TW200628997A - Radiation exposure apparatus comprising a gas flushing system - Google Patents

Radiation exposure apparatus comprising a gas flushing system

Info

Publication number
TW200628997A
TW200628997A TW094142799A TW94142799A TW200628997A TW 200628997 A TW200628997 A TW 200628997A TW 094142799 A TW094142799 A TW 094142799A TW 94142799 A TW94142799 A TW 94142799A TW 200628997 A TW200628997 A TW 200628997A
Authority
TW
Taiwan
Prior art keywords
exposure apparatus
flushing system
radiation exposure
gas flushing
gas
Prior art date
Application number
TW094142799A
Other languages
English (en)
Inventor
Klaus Simon
Den Brink Enno Van
Gerardus Johannes Joseph Keijsers
Dijk Adrianus Hubertus Henricus Van
Hubertus Antonius Marinus Baijens
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of TW200628997A publication Critical patent/TW200628997A/zh

Links

Classifications

    • G—PHYSICS
    • G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70—Microphotolithographic exposure; Apparatus therefor
    • G03F7/708—Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70908—Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
    • G03F7/70933—Purge, e.g. exchanging fluid or gas to remove pollutants

Landscapes

  • Health & Medical Sciences (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Environmental & Geological Engineering (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
TW094142799A 2004-12-07 2005-12-05 Radiation exposure apparatus comprising a gas flushing system TW200628997A (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US63372704P 2004-12-07 2004-12-07
US11/036,186 US20060119811A1 (en) 2004-12-07 2005-01-18 Radiation exposure apparatus comprising a gas flushing system

Publications (1)

Publication Number Publication Date
TW200628997A true TW200628997A (en) 2006-08-16

Family

ID=36084297

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094142799A TW200628997A (en) 2004-12-07 2005-12-05 Radiation exposure apparatus comprising a gas flushing system

Country Status (7)

Country Link
US (2) US20060119811A1 (zh)
EP (1) EP1669809A3 (zh)
JP (1) JP2006186352A (zh)
KR (1) KR100749943B1 (zh)
CN (1) CN1797220A (zh)
SG (1) SG123681A1 (zh)
TW (1) TW200628997A (zh)

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JP4814610B2 (ja) * 2005-10-25 2011-11-16 株式会社ニューフレアテクノロジー 吸引補助具
IL183693A0 (en) * 2007-06-05 2007-09-20 Nova Measuring Instr Ltd Optical method and system
JP5448724B2 (ja) 2009-10-29 2014-03-19 キヤノン株式会社 露光装置及びデバイスの製造方法
NL2006243A (en) * 2010-03-19 2011-09-20 Asml Netherlands Bv A lithographic apparatus, an illumination system, a projection system and a method of manufacturing a device using a lithographic apparatus.
WO2016169692A1 (en) 2015-04-20 2016-10-27 Asml Netherlands B.V. Lithographic apparatus and method in a lithographic process
US10018920B2 (en) * 2016-03-04 2018-07-10 Taiwan Semiconductor Manufacturing Co., Ltd. Lithography patterning with a gas phase resist
US11397385B2 (en) 2016-06-17 2022-07-26 Taiwan Semiconductor Manufacturing Company, Ltd Apparatus and a method of forming a particle shield
US10788764B2 (en) * 2016-06-17 2020-09-29 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus and a method of forming a particle shield
US10168626B2 (en) * 2016-06-17 2019-01-01 Taiwan Semiconductor Manufacturing Company, Ltd. Apparatus and a method of forming a particle shield
CN107552258B (zh) * 2016-07-01 2019-06-07 江苏鲁汶仪器有限公司 气体喷射装置
CN109283797B (zh) * 2017-07-21 2021-04-30 上海微电子装备（集团）股份有限公司 物镜保护装置、物镜系统以及光刻设备
CN115701293A (zh) * 2020-06-04 2023-02-07 Asml荷兰有限公司 流体净化系统、投射系统、照射系统、光刻设备和方法
EP3923076A1 (en) * 2020-06-09 2021-12-15 ASML Netherlands B.V. Fluid purging system
CN114460814B (zh) * 2022-01-20 2024-04-02 中国科学院微电子研究所 光刻设备、气浴装置及其气浴发生器

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JP2004080052A (ja) 2003-11-04 2004-03-11 Canon Inc 露光装置、デバイスの製造方法
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Also Published As

Publication number Publication date
KR100749943B1 (ko) 2007-08-16
US7570342B2 (en) 2009-08-04
SG123681A1 (en) 2006-07-26
US20060119811A1 (en) 2006-06-08
US20060146300A1 (en) 2006-07-06
CN1797220A (zh) 2006-07-05
JP2006186352A (ja) 2006-07-13
EP1669809A2 (en) 2006-06-14
KR20060083853A (ko) 2006-07-21
EP1669809A3 (en) 2006-11-29

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