WO2002031433A8 - Kombination von zwei sensoren, z.b. von einem kapazitiven sensor und einem auf wirbelstrom- oder ultraschallbasis arbeitendem abstandssensor, in einem gehäuse - Google Patents
Kombination von zwei sensoren, z.b. von einem kapazitiven sensor und einem auf wirbelstrom- oder ultraschallbasis arbeitendem abstandssensor, in einem gehäuseInfo
- Publication number
- WO2002031433A8 WO2002031433A8 PCT/DE2001/003031 DE0103031W WO0231433A8 WO 2002031433 A8 WO2002031433 A8 WO 2002031433A8 DE 0103031 W DE0103031 W DE 0103031W WO 0231433 A8 WO0231433 A8 WO 0231433A8
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- sensor
- sensors
- housing
- functions
- eddy current
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/08—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means
- G01B7/085—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means for measuring thickness of coating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/023—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B7/00—Measuring arrangements characterised by the use of electric or magnetic techniques
- G01B7/02—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness
- G01B7/06—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness
- G01B7/08—Measuring arrangements characterised by the use of electric or magnetic techniques for measuring length, width or thickness for measuring thickness using capacitive means
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measurement Of Length, Angles, Or The Like Using Electric Or Magnetic Means (AREA)
- Transmission And Conversion Of Sensor Element Output (AREA)
- Investigating Or Analyzing Materials By The Use Of Magnetic Means (AREA)
- Investigating Or Analyzing Materials By The Use Of Ultrasonic Waves (AREA)
Abstract
Priority Applications (3)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP2002534772A JP4059766B2 (ja) | 2000-10-09 | 2001-08-08 | センサ装置 |
EP01960157A EP1342048A1 (de) | 2000-10-09 | 2001-08-08 | Kombination von zwei sensoren, z.b. von einem kapazitiven sensor und einem auf wirbelstrom- oder ultraschallbasis arbeitendem abstandssensor, in einem gehäuse |
US10/408,989 US6822442B2 (en) | 2000-10-09 | 2003-04-08 | Sensor arrangement for detecting properties of a target |
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
DE10050193A DE10050193A1 (de) | 2000-10-09 | 2000-10-09 | Sensoranordnung |
DE10050193.1 | 2000-10-09 |
Related Child Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
US10/408,989 Continuation US6822442B2 (en) | 2000-10-09 | 2003-04-08 | Sensor arrangement for detecting properties of a target |
Publications (2)
Publication Number | Publication Date |
---|---|
WO2002031433A1 WO2002031433A1 (de) | 2002-04-18 |
WO2002031433A8 true WO2002031433A8 (de) | 2002-07-25 |
Family
ID=7659301
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
PCT/DE2001/003031 WO2002031433A1 (de) | 2000-10-09 | 2001-08-08 | Kombination von zwei sensoren, z.b. von einem kapazitiven sensor und einem auf wirbelstrom- oder ultraschallbasis arbeitendem abstandssensor, in einem gehäuse |
Country Status (5)
Country | Link |
---|---|
US (1) | US6822442B2 (de) |
EP (1) | EP1342048A1 (de) |
JP (1) | JP4059766B2 (de) |
DE (1) | DE10050193A1 (de) |
WO (1) | WO2002031433A1 (de) |
Families Citing this family (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE102004007314A1 (de) * | 2004-02-14 | 2005-08-25 | Robert Bosch Gmbh | Verfahren und Messgerät zur Ortung von in einem Medium eingeschlossenen Objekten |
DE102005039152A1 (de) * | 2005-08-17 | 2007-02-22 | Robert Bosch Gmbh | Mechanische Trägereinrichtung sowie Messgerät mit einer mechanischen Trägereinrichtung |
