TW200501160A - Multi-level memory device and methods for programming and reading the same - Google Patents

Multi-level memory device and methods for programming and reading the same

Info

Publication number
TW200501160A
TW200501160A TW092131759A TW92131759A TW200501160A TW 200501160 A TW200501160 A TW 200501160A TW 092131759 A TW092131759 A TW 092131759A TW 92131759 A TW92131759 A TW 92131759A TW 200501160 A TW200501160 A TW 200501160A
Authority
TW
Taiwan
Prior art keywords
reading
methods
programming
same
memory device
Prior art date
Application number
TW092131759A
Other languages
English (en)
Other versions
TWI223258B (en
Inventor
Yi-Chou Chen
Chih-Yuan Lu
Original Assignee
Macronix Int Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Macronix Int Co Ltd filed Critical Macronix Int Co Ltd
Application granted granted Critical
Publication of TWI223258B publication Critical patent/TWI223258B/zh
Publication of TW200501160A publication Critical patent/TW200501160A/zh

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/004—Reading or sensing circuits or methods
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
    • G11C11/5678—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using amorphous/crystalline phase transition storage elements
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0021—Auxiliary circuits
    • G11C13/0069—Writing or programming circuits or methods
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
    • G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
    • G11C13/0004—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements comprising amorphous/crystalline phase transition cells
TW092131759A 2003-06-18 2003-11-13 Multi-level memory device and methods for programming and reading the same TWI223258B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US10/465,012 US7180767B2 (en) 2003-06-18 2003-06-18 Multi-level memory device and methods for programming and reading the same

Publications (2)

Publication Number Publication Date
TWI223258B TWI223258B (en) 2004-11-01
TW200501160A true TW200501160A (en) 2005-01-01

Family

ID=33418170

Family Applications (1)

Application Number Title Priority Date Filing Date
TW092131759A TWI223258B (en) 2003-06-18 2003-11-13 Multi-level memory device and methods for programming and reading the same

Country Status (6)

Country Link
US (1) US7180767B2 (zh)
EP (1) EP1489623B1 (zh)
JP (1) JP5611499B2 (zh)
CN (1) CN100578668C (zh)
DE (1) DE60324117D1 (zh)
TW (1) TWI223258B (zh)

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US7138687B2 (en) * 2004-01-26 2006-11-21 Macronix International Co., Ltd. Thin film phase-change memory
ATE488842T1 (de) * 2004-09-30 2010-12-15 Nxp Bv Integrierte schaltung mit speicherzellen mit einem programmierbaren widerstand und verfahren zum adressieren von speicherzellen mit einem programmierbaren widerstand
US8116159B2 (en) * 2005-03-30 2012-02-14 Ovonyx, Inc. Using a bit specific reference level to read a resistive memory
KR100684908B1 (ko) * 2006-01-09 2007-02-22 삼성전자주식회사 다수 저항 상태를 갖는 저항 메모리 요소, 저항 메모리 셀및 그 동작 방법 그리고 상기 저항 메모리 요소를 적용한데이터 처리 시스템
US20070267620A1 (en) * 2006-05-18 2007-11-22 Thomas Happ Memory cell including doped phase change material
US20080019257A1 (en) * 2006-07-18 2008-01-24 Jan Boris Philipp Integrated circuit with resistivity changing material having a step-like programming characteristitic
US8084799B2 (en) * 2006-07-18 2011-12-27 Qimonda Ag Integrated circuit with memory having a step-like programming characteristic
US7688618B2 (en) * 2006-07-18 2010-03-30 Qimonda North America Corp. Integrated circuit having memory having a step-like programming characteristic
KR100887069B1 (ko) * 2007-07-24 2009-03-04 주식회사 하이닉스반도체 상 변화 메모리 장치
US7881100B2 (en) * 2008-04-08 2011-02-01 Micron Technology, Inc. State machine sensing of memory cells
US20100090189A1 (en) * 2008-09-15 2010-04-15 Savransky Semyon D Nanoscale electrical device
US7885101B2 (en) * 2008-12-29 2011-02-08 Numonyx B.V. Method for low-stress multilevel reading of phase change memory cells and multilevel phase change memory
KR101057725B1 (ko) * 2008-12-31 2011-08-18 주식회사 하이닉스반도체 멀티 레벨 셀 데이터 센싱 장치 및 그 방법
US7929338B2 (en) 2009-02-24 2011-04-19 International Business Machines Corporation Memory reading method for resistance drift mitigation
US8605495B2 (en) 2011-05-09 2013-12-10 Macronix International Co., Ltd. Isolation device free memory
US9281061B2 (en) 2012-09-19 2016-03-08 Micron Technology, Inc. Methods and apparatuses having a voltage generator with an adjustable voltage drop for representing a voltage drop of a memory cell and/or a current mirror circuit and replica circuit
KR102157357B1 (ko) * 2014-06-16 2020-09-17 삼성전자 주식회사 메모리 장치 및 상기 메모리 장치의 독출 방법
JP2016033843A (ja) * 2014-07-31 2016-03-10 株式会社東芝 不揮発性記憶装置およびその駆動方法
US10134470B2 (en) 2015-11-04 2018-11-20 Micron Technology, Inc. Apparatuses and methods including memory and operation of same
US9978810B2 (en) 2015-11-04 2018-05-22 Micron Technology, Inc. Three-dimensional memory apparatuses and methods of use
US10446226B2 (en) 2016-08-08 2019-10-15 Micron Technology, Inc. Apparatuses including multi-level memory cells and methods of operation of same
US10546632B2 (en) 2017-12-14 2020-01-28 Micron Technology, Inc. Multi-level self-selecting memory device
US10381075B2 (en) 2017-12-14 2019-08-13 Micron Technology, Inc. Techniques to access a self-selecting memory device
US11302390B2 (en) * 2020-07-10 2022-04-12 Micron Technology, Inc. Reading a multi-level memory cell

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JP2003100084A (ja) * 2001-09-27 2003-04-04 Toshiba Corp 相変化型不揮発性記憶装置
JP3749847B2 (ja) * 2001-09-27 2006-03-01 株式会社東芝 相変化型不揮発性記憶装置及びその駆動回路
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Also Published As

Publication number Publication date
CN100578668C (zh) 2010-01-06
TWI223258B (en) 2004-11-01
EP1489623A1 (en) 2004-12-22
DE60324117D1 (de) 2008-11-27
EP1489623B1 (en) 2008-10-15
CN1574091A (zh) 2005-02-02
JP2005012186A (ja) 2005-01-13
JP5611499B2 (ja) 2014-10-22
US7180767B2 (en) 2007-02-20
US20040257854A1 (en) 2004-12-23

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