JP2001201304A - Beveling dimension measuring device and beveling dimension measuring method using the device - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a beveling dimension measuring device capable of measuring beveling dimension without moving a body to be measured. SOLUTION: This beveling dimension measuring device measures the beveling dimension of a body to be measured having a corner part of two sides intersecting perpendicularly to each other beveled at an angle of about 45 deg.. The measuring device is provided with a back metal having a contact surface coming into contact with two sides intersecting orthogonally of the body to be measured and a surface parallel to the beveled surface of the body to be measured, and a depth measuring device mounted on the back metal for measuring the depth by pressing a gauge head vertically to the beveled surface of the body to be measured.

Description

DETAILED DESCRIPTION OF THE INVENTION

[0001]

BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to a chamfered dimension measuring apparatus for measuring a chamfered dimension of an object to be measured by chamfering a corner having two sides crossing at a right angle at an angle of about 45 degrees.

[0002]

2. Description of the Related Art FIG.
FIG. 1 is a configuration diagram showing a conventional chamfer dimension measuring device disclosed in Japanese Patent Application Laid-Open Publication No. HEI 10-115,036. In FIG. 8, reference numeral 101 denotes an object to be measured having a chamfered surface 102. 103 is a surface plate with a smooth surface,
Reference numeral 104 denotes a contact that slides on the surface plate 103, reference numeral 105 denotes a contact surface provided on one end side of the contact 104, and reference numeral 107 denotes a linear meter that presses against a back surface 106 of the contact 104 opposite to the contact surface 105. Reference numeral 108 denotes a reference plate perpendicular to the surface plate 103.

Next, a description will be given of a measuring method when a chamfer dimension measuring device is used. Prior to the measurement, a reference point serving as a reference is set on the surface plate 103. Specifically, two sides of a reference device (not shown) having a corner portion composed of two right sides are brought into contact with the surface plate 103 and the reference plate 108, respectively.
4. Touch the tip of the contact surface 105 to the right-angled corner of the reference device,
Linear meter 10 that presses back surface 106 of contact 104
The scale of 7 is set as a reading reference point. Once the reference point is determined, one of two sides perpendicular to the surface of the DUT 101 is brought into contact with the surface plate 103 having a smooth surface, and the other side is brought into contact with a reference plate 108 perpendicular to the surface plate 103. Let them be placed. Next, the contact surface 10 of the contact 104 is placed on the chamfered surface 102 of the measured object 101.
The contact 104 on the surface plate 103 is slid so that 5 contacts. Then, when the chamfered surface 102 and the contact surface 105 are in contact with each other, the scale of the linear meter 107 that presses the back surface 106 of the contact 104 is read, and the distance that the contact 104 slides from the reference point is defined as the size of the chamfer.

[0004]

In the conventional chamfer dimension measuring apparatus as described above, it is necessary to set the measured object 101 on the surface plate 103 for measuring the chamfer dimension.

Further, in the conventional apparatus, the contact 104 is slid, and only the position where the tip of the contact surface 105 is in contact with the object to be measured is measured. However, it was not possible to detect whether the chamfer angle was 45 degrees. For this reason, in the conventional apparatus, the chamfer dimension is measured on the premise that the chamfer angle is set to 45 degrees, and there is a fear that an incorrect dimension is measured as the chamfer dimension.

Another problem is that the chamfer dimension cannot be measured when one of two sides is a curved surface such as a chamfer around a hole.

SUMMARY OF THE INVENTION The present invention has been made to solve the above-mentioned problems, and an object of the present invention is to provide a chamfer dimension measuring device capable of measuring a chamfer dimension without moving a body to be measured.

The present invention also provides a chamfer dimension measuring device capable of detecting whether or not the chamfer angle is 45 degrees.

Another object of the present invention is to provide a chamfer dimension measuring apparatus capable of measuring a chamfer dimension even when one of the two sides is a curved surface.

Another object of the present invention is to provide a chamfer dimension measuring device which can easily determine a chamfer dimension without calculation.

Another object of the present invention is to provide a method for measuring a chamfered dimension which can measure a chamfered dimension without moving an object to be measured.

[0012]

According to the present invention, there is provided a chamfer dimension measuring apparatus for measuring a chamfer dimension of an object to be measured by chamfering a corner having two sides crossing at a right angle at an angle of approximately 45 degrees. In the apparatus, a contact plate having a contact surface in contact with two sides intersecting at right angles to a measured object, and a measuring element attached to the contact plate and pressed perpendicularly to a chamfered surface of the measured object to measure a depth. It is provided with a depth measuring device.

Further, the chamfer dimension measuring apparatus according to the present invention includes a metal plate having a hole for inserting a probe at a position corresponding to at least two points in the center or both ends of the chamfered surface of the measured object. Things.

