JP2014048108A - Chamfer dimension measuring apparatus - Google Patents

Abstract

PROBLEM TO BE SOLVED: To provide a chamfer dimension measuring apparatus of high practicability that is not affected by a measurement environment and can easily and precisely determine the C chamfer dimension in units of 1/100 mm.SOLUTION: The chamfer dimension measuring apparatus includes a measurement body 7 and a positioning substrate 9. The measurement body 7 includes: a spindle section including a screw part having a screw pitch set at √2/2 mm or √2/4 mm; a sleeve section 4 having, on its outer surface, a main scale part 3 displayed so as to indicate √2/2 mm as 1 mm; and a thimble section 6 having, on its outer surface, an auxiliary scale part 5 allowing reading of numerical values smaller than the minimum scale of the main scale part 3. The positioning substrate 9 includes a contact surface 8 that abuts on two orthogonal surfaces defining a C-chamfered corner part of a measuring object and is formed of two surfaces disposed in an orthogonal state, and determines a measuring position of the measurement body 7 by abutting the contact surface 8 on the two orthogonal surfaces of the measuring object.

Description

  The present invention relates to a chamfer dimension measuring device for measuring a chamfer dimension when a right-angled corner of a measurement object is chamfered.

  As a chamfer dimension measuring instrument that can easily measure a chamfer dimension when C-chamfered at a right angle corner formed by two orthogonal surfaces of a measured object, a chamfer dimension measuring instrument as shown in Patent Documents 1 and 2 is used. Has been proposed.

  The chamfer dimension measuring instrument shown in Patent Document 1 slides on a main scale having a main scale that reads about 0.707 mm as 1 mm and a measurement surface that comes into contact with the object to be measured, according to Pythagorean theorem. A moving jaw having a vernier scale corresponding to the scale and a measuring surface to be brought into contact with the object to be measured is provided to fix the moving jaw at a desired position of the main scale. The measuring surface is brought into contact, the measuring surface of the main scale is brought into contact with the chamfered surface of the object to be measured, and the chamfer dimensions can be measured by reading the main scale and the vernier scale in the same manner as a caliper. is there.

  Moreover, the chamfer dimension measuring instrument of Patent Document 2 includes a contact metal provided with a contact surface in contact with two sides intersecting at right angles to the object to be measured, and a perpendicular to the chamfered surface of the object to be measured attached to the metal pad. A depth measuring device having a display unit that displays a value obtained by dividing the actual measured value of the depth by sin 45 degrees and presses the probe to measure the depth, and the contactor is brought into contact with the object to be measured. The depth is measured by pressing a probe perpendicular to the chamfered surface of the object to be measured, and the measured chamfer dimension is calculated by dividing the measured depth by sin 45 degrees. Specifically, a dial gauge is employed for the depth measuring device, and a digital display is employed for the display unit.

JP-A-8-94303 JP 2001-201304 A

  Generally, the C-plane dimensional tolerance used for machining is ± 0.1 mm unit, and in inspection, it is necessary to accurately read and guarantee 1/10 of the intersection, that is, 1/100 mm unit.

  However, in the caliper type chamfer dimension measuring instrument of Patent Document 1, since the minimum reading value is 5/100 mm, there is a problem that the above 1/100 mm unit cannot be read accurately.

  Moreover, in the dial gauge type chamfer dimension measuring instrument of Patent Document 2, if the force that presses the measuring element fluctuates, the measuring element easily moves and the measured value is not stable, and it is difficult to hold the measured value. Since the display unit is digital, the numerical value can be easily confirmed, but it is easily affected by electromagnetic waves, and there is a concern that the reliability of measured values may be reduced when used in locations where electromagnetic waves are generated. There was a problem of being.

  The present invention solves the conventional problems as described above, and is excellent in practicality that can easily and accurately determine C chamfer dimensions in units of 1/100 mm without being affected by the measurement environment such as electromagnetic waves. An object of the present invention is to provide a chamfer dimension measuring instrument.

  The gist of the present invention will be described with reference to the accompanying drawings.

  The spindle portion 2 having the screw portion 1 with the screw pitch set to √2 / 2 mm or √2 / 4 mm, and the screw portion 1 of the spindle portion 2 are screwed together, so that √2 / 2 mm is read as 1 mm on the outer surface. A sleeve portion 4 provided with the displayed main scale portion 3 and an auxiliary scale portion 5 capable of reading a numerical value below the minimum scale of the main scale portion 3 are provided on the outer surface and connected to the spindle portion 2 to connect the sleeve portion 4. A measuring body 7 composed of a thimble portion 6 for moving the spindle portion 2 forward relative to the sleeve portion 4 by being provided so as to be rotatable, and a C-chamfered corner portion of the body 10 to be measured. An abutting surface 8 composed of two surfaces in contact with two orthogonal surfaces to be formed is provided, and the abutting surface 8 is brought into contact with the two orthogonal surfaces of the measurement object 10 to measure the measurement. The measurement position of the body 7 The positioning substrate 9 is configured to be positioned, and the abutting surface 8 of the positioning substrate 9 is brought into contact with two orthogonal surfaces that form the chamfered corners of the measured object 10 to thereby determine the positioning substrate 9. In the state where the measuring body 7 provided in the position is positioned at the measurement position, the thimble part 6 is rotated to advance the spindle part 2 whose tip part position is set to the zero point position, and the tip of the spindle part 2 is moved forward. The main scale portion 3 provided on the sleeve portion 4 and the auxiliary scale portion 5 provided on the thimble portion 6 when the portion is brought into contact with the chamfered surface 11 of the chamfered corner portion of the measured object 10. The value that can be read from the above is related to a chamfer dimension measuring device characterized in that the chamfered dimension of the chamfered corner portion of the object to be measured 10 is obtained.

  The main scale portion 3 is composed of a first scale portion 3A indicating 1 mm unit and a second scale portion 3B indicating 0.5 mm unit, and the auxiliary scale portion 5 has a scale interval of 7.2 degrees. 2. The chamfer dimension measuring instrument according to claim 1, wherein the chamfer dimension can be ascertained to a unit of 1/100 mm as a configuration in which the circumference of the thimble part 6 is equally divided by 50 intervals. Is.

  Further, one of the two surfaces of the abutting surface 8 formed by two surfaces provided in an orthogonal state is formed in a convex curved surface shape so as to form a chamfered corner portion of the measured object 10. The chamfer dimension measuring instrument according to any one of claims 1 and 2, wherein the chamfer dimension can be confirmed even if one of the two surfaces is a concave curved surface.

  Since the present invention is configured as described above, the chamfered dimension of the chamfered corner portion of the measured object can be ascertained easily, and the spindle portion serving as the measuring element is screwed to the axial direction. Since it moves forward and backward, the measurement position can be maintained without being easily displaced, so that the measurement result can be obtained with high reproducibility and high reliability.

  Furthermore, since the present invention does not use electronic equipment, it is not affected by electromagnetic waves, and therefore can be used with peace of mind without reducing the reliability of measured values even in an environment where electromagnetic waves are generated. This is a revolutionary chamfer dimension measuring instrument with excellent practicality.

  Further, in the invention described in claim 2, it becomes a chamfer dimension measuring device having a further excellent practicality capable of ascertaining a chamfer dimension to a unit of 1/100 mm.

  Further, in the invention described in claim 3, the chamfering depth of the C-chamfered corner portion of the measured object is accurate even if one of the two orthogonal surfaces forming the C-chamfered corner portion of the measured object is a concave curved surface shape. Since the height dimension can be measured, it becomes a chamfer dimension measuring device having more practicality and capable of ascertaining an accurate C chamfer dimension value.

1 is a perspective view showing Example 1. FIG. 1 is an exploded perspective view showing Example 1. FIG. FIG. 3 is an explanatory diagram illustrating a thread portion of a spindle portion according to the first embodiment. FIG. 3 is an explanatory diagram illustrating a usage state of the first embodiment. FIG. 10 is an explanatory diagram illustrating a usage state of the second embodiment. It is the figure which looked at the state of Drawing 5 from the lower side.

  An embodiment of the present invention which is considered to be suitable will be briefly described with reference to the drawings showing the operation of the present invention.

  When the contact surface 8 of the positioning base 9 is brought into contact with two orthogonal surfaces that form the chamfered corners of the measured body 10, the measurement position of the measurement body 7 provided on the positioning base 9 is positioned.

  Specifically, the tip of the spindle unit 2 aligned with the zero point position is positioned at a position corresponding to the top of the corner before chamfering that becomes the measurement position (measurement start position).

  When the thimble part 6 is rotated with the measuring body 7 positioned at the measurement position, the spindle part 2 connected to the thimble part 6 and screwed to the sleeve part 4 is screwed in the axial direction (of the spindle part 2). It advances in the direction of the rotation axis) and comes into contact with the chamfered surface 11 of the chamfered corner portion of the measured object 10.

  In this case, according to the present invention, since the screw pitch of the screw part 1 of the spindle part 2 is set to √2 / 2 mm or √2 / 4 mm, the spindle part 2 is √2 / 2 mm or √2 with one rotation of the thimble part 6. / 4mm.

  Further, since the thimble part 6 to be rotated is connected to the spindle part 2 and the spindle part 2 and the thimble part 6 are configured to rotate as a unit, the thimble part 6 itself is also rotated by the rotation operation in the same manner as the spindle part 2. The unit 6 moves forward by √2 / 2 mm or √2 / 4 mm per rotation.

  In the present invention, the main scale portion 3 provided on the outer surface of the sleeve portion 4 is displayed so that √2 / 2 mm is read as 1 mm, and the value readable from the main scale portion 3 is the moving distance of the spindle portion 2, that is, Since the depth of the chamfered portion is not shown, but the chamfered dimension of the chamfered portion is shown. When the tip of the spindle portion 2 comes into contact with the chamfered surface 11 of the measured object 10, By reading the values indicated by the main scale portion 3 provided on the outer surface of the sleeve portion 4 and the auxiliary scale portion 5 provided on the outer surface of the thimble portion 6, the value of the chamfered dimension of the C-chamfered portion is read. It becomes a chamfer dimension measuring device excellent in practicality that can confirm the chamfer dimension of the C chamfered portion very easily.

  That is, when C-chamfering the right-angled corner of the object 10 to be measured, from the Pythagorean theorem, the depth and chamfering dimension of this C-chamfered part are: For example, when a right angle portion of the measurement object 10 is chamfered with a chamfer dimension of 1 mm, the chamfered depth of the chamfered portion is √2 / 2 mm.

  The present invention utilizes the relationship between the depth of the C-chamfered portion and the chamfered dimension, and the location actually measured by the measuring body 7 is the depth of the C-chamfered portion of the measured object 10. The measured values shown, that is, the values read from the main scale portion 3 and the auxiliary scale portion 5 are not the depth of the C chamfered portion but the value of the chamfered dimension of the C chamfered portion. The chamfered dimension of the chamfered corner of the measuring body can be ascertained, and the spindle portion that becomes the measuring element moves forward and backward with respect to the axial direction by screwing, so that the measurement position is not easily displaced. Can be held, and the reproducibility of the measured value is good and a highly reliable measurement result can be obtained.

  Furthermore, the present invention reads the values indicated by the main scale part 3 and the auxiliary scale part 5 as described above, and does not use an electronic device such as a digital display. Therefore, even in an environment in which there is a problem, it is a revolutionary chamfer dimension measuring instrument with excellent practicality that it can be used with confidence without lowering the reliability of the measured numerical values.

  A first embodiment of the present invention will be described with reference to FIGS.

  When the right angle corner portion of the measurement object 10 is chamfered, the chamfered portion is chamfered into a right isosceles triangle shape. And the length of two sides with the same length of this right isosceles triangle becomes a chamfer dimension. The ratio of the length of two sides (hereinafter referred to as the hypotenuse) having the same chamfer dimension length to the other side (hereinafter referred to as the base side) is based on the Pythagorean theorem: hypotenuse: base = 1: √ In this case, the ratio of the height of the right isosceles triangle to the length of the hypotenuse is the relationship of height: hypotenuse = √2 / 2: 1.

  That is, when the right angle corner of the object to be measured 10 is chamfered, the chamfer depth (height of the right isosceles triangle) and the chamfer dimension (the hypotenuse of the right isosceles triangle) of the chamfered corner are measured. The ratio of the lengths is that a chamfered chamfered corner chamfered depth: chamfer dimension = √2 / 2: 1, and this example shows the chamfered chamfered corner chamfered depth: chamfered. Using the relationship of dimension = √2 / 2: 1, when the chamfering depth of the chamfered corner of the measurement object 10 was measured with the measurement body 7, the measurement value indicated by the measurement body 7 was C-chamfered. It is a chamfer dimension measuring device configured to show the chamfer dimension of a corner portion.

  As shown in FIG. 1, the present embodiment comprises a measuring body 7 for measuring the depth of the C-chamfered portion of the measured body 10 and a positioning base 9 for positioning the measuring position of the measuring body 7. Yes.

