TW200706896A - Testing device - Google Patents

Testing device

Info

Publication number
TW200706896A
TW200706896A TW095125192A TW95125192A TW200706896A TW 200706896 A TW200706896 A TW 200706896A TW 095125192 A TW095125192 A TW 095125192A TW 95125192 A TW95125192 A TW 95125192A TW 200706896 A TW200706896 A TW 200706896A
Authority
TW
Taiwan
Prior art keywords
pin
test
section
writing
signal supplying
Prior art date
Application number
TW095125192A
Other languages
English (en)
Inventor
Tadashi Okazaki
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200706896A publication Critical patent/TW200706896A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31928—Formatter
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31903—Tester hardware, i.e. output processing circuits tester configuration

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
TW095125192A 2005-08-12 2006-07-11 Testing device TW200706896A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2005233940A JP2007047098A (ja) 2005-08-12 2005-08-12 試験装置

Publications (1)

Publication Number Publication Date
TW200706896A true TW200706896A (en) 2007-02-16

Family

ID=37757424

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095125192A TW200706896A (en) 2005-08-12 2006-07-11 Testing device

Country Status (3)

Country Link
JP (1) JP2007047098A (zh)
TW (1) TW200706896A (zh)
WO (1) WO2007020756A1 (zh)

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2008044391A1 (fr) 2006-10-05 2008-04-17 Advantest Corporation Dispositif de contrôle, procédé de contrôle et procédé de fabrication

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07104386B2 (ja) * 1984-02-10 1995-11-13 株式会社アドバンテスト 論理回路試験装置
JP2515289Y2 (ja) * 1988-11-22 1996-10-30 安藤電気株式会社 異なるステーションのデータ切換回路
US5025205A (en) * 1989-06-22 1991-06-18 Texas Instruments Incorporated Reconfigurable architecture for logic test system
US6687861B1 (en) * 2000-10-31 2004-02-03 Agilent Technologies, Inc. Memory tester with enhanced post decode

Also Published As

Publication number Publication date
WO2007020756A1 (ja) 2007-02-22
JP2007047098A (ja) 2007-02-22

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