TR200200140T2 - Termik rezonans görüntüleme yöntemi. - Google Patents
Termik rezonans görüntüleme yöntemi.Info
- Publication number
- TR200200140T2 TR200200140T2 TR2002/00140T TR200200140T TR200200140T2 TR 200200140 T2 TR200200140 T2 TR 200200140T2 TR 2002/00140 T TR2002/00140 T TR 2002/00140T TR 200200140 T TR200200140 T TR 200200140T TR 200200140 T2 TR200200140 T2 TR 200200140T2
- Authority
- TR
- Turkey
- Prior art keywords
- image frames
- data
- resonance imaging
- imaging method
- frames
- Prior art date
Links
- 238000003384 imaging method Methods 0.000 title 1
- 238000000034 method Methods 0.000 abstract 1
- 238000001931 thermography Methods 0.000 abstract 1
- 230000001052 transient effect Effects 0.000 abstract 1
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N25/00—Investigating or analyzing materials by the use of thermal means
- G01N25/72—Investigating presence of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
- G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Radiation Pyrometers (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Bir enfraruj (IR) geçici termografi sisteminde, bir IR hassas, odak düzlemi tertibine sahip bir kameradan bir dizi görüntü karesi elde edilir. Ardisik olarak elde edilen her görüntü karesi, piksellerin meydana getirdigi bir tertipten olusur ve geçen zamana karsilik gelen tahsis edilmis bir kare sayisina sahiptir. Ardisik görüntü karelerinin olusturdugu kümelerden, her piksele karsilik gelen zamana karsi sicakli (T-t) verileri elde edilir. Bir objenin kalinliginin saptanmasi ve renkli olarak isaretlenmis veya gri ölçekli olarak kodlanmis bir kalinlik haritasinin üretilmesi için her pikselden alinan normallestirilmis T-t verileri egrisinin bir hizli fourier dönüskesi'nin gerçek ve sanal bilesen kisimlarinin kullanilmasiyla, termik veri görüntü karelerinden olusan kümelerin analiz edilmesi için bir yöntem de sunulmustur.
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US14488599P | 1999-07-21 | 1999-07-21 | |
US09/568,052 US6367968B1 (en) | 1999-07-21 | 2000-05-10 | Thermal resonance imaging method |
Publications (1)
Publication Number | Publication Date |
---|---|
TR200200140T2 true TR200200140T2 (tr) | 2002-06-21 |
Family
ID=26842456
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TR2002/00140T TR200200140T2 (tr) | 1999-07-21 | 2000-06-13 | Termik rezonans görüntüleme yöntemi. |
Country Status (9)
Country | Link |
---|---|
US (1) | US6367968B1 (tr) |
EP (1) | EP1203199B1 (tr) |
JP (1) | JP2003505683A (tr) |
KR (1) | KR100697477B1 (tr) |
BR (1) | BR0012644A (tr) |
DE (1) | DE60015555T2 (tr) |
TR (1) | TR200200140T2 (tr) |
TW (1) | TW463047B (tr) |
WO (1) | WO2001007867A1 (tr) |
Families Citing this family (28)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7690840B2 (en) * | 1999-12-22 | 2010-04-06 | Siemens Energy, Inc. | Method and apparatus for measuring on-line failure of turbine thermal barrier coatings |
US6517238B2 (en) * | 2001-01-18 | 2003-02-11 | The United States Of America As Represented By The United States Department Of Energy | Thermal imaging measurement of lateral diffusivity and non-invasive material defect detection |
EP1262765A1 (de) * | 2001-05-28 | 2002-12-04 | Solectron GmbH | Verfahren und Vorrichtung zur Detektion von defekten Leiterplattenrohlingen |
US6712502B2 (en) * | 2002-04-10 | 2004-03-30 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Synchronized electronic shutter system and method for thermal nondestructive evaluation |
