SI3042447T1 - Merilni ojačevalnik z justiranjem v ozadju in postopek za to - Google Patents

Merilni ojačevalnik z justiranjem v ozadju in postopek za to

Info

Publication number
SI3042447T1
SI3042447T1 SI201431858T SI201431858T SI3042447T1 SI 3042447 T1 SI3042447 T1 SI 3042447T1 SI 201431858 T SI201431858 T SI 201431858T SI 201431858 T SI201431858 T SI 201431858T SI 3042447 T1 SI3042447 T1 SI 3042447T1
Authority
SI
Slovenia
Prior art keywords
method therefor
measuring amplifier
background adjustment
adjustment
background
Prior art date
Application number
SI201431858T
Other languages
English (en)
Inventor
Marco M. SCHACK
Herbert Kitzing
Original Assignee
Hottinger Bruel & Kjaer Gmbh
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hottinger Bruel & Kjaer Gmbh filed Critical Hottinger Bruel & Kjaer Gmbh
Publication of SI3042447T1 publication Critical patent/SI3042447T1/sl

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1004—Calibration or testing without interrupting normal operation, e.g. by providing an additional component for temporarily replacing components to be tested or calibrated
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
    • G01D18/00—Testing or calibrating apparatus or arrangements provided for in groups G01D1/00 - G01D15/00
    • G01D18/002—Automatic recalibration
    • G01D18/004—Continuous recalibration
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
    • H03F3/45—Differential amplifiers
    • H03F3/45071—Differential amplifiers with semiconductor devices only
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/10—Calibration or testing
    • H03M1/1009—Calibration
    • H03M1/1028—Calibration at two points of the transfer characteristic, i.e. by adjusting two reference values, e.g. offset and gain error
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/261—Amplifier which being suitable for instrumentation applications
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03F—AMPLIFIERS
    • H03F2200/00—Indexing scheme relating to amplifiers
    • H03F2200/375—Circuitry to compensate the offset being present in an amplifier
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M1/00—Analogue/digital conversion; Digital/analogue conversion
    • H03M1/12—Analogue/digital converters

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Power Engineering (AREA)
  • Amplifiers (AREA)
  • Control Of Amplification And Gain Control (AREA)
  • Testing Or Calibration Of Command Recording Devices (AREA)
  • Analogue/Digital Conversion (AREA)
SI201431858T 2013-09-06 2014-09-05 Merilni ojačevalnik z justiranjem v ozadju in postopek za to SI3042447T1 (sl)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE102013014876.6A DE102013014876B3 (de) 2013-09-06 2013-09-06 Messverstärker mit Hintergrundjustierung und Verfahren dafür
PCT/DE2014/000463 WO2015032382A1 (de) 2013-09-06 2014-09-05 Messverstärker mit hintergrundjustierung und verfahren dafür
EP14789979.3A EP3042447B1 (de) 2013-09-06 2014-09-05 Messverstärker mit hintergrundjustierung und verfahren dafür

Publications (1)

Publication Number Publication Date
SI3042447T1 true SI3042447T1 (sl) 2021-09-30

Family

ID=51830163

Family Applications (1)

Application Number Title Priority Date Filing Date
SI201431858T SI3042447T1 (sl) 2013-09-06 2014-09-05 Merilni ojačevalnik z justiranjem v ozadju in postopek za to

Country Status (8)

Country Link
US (1) US10295383B2 (sl)
EP (1) EP3042447B1 (sl)
JP (1) JP6509226B2 (sl)
KR (1) KR102433284B1 (sl)
CN (1) CN105659500B (sl)
DE (1) DE102013014876B3 (sl)
SI (1) SI3042447T1 (sl)
WO (1) WO2015032382A1 (sl)

Family Cites Families (30)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3206192A1 (de) * 1982-02-20 1983-09-01 Datron-Electronic Pichl & Schulte KG, 6109 Mühltal Verfahren und vorrichtung zur automatischen nullpunktkorrektur bei messeinrichtungen
JPS63209208A (ja) 1987-02-25 1988-08-30 Yokogawa Electric Corp 増幅装置
JPH01102335A (ja) 1987-10-16 1989-04-20 Ono Sokki Co Ltd 車載型測定装置
JPH1185167A (ja) 1997-09-16 1999-03-30 Hitachi Ltd 能動騒音制御装置搭載の電子機器装置
US6445317B2 (en) * 1998-11-20 2002-09-03 Telefonaktiebolaget L M Ericsson (Publ) Adaptively calibrating analog-to-digital conversion
US6127955A (en) * 1998-11-20 2000-10-03 Telefonaktiebolaget Lm Ericsson (Publ) Method and system for calibrating analog-to-digital conversion
WO2001078297A2 (en) * 2000-04-07 2001-10-18 Comrex Corporation Method and apparatus for synchronizing data transmission and reception over a network
SE517457C2 (sv) * 2000-08-29 2002-06-11 Ericsson Telefon Ab L M Metod och anordning för bakgrundskalibrering av A/D- omvandlare
JP2003133954A (ja) * 2001-10-26 2003-05-09 Agilent Technologies Japan Ltd インターリーブａ／ｄ変換器の校正方法
DE60308135T2 (de) * 2003-01-31 2006-12-21 Agilent Technologies, Inc. (n.d.Ges.d.Staates Delaware), Palo Alto Sensorvorrichtung, Messsystem und Verfahren zur Kalibrierung
DE602005006765D1 (de) * 2005-01-11 2008-06-26 Anritsu Corp Zeitverschachtelungstyps und das bauelement verwe
US7227479B1 (en) 2005-12-22 2007-06-05 Lucent Technologies Inc. Digital background calibration for time-interlaced analog-to-digital converters
DE102006005835A1 (de) * 2006-02-08 2007-08-16 Logicdata Electronic & Software Entwicklungs Gmbh Schaltungsanordnung und Verfahren zur Kalibrierung einer Sensoranordnung, insbesondere für motorisch verstellbare Möbel, sowie Messverstärker und Sensoranordnung
DE102006051365B4 (de) * 2006-10-27 2011-04-21 Sartorius Ag Messverstärkungsvorrichtung und -verfahren
DE102006051364B4 (de) * 2006-10-27 2010-09-23 Sartorius Ag Messverstärkungsvorrichtung und -verfahren
JP2008131298A (ja) 2006-11-20 2008-06-05 Fyuutorekku:Kk アナログ／ディジタル変換装置及びアナログ／ディジタル変換補正方法
CN101188058A (zh) * 2007-10-29 2008-05-28 杭州锐达数字技术有限公司 基于多个数字路径和交叉校准的数据采集系统及方法
DE102007052440B4 (de) 2007-11-02 2009-11-19 Hottinger Baldwin Messtechnik Gmbh Verfahren und Anordnung eines Messverstärkers zur Korrektur von Eingangssignalen
TW200952328A (en) * 2008-06-13 2009-12-16 Univ Nat Chiao Tung Background calibration method for calibrating non-linear distortion of amplifier and system thereof
US20100002747A1 (en) * 2008-07-03 2010-01-07 Bosch Enrique Company System and method for n'th order digital piece-wise linear compensation of the variations with temperature of the non-linearities for high accuracy digital temperature sensors in an extended temperature range
US7973596B2 (en) * 2009-05-12 2011-07-05 Number 14 B.V. Low-noise, low-power, low drift offset correction in operational and instrumentation amplifiers
US8279097B2 (en) * 2009-07-16 2012-10-02 Taiwan Semiconductor Manufacturing Company, Ltd. Background calibration of analog-to-digital converters
JP5376151B2 (ja) * 2009-08-26 2013-12-25 日本電気株式会社 Ａ／ｄ変換装置
DE102010017465A1 (de) * 2010-06-18 2011-12-22 Phoenix Contact Gmbh & Co. Kg Messumformer mit zwei Übertragungskanälen
US8279100B2 (en) * 2010-09-30 2012-10-02 Lockheed Martin Corporation Complex analog to digital converter (CADC) system on chip double rate architecture
US8380145B2 (en) * 2011-06-08 2013-02-19 Mediatek Singapore Pte. Ltd. Integrated circuit, wireless communication unit and method for quadrature power detection
FR2982101A1 (fr) * 2011-11-02 2013-05-03 St Microelectronics Grenoble 2 Etalonnage d'un adc entrelace
CN102386921B (zh) * 2011-11-15 2014-04-09 北京时代民芯科技有限公司 一种流水线adc多比特子dac电容失配校准方法
CN102981113B (zh) * 2011-12-26 2016-02-17 中国电子科技集团公司第四十一研究所 一种高精度高线性高温度稳定性的动态校准源系统
US9401726B2 (en) * 2014-11-26 2016-07-26 Silicon Laboratories Inc. Background calibration of time-interleaved analog-to-digital converters

Also Published As

Publication number Publication date
JP6509226B2 (ja) 2019-05-08
US10295383B2 (en) 2019-05-21
KR20160051884A (ko) 2016-05-11
CN105659500A (zh) 2016-06-08
DE102013014876B3 (de) 2014-12-11
JP2016539344A (ja) 2016-12-15
KR102433284B1 (ko) 2022-08-16
EP3042447B1 (de) 2021-04-21
CN105659500B (zh) 2020-12-22
WO2015032382A1 (de) 2015-03-12
US20160298987A1 (en) 2016-10-13
EP3042447A1 (de) 2016-07-13

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