Further, in the chamfer dimension measuring device according to the present invention, the contact surface contacting one side of the contact surfaces contacting the two sides of the backing has a curved surface.

Further, the chamfer dimension measuring device according to the present invention includes a depth measuring device provided with a display unit for displaying a value obtained by dividing an actual measured value of the depth by 45 degrees sin.

The method for measuring a chamfered dimension according to the present invention is a method for measuring a chamfered dimension of an object to be measured by chamfering a corner where two sides intersect at a right angle at an angle of about 45 degrees. Contacting a metal plate with a contact surface having contact surfaces in contact with two sides intersecting at right angles to the body, and pressing the contact point perpendicular to the chamfered surface of the measured object attached to the metal plate to a depth of And the step of dividing the depth by 45 degrees sin.

[0017]

DESCRIPTION OF THE PREFERRED EMBODIMENTS Embodiment 1 FIG. 1 is a configuration diagram showing a configuration of the first embodiment of the present invention. In the drawing, reference numeral 1 denotes an object to be measured whose two corners intersecting at right angles are chamfered at an angle of 45 degrees, 2 denotes a chamfered surface of the object 1 to be measured, and 3 denotes two sides intersecting at right angles to the object 1 to be measured. Contact surface 3a that contacts
3b and a contact metal provided with a surface 3c parallel to the chamfered surface 2 of the measured object 1. Reference numeral 4 denotes a depth measuring gauge as a depth measuring device for measuring the depth of the chamfered surface 2 and displaying the measured value on a display section 4a. The measuring element 5 is inserted into a hole (not shown) provided in the pad 3. Have. Note that the tracing stylus 5 is arranged so as to be pressed perpendicularly to the chamfered surface 2.

The measuring method of the chamfer dimension measuring apparatus configured as described above will be described. FIG. 2 is an explanatory diagram illustrating the setting of the reference point according to the first embodiment. In FIG.
Reference numeral 6 denotes a reference device having a corner 7 at which two sides intersect at right angles. First, prior to the measurement, the reference device 6 is installed on the depth measuring gauge 4, and the tracing stylus 5 is pressed against the corner 7 to reset the zero point. Next, the measured object 1 is placed on the depth measuring gauge 4, the measuring element 5 is pressed against the chamfered surface 2, the numerical value of the depth measuring gauge 4 is read, and the value is divided by sin 45 degrees to calculate the chamfered dimension.

According to the present invention, it is possible to measure a chamfer dimension without moving the object 1 to be measured, for example, while being attached to a processing machine.

In the first embodiment, the depth measuring gauge is used as the depth measuring device. However, the mounting portion is configured so that the backing plate and the depth measuring device are fixed. For example, a micrometer or the like can be used.

Embodiment 2 FIG. 3 to 5 are configuration diagrams showing the configuration of the second embodiment. FIG. 3 is an explanatory diagram showing a state where the center of the chamfered surface is measured. FIG. 4 is a diagram showing one end of the chamfered surface being measured. FIG. 5 is an explanatory diagram showing a state in which the other end of the chamfered surface is being measured. In the drawing, reference numeral 8 denotes a metal plate provided with three holes into which the tracing stylus 5 of the depth measuring gauge 4 is inserted, and has a hole 8a corresponding to the center of the chamfered surface 2 and holes 8b and 8c corresponding to the ends. ing.

In the second embodiment, the depth of the center and both ends of the chamfered surface 2 is measured as shown in FIGS. Here, if the chamfered surface 2 is precisely chamfered at 45 degrees, the measured values of the depth at the center and both ends should be the same. Therefore, according to the second embodiment, it is possible to detect whether or not the chamfer angle is 45 degrees by measuring the depths of the center and both ends, respectively.

In the second embodiment, the center and both ends
Although the depth of the point is measured, it is possible to detect whether or not the chamfer angle is 45 degrees by measuring at least two points of the center and both ends.

Embodiment 3 FIG. The third embodiment measures the chamfer dimension of an object to be measured in which one of two sides crossing at right angles is a curved surface, and this embodiment shows an example in which the chamfer dimension of a hole is measured. . FIG. 6 is a front view showing the configuration of the chamfer dimension measuring device of the third embodiment, and FIG. 7 is a bottom view showing the configuration of the chamfer dimension measuring device of the third embodiment. In the drawing, reference numeral 9 denotes an object to be measured whose upper surface is flat and has a hole 10 and the periphery of the hole 10 is chamfered at an angle of 45 degrees, 9a denotes an inner wall of the hole 10 provided in the object to be measured 9, 11
Is a backing plate having one contact surface 11a formed of a curved surface, and the curved surface of the contact surface 11a has a shape along the curved surface of the inner wall 9a.

According to the third embodiment, the chamfer dimension can be measured even if one of the two sides intersecting at right angles is formed of a curved surface.

In the third embodiment, the contact surface 11a
By preparing a plurality of pads having different curved surfaces, the chamfer dimensions of holes having various curvatures can be measured.

Embodiment 4 In the above first to third embodiments, the display value of the display unit of the depth measurement gauge is an actual measurement value. However, if a value obtained by dividing the actual measurement value by sin45 degrees is displayed, the chamfer dimension can not be obtained by calculation. However, the chamfer dimensions can be read directly.

[0028]

According to the chamfer dimension measuring apparatus according to the present invention, a metal plate having a contact surface in contact with two sides perpendicular to each other to be measured, and a chamfered surface of the measured object attached to the metal plate Is provided with a depth measuring device for measuring the depth by pressing the probe vertically to the surface, so that the chamfer dimension can be measured without moving the object to be measured.

Further, according to the chamfer dimension measuring apparatus according to the present invention, the metal plate having the hole for inserting the tracing stylus at the position corresponding to at least two points at the center or at both ends of the chamfered surface of the measured object is provided. With this arrangement, it is possible to detect whether or not the chamfer angle is 45 degrees.

Further, according to the chamfer dimension measuring device according to the present invention, the contact surface contacting one of the contact surfaces contacting the two sides of the backing plate has a curved surface, so that one of the two sides is a curved surface. Even in certain cases, the chamfer dimensions can be measured.

Further, according to the chamfer dimension measuring apparatus of the present invention, since the display unit for displaying the value obtained by dividing the actual measured value of the depth by sin 45 degrees is provided, it is easy to know the chamfer dimension without calculating it. Can be.

Further, according to the chamfer dimension measuring method according to the present invention, a step of contacting a metal plate having a contact surface in contact with two sides perpendicular to each other to the object to be measured, and Measuring the depth by pressing the probe vertically to the chamfered surface of the object to be measured;
Since the step of dividing by the degree is provided, the chamfer dimension can be measured without moving the measured object.

[Brief description of the drawings]

FIG. 1 is a configuration diagram showing a configuration of a first embodiment of the present invention.

FIG. 2 is an explanatory diagram illustrating setting of a reference point according to the first embodiment;

FIG. 3 is an explanatory diagram showing a state where the center of a chamfered surface is measured.

FIG. 4 is an explanatory diagram showing a state in which one end of a chamfered surface is measured.

FIG. 5 is an explanatory diagram showing a state in which the other end of the chamfered surface is being measured.

FIG. 6 is a front view illustrating a configuration of a chamfer dimension measuring device according to a third embodiment.

FIG. 7 is a bottom view illustrating a configuration of a chamfer dimension measuring device according to a third embodiment.

FIG. 8 is a configuration diagram showing a conventional chamfer dimension measuring device.

[Explanation of symbols]

DESCRIPTION OF SYMBOLS 1 Measurement object, 2 chamfered surface, 3 buckle, 4 depth measuring gauge, 4a display part, 5 measuring element, 6 standard, 7
Corner part, 8 metal plate, 9 measured object, 10 holes, 11
Backing plate, 101 object to be measured, 102 chamfered surface, 103
Surface plate, 104 contacts, 105 contact surface, 106 back surface, 107 linear meter, 108 reference plate

Claims (5)

[Claims] 1. A chamfer dimension measuring apparatus for measuring a chamfer dimension of a measured object obtained by chamfering a corner portion where two sides intersect at a right angle at an angle of approximately 45 degrees. A contact metal having a contact surface in contact with, and a depth measuring device attached to the metal plate and measuring a depth by pressing a measuring element perpendicularly to the chamfered surface of the object to be measured. To measure chamfer dimensions. 2. The contact plate according to claim 1, further comprising a hole for inserting a tracing stylus at a position corresponding to at least two points at the center or both ends of the chamfered surface of the measured object.
The chamfer dimension measuring device described. 3. The chamfer dimension measuring device according to claim 1, wherein a contact surface contacting one side of the contact surfaces contacting two sides of the backing metal has a curved surface. 4. The depth measuring device according to claim 1, wherein the actual measured value of the depth is si.
2. The chamfer dimension measuring device according to claim 1, further comprising a display unit for displaying a value divided by n45 degrees. 5. A method for measuring a chamfered dimension of an object to be measured by chamfering a corner portion where two sides intersect at a right angle at an angle of about 45 degrees. Contacting the metal plate with a contact surface having a contact surface in contact with the measured object, and measuring the depth by pressing a measuring element perpendicular to the chamfered surface of the measured object attached to the metal plate, Dividing the depth by a sin 45 degree.