TW200509672A - CMOS image sensor having high speed sub sampling - Google Patents

CMOS image sensor having high speed sub sampling

Info

Publication number
TW200509672A
TW200509672A TW093112920A TW93112920A TW200509672A TW 200509672 A TW200509672 A TW 200509672A TW 093112920 A TW093112920 A TW 093112920A TW 93112920 A TW93112920 A TW 93112920A TW 200509672 A TW200509672 A TW 200509672A
Authority
TW
Taiwan
Prior art keywords
image sensor
high speed
sub sampling
cmos image
speed sub
Prior art date
Application number
TW093112920A
Other languages
English (en)
Inventor
Hongli Yang
Xinping He
Original Assignee
Omnivision Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Omnivision Tech Inc filed Critical Omnivision Tech Inc
Publication of TW200509672A publication Critical patent/TW200509672A/zh

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N3/00—Scanning details of television systems; Combination thereof with generation of supply voltages
    • H04N3/10—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical
    • H04N3/14—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices
    • H04N3/15—Scanning details of television systems; Combination thereof with generation of supply voltages by means not exclusively optical-mechanical by means of electrically scanned solid-state devices for picture signal generation
    • H04N3/155—Control of the image-sensor operation, e.g. image processing within the image-sensor
    • H04N3/1562—Control of the image-sensor operation, e.g. image processing within the image-sensor for selective scanning, e.g. windowing, zooming
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/42—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by switching between different modes of operation using different resolutions or aspect ratios, e.g. switching between interlaced and non-interlaced mode
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/40—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled
    • H04N25/46—Extracting pixel data from image sensors by controlling scanning circuits, e.g. by modifying the number of pixels sampled or to be sampled by combining or binning pixels
    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
    • H04N25/00—Circuitry of solid-state image sensors [SSIS]; Control thereof
    • H04N25/70—SSIS architectures; Circuits associated therewith
    • H04N25/76—Addressed sensors, e.g. MOS or CMOS sensors

Landscapes

  • Engineering & Computer Science (AREA)
  • Multimedia (AREA)
  • Signal Processing (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Transforming Light Signals Into Electric Signals (AREA)
TW093112920A 2003-06-04 2004-05-07 CMOS image sensor having high speed sub sampling TW200509672A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/454,913 US20040246354A1 (en) 2003-06-04 2003-06-04 CMOS image sensor having high speed sub sampling

Publications (1)

Publication Number Publication Date
TW200509672A true TW200509672A (en) 2005-03-01

Family

ID=33159559

Family Applications (1)

Application Number Title Priority Date Filing Date
TW093112920A TW200509672A (en) 2003-06-04 2004-05-07 CMOS image sensor having high speed sub sampling

Country Status (4)

Country Link
US (1) US20040246354A1 (zh)
EP (1) EP1484912A3 (zh)
CN (1) CN1591893A (zh)
TW (1) TW200509672A (zh)