US20050018748A1 (en) * | 2003-07-24 | 2005-01-27 | Ringermacher Harry Israel | Actively quenched lamp, infrared thermography imaging system, and method for actively controlling flash duration |
AU2003279935A1 (en) * | 2003-08-29 | 2005-04-14 | Nielsen Media Research, Inc. | Methods and apparatus for embedding and recovering an image for use with video content |
US7419298B2 (en) * | 2005-05-24 | 2008-09-02 | United Technologies Corporation | Thermal imaging method and apparatus |
US7388204B2 (en) * | 2005-12-07 | 2008-06-17 | Meyer Tool, Inc. | Apparatus and method for analyzing relative outward flow characterizations of fabricated features |
FR2895688B1 (fr) * | 2005-12-30 | 2010-08-27 | Pellenc Selective Technologies | Procede et machine automatiques d'inspection et de tri d'objets non metalliques |
US7432505B2 (en) * | 2006-05-04 | 2008-10-07 | Siemens Power Generation, Inc. | Infrared-based method and apparatus for online detection of cracks in steam turbine components |
US7671338B2 (en) * | 2006-06-14 | 2010-03-02 | Meyer Tool, Inc. | Apparatus and method for analyzing relative outward flow characterizations of fabricated features |
DE102006043339B4 (de) * | 2006-09-15 | 2010-11-11 | Siemens Ag | Verfahren und Vorrichtung zur Bestimmung von Bauteilwandstärken mittels Thermographie |
DE102006044443A1 (de) * | 2006-09-21 | 2008-04-03 | Robert Bosch Gmbh | Automatische Erkennung von Beschichtungsfehlern |
GB2442744B (en) * | 2006-10-12 | 2009-07-08 | Rolls Royce Plc | A test apparatus and method |
US7516663B2 (en) * | 2006-11-03 | 2009-04-14 | General Electric Company | Systems and method for locating failure events in samples under load |
US7549789B2 (en) * | 2007-06-20 | 2009-06-23 | General Electric Company | Method and apparatus for thermographic nondestructive evaluation of an object |
US8393784B2 (en) | 2008-03-31 | 2013-03-12 | General Electric Company | Characterization of flaws in composites identified by thermography |
KR101434720B1 (ko) | 2008-12-16 | 2014-08-26 | 사반치 유니버시티 | 3d 스캐너 |
US8577120B1 (en) | 2009-11-05 | 2013-11-05 | The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration | Methods and systems for characterization of an anomaly using infrared flash thermography |
US9066028B1 (en) | 2010-01-08 | 2015-06-23 | The United States Of America As Represented By The Administator Of The National Aeronautics And Space Administration | Methods and systems for measurement and estimation of normalized contrast in infrared thermography |
DE102010020874B4 (de) * | 2010-05-18 | 2014-04-03 | Dcg Systems, Inc. | Verfahren zur Messzeitreduktion bei der thermografischen Prüfung eines Bauteils |
US8692887B2 (en) * | 2010-08-27 | 2014-04-08 | General Electric Company | Thermal imaging method and apparatus for evaluating coatings |
US9007466B2 (en) * | 2011-04-27 | 2015-04-14 | General Electric Company | System and method for thermographic inspection |
US9357204B2 (en) * | 2012-03-19 | 2016-05-31 | Fittingbox | Method for constructing images of a pair of glasses |
US10343211B2 (en) | 2016-08-25 | 2019-07-09 | Honda Motor Co., Ltd. | Thermal camera system for die-cast machine |
CN110741136B (zh) * | 2017-06-20 | 2022-04-12 | 西门子能源全球两合公司 | 暴露至使用中的腐蚀损伤的动力涡轮盘的寿命延长 |
KR101877480B1 (ko) * | 2017-11-24 | 2018-08-07 | 한국과학기술원 | 도막 두께 분포 시각화 방법 및 이를 위한 능동형 열화상 장치 |
JP7308577B2 (ja) * | 2020-06-01 | 2023-07-14 | ヤマハロボティクスホールディングス株式会社 | 音響式不良検出装置及び不良検出方法 |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4854724A (en) | 1984-07-09 | 1989-08-08 | Lockheed Corporation | Method of and apparatus for thermographic evaluation of spot welds |
GB8431928D0 (en) | 1984-12-18 | 1985-01-30 | Stevenson G M | Non-destructively testing heat shrinkable sleeves |
JPS62172249A (ja) | 1986-01-25 | 1987-07-29 | Kajima Corp | 煙突の劣化診断方法及び装置 |
US4792683A (en) | 1987-01-16 | 1988-12-20 | Hughes Aircraft Company | Thermal technique for simultaneous testing of circuit board solder joints |
US4872762A (en) | 1987-08-25 | 1989-10-10 | Nkk Corporation | Method and apparatus for detecting defective portion on inner surface of pipe |
GB8813423D0 (en) | 1988-06-07 | 1988-07-13 | Atomic Energy Authority Uk | Coating inspection |
US5032727A (en) | 1990-09-14 | 1991-07-16 | Digital Equipment Corporation | Product defect detection using thermal ratio analysis |
US5250809A (en) | 1992-01-24 | 1993-10-05 | Shuji Nakata | Method and device for checking joint of electronic component |
US5201582A (en) * | 1992-05-15 | 1993-04-13 | Stress Photonics, Inc. | Differential temperature stress measurement employing array sensor with local offset |
US5246291A (en) | 1992-06-01 | 1993-09-21 | Motorola, Inc. | Bond inspection technique for a semiconductor chip |
US5292195A (en) | 1992-09-09 | 1994-03-08 | Martin Marietta Corporation | Thermographic evaluation technique |
US5376793A (en) | 1993-09-15 | 1994-12-27 | Stress Photonics, Inc. | Forced-diffusion thermal imaging apparatus and method |
US5539656A (en) | 1994-10-11 | 1996-07-23 | United Technologies Corporation | Crack monitoring apparatus |
US5683181A (en) | 1995-05-12 | 1997-11-04 | Thermal Wave Imaging, Inc. | Method and apparatus for enhancing thermal wave imaging of reflective low-emissivity solids |
US5631465A (en) | 1996-02-29 | 1997-05-20 | Shepard; Steven M. | Method of interpreting thermographic data for non-destructive evaluation |
WO1998005921A1 (de) | 1996-07-31 | 1998-02-12 | Siemens Aktiengesellschaft | Verfahren zur wanddickenbestimmung an einer turbinenschaufel und vorrichtung zur durchführung des verfahrens |
WO1998005949A1 (de) | 1996-07-31 | 1998-02-12 | Siemens Aktiengesellschaft | Verfahren und vorrichtung zur delaminationsprüfung bei beschichtungen auf substraten, insbesondere bei vps-beschichtungen auf gasturbinenschaufeln |
US5711603A (en) | 1996-10-30 | 1998-01-27 | United Technologies Corporation | Nondestructive testing: transient depth thermography |
JPH10274675A (ja) | 1997-03-31 | 1998-10-13 | Shimadzu Corp | 放射線検出器 |
-
2000
- 2000-05-10 US US09/568,052 patent/US6367968B1/en not_active Expired - Fee Related
- 2000-06-13 EP EP00942767A patent/EP1203199B1/en not_active Expired - Lifetime
- 2000-06-13 TR TR2002/00140T patent/TR200200140T2/tr unknown
- 2000-06-13 WO PCT/US2000/016173 patent/WO2001007867A1/en active IP Right Grant
- 2000-06-13 KR KR1020027000845A patent/KR100697477B1/ko not_active IP Right Cessation
- 2000-06-13 BR BR0012644-6A patent/BR0012644A/pt not_active IP Right Cessation
- 2000-06-13 JP JP2001512251A patent/JP2003505683A/ja not_active Withdrawn
- 2000-06-13 DE DE60015555T patent/DE60015555T2/de not_active Expired - Fee Related
- 2000-07-10 TW TW089113696A patent/TW463047B/zh not_active IP Right Cessation
Also Published As
Publication number | Publication date |
---|---|
EP1203199B1 (en) | 2004-11-03 |
KR100697477B1 (ko) | 2007-03-20 |
DE60015555D1 (de) | 2004-12-09 |
BR0012644A (pt) | 2002-04-09 |
DE60015555T2 (de) | 2005-12-08 |
US6367968B1 (en) | 2002-04-09 |
JP2003505683A (ja) | 2003-02-12 |
KR20020035105A (ko) | 2002-05-09 |
EP1203199A1 (en) | 2002-05-08 |
WO2001007867A1 (en) | 2001-02-01 |
TW463047B (en) | 2001-11-11 |
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