SI9620133B - Priprava za električno preskušanje tiskanih vezij z nastavljivim položajem sondnih igel - Google Patents

Priprava za električno preskušanje tiskanih vezij z nastavljivim položajem sondnih igel Download PDF

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Publication number
SI9620133B
SI9620133B SI9620133A SI9620133A SI9620133B SI 9620133 B SI9620133 B SI 9620133B SI 9620133 A SI9620133 A SI 9620133A SI 9620133 A SI9620133 A SI 9620133A SI 9620133 B SI9620133 B SI 9620133B
Authority
SI
Slovenia
Prior art keywords
needle
plates
needles
card
needle plate
Prior art date
Application number
SI9620133A
Other languages
English (en)
Slovenian (sl)
Other versions
SI9620133A (sl
Inventor
Jozef Vodopivec
Cesare Fumo
Original Assignee
New System S.R.L.
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by New System S.R.L. filed Critical New System S.R.L.
Publication of SI9620133A publication Critical patent/SI9620133A/sl
Publication of SI9620133B publication Critical patent/SI9620133B/sl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G01R1/07364—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card with provisions for altering position, number or connection of probe tips; Adapting to differences in pitch

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Measuring Leads Or Probes (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Perforating, Stamping-Out Or Severing By Means Other Than Cutting (AREA)
  • Measurement Of Mechanical Vibrations Or Ultrasonic Waves (AREA)
  • Supply And Installment Of Electrical Components (AREA)
SI9620133A 1995-12-22 1996-08-09 Priprava za električno preskušanje tiskanih vezij z nastavljivim položajem sondnih igel SI9620133B (sl)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
IT95UD000251A IT1282829B1 (it) 1995-12-22 1995-12-22 Macchina di test elettrico per circuiti stampati con posizione registrabile degli aghi di sonda
PCT/IT1996/000160 WO1997023784A1 (en) 1995-12-22 1996-08-09 Machine for the electric test of printed circuits with adjustable position of the sound needles

Publications (2)

Publication Number Publication Date
SI9620133A SI9620133A (sl) 1998-12-31
SI9620133B true SI9620133B (sl) 2005-10-31

Family

ID=11421986

Family Applications (1)

Application Number Title Priority Date Filing Date
SI9620133A SI9620133B (sl) 1995-12-22 1996-08-09 Priprava za električno preskušanje tiskanih vezij z nastavljivim položajem sondnih igel

Country Status (27)

Country Link
US (1) US6124722A (it)
EP (1) EP0876619B1 (it)
JP (1) JP2000502791A (it)
KR (1) KR100526744B1 (it)
CN (1) CN1175270C (it)
AT (1) ATE202850T1 (it)
AU (1) AU718507B2 (it)
BR (1) BR9612251A (it)
CA (1) CA2241326C (it)
CZ (1) CZ298035B6 (it)
DE (1) DE69613717T2 (it)
DK (1) DK0876619T3 (it)
ES (1) ES2160830T3 (it)
GR (1) GR3036790T3 (it)
HU (1) HUP9901931A3 (it)
IT (1) IT1282829B1 (it)
MX (1) MX9805100A (it)
NO (1) NO315877B1 (it)
NZ (1) NZ315085A (it)
PL (1) PL327496A1 (it)
PT (1) PT876619E (it)
RO (1) RO119659B1 (it)
RU (1) RU2212775C2 (it)
SI (1) SI9620133B (it)
TR (1) TR199801178T2 (it)
UA (1) UA28121C2 (it)
WO (1) WO1997023784A1 (it)

Families Citing this family (11)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
IT1282827B1 (it) 1995-09-22 1998-03-31 New System Srl Macchina per il controllo contrapposto dei circuiti stampati
IL152940A0 (en) 2000-07-19 2003-06-24 Orbotech Ltd Apparatus and method for electrical testing of electrical circuits
CN100357752C (zh) * 2004-03-26 2007-12-26 广辉电子股份有限公司 线路缺陷检测维修设备及方法
WO2005093441A1 (fr) * 2004-03-26 2005-10-06 Quanta Display Inc. Dispositif et procede de reparation et de mise a l'essai d'un defaut de ligne
CN100388001C (zh) * 2004-05-24 2008-05-14 名威科技实业有限公司 具有多个侦测单元的检测芯片
DE102009004555A1 (de) 2009-01-14 2010-09-30 Atg Luther & Maelzer Gmbh Verfahren zum Prüfen von Leiterplatten
CN108761233B (zh) * 2018-05-23 2024-07-26 沈小晴 针对ied设备柔性化测试的模块可切换针盘设备及测试方法
CN113039443A (zh) * 2018-09-11 2021-06-25 迈吉克汽车运动公司 用于在电气和/或电子电路上进行测试的工具和组件
KR102501995B1 (ko) * 2019-12-18 2023-02-20 주식회사 아도반테스토 하나 이상의 피시험 장치를 테스트하기 위한 자동식 테스트 장비 및 자동식 테스트 장비의 작동 방법
DE112020000048T5 (de) 2019-12-18 2022-06-02 Advantest Corporation Automatisierte prüfeinrichtung zum prüfen eines oder mehrerer prüfobjekte undverfahren zum betreiben einer automatisierten prüfeinrichtung
TWI797552B (zh) * 2020-02-06 2023-04-01 日商愛德萬測試股份有限公司 用於測試一或多個受測裝置之自動測試設備及用於操作自動測試設備的方法

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
SU563614A1 (ru) * 1974-04-17 1977-06-30 Московский Ордена Ленина Энергетический Институт Вихретоковый преобразователь
DE2628428C3 (de) * 1976-06-24 1979-02-15 Siemens Ag, 1000 Berlin Und 8000 Muenchen Adapter zum Verbinden von Anschluß- und/oder Prüfpunkten einer Baugruppe mit einer Mefischaltung
EP0256368B1 (de) * 1986-08-07 1992-09-30 Siemens Aktiengesellschaft Prüfeinrichtung für beidseitige, zweistufige Kontaktierung bestückter Leiterplatten
US4841241A (en) * 1986-08-07 1989-06-20 Siemens Aktiengesellschaft Testing device for both-sided contacting of component-equipped printed circuit boards
US4975637A (en) * 1989-12-29 1990-12-04 International Business Machines Corporation Method and apparatus for integrated circuit device testing
US5436567A (en) * 1993-02-08 1995-07-25 Automated Test Engineering, Inc. Double-sided automatic test equipment probe clamshell with vacuum-actuated bottom probe contacts and mechanical-actuated top probe contacts

Also Published As

Publication number Publication date
NZ315085A (en) 2007-12-21
EP0876619B1 (en) 2001-07-04
SI9620133A (sl) 1998-12-31
CZ298035B6 (cs) 2007-05-30
AU718507B2 (en) 2000-04-13
CZ187498A3 (cs) 1998-11-11
PL327496A1 (en) 1998-12-21
DK0876619T3 (da) 2001-10-22
KR19990076663A (ko) 1999-10-15
JP2000502791A (ja) 2000-03-07
KR100526744B1 (ko) 2005-12-21
CN1175270C (zh) 2004-11-10
CA2241326C (en) 2001-11-27
ATE202850T1 (de) 2001-07-15
RU2212775C2 (ru) 2003-09-20
TR199801178T2 (xx) 1998-12-21
CA2241326A1 (en) 1997-07-03
RO119659B1 (ro) 2005-01-28
GR3036790T3 (en) 2002-01-31
ITUD950251A1 (it) 1997-06-22
HUP9901931A3 (en) 1999-11-29
BR9612251A (pt) 1999-07-13
NO982707D0 (no) 1998-06-12
EP0876619A1 (en) 1998-11-11
IT1282829B1 (it) 1998-03-31
NO315877B1 (no) 2003-11-03
DE69613717D1 (de) 2001-08-09
WO1997023784A1 (en) 1997-07-03
PT876619E (pt) 2001-12-28
MX9805100A (es) 1998-10-31
HUP9901931A2 (hu) 1999-10-28
NO982707L (no) 1998-07-13
DE69613717T2 (de) 2002-05-16
UA28121C2 (uk) 2000-10-16
ES2160830T3 (es) 2001-11-16
AU6668496A (en) 1997-07-17
CN1205774A (zh) 1999-01-20
US6124722A (en) 2000-09-26
ITUD950251A0 (it) 1995-12-22

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Legal Events

Date Code Title Description
IF Valid on the event date
OU02 Decision according to article 73(2) ipa 1992, publication of decision on partial fulfilment of the invention and change of patent claims

Effective date: 20050725

KO00 Lapse of patent

Effective date: 20070315