TR200002716A2 - İndüksiyon akımı ayar ölçüsü - Google Patents

İndüksiyon akımı ayar ölçüsü

Info

Publication number
TR200002716A2
TR200002716A2 TR2000/02716A TR200002716A TR200002716A2 TR 200002716 A2 TR200002716 A2 TR 200002716A2 TR 2000/02716 A TR2000/02716 A TR 2000/02716A TR 200002716 A TR200002716 A TR 200002716A TR 200002716 A2 TR200002716 A2 TR 200002716A2
Authority
TR
Turkey
Prior art keywords
induction current
longitudinal direction
current setting
setting size
lateralization
Prior art date
Application number
TR2000/02716A
Other languages
English (en)
Inventor
Lloyd Trantow Richard
Howard Little Franci̇s
Olive Gambrell Gigi
William Ertel John
Original Assignee
General Electric Company
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US09/453,089 external-priority patent/US6356069B1/en
Application filed by General Electric Company filed Critical General Electric Company
Publication of TR200002716A2 publication Critical patent/TR200002716A2/tr

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/72—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables
    • G01N27/82—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws
    • G01N27/90—Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating magnetic variables for investigating the presence of flaws using eddy currents
    • G01N27/9073—Recording measured data
    • G01N27/9086—Calibrating of recording device

Landscapes

  • Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

Imal edilmis bir parçanin önceden seçilmis düzlemsel-olmayan bir vasfini muayene etmek üzere uygun ebada getirilmis ve biçimlendirilmis olan bir indüksiyon akimi muayene sondasinin ayarlanmasina mahsus bir ölçü ayari (10) olmaktadir. Vasif, uzunlamasina bir yön içinde ve yanlamasina bir yön içinde uzanmaktadir. Bundan baska, vasif, uzunlamasina yön içinde bakildiginda esas itibariyle degismez bir biçime ve konuma sahip bulunan bir uç görümüne sahip bulunmaktadir. Ayar ölçüsü (10), bir uzunlamasina yön (22) içinde ve bir yanlamasina yön (24) içinde uzanmakta olan bir düzlemsel-olmayan yüzeye (18) sahip bulunan bir gövde (14) ihtiva etmektedir.
TR2000/02716A 1999-09-22 2000-09-21 İndüksiyon akımı ayar ölçüsü TR200002716A2 (tr)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US15544099P 1999-09-22 1999-09-22
US09/453,089 US6356069B1 (en) 1999-09-23 1999-12-02 Eddy current calibration standard

Publications (1)

Publication Number Publication Date
TR200002716A2 true TR200002716A2 (tr) 2001-04-20

Family

ID=26852334

Family Applications (1)

Application Number Title Priority Date Filing Date
TR2000/02716A TR200002716A2 (tr) 1999-09-22 2000-09-21 İndüksiyon akımı ayar ölçüsü

Country Status (4)

Country Link
EP (1) EP1087228B1 (tr)
JP (1) JP4659194B2 (tr)
DE (1) DE60044598D1 (tr)
TR (1) TR200002716A2 (tr)

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7154265B2 (en) * 2004-12-21 2006-12-26 General Electric Company Eddy current probe and inspection method
DE102005054589B4 (de) 2005-11-14 2017-11-02 Immobiliengesellschaft Helmut Fischer Gmbh & Co. Kg Kalibriernormal
DE102009022138A1 (de) * 2009-05-20 2010-11-25 Prüftechnik Dieter Busch AG Vorrichtung und Verfahren für induktive Messungen
FR2949262B1 (fr) * 2009-08-20 2012-12-28 Snecma Dispositif d'etalonnage de moyens de controle non destructif d'une piece de turbomachine
JP6170005B2 (ja) * 2014-03-31 2017-07-26 日立Ｇｅニュークリア・エナジー株式会社 渦電流探傷方法及び渦電流探傷装置

Family Cites Families (13)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3718855A (en) * 1970-11-30 1973-02-27 R Cordova Eddy current flaw detection system
US4425545A (en) * 1981-07-27 1984-01-10 Scalese Joseph J Eddy current probe calibration standard
US4578643A (en) * 1983-11-18 1986-03-25 Westinghouse Electric Corp. Simulation apparatus for eddy current inspection techniques
JPS62121347A (ja) * 1985-11-21 1987-06-02 Touden Kogyo Kk 細管の欠陥検査法
JPH02230903A (ja) * 1989-03-03 1990-09-13 Tokyo Electric Power Co Inc:The セラミツク動翼の嵌合構造
US4963826A (en) * 1989-07-18 1990-10-16 The United States Of America As Represented By The Secretary Of Commerce Reference standard block for use in nondestructive test probe calibration and method of manufacture thereof
JPH03264862A (ja) * 1990-03-14 1991-11-26 Fujikura Ltd 探傷装置感度校正用往復運動装置
DE9006978U1 (de) * 1990-06-22 1990-08-23 Institut Dr. Friedrich Förster Prüfgerätebau GmbH & Co KG, 7410 Reutlingen Fehlernormal für einen Innenrotiergeber
JPH07167839A (ja) * 1993-12-14 1995-07-04 Nippon Steel Corp 電磁誘導探傷用検査コイルおよび探傷方法
JPH08327602A (ja) * 1995-05-31 1996-12-13 Sumitomo Metal Ind Ltd 漏洩磁気検出用センサ
US5801532A (en) * 1996-07-30 1998-09-01 General Electric Company Hand-holdable eddy-current probe
JP2913600B2 (ja) * 1996-09-03 1999-06-28 神鋼特殊鋼管株式会社 原子燃料被覆管の表面探傷法
US6252393B1 (en) * 1998-06-23 2001-06-26 General Electric Company System and method for normalizing and calibrating a sensor array

Also Published As

Publication number Publication date
JP2001116727A (ja) 2001-04-27
DE60044598D1 (de) 2010-08-12
EP1087228B1 (en) 2010-06-30
EP1087228A2 (en) 2001-03-28
EP1087228A3 (en) 2004-08-18
JP4659194B2 (ja) 2011-03-30

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