  First, the measuring body 7 of this embodiment will be described in detail. The measuring body 7 of this embodiment is a so-called micrometer head including a spindle portion 2, a sleeve portion 4, and a thimble portion 6, and is a general micrometer head. Similar to the meter head, by rotating the thimble part 6 connected to the spindle part 2 and rotating integrally with the spindle part 2, the spindle part 2 screwed to the sleeve part 4 is screwed and the sleeve part 4 is screwed. It is configured to move forward and backward in the axial direction.

  The general micrometer head is configured to read the moving amount of the spindle that moves forward and backward from the scale portion provided on the micrometer head. However, the measuring body 7 of this embodiment includes the main scale portion 3 and the auxiliary scale portion. The value that can be read from 5 is not the amount of movement of the spindle portion 2, but the chamfer dimension corresponding to the chamfering depth of the chamfered corner portion of the measured object 10 measured by moving the spindle portion 2, that is, The measuring body 7 of the present embodiment is configured so that the chamfered dimension of the chamfered corner portion of the measured body 10 can be directly read.

  More specifically, as shown in FIG. 2, the spindle portion 2 is composed of a measuring portion 12 and a screw portion 1 (male screw) that is screwed with a sleeve portion 4 to be described later. As shown in FIG. 3, the screw pitch is set to √2 / 4 mm.

  Further, the sleeve portion 4 is formed in a cylindrical shape, and a positioning base engaging portion (not shown) that engages with a positioning base 9 described later is provided on the tip side, and the screw portion 1 and the screw portion of the spindle portion 2 are screwed on the inner peripheral surface. The internal thread portion 13 is formed, and the internal thread portion 13 is set to a thread pitch of √2 / 4 mm, like the thread portion 1 of the spindle portion 2.

  Further, the outer peripheral surface of the sleeve portion 4 is provided with a main scale portion 3 indicating the chamfered dimension of the C-chamfered corner portion of the measured object 10, and the main scale portion 3 reads √2 / 2 mm as 1 mm. It is set as the structure displayed as follows.

  That is, the main scale portion 3 of the present embodiment is actually provided with scales at intervals of √2 / 2 mm, but it looks like the scales are provided at intervals of 1 mm as shown in FIG. 1 and FIG. The displayed configuration is used.

  The main scale part 3 will be described in detail. The main scale part 3 of the present embodiment is composed of a first main scale part 3A indicating 1 mm unit and a second main scale part 3B indicating 0.5 mm unit. The outer peripheral surface of the portion 4 is provided along the axial direction (longitudinal direction of the sleeve portion 4).

  More specifically, the main scale portion 3 has the first main scale portion 3A engraved on the upper side with the reference line 3C as a boundary, and the first main scale portion 3A and the half scale portion are shifted on the lower side. The second main scale portion 3B is engraved and the scale of the second main scale portion 3B located in the middle between the scales of the first main scale portion 3A is configured to indicate 0.5 mm units. The scale portion 3 is configured to be able to read the chamfered dimension of the chamfered corner portion of the measured object 10 to a unit of 0.5 mm.

  Further, the thimble portion 6 is formed in a cylindrical shape and has a tapered surface at the tip portion, and an auxiliary scale that can read a numerical value below the minimum scale of the main scale portion 3 described above on the tapered surface of the tip portion. The part 5 is provided.

  The auxiliary scale part 5 of the present embodiment has a scale interval of 7.2 degrees, that is, the scales from 0 to 49 are arranged in the circumferential direction of the thimble part 6 so that the circumference of the thimble part 6 is equally divided into 50 parts. By reading the value indicated by the main scale portion 3 and the value indicated by the auxiliary scale portion 5 as a configuration arranged at equal intervals along the chamfering dimension, the chamfer dimension can be directly read to a unit of 1/100 mm. It is composed.

  That is, when the measuring body 7 of the present embodiment rotates the thimble part 6 once, the spindle part 2 and the thimble part 6 move forward by √2 / 4 mm with respect to the sleeve part 4 to rotate the thimble part 6 twice. The thimble portion 6 moves forward by √2 / 2 mm by one graduation, and the main graduation portion 3 and the auxiliary graduation portion 5 are read. Thus, the configuration is such that the chamfered dimensions of the chamfered corners of the measurement object 10 can be read directly.

  In the present embodiment, as described above, the screw pitch of the spindle portion 2 and the sleeve portion 4 is set to √2 / 4 mm. However, the screw pitch may be set to √2 / 2 mm. By rotation, the spindle portion 2 and the thimble portion 6 advance by √2 / 2 mm, and advance on the main scale portion 3 by one scale. Further, when the screw pitch is set to √2 / 2 mm, the auxiliary scale part 5 of the thimble part 6 has a scale interval of 3.6 degrees, that is, the circumference of the thimble part 6 is divided into 100 equal parts, It is good to set it as the structure which arrange | positioned the scale to 0-99 at equal intervals along the circumferential direction of the thimble part 6. FIG.

  Next, the positioning substrate 9 of this embodiment will be described in detail. As shown in FIG. 3, the positioning substrate 9 of this embodiment has two orthogonal surfaces that form the chamfered corners of the measured object 10. A measuring surface of the measuring body 7 by bringing the contacting surface 8 into contact with the two orthogonal surfaces of the object to be measured 10. It is configured to be positioned.

  More specifically, it is composed of a block body formed in a square shape or an L shape, and a contact surface 8 consisting of two surfaces provided in the orthogonal state is formed on the inner surface side, and the outer surface side corner portion is A flat portion is formed by chamfering, and a sleeve engaging hole into which the measuring body 7, specifically, a positioning base engaging portion of the sleeve portion 4 can be inserted and disposed is formed in the flat portion. A spindle through hole 15 is formed which communicates with the hole and can penetrate the spindle portion 2 of the measuring body 7 inserted and arranged from the outer surface side to the inner surface side.

  Furthermore, when the tip of the spindle portion 2 of the measuring body 7 is adjusted to the zero point position on the inner corner where the two surfaces forming the contact surface 8 are orthogonal to the inner surface on which the contact surface 8 is formed. In this configuration, the concave portion 14 in which the corner of the zero point adjusting block used in the above can be disposed is formed.

  Reference numeral 16 denotes a fixing screw 16 for fixing the measuring body 7 inserted and disposed in the sleeve engaging hole. In this embodiment, the position of the measuring body 7 can be freely adjusted by loosening the fixing screw 16. When the zero point position of the tip of the spindle part 2 of the measuring body 7 is adjusted, the fixing screw 16 is loosened.

  Since the present embodiment is configured as described above, the following actions and effects are exhibited.

  When measuring the chamfered dimension of the chamfered corner portion of the measured object 10 using this embodiment, the positioning substrate 9 is brought into contact with two orthogonal surfaces forming the chamfered corner portion of the measured object 10. By bringing the surface 8 into contact, the measurement position of the measurement body 7 provided on the positioning substrate 9 can be positioned.

  When the thimble part 6 is rotated with the measuring body 7 positioned at the measurement position, the spindle part 2 connected to the thimble part 6 and screwed to the sleeve part 4 is screwed in the axial direction (of the spindle part 2). It advances in the direction of the rotation axis) and comes into contact with the chamfered surface 11 of the chamfered corner portion of the measured object 10.

  At this time, since the screw pitch of the screw portion 1 of the spindle portion 2 is set to √2 / 4 mm, the spindle portion 2 advances by √2 / 4 mm as the thimble portion 6 is rotated once.

  Further, since the thimble part 6 to be rotated is connected to the spindle part 2 and the spindle part 2 and the thimble part 6 are configured to rotate together, the thimble part 6 itself is also rotated, so that the spindle part As in the case of 2, the thimble part 6 moves forward by √2 / 4 mm per rotation.

  Further, the main scale portion 3 provided on the outer surface of the sleeve portion 4 is displayed so that √2 / 2 mm is read as 1 mm, and the value that can be read from the main scale portion 3 is the moving distance of the spindle portion 2, that is, the chamfered portion The chamfered dimension of the chamfered portion is not shown, but the sleeve portion when the tip of the spindle 2 abuts the chamfered surface 11 of the measured object 10 is shown. By reading the values indicated by the main scale portion 3 provided on the outer surface 4 and the auxiliary scale portion 5 provided on the outer surface of the thimble portion 6, the value of the chamfered dimension of the C chamfered portion can be read, which is extremely easy. It becomes a chamfer dimension measuring device excellent in practicality capable of ascertaining the chamfer dimension of the chamfered portion.

