TWI297079B - - Google Patents

Download PDF

Info

Publication number
TWI297079B
TWI297079B TW92136450A TW92136450A TWI297079B TW I297079 B TWI297079 B TW I297079B TW 92136450 A TW92136450 A TW 92136450A TW 92136450 A TW92136450 A TW 92136450A TW I297079 B TWI297079 B TW I297079B
Authority
TW
Taiwan
Prior art keywords
positioning
test
point
patent application
adjustment
Prior art date
Application number
TW92136450A
Other languages
English (en)
Chinese (zh)
Other versions
TW200521451A (en
Inventor
Hsi Hua Hsiao
Cheng Te Chen
Wei Min Cehn
Yung Yi Lin
Original Assignee
Jet Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Jet Technology Co Ltd filed Critical Jet Technology Co Ltd
Priority to TW92136450A priority Critical patent/TW200521451A/zh
Publication of TW200521451A publication Critical patent/TW200521451A/zh
Application granted granted Critical
Publication of TWI297079B publication Critical patent/TWI297079B/zh

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
TW92136450A 2003-12-22 2003-12-22 Detecting and positioning method of circuit board and test mechanism TW200521451A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW92136450A TW200521451A (en) 2003-12-22 2003-12-22 Detecting and positioning method of circuit board and test mechanism

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW92136450A TW200521451A (en) 2003-12-22 2003-12-22 Detecting and positioning method of circuit board and test mechanism

Publications (2)

Publication Number Publication Date
TW200521451A TW200521451A (en) 2005-07-01
TWI297079B true TWI297079B (enrdf_load_stackoverflow) 2008-05-21

Family

ID=45068969

Family Applications (1)

Application Number Title Priority Date Filing Date
TW92136450A TW200521451A (en) 2003-12-22 2003-12-22 Detecting and positioning method of circuit board and test mechanism

Country Status (1)

Country Link
TW (1) TW200521451A (enrdf_load_stackoverflow)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7924033B2 (en) * 2008-03-21 2011-04-12 Electro Scientific Industries, Inc. Compensation tool for calibrating an electronic component testing machine to a standardized value
TWI732167B (zh) * 2019-01-03 2021-07-01 和碩聯合科技股份有限公司 阻抗檢查的方法
CN112763802B (zh) * 2019-11-04 2023-04-25 航天科工惯性技术有限公司 一种电阻检测装置及方法

Also Published As

Publication number Publication date
TW200521451A (en) 2005-07-01

Similar Documents

Publication Publication Date Title
US20080155846A1 (en) Micrometer-based measuring system and method of using same
CN104165717B (zh) 一种机床螺栓连接处应力检测方法
JPH02224259A (ja) 集積回路用プローブカードを検査する方法及び装置
CN205374922U (zh) 可视角测试装置
CN104359436A (zh) 关节臂式三坐标测量机、多测量模型系统及工件测量方法
CN215493962U (zh) 测试系统
TWI297079B (enrdf_load_stackoverflow)
CN108981641A (zh) 一种用于小角度测量仪器数字化检定装置的校准方法
CN100504294C (zh) 大型环形平台平面度的检测方法
CN101470181B (zh) 磁共振成像系统的测试装置
US11255652B2 (en) Methods and apparatus for determining a height of an edge portion of a product
CN111947541B (zh) 一种梯形台尺寸检测装置的检测方法
CN211528032U (zh) 折弯检测装置
JPH11183111A (ja) 膜厚変化の測定方法とその装置
CN106052618A (zh) Pcb与焊盘中心距离的测量方法及应用该方法的测量装置
CN222784423U (zh) 一种半软板弯折测试冶具
CN204388827U (zh) 厚度测量装置
CN217845867U (zh) 一种焊点推力测试装置
CN204881475U (zh) 一种角度测量装置
CN222189469U (zh) 一种角度可调的激光标定仪
JP3001110B2 (ja) 被検査基板用測定点座標検出装置
CN212031334U (zh) 一种便于更换测试角度的探针卡测定装置及关键结构
TW200419424A (en) An apparatus for testing touch panel
CN216745887U (zh) 一种多角度测量比较仪
CN114295060B (zh) 一种车载3d显示盖板用的仿形治具及显示盖板的测试方法

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees