BR0012644A - Método de formação de imagem por ressonância térmica - Google Patents

Método de formação de imagem por ressonância térmica

Info

Publication number
BR0012644A
BR0012644A BR0012644-6A BR0012644A BR0012644A BR 0012644 A BR0012644 A BR 0012644A BR 0012644 A BR0012644 A BR 0012644A BR 0012644 A BR0012644 A BR 0012644A
Authority
BR
Brazil
Prior art keywords
image frames
stacks
thermal
pixel
data
Prior art date
Application number
BR0012644-6A
Other languages
English (en)
Inventor
Harry Israel Ringermacher
Donald Robert Howard
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of BR0012644A publication Critical patent/BR0012644A/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N25/00—Investigating or analyzing materials by the use of thermal means
    • G01N25/72—Investigating presence of flaws
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/08—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness
    • G01B21/085—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness for measuring thickness using thermal means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Radiation Pyrometers (AREA)
  • Investigating Or Analyzing Materials Using Thermal Means (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Patente de Invenção: "MéTODO DE FORMAçãO DE IMAGEM POR RESSONâNCIA TéRMICA". Em um sistema termográfico transitório infravermelho (IV) uma seq³ência de quadros de imagem é adquirida a partir de um câmara de série de plano focal sensível IV. Cada quadro de imagem seq³encialmente adquirido é constituído de uma série de pixels e possui um número de quadro designado que corresponde ao tempo decorrido. Dados de temperatura versus tempo (T-t) correspondendo a cada pixel são desenvolvidos a partir de pilhas de quadros de imagem seq³enciais. Um método para analisar as pilhas de quadros de imagem de dados térmicos é apresentado onde as partes componentes Real ou Imaginária de uma Transformação Fourier Rápida de uma curva de dados T-t normalizada de cada pixel são utilizadas para determinar a espessura de um objeto e produzir um mapa de espessura codificado colorido ou em escala cinza.
BR0012644-6A 1999-07-21 2000-06-13 Método de formação de imagem por ressonância térmica BR0012644A (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US14488599P 1999-07-21 1999-07-21
US09/568,052 US6367968B1 (en) 1999-07-21 2000-05-10 Thermal resonance imaging method
PCT/US2000/016173 WO2001007867A1 (en) 1999-07-21 2000-06-13 Thermal resonance imaging method

Publications (1)

Publication Number Publication Date
BR0012644A true BR0012644A (pt) 2002-04-09

Family

ID=26842456

Family Applications (1)

Application Number Title Priority Date Filing Date
BR0012644-6A BR0012644A (pt) 1999-07-21 2000-06-13 Método de formação de imagem por ressonância térmica

Country Status (9)

Country Link
US (1) US6367968B1 (pt)
EP (1) EP1203199B1 (pt)
JP (1) JP2003505683A (pt)
KR (1) KR100697477B1 (pt)
BR (1) BR0012644A (pt)
DE (1) DE60015555T2 (pt)
TR (1) TR200200140T2 (pt)
TW (1) TW463047B (pt)
WO (1) WO2001007867A1 (pt)

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US6517238B2 (en) * 2001-01-18 2003-02-11 The United States Of America As Represented By The United States Department Of Energy Thermal imaging measurement of lateral diffusivity and non-invasive material defect detection
EP1262765A1 (de) * 2001-05-28 2002-12-04 Solectron GmbH Verfahren und Vorrichtung zur Detektion von defekten Leiterplattenrohlingen
US6712502B2 (en) * 2002-04-10 2004-03-30 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Synchronized electronic shutter system and method for thermal nondestructive evaluation
US20050018748A1 (en) * 2003-07-24 2005-01-27 Ringermacher Harry Israel Actively quenched lamp, infrared thermography imaging system, and method for actively controlling flash duration
AU2003279935A1 (en) * 2003-08-29 2005-04-14 Nielsen Media Research, Inc. Methods and apparatus for embedding and recovering an image for use with video content
US7419298B2 (en) 2005-05-24 2008-09-02 United Technologies Corporation Thermal imaging method and apparatus
US7388204B2 (en) * 2005-12-07 2008-06-17 Meyer Tool, Inc. Apparatus and method for analyzing relative outward flow characterizations of fabricated features
FR2895688B1 (fr) * 2005-12-30 2010-08-27 Pellenc Selective Technologies Procede et machine automatiques d'inspection et de tri d'objets non metalliques
US7432505B2 (en) * 2006-05-04 2008-10-07 Siemens Power Generation, Inc. Infrared-based method and apparatus for online detection of cracks in steam turbine components
US7671338B2 (en) * 2006-06-14 2010-03-02 Meyer Tool, Inc. Apparatus and method for analyzing relative outward flow characterizations of fabricated features
DE102006043339B4 (de) * 2006-09-15 2010-11-11 Siemens Ag Verfahren und Vorrichtung zur Bestimmung von Bauteilwandstärken mittels Thermographie
DE102006044443A1 (de) * 2006-09-21 2008-04-03 Robert Bosch Gmbh Automatische Erkennung von Beschichtungsfehlern
GB2442744B (en) * 2006-10-12 2009-07-08 Rolls Royce Plc A test apparatus and method
US7516663B2 (en) * 2006-11-03 2009-04-14 General Electric Company Systems and method for locating failure events in samples under load
US7549789B2 (en) * 2007-06-20 2009-06-23 General Electric Company Method and apparatus for thermographic nondestructive evaluation of an object
US8393784B2 (en) 2008-03-31 2013-03-12 General Electric Company Characterization of flaws in composites identified by thermography
US8629400B2 (en) 2008-12-16 2014-01-14 Sabanci Universitesi 3D scanner
US8577120B1 (en) 2009-11-05 2013-11-05 The United States Of America As Represented By The Administrator Of The National Aeronautics And Space Administration Methods and systems for characterization of an anomaly using infrared flash thermography
US9066028B1 (en) 2010-01-08 2015-06-23 The United States Of America As Represented By The Administator Of The National Aeronautics And Space Administration Methods and systems for measurement and estimation of normalized contrast in infrared thermography
DE102010020874B4 (de) * 2010-05-18 2014-04-03 Dcg Systems, Inc. Verfahren zur Messzeitreduktion bei der thermografischen Prüfung eines Bauteils
US8692887B2 (en) * 2010-08-27 2014-04-08 General Electric Company Thermal imaging method and apparatus for evaluating coatings
US9007466B2 (en) * 2011-04-27 2015-04-14 General Electric Company System and method for thermographic inspection
WO2013139814A2 (fr) * 2012-03-19 2013-09-26 Fittingbox Modèle et procédé de production de modèle 3d photo-réalistes
US10343211B2 (en) 2016-08-25 2019-07-09 Honda Motor Co., Ltd. Thermal camera system for die-cast machine
WO2018236618A2 (en) * 2017-06-20 2018-12-27 Siemens Aktiengesellschaft EXTENDING THE LIFETIME OF POWER TURBINE DISKS EXPOSED TO CORROSION DAMAGE IN SERVICE
KR101877480B1 (ko) * 2017-11-24 2018-08-07 한국과학기술원 도막 두께 분포 시각화 방법 및 이를 위한 능동형 열화상 장치
WO2021246271A1 (ja) * 2020-06-01 2021-12-09 ヤマハロボティクスホールディングス株式会社 音響式不良検出装置及び不良検出方法

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US4854724A (en) 1984-07-09 1989-08-08 Lockheed Corporation Method of and apparatus for thermographic evaluation of spot welds
GB8431928D0 (en) 1984-12-18 1985-01-30 Stevenson G M Non-destructively testing heat shrinkable sleeves
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US4792683A (en) * 1987-01-16 1988-12-20 Hughes Aircraft Company Thermal technique for simultaneous testing of circuit board solder joints
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US5032727A (en) 1990-09-14 1991-07-16 Digital Equipment Corporation Product defect detection using thermal ratio analysis
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US5201582A (en) * 1992-05-15 1993-04-13 Stress Photonics, Inc. Differential temperature stress measurement employing array sensor with local offset
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Also Published As

Publication number Publication date
KR100697477B1 (ko) 2007-03-20
DE60015555D1 (de) 2004-12-09
DE60015555T2 (de) 2005-12-08
KR20020035105A (ko) 2002-05-09
WO2001007867A1 (en) 2001-02-01
EP1203199A1 (en) 2002-05-08
US6367968B1 (en) 2002-04-09
EP1203199B1 (en) 2004-11-03
JP2003505683A (ja) 2003-02-12
TR200200140T2 (tr) 2002-06-21
TW463047B (en) 2001-11-11

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Legal Events

Date Code Title Description
B08F Application dismissed because of non-payment of annual fees [chapter 8.6 patent gazette]

Free format text: CONFORME ARTIGO 10O DA RESOLUCAO 124/06, CABE SER ARQUIVADO REFERENTE AO NAO RECOLHIMENTO DA 11A ANUIDADE.

B08K Patent lapsed as no evidence of payment of the annual fee has been furnished to inpi [chapter 8.11 patent gazette]

Free format text: REFERENTE AO DESPACHO 8.6 PUBLICADO NA RPI 2138 DE 27/12/2011.