SG78405A1 - Polishing composition and rinsing composition - Google Patents
Polishing composition and rinsing compositionInfo
- Publication number
- SG78405A1 SG78405A1 SG1999005634A SG1999005634A SG78405A1 SG 78405 A1 SG78405 A1 SG 78405A1 SG 1999005634 A SG1999005634 A SG 1999005634A SG 1999005634 A SG1999005634 A SG 1999005634A SG 78405 A1 SG78405 A1 SG 78405A1
- Authority
- SG
- Singapore
- Prior art keywords
- composition
- rinsing
- polishing
- polishing composition
- rinsing composition
- Prior art date
Links
Classifications
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09G—POLISHING COMPOSITIONS; SKI WAXES
- C09G1/00—Polishing compositions
- C09G1/02—Polishing compositions containing abrasives or grinding agents
-
- C—CHEMISTRY; METALLURGY
- C09—DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
- C09K—MATERIALS FOR MISCELLANEOUS APPLICATIONS, NOT PROVIDED FOR ELSEWHERE
- C09K3/00—Materials not provided for elsewhere
- C09K3/14—Anti-slip materials; Abrasives
- C09K3/1454—Abrasive powders, suspensions and pastes for polishing
- C09K3/1463—Aqueous liquid suspensions
Landscapes
- Chemical & Material Sciences (AREA)
- Organic Chemistry (AREA)
- Engineering & Computer Science (AREA)
- Materials Engineering (AREA)
- Manufacturing Of Magnetic Record Carriers (AREA)
- Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
- Detergent Compositions (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP32645198A JP4014741B2 (ja) | 1998-11-17 | 1998-11-17 | リンス用組成物 |
JP32643398 | 1998-11-17 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG78405A1 true SG78405A1 (en) | 2001-02-20 |
Family
ID=26572182
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG1999005634A SG78405A1 (en) | 1998-11-17 | 1999-11-12 | Polishing composition and rinsing composition |
Country Status (6)
Country | Link |
---|---|
US (1) | US6117220A (zh) |
KR (1) | KR20000035505A (zh) |
CN (1) | CN1146623C (zh) |
GB (1) | GB2350369B (zh) |
SG (1) | SG78405A1 (zh) |
TW (1) | TW562851B (zh) |
Families Citing this family (60)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US6475407B2 (en) * | 1998-05-19 | 2002-11-05 | Showa Denko K.K. | Composition for polishing metal on semiconductor wafer and method of using same |
US6553788B1 (en) * | 1999-02-23 | 2003-04-29 | Nippon Sheet Glass Co., Ltd. | Glass substrate for magnetic disk and method for manufacturing |
US6428392B1 (en) * | 1999-03-23 | 2002-08-06 | Seimi Chemical Co., Ltd. | Abrasive |
US6673757B1 (en) * | 2000-03-22 | 2004-01-06 | Ashland Inc. | Process for removing contaminant from a surface and composition useful therefor |
US6258140B1 (en) * | 1999-09-27 | 2001-07-10 | Fujimi America Inc. | Polishing composition |
US6488729B1 (en) * | 1999-09-30 | 2002-12-03 | Showa Denko K.K. | Polishing composition and method |
US6454821B1 (en) * | 2000-06-21 | 2002-09-24 | Praxair S. T. Technology, Inc. | Polishing composition and method |
DE60124473T2 (de) * | 2000-09-08 | 2007-09-06 | Kanto Kagaku K.K. | Ätzflüssigkeitszusammensetzung |
JP4009986B2 (ja) | 2000-11-29 | 2007-11-21 | 株式会社フジミインコーポレーテッド | 研磨用組成物、およびそれを用いてメモリーハードディスクを研磨する研磨方法 |
CN100378145C (zh) * | 2001-06-21 | 2008-04-02 | 花王株式会社 | 研磨液组合物 |
JP4003116B2 (ja) | 2001-11-28 | 2007-11-07 | 株式会社フジミインコーポレーテッド | 磁気ディスク用基板の研磨用組成物及びそれを用いた研磨方法 |
US6821897B2 (en) * | 2001-12-05 | 2004-11-23 | Cabot Microelectronics Corporation | Method for copper CMP using polymeric complexing agents |
CN1240816C (zh) * | 2001-12-12 | 2006-02-08 | 海力士半导体有限公司 | 除去光致抗蚀剂的洗涤液 |
US6776810B1 (en) * | 2002-02-11 | 2004-08-17 | Cabot Microelectronics Corporation | Anionic abrasive particles treated with positively charged polyelectrolytes for CMP |
US7677956B2 (en) | 2002-05-10 | 2010-03-16 | Cabot Microelectronics Corporation | Compositions and methods for dielectric CMP |
JP4095833B2 (ja) * | 2002-05-30 | 2008-06-04 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
US6974777B2 (en) * | 2002-06-07 | 2005-12-13 | Cabot Microelectronics Corporation | CMP compositions for low-k dielectric materials |
US6936543B2 (en) * | 2002-06-07 | 2005-08-30 | Cabot Microelectronics Corporation | CMP method utilizing amphiphilic nonionic surfactants |
GB2393186B (en) * | 2002-07-31 | 2006-02-22 | Kao Corp | Polishing composition |
GB2395486B (en) * | 2002-10-30 | 2006-08-16 | Kao Corp | Polishing composition |
US7071105B2 (en) | 2003-02-03 | 2006-07-04 | Cabot Microelectronics Corporation | Method of polishing a silicon-containing dielectric |
US20050022456A1 (en) * | 2003-07-30 | 2005-02-03 | Babu S. V. | Polishing slurry and method for chemical-mechanical polishing of copper |
US7186653B2 (en) * | 2003-07-30 | 2007-03-06 | Climax Engineered Materials, Llc | Polishing slurries and methods for chemical mechanical polishing |
US7427361B2 (en) * | 2003-10-10 | 2008-09-23 | Dupont Air Products Nanomaterials Llc | Particulate or particle-bound chelating agents |
JP4249008B2 (ja) * | 2003-12-25 | 2009-04-02 | 株式会社フジミインコーポレーテッド | 研磨用組成物及びそれを用いた研磨方法 |
DE602005000732T2 (de) * | 2004-06-25 | 2007-12-06 | Jsr Corp. | Reinigungszusammensetzung für Halbleiterkomponente und Verfahren zur Herstellung eines Halbleitergeräts |
JP2006077127A (ja) * | 2004-09-09 | 2006-03-23 | Fujimi Inc | 研磨用組成物及びそれを用いた研磨方法 |
JP4667848B2 (ja) * | 2004-12-13 | 2011-04-13 | 花王株式会社 | ガラス基板用研磨液組成物 |
WO2006105020A1 (en) | 2005-03-25 | 2006-10-05 | Dupont Air Products Nanomaterials Llc | Dihydroxy enol compounds used in chemical mechanical polishing compositions having metal ion oxidizers |
KR101100861B1 (ko) * | 2005-04-21 | 2012-01-02 | 삼성코닝정밀소재 주식회사 | 금속 산화물 서스펜션 제조 방법 |
US20060280860A1 (en) * | 2005-06-09 | 2006-12-14 | Enthone Inc. | Cobalt electroless plating in microelectronic devices |
US7410899B2 (en) * | 2005-09-20 | 2008-08-12 | Enthone, Inc. | Defectivity and process control of electroless deposition in microelectronics applications |
US7691287B2 (en) * | 2007-01-31 | 2010-04-06 | Dupont Air Products Nanomaterials Llc | Method for immobilizing ligands and organometallic compounds on silica surface, and their application in chemical mechanical planarization |
US8901053B2 (en) * | 2007-09-14 | 2014-12-02 | Kao Corporation | Aqueous cleaning composition for substrate for perpendicular magnetic recording hard disk |
JP2010080022A (ja) | 2008-09-29 | 2010-04-08 | Showa Denko Kk | 垂直磁気記録媒体の製造方法 |
US8324143B2 (en) | 2008-12-19 | 2012-12-04 | Sanyo Chemical Industries, Ltd. | Cleaning agent for electronic materials |
KR101126530B1 (ko) * | 2010-06-09 | 2012-03-22 | 주식회사 엔유씨전자 | 마그네슘 합금의 화학연마 방법 |
WO2013088928A1 (ja) * | 2011-12-14 | 2013-06-20 | 旭硝子株式会社 | 洗浄剤、および炭化ケイ素単結晶基板の製造方法 |
US8859428B2 (en) | 2012-10-19 | 2014-10-14 | Air Products And Chemicals, Inc. | Chemical mechanical polishing (CMP) composition for shallow trench isolation (STI) applications and methods of making thereof |
US9058976B2 (en) * | 2012-11-06 | 2015-06-16 | International Business Machines Corporation | Cleaning composition and process for cleaning semiconductor devices and/or tooling during manufacturing thereof |
CN102977790B (zh) * | 2012-12-21 | 2015-01-07 | 青岛文创科技有限公司 | 一种抛光剂 |
