TW200521451A - Detecting and positioning method of circuit board and test mechanism - Google Patents

Abstract

This invention relates to a detecting and positioning method of circuit board and test mechanism. It is particularly suitable for a detecting and positioning method and mechanism for a circuit board. The detecting and positioning method comprises the following procedures: Firstly, it utilizes a Computer Aided Design (CAD) graph file to set a benchmark for an under-testing board (circuit board). Further, it uses the benchmark to compute coordinate values of plural positioning points on the under-testing board. Furthermore, it computes the gap length and width of PCB trace between the under-testing points. Moreover, it automatically converts the gap length, width and dielectric constant into meter measurement parameter setting values for being stored as a file. Afterward, it transfers the meter measurement parameter to the meter for obtaining high-frequency impedance between under-testing points. Subsequently, it makes the high-frequency impedance matched with a predetermined high-frequency impedance waveform. Finally, it completes setting the gap between under-testing points. According to the coordinates of positioning points, the test mechanism configures a positioning device detected by the detecting and positioning method and the coordinate of the under-testing point. Eventually, it achieves the functions of maintaining the under-testing board balanced and not deformed. Therefore, it saves the working time and setting time.

Description

200521451 V. Description of the invention (1) [Technical field to which the invention belongs]

The present invention provides a method for detecting and positioning private circuit boards and a test mechanism for the electric circuit board, especially using computer-aided design (C Α η, η μ-a # u η D) drawing files to be tested. The coordinate values of the 及 position on the board (circuit board) and the complex number of stand-by — μ t rows ’points, and calculate the distance length of the point ^ of the point to be measured ^ Use the :: ;; parameter to get the point to be measured [prior art] + mouth pre -... frequency impedance waveform. Today 咼 Technology Electronic Information 鳘 +

The electronic products are also quite good; the development is very fast and convenient for many high-value sub-products. It is also provided here to provide users with the use of teleconferencing. Therefore, many technologies are transformed into a civilized society that will help humans move to high technology. , Audio, home appliances, electricity; production of computers, televisions, living environment to provide life around: work :: = appliances, etc., in the human life in a variety of electronic, electrical appliances for entertainment and convenience, and circuit boards, and The circuit board is provided with a type of electronic material that controls the execution of the action.

The faster the operation speed, the second high =:;?; And :, ", the product on the circuit board will be unstable or even crashed" Special 14 越 疋 重 # 'If the frequency characteristics are not good, the impedance is accurate and qualified, printed 2: It is necessary to detect whether the high frequency of the circuit on the circuit board is short-circuited, whether the electronic component circuit is conductive, and the non-conductable circuit is removed. The defective circuit board is not as good as the announcement; for: sub-products. It is a circuit board testing machine announced in 1992. It is a patent gazette dated July 1.

200521451 V. Description of the invention (2) The 912024 group can move the upper and lower circuit boards of a circuit adjustment table in the direction of the jig, and the electricity on both sides of the board can be adjusted by the entire board. The first adjustments are combined on the XY axis plane, and the adjustment table device is located in the adjustment, and the first mutual clamping and positioning can be fixed at the same time; and the pressing plate is moved to the most pressing plate and top. The above-mentioned Y-axis direction of the circuit and the inconvenience of X γ on the circuit board, such as 1, the circuit board is in the adjustment, the second adjustment 2, each ~ 蚬 on the adjustment table, the board is equipped with a test tool and a positioning On the fixture, the lower test road test point has a corner plate that can be rotated in the X-axis direction, the second further has a whole peripheral adjustment plate, on the base, the top seat and the pressure are close to the top Block relative position. The board testing machine is used to set the upper and lower sides of the plane, and the fine-tuning adjustment of the position in the direction of the measurement axis by the pressing tool and the adjustment axis has a plurality of second adjustments in the area so that the position between the boards There is a fixture set. The fixture set includes an upper plate and an upper plate to drive the upper and upper fixtures to take separate tests. It is characterized by the third and the inner locking plate and the lower plate of the lock device. When the fixture is further provided, the two adjustment and adjustment plates and the three adjustments are set, so that 'by the third position, an insurance cover is installed to position the fixture one at', so that the fixture touches the circuit downward to the first The adjustment plate and a reachable bottom plate and the plates overlap each other. The locking and locking devices are adjusted after the adjustment of the plate. The adjustment of the fixture can be fixed through the X axis and the fine adjustment of the angle. When there are many defects in use to perform alignment on the entire machine, the first adjustment plate and the third adjustment plate must be fine-tuned, which is time-consuming and labor-intensive. Replacement of a circuit board requires re-trimming

Page 7 200521451 V. Description of the invention (3) Correction, alignment 'use quite 3', adjust the adjusted fine adjustment in order 4, and adjust the adjustment table so that each adjustment plate 5 and each deviation on the adjustment table are too large Therefore, those who want to improve this industry need to improve the space. [Summary of the invention] Therefore, the invention is evaluated and tested by multiple parties. After continuous trial and error, the detection and positioning method of the test board is quickly established. The main point of the present invention is to set the positioning points and on the computer, and it is inconvenient to adjust each time. When each adjustment plate is adjusted, the entire plate is biased by one adjustment plate, and the locking device clamp is displaced. Therefore, the adjustment plate must be more restrictive than the above-mentioned problem of conventional electric appliances. All three adjustment plates are adjusted in three times. And the second adjustment must be tight and fixed, and the adjustment must be professional and strict. Road test, the same adjustment must be re-adjusted and ’lost the fixed position, prudent, knowledgeable, and investigating

The value of T is calculated in view of the amount, and the test board is to be tested and tested from the modification. The main purpose is to calculate (CAD) the length of the ce. This interstitial point is measured. By setting the coordinates of the electric map file and converting the frequency impedance, it is the industry-specific setting to set the high-frequency resistance circuit board to be measured; and the impedance value is 0. The whole board is likely to affect the adjustment. The third adjustment plate is easily offset during the tightening process. The lack of careful adjustment and testing can not be performed, that is, there are many methods to improve the collection of relevant data, accumulated over many years of experience, the reference point and the point to be measured circuit detection positioning method, test board (ie circuit The board will wait for the coordinate measurement parameters of the Australian point and get the board

200521451

The secondary purpose of the present invention is to test, plural positioning devices, and the index penetrating center mechanism include a test platform to measure a thousand mouths above and can project laser light on the test platform, and indicate by laser light on the side test platform. Positioning devices are set one by one in order to make the positioning device on the test platform become a support pad for the point to be tested and a fixed part of the positioning point, so that the board to be tested can be quickly positioned on the test platform. Another aspect of the present invention is that each of the falling pads & pads are arranged below the test point of the board to be tested, so that the board to be tested does not dent or bend during the test. [Embodiment] In order to achieve the above-mentioned object and effect, the method and positioning method adopted by the present invention's edge map shows the best practice of the present invention == The features and functions are as follows. Ye Dao Zhu Mingqi Please refer to the first and second figures, which are schematic diagrams of the inspection flow chart and the selection of reference points on the circuit board of the present invention. The steps of the method are described as follows: (A) Call the computer-aided design (c AD) drawing file on the board to be tested; (B) Use the CCD to find the reference point on the board to be tested (the positioning hole at the diagonal position of the board) (Hole position) ^ Hang the value to be tested; and set the coordinate (C) to the coordinate value of the reference point to calculate the coordinate value of the point to be measured and the positioning point; and (D) on the #board The coordinate values of the points to be measured are calculated, and

200521451 V. Description of the invention (5) The length of the T race; (E) The length of the distance between the points to be measured (T race) is converted into the measurement parameter value of the high frequency impedance; (F) Detection of the measurement The parameter value is set according to the preset high-frequency impedance waveform (G). The position of the circuit is called the electrical setting, and the position is 4, 2. The distance between point A and point C is calculated, and X is calculated. Calculated as high Sea. Complete the reference in the setup. Establish the computer brain to set the reference point (the reference point 4 1, the positioning point 4 (Tra coordinate (x coordinate · · out: length = I out: T rac measuring point 4 2 frequency) Impedance (1 e = interval operation. The setting of the points is to take the CAD design drawing on the board 4 to be tested; that is, the electrical meter (CAD) drawing file, and usually two pairs on the circuit board directly in the figure. The angular position becomes the reference. The coordinates of the reference point and 1 of the board 4 to be tested are selected on the board 4 to be tested, and the length of the board to be tested ce is measured in the figure, for example: 1, y 1) Coordinates of point B, X 2 ...... Coordinates of point D · · · · X 2-X 1 Y electronic brain software Points to be located) Measurement point 4 2 Each point to be measured 4 2 2 y 2) y 2-ye) Length = (X length square + Y length square) TDR calculated by T race) : Distance (T race) length / speed of light X medium constant opening number; length value change

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200521451 V. Description of the invention (6), so that the speculative parameter (S c a 1 e) conforms to the preset high buccal resistance ^, that is, the setting of the distance between the test points 4 and 2 on the circuit board is completed. Please refer to the third, fourth, fifth, and sixth figures, which are the three-dimensional exploded view of the preferred embodiment of the mechanism of the present invention, the three-dimensional exploded view, and the three-dimensional positioning device of the positioning device. The test platform 1 is composed of a positioning platform 1, a positioning device 2 and an indexing device 3. The test platform 1 is provided with a plurality of sequential holes i 1. The arrangement of the I-distance method is set on the test platform], the direction of the displacement adjustment, and positioning, and on the base 2 fixtures, 0 ^ ^ side is provided with a positioning member 丄 ", and the departure positioning position η is adjusted Part 2; Dagger 211, support ㈣ distant adjustment part 2 2 is to set the adjustment slot: L 2 2 1 is for the adjustment dial 2 2 ^ ', and the fixing part 2 2 3 is then fixed to the test f and set above the test platform 丄The upper f plural positioning holes 11 are internally threaded holes, and the fixing members 2 2 of the adjusting portion 2 2 can be screws, that is, the screw-shaped fixing members 2 2 3 are locked into the screw holes and the plural positioning devices 2 are respectively fixed to the test. «Wheel adjustment dial 2 of Zhouying 22 makes fixing holes " and makes the adjustment section? Adjust and shift the whole slot to the proper position, then 200521451 V. Description of the invention (7) Rotate the adjustment dial 2 2 to the positioning function, and the above-mentioned calculation can obtain the coordinate value of the board to be tested at 4 degrees For the test target device 3 to project the laser to move to the pad 2 of the index device 3, 2 pairs of fixing members located at 2 223, the positioning device 2 is fixed in position, and the coordinate values of 4 1 to be tested are also provided for each positioning device 2 Light 'and using the positioning hole 11 of the adjustment part, the positioning piece 2 1 2 of the position device 2 is the effect of placing the working arm to be measured at the speed measurement position. Please refer to the seventh, three-dimensional appearance drawing, side view scraping surface to be tested, its plate 4 is positioned, and other plates to be tested 4 are to be tested, 2 the fixing members 2 2 3 are locked into the positioning holes 1 1 The positioning device 2 is adjusted appropriately. The parameter value of the high-frequency impedance measuring instrument (TDR) is obtained, and the distance between the points to be measured is 4 and 2, and the long platform 1 is shifted to the position of the positive 4 'and the light is on the test platform 1. Position the positioning device 2 under the laser light, and support the positioning device 2 with the laser light of the index device 3, and use the adjustment unit 2 to lock the positioning hole 1 1 on the test platform i. The setting of the laser light indicating point 4 2 of the pointing device 3; and after the positioning point test platform 1 on the test board 4 is moved to the correct coordinate position, the positioning member 2 1 1 pairs the fixing member of the laser 22 located at the pointing device 3 2 2 3 is locked into the test platform 1 to complete the setting of each positioning point 41; and each setting 2 1 1 is the position of the positioning point 41 and the position of the support pad 4 2 and is available for the board 4 to be tested. By testing the platform on the 1st (as shown in Figure 7)