PL2409114T3 (pl) * | 2009-03-17 | 2013-08-30 | Abb Schweiz Ag | Sposób i urządzenie do pomiaru grubości metalowej warstwy umieszczonej na metalowym przedmiocie |
JP5403524B2 (ja) * | 2010-12-08 | 2014-01-29 | レーザーテック株式会社 | 電池用電極材の厚さ測定装置、及び厚さ測定方法 |
US20140002069A1 (en) * | 2012-06-27 | 2014-01-02 | Kenneth Stoddard | Eddy current probe |
US10669088B2 (en) | 2015-12-28 | 2020-06-02 | Eaton Intelligent Power Limited | Eddy current joint sensor |
CN107014896B (zh) * | 2017-03-28 | 2020-04-03 | 中国人民解放军国防科学技术大学 | 一种集成式电磁电容平面阵列传感器及其制备方法 |
Family Cites Families (17)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US3077858A (en) * | 1960-03-17 | 1963-02-19 | Gen Electric Canada | Apparatus for controlling and measuring the thickness of thin electrically conductive films |
FR1318027A (fr) * | 1962-01-29 | 1963-02-15 | Wayne Kerr Lab Ltd | Appareil pour mesurer l'épaisseur d'une couche d'un matériau, par exemple une pellicule ou une feuille |
US4168464A (en) * | 1978-05-04 | 1979-09-18 | General Dynamics Corporation | Set point sensing system for numerically controlled machine tools |
DE2829851A1 (de) * | 1978-07-07 | 1980-01-24 | Precitec Gmbh | Anordnung zur messung des abstands zwischen einem metallischen werkstueck und einem bearbeitungswerkzeug |
DE3134342A1 (de) * | 1981-08-31 | 1983-03-10 | Ingenieure Block + Seichter, 3000 Hannover | Elektronischer kapazitiver messkopf fuer distanzmessungen |
US4686454A (en) * | 1984-08-22 | 1987-08-11 | Pasar, Inc. | Conductor tracer with improved open circuit detection, close-range discrimination and directionality |
GB8607747D0 (en) * | 1986-03-27 | 1986-04-30 | Duracell Int | Device |
JPH071313B2 (ja) * | 1986-12-23 | 1995-01-11 | 松下電工株式会社 | 壁の背後部材検知装置 |
DE3910297A1 (de) * | 1989-03-30 | 1990-10-04 | Micro Epsilon Messtechnik | Beruehrungslos arbeitendes wegmesssystem |
EP0556682B1 (de) * | 1992-02-10 | 1997-12-03 | SYEL di FRANCHI A.- MARTOLINI A. & C. s.n.c. | Elektronische kapazitive Sensorstangeneinrichtung |
US5337353A (en) * | 1992-04-01 | 1994-08-09 | At&T Bell Laboratories | Capacitive proximity sensors |
US5717332A (en) * | 1993-05-03 | 1998-02-10 | General Electric Company | System and method using eddy currents to acquire positional data relating to fibers in a composite |
FR2705145B1 (fr) * | 1993-05-10 | 1995-08-04 | Exa Ingenierie | Dispositif de mesure de rectitude. |
DE4327712C2 (de) | 1993-08-18 | 1997-07-10 | Micro Epsilon Messtechnik | Sensoranordnung und Verfahren zum Erfassen von Eigenschaften der Oberflächenschicht eines metallischen Targets |
DE19511939C2 (de) * | 1995-03-31 | 2000-05-18 | Micro Epsilon Messtechnik | Sensor zur berührungslosen Dickenmessung an Folien |
AT408580B (de) * | 1997-11-21 | 2002-01-25 | Bierbaumer Hans Peter Dr | Messvorrichtung zumindest zur ermittlung der dicke einer bahn sowie verfahren hierfür |
DE19757575C1 (de) * | 1997-12-23 | 1999-07-15 | Siemens Ag | Elektromagnetische Untersuchungseinrichtung, geeignet für Materialuntersuchung, mit Wirbelstrommeßkopf sowie Verfahren zum Betrieb derselben |
-
2000
- 2000-10-09 DE DE10050193A patent/DE10050193A1/de not_active Withdrawn
-
2001
- 2001-08-08 EP EP01960157A patent/EP1342048A1/de not_active Ceased
- 2001-08-08 JP JP2002534772A patent/JP4059766B2/ja not_active Expired - Fee Related
- 2001-08-08 WO PCT/DE2001/003031 patent/WO2002031433A1/de active Application Filing
-
2003
- 2003-04-08 US US10/408,989 patent/US6822442B2/en not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
DE10050193A1 (de) | 2002-04-18 |
WO2002031433A1 (de) | 2002-04-18 |
EP1342048A1 (de) | 2003-09-10 |
US20030169036A1 (en) | 2003-09-11 |
JP2004510997A (ja) | 2004-04-08 |
JP4059766B2 (ja) | 2008-03-12 |
US6822442B2 (en) | 2004-11-23 |
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