TW200515440A - Screening method for laminated ceramic capacitors - Google Patents

Screening method for laminated ceramic capacitors

Info

Publication number
TW200515440A
TW200515440A TW093128660A TW93128660A TW200515440A TW 200515440 A TW200515440 A TW 200515440A TW 093128660 A TW093128660 A TW 093128660A TW 93128660 A TW93128660 A TW 93128660A TW 200515440 A TW200515440 A TW 200515440A
Authority
TW
Taiwan
Prior art keywords
direct
current voltage
screening method
laminated ceramic
applying
Prior art date
Application number
TW093128660A
Other languages
English (en)
Other versions
TWI329327B (en
Inventor
Kazunori Ito
Yuusaku Horie
Kazuyuki Hasebe
Original Assignee
Tdk Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tdk Corp filed Critical Tdk Corp
Publication of TW200515440A publication Critical patent/TW200515440A/zh
Application granted granted Critical
Publication of TWI329327B publication Critical patent/TWI329327B/zh

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01M—PROCESSES OR MEANS, e.g. BATTERIES, FOR THE DIRECT CONVERSION OF CHEMICAL ENERGY INTO ELECTRICAL ENERGY
    • H01M4/00—Electrodes
    • H01M4/02—Electrodes composed of, or comprising, active material
    • H01M4/24—Electrodes for alkaline accumulators
    • H01M4/26—Processes of manufacture
    • H01M4/30—Pressing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G4/00—Fixed capacitors; Processes of their manufacture
    • H01G4/30—Stacked capacitors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
    • G01R31/64—Testing of capacitors
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
    • H01G13/00—Apparatus specially adapted for manufacturing capacitors; Processes specially adapted for manufacturing capacitors not provided for in groups H01G4/00 - H01G11/00
    • Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
    • Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
    • Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
    • Y02E60/10—Energy storage using batteries

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • General Chemical & Material Sciences (AREA)
  • Fixed Capacitors And Capacitor Manufacturing Machines (AREA)
  • Ceramic Capacitors (AREA)
TW093128660A 2003-09-25 2004-09-22 Screening method for laminated ceramic capacitors TWI329327B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP2003334140A JP3859079B2 (ja) 2003-09-25 2003-09-25 積層セラミックコンデンサのスクリーニング方法

Publications (2)

Publication Number Publication Date
TW200515440A true TW200515440A (en) 2005-05-01
TWI329327B TWI329327B (en) 2010-08-21

Family

ID=34373148

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093128660A TWI329327B (en) 2003-09-25 2004-09-22 Screening method for laminated ceramic capacitors

Country Status (5)

Country Link
US (1) US7199590B2 (zh)
JP (1) JP3859079B2 (zh)
KR (1) KR100877041B1 (zh)
CN (1) CN100460884C (zh)
TW (1) TWI329327B (zh)

Families Citing this family (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP4853316B2 (ja) * 2007-02-13 2012-01-11 Ｔｄｋ株式会社 電子部品の製造方法
US7701231B2 (en) * 2007-03-20 2010-04-20 Cummins Filtration Ip, Inc Apparatus, system, and method for detecting cracking within an aftertreatment device
CN102253089B (zh) * 2011-04-27 2013-01-02 西安交通大学 高压陶瓷电容器质量缺陷水平的非破坏检测和评价的方法
WO2014024538A1 (ja) 2012-08-07 2014-02-13 株式会社村田製作所 積層セラミックコンデンサおよび積層セラミックコンデンサの製造方法
CN104070023B (zh) * 2014-06-26 2016-03-02 上海仪器仪表研究所 用于电容器高压分选的灭弧装置
CN109828152B (zh) * 2019-01-28 2021-12-03 东莞市硅翔绝缘材料有限公司 电池加热片的自动化测试设备
CN115178501B (zh) * 2022-07-12 2024-08-27 中国振华(集团)新云电子元器件有限责任公司(国营第四三二六厂) 一种高可靠固体电解质钽电容器的筛选方法
CN116609631A (zh) * 2023-05-26 2023-08-18 中国人民解放军陆军装甲兵学院 一种陶瓷电容容值筛选装置、筛选方法以及测量方法

Family Cites Families (15)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US647617A (en) * 1899-04-29 1900-04-17 Gustav Schuenemann Electric gas-lighting device.
JP2760263B2 (ja) * 1993-08-20 1998-05-28 株式会社村田製作所 セラミックコンデンサの初期故障品のスクリーニング方法
JP3144224B2 (ja) * 1994-06-14 2001-03-12 株式会社村田製作所 セラミックコンデンサのスクリーニング方法
JPH09205037A (ja) 1996-01-24 1997-08-05 Matsushita Electric Ind Co Ltd 積層セラミックコンデンサのスクリーニング方法
JPH10308330A (ja) * 1997-05-08 1998-11-17 Matsushita Electric Ind Co Ltd 積層セラミックコンデンサのスクリーニング方法
JP3653987B2 (ja) * 1998-06-01 2005-06-02 株式会社村田製作所 積層セラミックコンデンサの絶縁抵抗不良選別方法
JP2000150328A (ja) 1998-11-17 2000-05-30 Tdk Corp 積層セラミックコンデンサのスクリーニング方法
US6469517B1 (en) * 1998-11-25 2002-10-22 Murata Manufacturing Co., Ltd. Sorting method of monolithic ceramic capacitors based on insulation resistance
JP3620636B2 (ja) * 1998-11-25 2005-02-16 株式会社村田製作所 積層セラミックコンデンサの選別方法
JP2000208380A (ja) * 1999-01-18 2000-07-28 Murata Mfg Co Ltd 積層セラミックコンデンサの選別方法
JP3173483B2 (ja) * 1998-12-04 2001-06-04 株式会社村田製作所 コンデンサの良否判別方法
JP3411848B2 (ja) 1999-03-08 2003-06-03 ティーディーケイ株式会社 積層セラミックコンデンサおよびその製造方法と検査方法
JP4008173B2 (ja) * 2000-01-25 2007-11-14 株式会社 東京ウエルズ 蓄電器の絶縁抵抗測定方法および絶縁抵抗測定装置
JP2003059784A (ja) * 2001-08-09 2003-02-28 Murata Mfg Co Ltd 積層セラミックコンデンサの選別方法
JP3633532B2 (ja) * 2001-08-30 2005-03-30 株式会社村田製作所 チップ型電子部品の検査方法および検査装置

Also Published As

Publication number Publication date
TWI329327B (en) 2010-08-21
JP3859079B2 (ja) 2006-12-20
JP2005101355A (ja) 2005-04-14
US7199590B2 (en) 2007-04-03
KR20050030581A (ko) 2005-03-30
CN100460884C (zh) 2009-02-11
US20050068711A1 (en) 2005-03-31
CN1601290A (zh) 2005-03-30
KR100877041B1 (ko) 2008-12-31

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees