TW200711119A - Shared amplifier pixel with matched coupling capacitances - Google Patents

Shared amplifier pixel with matched coupling capacitances

Info

Publication number
TW200711119A
TW200711119A TW095119082A TW95119082A TW200711119A TW 200711119 A TW200711119 A TW 200711119A TW 095119082 A TW095119082 A TW 095119082A TW 95119082 A TW95119082 A TW 95119082A TW 200711119 A TW200711119 A TW 200711119A
Authority
TW
Taiwan
Prior art keywords
providing
coupling capacitances
shared
shared amplifier
matched coupling
Prior art date
Application number
TW095119082A
Other languages
English (en)
Chinese (zh)
Inventor
Robert M Guidash
Ravi Mruthyunjaya
wei-ze Xu
Original Assignee
Eastman Kodak Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Eastman Kodak Co filed Critical Eastman Kodak Co
Publication of TW200711119A publication Critical patent/TW200711119A/zh

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/60—Noise processing, e.g. detecting, correcting, reducing or removing noise
    • H04N25/67—Noise processing, e.g. detecting, correcting, reducing or removing noise applied to fixed-pattern noise, e.g. non-uniformity of response
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors
    • H04N25/77—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components
    • H04N25/778—Pixel circuitry, e.g. memories, A/D converters, pixel amplifiers, shared circuits or shared components comprising amplifiers shared between a plurality of pixels, i.e. at least one part of the amplifier must be on the sensor array itself

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Solid State Image Pick-Up Elements (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
TW095119082A 2005-06-01 2006-05-30 Shared amplifier pixel with matched coupling capacitances TW200711119A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US68616005P 2005-06-01 2005-06-01
US11/398,514 US7238926B2 (en) 2005-06-01 2006-04-05 Shared amplifier pixel with matched coupling capacitances

Publications (1)

Publication Number Publication Date
TW200711119A true TW200711119A (en) 2007-03-16

Family

ID=37165187

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095119082A TW200711119A (en) 2005-06-01 2006-05-30 Shared amplifier pixel with matched coupling capacitances

Country Status (7)

Country Link
US (1) US7238926B2 (enExample)
EP (1) EP1900192A2 (enExample)
JP (1) JP2008546201A (enExample)
KR (1) KR101244573B1 (enExample)
CN (1) CN101189863B (enExample)
TW (1) TW200711119A (enExample)
WO (1) WO2006130519A2 (enExample)

Families Citing this family (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7542085B2 (en) * 2003-11-26 2009-06-02 Aptina Imaging Corporation Image sensor with a capacitive storage node linked to transfer gate
US7443437B2 (en) * 2003-11-26 2008-10-28 Micron Technology, Inc. Image sensor with a gated storage node linked to transfer gate
US11282891B2 (en) 2003-11-26 2022-03-22 Samsung Electronics Co., Ltd. Image sensor with a gated storage node linked to transfer gate
US7705900B2 (en) * 2005-06-01 2010-04-27 Eastman Kodak Company CMOS image sensor pixel with selectable binning and conversion gain
JP2008205638A (ja) * 2007-02-16 2008-09-04 Texas Instr Japan Ltd 固体撮像装置及びその動作方法
US8159585B2 (en) * 2007-05-01 2012-04-17 Omnivision Technologies, Inc. Image sensor pixel with gain control
US7924333B2 (en) * 2007-08-17 2011-04-12 Aptina Imaging Corporation Method and apparatus providing shared pixel straight gate architecture
JP5187550B2 (ja) * 2007-08-21 2013-04-24 ソニー株式会社 撮像装置
US7989749B2 (en) * 2007-10-05 2011-08-02 Aptina Imaging Corporation Method and apparatus providing shared pixel architecture
JP4952601B2 (ja) * 2008-02-04 2012-06-13 日本テキサス・インスツルメンツ株式会社 固体撮像装置
US8233070B2 (en) * 2009-03-27 2012-07-31 International Business Machines Corporation Variable dynamic range pixel sensor cell, design structure and method
JP5521682B2 (ja) * 2010-02-26 2014-06-18 ソニー株式会社 固体撮像装置、固体撮像装置の駆動方法、及び、電子機器
JP2013125861A (ja) * 2011-12-14 2013-06-24 Sony Corp 固体撮像素子および電子機器
CN104113714B (zh) * 2014-07-31 2017-12-29 深圳大学 Cmos有源像素结构及图像传感器
US10190329B2 (en) 2015-03-18 2019-01-29 Jacob Kobelt Methods, systems, and assemblies for covering an end of a post
KR102356706B1 (ko) 2015-07-07 2022-01-27 삼성전자주식회사 넓은 다이나믹 레인지를 갖는 이미지 센서, 이미지 센서의 픽셀 회로 및 이미지 센서의 동작방법
JP2017085065A (ja) * 2015-10-30 2017-05-18 ルネサスエレクトロニクス株式会社 半導体装置およびその製造方法
US10103190B2 (en) * 2016-05-13 2018-10-16 Semiconductor Components Industries, Llc Imaging sensor having floating region of imaging device on one substrate electrically coupled to another floating region formed on a second substrate
US20180301484A1 (en) * 2017-04-17 2018-10-18 Semiconductor Components Industries, Llc Image sensors with high dynamic range and autofocusing hexagonal pixels
KR20200118723A (ko) * 2019-04-08 2020-10-16 삼성전자주식회사 픽셀 그룹들을 포함하는 이미지 센서 및 이를 포함하는 전자 장치

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4721380B2 (ja) * 2000-04-14 2011-07-13 キヤノン株式会社 固体撮像装置および撮像システム
JP2002050752A (ja) * 2000-08-01 2002-02-15 Canon Inc 光電変換装置およびこれを用いた撮像システム
US7382408B2 (en) * 2002-07-18 2008-06-03 Micron Technology, Inc. Varying capacitance that receives signals from sensing elements
CN1203663C (zh) * 2003-06-03 2005-05-25 北京大学 一种快闪电荷放大结构焦平面读出电路及其复位读出方法
US7859581B2 (en) * 2003-07-15 2010-12-28 Eastman Kodak Company Image sensor with charge binning and dual channel readout
JP4635191B2 (ja) * 2003-10-21 2011-02-16 国立大学法人静岡大学 超解像画素電極の配置構造及び信号処理方法
US7542085B2 (en) * 2003-11-26 2009-06-02 Aptina Imaging Corporation Image sensor with a capacitive storage node linked to transfer gate
JP4553612B2 (ja) * 2004-03-18 2010-09-29 ルネサスエレクトロニクス株式会社 撮像素子およびそれを備えた撮像装置
US7616231B2 (en) * 2005-01-06 2009-11-10 Goodrich Corporation CMOS active pixel sensor with improved dynamic range and method of operation for object motion detection
JP4518996B2 (ja) * 2005-04-22 2010-08-04 シャープ株式会社 固体撮像装置の製造方法および電子情報装置

Also Published As

Publication number Publication date
EP1900192A2 (en) 2008-03-19
WO2006130519A3 (en) 2007-02-01
US20060273240A1 (en) 2006-12-07
US7238926B2 (en) 2007-07-03
CN101189863A (zh) 2008-05-28
KR101244573B1 (ko) 2013-03-25
KR20080011679A (ko) 2008-02-05
WO2006130519A2 (en) 2006-12-07
JP2008546201A (ja) 2008-12-18
CN101189863B (zh) 2010-09-29

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