TW200634322A - Device with a circuit for detecting an abnormal substrate - Google Patents

Device with a circuit for detecting an abnormal substrate

Info

Publication number
TW200634322A
TW200634322A TW094143705A TW94143705A TW200634322A TW 200634322 A TW200634322 A TW 200634322A TW 094143705 A TW094143705 A TW 094143705A TW 94143705 A TW94143705 A TW 94143705A TW 200634322 A TW200634322 A TW 200634322A
Authority
TW
Taiwan
Prior art keywords
dsa
connectors
circuit
detecting
board
Prior art date
Application number
TW094143705A
Other languages
Chinese (zh)
Other versions
TWI292484B (en
Inventor
Kousaku Hirano
Original Assignee
Advantest Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Advantest Corp filed Critical Advantest Corp
Publication of TW200634322A publication Critical patent/TW200634322A/en
Application granted granted Critical
Publication of TWI292484B publication Critical patent/TWI292484B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
    • G01R31/2808—Holding, conveying or contacting devices, e.g. test adapters, edge connectors, extender boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/26—Testing of individual semiconductor devices
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L22/00—Testing or measuring during manufacture or treatment; Reliability measurements, i.e. testing of parts without further processing to modify the parts as such; Structural arrangements therefor
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Manufacturing & Machinery (AREA)
  • Power Engineering (AREA)
  • General Engineering & Computer Science (AREA)
  • Testing Of Individual Semiconductor Devices (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Combinations Of Printed Boards (AREA)

Abstract

This invention provides a device for testing a semiconductor, for finding the faulty mounting of DSA or inperfact connections. The device of this invention includes a pair of DSA 10a, 10b carrying socket boards 11, and a mother board 20 provided with connectors to which connectors 14 of each socket board 11 of the pair of DSA 10a and 10b are connected. The device is provided with an ID setting board for each DSA 10a, 10b for setting an ID number for the DSA 10a, 10b and producing ID signals indicating ID numbers, a conforming circuit for detecting the conformity of the ID numbers, and a daisey chain circuit for receiving siganis from one of the connectors 21 of mother board 20 side and sequencially transmitting the signals to all connectors 21, 14 through the connectors 14 of the opposite DSA side to detect whether an output signal is present.
TW094143705A 2002-03-01 2003-02-27 Device with a circuit for detecting an abnormal substrate TWI292484B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2002056570A JP3790175B2 (en) 2002-03-01 2002-03-01 Device with substrate abnormality detection circuit

Publications (2)

Publication Number Publication Date
TW200634322A true TW200634322A (en) 2006-10-01
TWI292484B TWI292484B (en) 2008-01-11

Family

ID=27784643

Family Applications (3)

Application Number Title Priority Date Filing Date
TW096116860A TWI325060B (en) 2002-03-01 2003-02-27 Device with a circuit for detecting an abnormal substrate
TW092104151A TWI277757B (en) 2002-03-01 2003-02-27 Device with a circuit for detecting an abnormal substrate
TW094143705A TWI292484B (en) 2002-03-01 2003-02-27 Device with a circuit for detecting an abnormal substrate

Family Applications Before (2)

Application Number Title Priority Date Filing Date
TW096116860A TWI325060B (en) 2002-03-01 2003-02-27 Device with a circuit for detecting an abnormal substrate
TW092104151A TWI277757B (en) 2002-03-01 2003-02-27 Device with a circuit for detecting an abnormal substrate

Country Status (7)

Country Link
JP (1) JP3790175B2 (en)
KR (3) KR100966686B1 (en)
CN (2) CN1811479A (en)
DE (1) DE10392347T5 (en)
MY (1) MY134319A (en)
TW (3) TWI325060B (en)
WO (1) WO2003075026A1 (en)

Families Citing this family (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN100395718C (en) * 2004-03-13 2008-06-18 鸿富锦精密工业（深圳）有限公司 Motherboard function test board
KR100897349B1 (en) 2007-06-12 2009-05-15 주식회사 유니테스트 Tester for testing semiconductor device
CN101551427B (en) * 2008-03-31 2012-04-04 无锡松下冷机有限公司 Substrate detecting method
TWI385773B (en) * 2008-05-21 2013-02-11 Lefram Technology Corp Lead frame carrier and method of manufacturing the same
CN102445635B (en) * 2010-10-11 2014-12-03 中国电信股份有限公司 Quick tester for wire jumper
US8878182B2 (en) * 2011-10-12 2014-11-04 Taiwan Semiconductor Manufacturing Company, Ltd. Probe pad design for 3DIC package yield analysis
KR101316785B1 (en) 2013-07-31 2013-10-10 테스토피아 주식회사 Apparatus for changing socket board using vertical type cylinder
CN103440567A (en) * 2013-08-28 2013-12-11 杭州华三通信技术有限公司 Method and device for differentiating devices sold to different markets
KR102377694B1 (en) * 2020-07-28 2022-03-23 주식회사 에스티아이테크 A Bracket for Securing a Board and an Assembly with the Same

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4787143A (en) * 1985-12-04 1988-11-29 Tdk Corporation Method for detecting and correcting failure in mounting of electronic parts on substrate and apparatus therefor
JP3730340B2 (en) * 1996-11-20 2006-01-05 株式会社アドバンテスト Semiconductor test equipment
CN1133359C (en) * 1997-01-16 2003-12-31 松下电器产业株式会社 Component supplying method, component arrangement data forming method and electronic component mounting apparatus using methods
US6040530A (en) * 1997-12-05 2000-03-21 Hewlett-Packard Company Versatile printed circuit board for testing processing reliability
JPH11326448A (en) * 1998-05-20 1999-11-26 Advantest Corp Ic testing device
CN1240939A (en) * 1998-06-09 2000-01-12 株式会社爱德万测试 Electronic component and device testing unit
KR20000008963U (en) * 1998-10-29 2000-05-25 김영환 Semiconductor Device Package Tester with Novel Socket Adapter
JP2000310664A (en) * 1999-04-27 2000-11-07 Ando Electric Co Ltd Ic testing device and external equipment discriminating method in the same
JP3797529B2 (en) * 1999-05-20 2006-07-19 富士写真フイルム株式会社 Integrated circuit with continuity detection function
JP2001004701A (en) * 1999-06-22 2001-01-12 Advantest Corp Method for recognizing id and apparatus for recognizing id using this method

Also Published As

Publication number Publication date
TW200303990A (en) 2003-09-16
KR20040082446A (en) 2004-09-24
TWI325060B (en) 2010-05-21
KR100624060B1 (en) 2006-09-20
DE10392347T5 (en) 2005-04-07
CN1639579B (en) 2011-01-26
WO2003075026A1 (en) 2003-09-12
CN1811479A (en) 2006-08-02
KR20050121763A (en) 2005-12-27
JP2003255020A (en) 2003-09-10
KR100966686B1 (en) 2010-06-29
CN1639579A (en) 2005-07-13
KR20100050568A (en) 2010-05-13
MY134319A (en) 2007-12-31
TWI292484B (en) 2008-01-11
JP3790175B2 (en) 2006-06-28
TWI277757B (en) 2007-04-01
TW200739100A (en) 2007-10-16

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees