TW200521451A - Detecting and positioning method of circuit board and test mechanism - Google Patents
Detecting and positioning method of circuit board and test mechanism Download PDFInfo
- Publication number
- TW200521451A TW200521451A TW92136450A TW92136450A TW200521451A TW 200521451 A TW200521451 A TW 200521451A TW 92136450 A TW92136450 A TW 92136450A TW 92136450 A TW92136450 A TW 92136450A TW 200521451 A TW200521451 A TW 200521451A
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- TW
- Taiwan
- Prior art keywords
- positioning
- circuit board
- patent application
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- points
- Prior art date
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- 238000012360 testing method Methods 0.000 title claims abstract description 91
- 238000000034 method Methods 0.000 title claims abstract description 25
- 230000007246 mechanism Effects 0.000 title claims abstract description 19
- 238000005259 measurement Methods 0.000 claims abstract description 10
- 238000011960 computer-aided design Methods 0.000 claims abstract description 9
- 238000001514 detection method Methods 0.000 claims description 7
- 238000010586 diagram Methods 0.000 description 7
- 238000013461 design Methods 0.000 description 4
- 238000004364 calculation method Methods 0.000 description 3
- 230000000694 effects Effects 0.000 description 3
- 238000005516 engineering process Methods 0.000 description 3
- 238000003825 pressing Methods 0.000 description 3
- 230000008859 change Effects 0.000 description 2
- 230000005611 electricity Effects 0.000 description 2
- 238000012986 modification Methods 0.000 description 2
- 230000004048 modification Effects 0.000 description 2
- 230000008569 process Effects 0.000 description 2
- 230000009471 action Effects 0.000 description 1
- 238000003339 best practice Methods 0.000 description 1
- 210000004556 brain Anatomy 0.000 description 1
- 238000012937 correction Methods 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000000994 depressogenic effect Effects 0.000 description 1
- 238000011161 development Methods 0.000 description 1
- 238000006073 displacement reaction Methods 0.000 description 1
- 239000012776 electronic material Substances 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000004519 manufacturing process Methods 0.000 description 1
- 230000000149 penetrating effect Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
- 238000012552 review Methods 0.000 description 1
- 238000007790 scraping Methods 0.000 description 1
- 238000009966 trimming Methods 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW92136450A TW200521451A (en) | 2003-12-22 | 2003-12-22 | Detecting and positioning method of circuit board and test mechanism |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| TW92136450A TW200521451A (en) | 2003-12-22 | 2003-12-22 | Detecting and positioning method of circuit board and test mechanism |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| TW200521451A true TW200521451A (en) | 2005-07-01 |
| TWI297079B TWI297079B (enrdf_load_stackoverflow) | 2008-05-21 |
Family
ID=45068969
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| TW92136450A TW200521451A (en) | 2003-12-22 | 2003-12-22 | Detecting and positioning method of circuit board and test mechanism |
Country Status (1)
| Country | Link |
|---|---|
| TW (1) | TW200521451A (enrdf_load_stackoverflow) |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI449919B (zh) * | 2008-03-21 | 2014-08-21 | Electro Scient Ind Inc | 用於將電子元件測試機校準至標準值之補償工具 |
| CN112763802A (zh) * | 2019-11-04 | 2021-05-07 | 航天科工惯性技术有限公司 | 一种电阻检测装置及方法 |
| TWI732167B (zh) * | 2019-01-03 | 2021-07-01 | 和碩聯合科技股份有限公司 | 阻抗檢查的方法 |
-
2003
- 2003-12-22 TW TW92136450A patent/TW200521451A/zh not_active IP Right Cessation
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| TWI449919B (zh) * | 2008-03-21 | 2014-08-21 | Electro Scient Ind Inc | 用於將電子元件測試機校準至標準值之補償工具 |
| TWI732167B (zh) * | 2019-01-03 | 2021-07-01 | 和碩聯合科技股份有限公司 | 阻抗檢查的方法 |
| CN112763802A (zh) * | 2019-11-04 | 2021-05-07 | 航天科工惯性技术有限公司 | 一种电阻检测装置及方法 |
Also Published As
| Publication number | Publication date |
|---|---|
| TWI297079B (enrdf_load_stackoverflow) | 2008-05-21 |
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|---|---|---|---|
| MM4A | Annulment or lapse of patent due to non-payment of fees |