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JP2002330349A (ja) * 2001-04-26 2002-11-15 Fujitsu Ltd Ｘｙアドレス型固体撮像装置
US7154075B2 (en) * 2003-11-13 2006-12-26 Micron Technology, Inc. Method and apparatus for pixel signal binning and interpolation in column circuits of a sensor circuit
KR100994993B1 (ko) 2004-03-16 2010-11-18 삼성전자주식회사 서브 샘플링된 아날로그 신호를 평균화하여 디지털 변환한영상신호를 출력하는 고체 촬상 소자 및 그 구동 방법
TWI256840B (en) * 2004-03-16 2006-06-11 Samsung Electronics Co Ltd Method and circuit for performing correlated double sub-sampling (CDSS) of pixels in an active pixel sensor (APS) array
JP4421353B2 (ja) * 2004-04-01 2010-02-24 浜松ホトニクス株式会社 固体撮像装置
JP2006014316A (ja) * 2004-06-22 2006-01-12 Samsung Electronics Co Ltd サブサンプリングされたアナログ信号を平均化する改善された固体撮像素子及びその駆動方法
KR100656666B1 (ko) 2004-09-08 2006-12-11 매그나칩 반도체 유한회사 이미지 센서
EP1659778A1 (en) * 2004-11-23 2006-05-24 Dialog Semiconductor GmbH A column averaging/row binning circuit for image sensor resolution adjustment in lower intensity light environment
EP1659776A1 (en) * 2004-11-23 2006-05-24 Dialog Semiconductor GmbH An image sensor having resolution adjustment employing an analog column averaging/row averaging for high intensity light or row binning for low intensity light
US7548261B2 (en) * 2004-11-30 2009-06-16 Digital Imaging Systems Gmbh Column averaging/row averaging circuit for image sensor resolution adjustment in high intensity light environment
KR100674957B1 (ko) * 2005-02-23 2007-01-26 삼성전자주식회사 임의의 서브-샘플링 레이트로 아날로그 신호를 평균화하여서브-샘플링하는 고체 촬상 소자 및 그 구동 방법
JP4534804B2 (ja) * 2005-03-09 2010-09-01 ソニー株式会社 撮像デバイス
EP2031869A1 (en) * 2007-08-30 2009-03-04 Thomson Licensing Image sensor with vertical scan conversion
US7999870B2 (en) * 2008-02-01 2011-08-16 Omnivision Technologies, Inc. Sampling and readout of an image sensor having a sparse color filter array pattern
JP4659868B2 (ja) * 2008-09-19 2011-03-30 キヤノン株式会社 固体撮像装置および撮像システム
KR101195389B1 (ko) * 2010-11-01 2012-10-30 에스케이하이닉스 주식회사 서브 샘플링 기능을 구비한 이미지 센서
US20140103191A1 (en) * 2012-10-12 2014-04-17 Samsung Electronics Co., Ltd. Sensing methods for image sensors
WO2014192223A1 (ja) * 2013-05-29 2014-12-04 パナソニックＩｐマネジメント株式会社 撮像装置および撮像方法
US9584745B2 (en) * 2013-11-11 2017-02-28 Semiconductor Components Industries, Llc Image sensors with N-row parallel readout capability
JP2015103958A (ja) * 2013-11-25 2015-06-04 ルネサスエレクトロニクス株式会社 撮像装置
US9946907B2 (en) * 2014-05-20 2018-04-17 Symbol Technologies, Llc Compact imaging module and imaging reader for, and method of, detecting objects associated with targets to be read by image capture
US20180146149A1 (en) 2016-11-21 2018-05-24 Samsung Electronics Co., Ltd. Event-based sensor, user device including the same, and operation method of the same
US10218923B2 (en) 2017-02-17 2019-02-26 Semiconductor Components Industries, Llc Methods and apparatus for pixel binning and readout
CN110278390A (zh) * 2018-03-15 2019-09-24 清华大学深圳研究生院 一种改进型图像传感器读取方法
US11082643B2 (en) * 2019-11-20 2021-08-03 Waymo Llc Systems and methods for binning light detectors
US11902682B2 (en) 2020-05-29 2024-02-13 Uti Limited Partnership Amplitude modulated pixel setup for high-speed readout of CMOS image sensors

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5949483A (en) * 1994-01-28 1999-09-07 California Institute Of Technology Active pixel sensor array with multiresolution readout
US5965871A (en) * 1997-11-05 1999-10-12 Pixart Technology, Inc. Column readout multiplexer for CMOS image sensors with multiple readout and fixed pattern noise cancellation
US6366320B1 (en) * 1997-12-08 2002-04-02 Intel Corporation High speed readout architecture for analog storage arrays
US6693270B2 (en) * 1998-03-16 2004-02-17 Silicon Video, Inc. Current mode analog signal multiplexing bus and a method thereof
JP2916620B1 (ja) * 1998-03-19 1999-07-05 東京大学長 サンプリング制御機構搭載型イメージセンサ
US6888568B1 (en) * 1999-08-19 2005-05-03 Dialog Semiconductor Gmbh Method and apparatus for controlling pixel sensor elements
US6519371B1 (en) * 1999-09-30 2003-02-11 California Institute Of Technology High-speed on-chip windowed centroiding using photodiode-based CMOS imager
EP1356665A4 (en) * 2000-11-27 2006-10-04 Vision Sciences Inc CMOS IMAGE SENSOR WITH PROGRAMMABLE RESOLUTION
JP2002320235A (ja) * 2001-04-19 2002-10-31 Fujitsu Ltd 空間解像度の低下を抑えて縮小画像信号を生成するｃｍｏｓイメージセンサ

Also Published As

Publication number Publication date
EP1484912A3 (en) 2007-03-21
EP1484912A2 (en) 2004-12-08
US20040246354A1 (en) 2004-12-09
CN1591893A (zh) 2005-03-09

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