KR101405333B1 (ko) * | 2013-09-12 | 2014-06-11 | 유비머트리얼즈주식회사 | 연마 입자, 연마 슬러리 및 이를 이용한 반도체 소자의 제조 방법 |
CN105234835A (zh) * | 2015-08-27 | 2016-01-13 | 安徽威铭耐磨材料有限公司 | 一种含纳米碳化铌弥散增强的高抗蚀超细粒度cbn砂轮及其制备方法 |
CN105234837A (zh) * | 2015-08-27 | 2016-01-13 | 安徽威铭耐磨材料有限公司 | 一种高速磨削用自修复型超细粒度cbn砂轮及其制备方法 |
CN105081990A (zh) * | 2015-08-27 | 2015-11-25 | 安徽威铭耐磨材料有限公司 | 一种含纳米纤维素晶须的高分散性超硬超细粒度cbn砂轮及其制备方法 |
CN105127914A (zh) * | 2015-08-27 | 2015-12-09 | 安徽威铭耐磨材料有限公司 | 一种含纳米碳球的高表面光滑度超细粒度cbn砂轮及其制备方法 |
CN105196192A (zh) * | 2015-08-27 | 2015-12-30 | 安徽威铭耐磨材料有限公司 | 一种含电气石的高活性高孔径率超细粒度cbn砂轮及其制备方法 |
CN105127915A (zh) * | 2015-08-27 | 2015-12-09 | 安徽威铭耐磨材料有限公司 | 一种含纳米碳纤维的高磨削精度高强度超细粒度cbn砂轮及其制备方法 |
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CN105234836A (zh) * | 2015-08-27 | 2016-01-13 | 安徽威铭耐磨材料有限公司 | 一种含六钛酸钾晶须的低摩擦损耗超细粒度cbn砂轮及其制备方法 |
CN105252426A (zh) * | 2015-08-27 | 2016-01-20 | 安徽威铭耐磨材料有限公司 | 一种高耐磨高致密度的超细粒度cbn砂轮及其制备方法 |
CN105234838A (zh) * | 2015-08-27 | 2016-01-13 | 安徽威铭耐磨材料有限公司 | 一种含有纳米硼化锆的耐磨高光滑度超细粒度cbn砂轮及其制备方法 |
CN105234834A (zh) * | 2015-08-27 | 2016-01-13 | 安徽威铭耐磨材料有限公司 | 一种高耐磨高导热性的超细粒度cbn砂轮及其制备方法 |
CN105108664A (zh) * | 2015-08-28 | 2015-12-02 | 安徽威铭耐磨材料有限公司 | 一种具有减振降噪功效的高磨削精度超细粒度cbn砂轮及其制备方法 |
US10294399B2 (en) * | 2017-01-05 | 2019-05-21 | Cabot Microelectronics Corporation | Composition and method for polishing silicon carbide |
CN111020591B (zh) * | 2019-12-09 | 2021-05-04 | 怀化学院 | 一种疏水性表面抛光的铝合金的制备方法 |
CN115247026A (zh) * | 2021-04-26 | 2022-10-28 | 福建晶安光电有限公司 | 一种蓝宝石抛光液及其制备方法 |
Family Cites Families (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6487146A (en) * | 1987-09-22 | 1989-03-31 | Lion Corp | Dispersant for polishing agent |
JPH0284485A (ja) * | 1988-09-20 | 1990-03-26 | Showa Denko Kk | アルミニウム磁気ディスク研磨用組成物 |
CA2021126C (en) * | 1989-07-13 | 1994-12-27 | David Elliott | Machine dishwashing compositions |
JP3106339B2 (ja) * | 1994-02-04 | 2000-11-06 | 株式会社フジミインコーポレーテッド | 研磨用組成物 |
AU5884696A (en) * | 1995-06-23 | 1997-01-22 | Bausch & Lomb Incorporated | Method for cleaning contact lenses utilizing polysulfonates |
CA2234407C (en) * | 1995-10-09 | 2005-08-02 | The Procter & Gamble Company | Hard surface cleaning compositions |
EP0786504A3 (en) * | 1996-01-29 | 1998-05-20 | Fujimi Incorporated | Polishing composition |
JPH1036818A (ja) * | 1996-07-24 | 1998-02-10 | Mitsubishi Chem Corp | ハードディスク基板の研磨用組成物及びこれを用いた研磨方法 |
JP4141514B2 (ja) * | 1996-11-26 | 2008-08-27 | 株式会社フジミインコーポレーテッド | リンス用組成物 |
SG54606A1 (en) * | 1996-12-05 | 1998-11-16 | Fujimi Inc | Polishing composition |
JPH10204416A (ja) * | 1997-01-21 | 1998-08-04 | Fujimi Inkooporeetetsudo:Kk | 研磨用組成物 |
EP0875554B1 (en) * | 1997-04-30 | 2003-06-11 | The Procter & Gamble Company | Acidic limescale removal compositions |
-
1999
- 1999-11-12 SG SG1999005634A patent/SG78405A1/en unknown
- 1999-11-16 US US09/441,295 patent/US6117220A/en not_active Expired - Fee Related
- 1999-11-16 KR KR1019990050868A patent/KR20000035505A/ko not_active Application Discontinuation
- 1999-11-17 GB GB9927203A patent/GB2350369B/en not_active Expired - Fee Related
- 1999-11-17 TW TW088120069A patent/TW562851B/zh active
- 1999-11-17 CN CNB991248880A patent/CN1146623C/zh not_active Expired - Lifetime
Also Published As
Publication number | Publication date |
---|---|
GB9927203D0 (en) | 2000-01-12 |
KR20000035505A (ko) | 2000-06-26 |
GB2350369A (en) | 2000-11-29 |
CN1146623C (zh) | 2004-04-21 |
TW562851B (en) | 2003-11-21 |
CN1253963A (zh) | 2000-05-24 |
GB2350369B (en) | 2003-08-20 |
US6117220A (en) | 2000-09-12 |
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