  Moreover, since the spindle portion that becomes the measuring element moves forward and backward with respect to the axial direction by screwing, the measuring position can be held without being easily displaced, and the reproducibility of the measured value is good and the reliability is high. Measurement results can be obtained.

  Furthermore, since the present embodiment reads the values indicated by the main scale portion 3 and the auxiliary scale portion 5 as described above and does not use an electronic device such as a digital display, it is not affected by electromagnetic waves. Even in an environment where electromagnetic waves are generated, it is a revolutionary chamfer dimension measuring instrument with excellent practicality that can be used with peace of mind without reducing the reliability of measured values.

  A second embodiment of the present invention will be described with reference to FIGS.

  In this embodiment, in the first embodiment, either one of the two surfaces of the two contact surfaces 8 provided in an orthogonal state is formed into a convex curved surface, and the C of the object to be measured 10 is formed. This is a case where the chamfer dimension can be confirmed even if one of two orthogonal surfaces forming a chamfered corner is a concave curved surface.

  Specifically, as shown in FIGS. 5 and 6, the contact surface 8 of the positioning base 9 has a configuration in which one surface is a flat surface and the other surface is a curved surface having a semi-cylindrical cross section.

  Further, in this embodiment, as shown in FIG. 5, when measuring the chamfered dimension of the chamfered corner portion inside the donut-shaped object to be measured 10, a fixing tool for fixing the positioning base 9 to the object to be measured 10. 17 is configured to be detachable.

  The fixture 17 includes a shaft portion 18 and an abutment block 19. The abutment block 19 has one surface formed into a curved surface having a semi-cylindrical cross section, and the other surface on the opposite side is flat. When measuring the chamfered dimensions of the chamfered corners inside the donut-shaped object 10 as shown in FIG. 6, the curved surface is brought into contact with the donut-shaped object 10 as shown in FIG. When measuring the chamfered dimension of the corner portion chamfered on the outer side of 10, it is configured to use a flat surface in contact.

  Other configurations are the same as those of the first embodiment.

  The present invention is not limited to the first and second embodiments, and the specific configuration of each component can be designed as appropriate.

DESCRIPTION OF SYMBOLS 1 Screw part 2 Spindle part 3 Main scale part 4 Sleeve part 5 Auxiliary scale part 6 Thimble part 7 Measuring body 8 Contact surface 9 Positioning base | substrate
10 DUT
11 Chamfer

Claims (3)

  A main scale which is displayed so that √2 / 2 mm is read as 1 mm on the outer surface of a spindle portion having a screw portion with a screw pitch set to √2 / 2 mm or √2 / 4 mm, and screwed with the screw portion of the spindle portion. A sleeve portion provided with a portion and an auxiliary scale portion capable of reading a numerical value below the minimum scale of the main scale portion are provided on the outer surface and connected to the spindle portion so as to be freely rotatable on the sleeve portion. Thus, a measuring body constituted by a thimble portion that advances the spindle portion relative to the sleeve portion and two orthogonal surfaces that are in contact with two orthogonal surfaces that form a chamfered corner portion of the measured object are provided. A positioning base having a contact surface comprising a surface and configured to position the measurement position of the measurement body by contacting the contact surfaces with the two orthogonal surfaces of the measurement object The contact surface of the positioning substrate is brought into contact with two orthogonal surfaces forming the chamfered corners of the measured body, and the measurement body provided on the positioning substrate is positioned at the measurement position. Rotating the thimble part to advance the spindle part whose tip part position is set to the zero point position, and abutting the tip part of the spindle part to the chamfered chamfered surface of the object to be measured The value that can be read from the main scale portion provided in the sleeve portion and the auxiliary scale portion provided in the thimble portion when being made to be the chamfer dimension of the chamfered corner portion of the measured object A chamfer dimension measuring instrument characterized by the above.   The main graduation part is composed of a first graduation part indicating 1 mm unit and a second graduation part indicating 0.5 mm unit, and the auxiliary graduation part has a graduation interval of 7.2 degrees. The chamfer dimension measuring instrument according to claim 1, wherein the chamfer dimension is configured to be ascertained to a unit of 1/100 mm as a configuration in which the circumference is divided into 50 equal parts.   One of the two surfaces of the abutting surface formed in two orthogonal states is formed into a convex curved surface shape, and two orthogonal surfaces forming a chamfered corner of the measured object The chamfer dimension measuring instrument according to any one of claims 1 and 2, wherein the chamfer dimension can be ascertained even if one surface is a concave curved surface.

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