200521451 2 Performing detection can avoid the positioning points to be placed on the board 4 2. The board 4 can be used to perform the 4 2 and fixed map files. You can use the existing points 4 2, and 3 to recalculate the positioning mechanism to be used and the time of the test. 4 under the device 2 can be located according to the positioning point 4 1 and test the location 41 and the next batch of computer-assisted positioning points 4 1 instead of measuring the location 4 2. The test steps and positioning method 8) The test point 4 on the board 4 holds the board 4 to be tested, and the test platform 1 board 4 resets the test board 4 to be tested with a different size and the test point auxiliary design (CAD) board 4 is tested. Reading the old circuit using the indicator mounting plate 4 on the old to-be-tested platform 1 can save repeated testing. And the test of the present invention has the advantages: the support pad 2 1 2 is depressed or bent. Positions to be tested in various sizes are provided for various purposes, and the tested data to be stored is stored in the CAD design file data of the same size on the computer, and then the test points need to be read again. 4 The position of 1 has excellent practical effects. It has the following items. 1. The positioning points on the board to be tested, the calculation and setting of the points to be tested are all set by the test platform in cooperation with the index device. No manual setting is required. And more accurate, fast and short time. 2. On the test platform, use the positioning device to set the coordinate positions of each positioning point and the point to be measured. After setting, it will not shift and needs to be readjusted.

3. After setting a plurality of positioning points and test points on the test platform, the test board can be quickly positioned on the test platform for testing. After the test board is replaced, the test can be performed without recalibration. 4. The positioning device on the test platform is fixed in the positioning hole of the test platform with a fixing member. When the test board is tested, the positioning device will not produce

Page 13 200521451 V. Description of the invention (9) It is easy to deviate, not in the process, using a computer site, and to be set up. The operation is easy, but the above is the limitation of the present invention. The above-mentioned agency Yu Guanshi, the invention is the real thing, Ling issued the person's hard letter instructions according to the law, the invention is located in the test device of each calibration device to do the work, anyone has' not included in the description and drawings For the purpose of method and test, the application of the principal and interest should be in order to ensure that the “please do not shift” to ensure that the positioning points will change. Auxiliary design of CAD temple measuring points (CAD) Calculation of slot measuring points, and measuring :: = Cheng Cheng is simple, does not require professional skills; The above is only the scope of the patent of the present invention, so Fan Fan 2 For example, simple modification and equivalent structure: within the scope of this patent, all Chen Minghua should make Mingyao: road board detection positioning: mouth different: invention, in order to comply with the invention Ming, the second / pattern review committee has given permission In this case, there are any inspectors on the right and sentence bureau of the Judicial Bureau who are courageous and co-operating with each other. Page 14 i Lu 200521451 Brief description of the diagram Brief description of the diagram The first diagram is a flowchart of the detection and positioning method of the present invention. The second diagram is a schematic diagram of selecting a reference point on a circuit board of the present invention. The third figure is a three-dimensional appearance view of the testing mechanism of the present invention. The fourth figure is an exploded perspective view of the testing mechanism of the present invention. The fifth figure is an exploded perspective view of the positioning device of the present invention. The sixth figure is an exploded perspective view of a preferred embodiment of the positioning device of the present invention. The seventh figure is a three-dimensional appearance view of a use state of the present invention. The eighth figure is an exploded perspective view of the calibration and alignment of the board to be tested according to the present invention. The ninth figure is a side sectional view of the board to be tested according to the present invention. Component symbol Description Test platform Positioning hole 2 2 1 2 11 2 1 2 2 2 Positioning device base Positioning piece Support pad adjustment part 2 2 1. Adjusting slot hole 2 2 2. Adjusting turntable 2 2 3 Fixing part Index device

