SG90756A1 - Method of reading mark and apparatus for the same - Google Patents

Method of reading mark and apparatus for the same

Info

Publication number
SG90756A1
SG90756A1 SG200005850A SG200005850A SG90756A1 SG 90756 A1 SG90756 A1 SG 90756A1 SG 200005850 A SG200005850 A SG 200005850A SG 200005850 A SG200005850 A SG 200005850A SG 90756 A1 SG90756 A1 SG 90756A1
Authority
SG
Singapore
Prior art keywords
same
reading mark
mark
reading
Prior art date
Application number
SG200005850A
Other languages
English (en)
Inventor
Kunimasa Nakata
Original Assignee
Tdk Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tdk Corp filed Critical Tdk Corp
Publication of SG90756A1 publication Critical patent/SG90756A1/en

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11B—INFORMATION STORAGE BASED ON RELATIVE MOVEMENT BETWEEN RECORD CARRIER AND TRANSDUCER
    • G11B5/00—Recording by magnetisation or demagnetisation of a record carrier; Reproducing by magnetic means; Record carriers therefor
    • G11B5/127—Structure or manufacture of heads, e.g. inductive
    • G11B5/31—Structure or manufacture of heads, e.g. inductive using thin films
    • G11B5/3163—Fabrication methods or processes specially adapted for a particular head structure, e.g. using base layers for electroplating, using functional layers for masking, using energy or particle beams for shaping the structure or modifying the properties of the basic layers
    • G11B5/3173—Batch fabrication, i.e. producing a plurality of head structures in one batch
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING OR COUNTING
    • G06V—IMAGE OR VIDEO RECOGNITION OR UNDERSTANDING
    • G06V10/00—Arrangements for image or video recognition or understanding
    • G06V10/10—Image acquisition
    • G06V10/12—Details of acquisition arrangements; Constructional details thereof
    • G06V10/14—Optical characteristics of the device performing the acquisition or on the illumination arrangements
    • G06V10/145—Illumination specially adapted for pattern recognition, e.g. using gratings

Landscapes

  • Engineering & Computer Science (AREA)
  • Artificial Intelligence (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Multimedia (AREA)
  • Theoretical Computer Science (AREA)
  • Manufacturing & Machinery (AREA)
  • Magnetic Heads (AREA)
  • Adjustment Of The Magnetic Head Position Track Following On Tapes (AREA)
SG200005850A 1999-10-20 2000-10-12 Method of reading mark and apparatus for the same SG90756A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP33477799A JP2001118232A (ja) 1999-10-20 1999-10-20 記号読取方法および装置

Publications (1)

Publication Number Publication Date
SG90756A1 true SG90756A1 (en) 2002-08-20

Family

ID=18281128

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200005850A SG90756A1 (en) 1999-10-20 2000-10-12 Method of reading mark and apparatus for the same

Country Status (5)

Country Link
US (1) US6721443B1 (zh)
JP (1) JP2001118232A (zh)
CN (1) CN1308315A (zh)
HK (1) HK1039825A1 (zh)
SG (1) SG90756A1 (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3614418B2 (ja) * 2002-10-04 2005-01-26 株式会社Ｎｅｏｍａｘ 薄膜磁気ヘッド用基板およびその製造方法
JP2005285308A (ja) * 2004-03-02 2005-10-13 Tdk Corp 薄膜処理方法及び薄膜磁気ヘッドの製造方法
JP2005310230A (ja) * 2004-04-20 2005-11-04 Alps Electric Co Ltd 薄膜磁気ヘッド及びその個体識別方法
JP2006172080A (ja) * 2004-12-15 2006-06-29 Hitachi Global Storage Technologies Netherlands Bv 光源のパラメータ設定方法及び識別記号の認識方法
JP5939699B2 (ja) * 2011-03-07 2016-06-22 いすゞ自動車株式会社 画像認識システム
CN104907914A (zh) * 2014-03-11 2015-09-16 张家港鹿鸣生物质能源设备有限公司 一种生物质颗粒机模板抛光装置

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0132520B1 (en) * 1983-06-23 1990-10-24 International Business Machines Corporation A method of producing a semiconductor device
CH684509A5 (de) * 1992-08-27 1994-09-30 Esec Sa Verfahren zur Prozess-Steuerung und -Protokollierung bei der Montage von Halbleiterbauteilen.
JPH10185530A (ja) * 1996-08-23 1998-07-14 Asahi Optical Co Ltd パターン読み取り装置
US5837963A (en) * 1995-08-02 1998-11-17 Tdk Corporation Method of manufacturing a thin film magnetic head with identification marks
US5942763A (en) * 1997-04-11 1999-08-24 Mitsubishi Denki Kabushiki Kaisha Apparatus and method for identifying an identification mark of a wafer
US5984190A (en) * 1997-05-15 1999-11-16 Micron Technology, Inc. Method and apparatus for identifying integrated circuits

Family Cites Families (7)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0652138A (ja) * 1992-08-04 1994-02-25 Nippon Telegr & Teleph Corp <Ntt> 光受信器の学習方法および装置
JPH07141461A (ja) 1993-11-16 1995-06-02 Sony Corp 半導体ウエハのような平面基板の認識記号の読取り方法、認識記号読取り装置及び高速ウエハ移載装置
JPH08130171A (ja) 1994-11-02 1996-05-21 Hitachi Ltd 半導体製造装置およびそれに用いるｉｄマークの認識方法
US6104579A (en) * 1996-04-11 2000-08-15 Sony Corporation Magnetic disk head having data zone and control signal zones which generate different lifts when flown over by a head slider
US6310689B1 (en) 1996-08-23 2001-10-30 Asahi Kogaku Kogyo Kabushiki Kaisha Pattern reading apparatus
US6504620B1 (en) * 1997-03-25 2003-01-07 Fuji Photo Film Co., Ltd. Print ordering method, printing system and film scanner
JP3544480B2 (ja) * 1998-10-30 2004-07-21 日立金属株式会社 薄膜磁気ヘッドの製造方法

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0132520B1 (en) * 1983-06-23 1990-10-24 International Business Machines Corporation A method of producing a semiconductor device
CH684509A5 (de) * 1992-08-27 1994-09-30 Esec Sa Verfahren zur Prozess-Steuerung und -Protokollierung bei der Montage von Halbleiterbauteilen.
US5837963A (en) * 1995-08-02 1998-11-17 Tdk Corporation Method of manufacturing a thin film magnetic head with identification marks
JPH10185530A (ja) * 1996-08-23 1998-07-14 Asahi Optical Co Ltd パターン読み取り装置
US5942763A (en) * 1997-04-11 1999-08-24 Mitsubishi Denki Kabushiki Kaisha Apparatus and method for identifying an identification mark of a wafer
US5984190A (en) * 1997-05-15 1999-11-16 Micron Technology, Inc. Method and apparatus for identifying integrated circuits

Also Published As

Publication number Publication date
CN1308315A (zh) 2001-08-15
US6721443B1 (en) 2004-04-13
HK1039825A1 (zh) 2002-05-10
JP2001118232A (ja) 2001-04-27

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