TW200708183A - Repairing method of organic electroluminescence by laser and repairing device by laser - Google Patents
Repairing method of organic electroluminescence by laser and repairing device by laserInfo
- Publication number
- TW200708183A TW200708183A TW094134408A TW94134408A TW200708183A TW 200708183 A TW200708183 A TW 200708183A TW 094134408 A TW094134408 A TW 094134408A TW 94134408 A TW94134408 A TW 94134408A TW 200708183 A TW200708183 A TW 200708183A
- Authority
- TW
- Taiwan
- Prior art keywords
- laser
- organic
- leak
- repairing
- luminous
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
- H10K71/861—Repairing
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2005226604A JP2007042498A (ja) | 2005-08-04 | 2005-08-04 | 有機elレーザリペア方法及びレーザリペア装置 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200708183A true TW200708183A (en) | 2007-02-16 |
Family
ID=37700714
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW094134408A TW200708183A (en) | 2005-08-04 | 2005-09-30 | Repairing method of organic electroluminescence by laser and repairing device by laser |
Country Status (3)
Country | Link |
---|---|
JP (1) | JP2007042498A (zh) |
CN (1) | CN1909752A (zh) |
TW (1) | TW200708183A (zh) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP5109403B2 (ja) | 2007-02-22 | 2012-12-26 | 富士通セミコンダクター株式会社 | 半導体記憶装置およびその製造方法 |
JP2009027036A (ja) | 2007-07-20 | 2009-02-05 | Fujifilm Corp | 表示装置及び欠陥画素のリペア方法 |
JP5045581B2 (ja) * | 2008-06-27 | 2012-10-10 | カシオ計算機株式会社 | 発光装置の検査方法 |
JP5228649B2 (ja) * | 2008-06-27 | 2013-07-03 | パナソニック株式会社 | 有機elパネル製造方法および製造装置 |
KR101720077B1 (ko) * | 2009-07-28 | 2017-03-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 발광 장치의 검사 방법 및 제조 방법 |
JP2012146529A (ja) * | 2011-01-12 | 2012-08-02 | Hitachi High-Technologies Corp | 薄膜表示素子の検査修正方法及び検査修正装置 |
JP5351297B2 (ja) | 2011-04-27 | 2013-11-27 | パナソニック株式会社 | 有機el素子の製造方法 |
KR20130021029A (ko) * | 2011-08-22 | 2013-03-05 | 삼성디스플레이 주식회사 | 표시 패널의 리페어 방법 및 이를 수행하기 위한 장치 |
JP5654037B2 (ja) | 2011-09-15 | 2015-01-14 | パナソニック株式会社 | 有機el素子の製造方法及び評価方法 |
US9711761B2 (en) | 2011-09-15 | 2017-07-18 | Joled Inc. | Electro luminescence panel and method for manufacturing electro luminescence panel |
KR101387996B1 (ko) | 2012-06-15 | 2014-04-22 | 한국기계연구원 | 능동형 유기 자체 발광 소자의 열적 및 비열적 복합 리페어 장치 |
CN104091901A (zh) * | 2014-06-24 | 2014-10-08 | 京东方科技集团股份有限公司 | 一种oled制备方法 |
CN104931842B (zh) * | 2015-05-25 | 2017-11-03 | 朱华兵 | 电路板电致发光检测系统及检测方法 |
Family Cites Families (8)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP2818255B2 (ja) * | 1990-05-08 | 1998-10-30 | 出光興産株式会社 | 有機エレクトロルミネッセンス素子の製造方法 |
JPH10325780A (ja) * | 1997-05-23 | 1998-12-08 | Matsushita Electric Ind Co Ltd | ディスプレイ画面検査装置 |
JP3501671B2 (ja) * | 1999-01-12 | 2004-03-02 | シャープ株式会社 | 表示装置の欠陥絵素座標特定装置 |
JP2001147178A (ja) * | 1999-11-24 | 2001-05-29 | Sharp Corp | 液晶ディスプレイパネルの検査方法及び検査装置 |
JP2002260857A (ja) * | 2000-12-28 | 2002-09-13 | Semiconductor Energy Lab Co Ltd | 発光装置の作製方法および薄膜形成装置 |
KR20030022857A (ko) * | 2001-05-15 | 2003-03-17 | 코닌클리케 필립스 일렉트로닉스 엔.브이. | 복수의 led를 포함하는 디스플레이 디바이스 |
JP4342827B2 (ja) * | 2002-04-30 | 2009-10-14 | 株式会社半導体エネルギー研究所 | アクティブマトリクス型発光装置の作製方法 |
TW577136B (en) * | 2002-10-25 | 2004-02-21 | Ritdisplay Corp | Detecting repairing system and method |
-
2005
- 2005-08-04 JP JP2005226604A patent/JP2007042498A/ja active Pending
- 2005-09-30 TW TW094134408A patent/TW200708183A/zh unknown
- 2005-11-08 CN CNA2005101200190A patent/CN1909752A/zh active Pending
Also Published As
Publication number | Publication date |
---|---|
CN1909752A (zh) | 2007-02-07 |
JP2007042498A (ja) | 2007-02-15 |
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