slits Inspecting things , Shea characterized - to provide an inspection apparatus of bets like material.
[0006]
DETAILED DESCRIPTION OF THE INVENTION
Hereinafter, the present invention will be described in more detail with reference to the drawings. FIG. 1 is a schematic view showing a sheet inspection apparatus according to the present invention, and FIGS. 2 to 4 are schematic views showing a top plate structure of a vacuum suction mechanism B in contact with a belt 4. In FIG. 1, a polarizing film 2 that is a sheet-like inspection object is placed on a traveling belt and conveyed to an inspection position A. The inspection position A has a vacuum suction mechanism B composed of a vacuum suction box 5 and a top plate 6 at the lower part of the belt, and the polarizing film conveyed by the belt is sucked from the lower part of the belt and brought into close contact with the belt. The light irradiated from 1 is received as reflected and scattered light by a sensor 3 such as a CCD linear image sensor or a laser inspection machine, and an output signal from the sensor is detected by a detection means (not shown). In this method, the defect is detected and judged as the brightness of the light.
[0007]
The present invention is characterized by the hole structure of the top plate 6 of the vacuum suction mechanism B. 2 and 3 show the top plate 6 used in the present invention. The top plate 6 shown in FIG. 2 is an example in which a plurality of rows of round holes 8 are continuously formed perpendicular to the running direction surface of the belt 4. FIG. 3 is an example having a plurality of rows of slits 7 perpendicular to the running direction surface of the belt. The number of holes, hole diameter, hole shape, slit width, number of rows, and the like are not particularly limited as long as the film placed on the belt is in close contact with the belt, but usually has a hole diameter of 5 mm to 20 mm and a hole interval of 5 mm to What is necessary is just to implement in 15 mm and the range of the space | interval 5 mm-15 mm of each row | line | column. In the case of slits, the slit width may be 5 mm to 15 mm, and the interval between rows may be 5 mm to 15 mm.
[0008]
In the present invention, it is essential to install the light source 1 and the sensor 3 on the line A perpendicular to the running direction plane of the belt 4 in a state where the focus of the sensor is always in the space Y between the holes or slits. . With such a structure, the test position A is always for inspecting the sheet-like object to be inspected present on the top plate with no holes or slits in the top plate 6, Ya deflection into a sheet inspection object inspection position A Concavities and convexities are unlikely to occur, and the images are flat as seen in the reflected image waveforms of FIGS. The inspection position A may be between any slits Y to Yn ′ or between holes Y to Yn ′ formed on the top plate.
[0009]
The belt 4 used in the present invention may be any belt as long as the suction ability from the vacuum suction mechanism can reach the film 2 on the belt, and a polyethylene porous belt having a thickness of about 0.3 mm to 0.5 mm is usually used. . The color of the belt is not particularly limited, but usually gray is used. A polyethylene porous sheet 9 having a thickness of about 2 mm to 4 mm may be disposed between the top plate 6 of the vacuum suction box 5 and the belt 4 for the purpose of reducing resistance. Moreover, the material of the top plate 6 may be any of stainless steel, synthetic resin molding, ceramics, etc., and is not particularly limited.
The degree of vacuum in the vacuum suction box is usually in the range of about 70 mmHg to about 90 mmHg.
[0010]
【The invention's effect】
According to the present invention described above in detail, the top plate of the vacuum suction mechanism has a special structure, and the image pickup unit (focal point) of the sensor is merely disposed at a specific position, and the conventional known CCD is not complicated. The detection accuracy of an optical inspection apparatus using a linear image sensor or the like can be improved, and its industrial effect is extremely great.
[Brief description of the drawings]
FIG. 1 is a schematic view of an optical inspection apparatus using a CCD linear image sensor.
FIG. 2 is a schematic diagram showing a hole structure of a top plate of a vacuum suction mechanism and a reflected image waveform using the same.
FIG. 3 is a schematic diagram showing a hole structure of a top plate of a vacuum suction mechanism and a reflected image waveform using the same.
FIG. 4 is a schematic diagram showing a hole structure of a top plate of a vacuum suction mechanism and a reflected image waveform using the same.
FIG. 5 is a schematic diagram showing a vacuum suction mechanism without a top plate and a reflection image waveform using the vacuum suction mechanism.
FIG. 6 is a schematic view of an optical inspection apparatus using a CCD linear image sensor.
[Explanation of symbols]
DESCRIPTION OF SYMBOLS 1 Light source 2 Sheet-shaped to-be-inspected object 3 Sensor 4 Belt 5 Vacuum suction box 6 Top plate 7 Slit 8 Round hole

Claims (1)

一定方向に移動するベルト上にシート状被検査物を載置し、これに光源より光を照射して反射散乱光をセンサーで受光し、シート状被検査物に存在する欠陥を検出する装置に於いて、
(1)ベルトに通気性素材を用いること、
(2)検査位置を通過するベルト下部に、ベルトの走行方向に垂直に複数の孔またはスリットを複数列設けた天板を有する真空吸引機構を配設し、検査位置を通過するシート状被検査物をベルト下部より吸引すること、
(3)該センサーの撮像部(焦点)が天板に穿った孔間またはスリット間になる如く光源とセンサーが配設されてること
(4)該センサーがCCDリニアイメージセンサーまたはレーザー式検査機であり、孔またはスリットのない天板上に存在するシート状被検査物を検査すること、
を特徴とするシ−ト状物の欠陥検査装置。
A device that places a sheet-like object on a belt that moves in a certain direction, irradiates light from the light source, receives reflected and scattered light with a sensor, and detects defects present in the sheet-like object. In
(1) Use a breathable material for the belt,
(2) the belt lower passing the inspection position, the sheet-like object to be disposed a vacuum suction mechanism having a top plate provided with a plurality of rows running side plurality of holes or slits perpendicular to the direction of the belt, pass through the inspection position Sucking the test object from the bottom of the belt
(3) Rukoto imaging unit of the sensor (focus) of the light source and sensor as will foramen or between slits bored in the top plate is arranged,
(4) The sensor is a CCD linear image sensor or a laser type inspection machine, and inspects a sheet-like inspection object existing on a top plate having no holes or slits,
A sheet defect inspection apparatus characterized by the above.
JP22377796A 1996-08-26 1996-08-26 Sheet inspection equipment Expired - Fee Related JP3677885B2 (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP22377796A JP3677885B2 (en) 1996-08-26 1996-08-26 Sheet inspection equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP22377796A JP3677885B2 (en) 1996-08-26 1996-08-26 Sheet inspection equipment

Publications (2)

Publication Number Publication Date
JPH1062146A JPH1062146A (en) 1998-03-06
JP3677885B2 true JP3677885B2 (en) 2005-08-03

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Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100788733B1 (en) * 2005-12-05 2007-12-26 에버테크노 주식회사 Apparatus and Method for Inspecting Polarizing Film
KR100788734B1 (en) * 2005-12-05 2008-01-02 에버테크노 주식회사 Polarizing Film Inspecting Apparatus and Method
KR20090002368A (en) * 2007-06-28 2009-01-09 주식회사 엔씨비네트웍스 Polarizing film inspecting apparatus of multi-step type
KR100922616B1 (en) * 2007-10-24 2009-10-21 주식회사 아바코 Film inspection system
JP5276875B2 (en) * 2008-03-31 2013-08-28 富士フイルム株式会社 Film defect inspection method and apparatus
JP2012078120A (en) * 2010-09-30 2012-04-19 Kirin Techno-System Co Ltd Container cap inspection apparatus

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