SG71910A1 - Probe end cleaning sheet - Google Patents
Probe end cleaning sheetInfo
- Publication number
- SG71910A1 SG71910A1 SG1999000645A SG1999000645A SG71910A1 SG 71910 A1 SG71910 A1 SG 71910A1 SG 1999000645 A SG1999000645 A SG 1999000645A SG 1999000645 A SG1999000645 A SG 1999000645A SG 71910 A1 SG71910 A1 SG 71910A1
- Authority
- SG
- Singapore
- Prior art keywords
- cleaning sheet
- probe end
- end cleaning
- probe
- sheet
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D11/00—Constructional features of flexible abrasive materials; Special features in the manufacture of such materials
- B24D11/001—Manufacture of flexible abrasive materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B29/00—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents
- B24B29/02—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents designed for particular workpieces
- B24B29/04—Machines or devices for polishing surfaces on work by means of tools made of soft or flexible material with or without the application of solid or liquid polishing agents designed for particular workpieces for rotationally symmetrical workpieces, e.g. ball-, cylinder- or cone-shaped workpieces
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/02—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent
- B24D3/20—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents the constituent being used as bonding agent and being essentially organic
- B24D3/22—Rubbers synthetic or natural
Landscapes
- Engineering & Computer Science (AREA)
- Mechanical Engineering (AREA)
- Manufacturing & Machinery (AREA)
- Testing Or Measuring Of Semiconductors Or The Like (AREA)
- Measuring Leads Or Probes (AREA)
- Polishing Bodies And Polishing Tools (AREA)
- Tests Of Electronic Circuits (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
JP10056234A JPH11238768A (ja) | 1998-02-20 | 1998-02-20 | プローブ先端クリーニングシート |
Publications (1)
Publication Number | Publication Date |
---|---|
SG71910A1 true SG71910A1 (en) | 2000-04-18 |
Family
ID=13021424
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG1999000645A SG71910A1 (en) | 1998-02-20 | 1999-02-19 | Probe end cleaning sheet |
Country Status (6)
Country | Link |
---|---|
US (1) | US20020028641A1 (ja) |
EP (1) | EP0937541A3 (ja) |
JP (1) | JPH11238768A (ja) |
CN (1) | CN1232288A (ja) |
SG (1) | SG71910A1 (ja) |
TW (1) | TW409322B (ja) |
Families Citing this family (23)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
DE19952183B4 (de) * | 1999-10-29 | 2008-11-06 | Micronas Gmbh | Einrichtung zur Spitzenformung |
JP2002326169A (ja) * | 2001-05-02 | 2002-11-12 | Nihon Micro Coating Co Ltd | 接触子クリーニングシート及び方法 |
US6908364B2 (en) | 2001-08-02 | 2005-06-21 | Kulicke & Soffa Industries, Inc. | Method and apparatus for probe tip cleaning and shaping pad |
US7182672B2 (en) | 2001-08-02 | 2007-02-27 | Sv Probe Pte. Ltd. | Method of probe tip shaping and cleaning |
JP2005249409A (ja) | 2004-03-01 | 2005-09-15 | Oki Electric Ind Co Ltd | プローブ針用クリーニングシート |
US9833818B2 (en) | 2004-09-28 | 2017-12-05 | International Test Solutions, Inc. | Working surface cleaning system and method |
JP4745814B2 (ja) * | 2005-12-19 | 2011-08-10 | 東京エレクトロン株式会社 | プローブの研磨部材 |
CN100504398C (zh) * | 2005-12-22 | 2009-06-24 | 王志忠 | 安装在测试卡上的探针表面处理的方法 |
JP2008281413A (ja) * | 2007-05-10 | 2008-11-20 | Micronics Japan Co Ltd | プローブのためのクリーニング装置 |
KR100893877B1 (ko) | 2007-08-06 | 2009-04-20 | 윌테크놀러지(주) | 프로브 카드용 니들 단부의 연마 방법 |
US8371316B2 (en) | 2009-12-03 | 2013-02-12 | International Test Solutions, Inc. | Apparatuses, device, and methods for cleaning tester interface contact elements and support hardware |
JP6279309B2 (ja) * | 2013-12-20 | 2018-02-14 | スリーエム イノベイティブ プロパティズ カンパニー | 研磨用クッション、研磨装置、研磨方法、及び当該研磨方法により研磨された対象物を含む物品 |
JP6292397B2 (ja) * | 2014-04-23 | 2018-03-14 | 富士紡ホールディングス株式会社 | 研磨パッド |
JP6531344B2 (ja) * | 2015-02-18 | 2019-06-19 | 株式会社東京精密 | プローブ装置 |
DE102016119746B4 (de) * | 2016-10-17 | 2024-02-08 | Matuschek Meßtechnik GmbH | Schleifscheibe |
US9825000B1 (en) | 2017-04-24 | 2017-11-21 | International Test Solutions, Inc. | Semiconductor wire bonding machine cleaning device and method |
US11434095B2 (en) | 2018-02-23 | 2022-09-06 | International Test Solutions, Llc | Material and hardware to automatically clean flexible electronic web rolls |
US10792713B1 (en) | 2019-07-02 | 2020-10-06 | International Test Solutions, Inc. | Pick and place machine cleaning system and method |
US11756811B2 (en) | 2019-07-02 | 2023-09-12 | International Test Solutions, Llc | Pick and place machine cleaning system and method |
US11211242B2 (en) | 2019-11-14 | 2021-12-28 | International Test Solutions, Llc | System and method for cleaning contact elements and support hardware using functionalized surface microfeatures |
US11318550B2 (en) | 2019-11-14 | 2022-05-03 | International Test Solutions, Llc | System and method for cleaning wire bonding machines using functionalized surface microfeatures |
US11035898B1 (en) | 2020-05-11 | 2021-06-15 | International Test Solutions, Inc. | Device and method for thermal stabilization of probe elements using a heat conducting wafer |
CN112720231B (zh) * | 2020-12-30 | 2022-12-02 | 福建省佳美集团公司 | 一种陶瓷加工用抛光设备及抛光方法 |
Family Cites Families (3)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JP3135741B2 (ja) * | 1993-05-07 | 2001-02-19 | 富士写真フイルム株式会社 | 研磨体 |
JP3305557B2 (ja) * | 1995-04-10 | 2002-07-22 | 大日本印刷株式会社 | 研磨テープ、その製造方法および研磨テープ用塗工剤 |
JPH08294872A (ja) * | 1995-04-27 | 1996-11-12 | Fuji Photo Film Co Ltd | 研磨体 |
-
1998
- 1998-02-20 JP JP10056234A patent/JPH11238768A/ja active Pending
-
1999
- 1999-02-10 TW TW088102086A patent/TW409322B/zh not_active IP Right Cessation
- 1999-02-14 CN CN99103313.2A patent/CN1232288A/zh active Pending
- 1999-02-16 US US09/249,858 patent/US20020028641A1/en not_active Abandoned
- 1999-02-19 EP EP99301238A patent/EP0937541A3/en not_active Withdrawn
- 1999-02-19 SG SG1999000645A patent/SG71910A1/en unknown
Also Published As
Publication number | Publication date |
---|---|
EP0937541A3 (en) | 2002-07-10 |
EP0937541A2 (en) | 1999-08-25 |
TW409322B (en) | 2000-10-21 |
US20020028641A1 (en) | 2002-03-07 |
CN1232288A (zh) | 1999-10-20 |
JPH11238768A (ja) | 1999-08-31 |
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