Page 15 200521451 Simple illustration of the diagram 4. Board to be tested 4 1, Positioning point 4 2. Point to be tested 5, Measuring part

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Claims (1)

200521451_— 6. Scope of patent application 1. A method for detecting and positioning circuit boards, the main steps are: (A) calling a computer-aided design (CAD) drawing file to retrieve the circuit on the board to be tested; (B) using CCD to find (C) Calculate the coordinate value of each test point and positioning point on the test board based on the coordinate value of the reference point; (D) Use each test point to be measured The coordinate values of the points are calculated to obtain the length of the distance between the points to be measured; (E) The length of the distance between the points to be measured is converted into the measurement parameter value of the high-frequency impedance (TDR); (F) The amount is detected Measure the parameter value to match the waveform of the preset high-frequency impedance; (G) Complete the setting operation. 2. The method for detecting and positioning a circuit board as described in item 1 of the scope of patent application, wherein the positioning point selected by the computer-aided design drawing file is the reference hole position for selecting the diagonal position of the test board to be tested. 3. The method for detecting and positioning a circuit board as described in item 2 of the scope of the patent application, wherein the positioning points selected in the computer-aided design drawing file are two points, one of which is a transmitting point and the other is a grounding point. 4. The method for detecting and positioning a circuit board as described in item 1 of the scope of patent application, wherein the positioning points selected in the computer-aided design drawing are directional and can be divided into 0 degrees, 90 degrees, 180 degrees, and 270 degrees . 5. The detection and positioning method of the circuit board as described in item 1 of the scope of patent application, Page 17 200521451_ 6. Scope of patent application Among them, the measurement parameters of high-frequency impedance (T D R): S c a 1 e = pitch length / speed of light X dielectric constant. 6. The method for detecting and positioning a circuit board as described in item 5 of the scope of patent application, wherein the dielectric constant is a constant value defined according to the material of the board to be tested. 7. A testing mechanism for a circuit board, comprising a test platform, a positioning device and an index device. The test platform is provided with a plurality of positioning devices, and an index device is provided above the plurality of positioning devices. Use the index device to specify the positions of the multiple points to be tested and the positioning points on the test platform, and set positioning devices at each position, so that the board to be tested can be quickly positioned on the test platform for testing. 8. The testing mechanism for a circuit board as described in item 7 of the scope of patent application, wherein the testing platform is provided with a plurality of positioning holes. 9. The testing mechanism for a circuit board as described in item 8 of the scope of patent application, wherein the plurality of positioning holes on the testing platform may be internally threaded holes. 10. The testing mechanism of the circuit board according to item 7 of the scope of patent application, wherein the 4-position device has a base. The base is provided with a positioning member on one side, and the other side away from the positioning member is provided. There is an adjustment section. 1 1. The testing mechanism for a circuit board as described in Item 10 of the scope of patent application, wherein the adjustment part of the base is provided with an adjustment slot and an adjustment turntable, and the adjustment turntable is provided with a fixing member extended to one side, and Further, the fixing member of the adjusting turntable can be moved and displaced in the adjusting slot. 12 2. The testing mechanism of the circuit board according to item 11 of the scope of patent application, wherein the fixing part on one side of the adjusting turntable may be a screw. 200521451 VI. Scope of patent application 1 3. The testing mechanism for circuit boards as described in item 7 of the scope of patent application, wherein the positioning device has a base, and the base is provided with a pad on one side and is far from the pad. An adjustment section is provided on the other side. 14. The testing mechanism for a circuit board as described in item 13 of the scope of patent application, wherein the adjustment part of the base is provided with an adjustment turntable, and the adjustment turntable is provided with a fixing member extended to one side. 15. The testing mechanism of the circuit board according to item 14 of the scope of patent application, wherein the fixing part on one side of the adjusting turntable may be a screw. Page 19