TW200504791A - Substrate processing device of transporting type - Google Patents
Substrate processing device of transporting typeInfo
- Publication number
- TW200504791A TW200504791A TW092120389A TW92120389A TW200504791A TW 200504791 A TW200504791 A TW 200504791A TW 092120389 A TW092120389 A TW 092120389A TW 92120389 A TW92120389 A TW 92120389A TW 200504791 A TW200504791 A TW 200504791A
- Authority
- TW
- Taiwan
- Prior art keywords
- water
- substrate
- stream side
- bubble
- processing section
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67046—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly scrubbing means, e.g. brushes
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67155—Apparatus for manufacturing or treating in a plurality of work-stations
- H01L21/67161—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers
- H01L21/67173—Apparatus for manufacturing or treating in a plurality of work-stations characterized by the layout of the process chambers in-line arrangement
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Cleaning By Liquid Or Steam (AREA)
Abstract
In a substrate processing device of transporting type performing the etching processing etc., the substrate (10) sequentially passes through a drug-fluid processing section (40) and a water-washing section (50) etc., its purpose is to prevent the occurrence of the spots at the bubble-jet processing section (54) mounted in the water-washing section (50), and at the same time to prevent the drying of the substrate (10). In order to attain this purpose, a shield-plate for preventing the mist sputtering is mounted at the up-stream side and the down-stream side of two fluid-nozzle rows (56) for performing the bubble-jet processing. At the down-stream side of the shield-plate located at least at the most down-stream side among several shield-plates, a water-supply means (58) supplying the cleansing water to the surface of the substrate (10) is mounted. A separating wall (52) is provided to separate the bubble-jet processing section (54) from the next processing section (55). At the down-stream side of the separating wall (52), a water-supply means (58) supplying the cleansing water to the surface of the substrate (10) is mounted.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2002/001684 WO2003071594A1 (en) | 2002-02-25 | 2002-02-25 | Carrier type substrate processing device |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI227035B TWI227035B (en) | 2005-01-21 |
TW200504791A true TW200504791A (en) | 2005-02-01 |
Family
ID=27742310
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW092120389A TWI227035B (en) | 2002-02-25 | 2003-07-25 | Substrate processing device of transporting type |
Country Status (3)
Country | Link |
---|---|
JP (1) | JPWO2003071594A1 (en) |
TW (1) | TWI227035B (en) |
WO (1) | WO2003071594A1 (en) |
Families Citing this family (13)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP4365192B2 (en) * | 2003-11-25 | 2009-11-18 | 住友精密工業株式会社 | Transport type substrate processing equipment |
JP4789446B2 (en) * | 2004-09-27 | 2011-10-12 | 芝浦メカトロニクス株式会社 | Substrate processing equipment |
JP4851776B2 (en) * | 2004-11-02 | 2012-01-11 | 昭和電工株式会社 | Liquid honing machine and liquid honing method |
KR100691479B1 (en) | 2005-12-20 | 2007-03-12 | 주식회사 케이씨텍 | Etching chamber for large area substrate |
WO2008087903A1 (en) * | 2007-01-15 | 2008-07-24 | Shibaura Mechatronics Corporation | Apparatus and method for processing substrate |
JP5454834B2 (en) * | 2007-08-30 | 2014-03-26 | 日立化成株式会社 | Roughening device |
JP4977230B2 (en) * | 2010-03-31 | 2012-07-18 | 積水化学工業株式会社 | Etching method and apparatus |
JP2012126582A (en) * | 2010-12-13 | 2012-07-05 | Asahi Glass Co Ltd | Method for producing cover glass for display device |
JP2013026490A (en) * | 2011-07-22 | 2013-02-04 | Tokyo Electron Ltd | Substrate processor |
JP6366328B2 (en) * | 2014-04-02 | 2018-08-01 | 株式会社中西製作所 | Nozzle tube unit and cleaning device using the same |
CN106971966A (en) * | 2017-04-06 | 2017-07-21 | 安徽熙泰智能科技有限公司 | A kind of semiconductor chip cleaning device |
KR102410120B1 (en) * | 2020-09-14 | 2022-06-21 | 주식회사 티케이씨 | Vertical Typed Continuous Developing System Having Improved Stain Proof Function |
TWI821799B (en) * | 2020-12-28 | 2023-11-11 | 日商芝浦機械電子裝置股份有限公司 | Substrate processing equipment |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3594863B2 (en) * | 1995-06-01 | 2004-12-02 | 株式会社半導体エネルギー研究所 | Method for manufacturing active matrix display device |
JP3315611B2 (en) * | 1996-12-02 | 2002-08-19 | 三菱電機株式会社 | Two-fluid jet nozzle for cleaning, cleaning device, and semiconductor device |
JP2000323813A (en) * | 1999-05-12 | 2000-11-24 | Dainippon Screen Mfg Co Ltd | Substrate treatment unit |
-
2002
- 2002-02-25 WO PCT/JP2002/001684 patent/WO2003071594A1/en active Application Filing
- 2002-02-25 JP JP2003570396A patent/JPWO2003071594A1/en active Pending
-
2003
- 2003-07-25 TW TW092120389A patent/TWI227035B/en not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
JPWO2003071594A1 (en) | 2005-06-16 |
TWI227035B (en) | 2005-01-21 |
WO2003071594A1 (en) | 2003-08-28 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |