SG60109A1 - Epoxy resin composition and semiconductor device encapsulated therewith - Google Patents

Epoxy resin composition and semiconductor device encapsulated therewith

Info

Publication number
SG60109A1
SG60109A1 SG1997003173A SG1997003173A SG60109A1 SG 60109 A1 SG60109 A1 SG 60109A1 SG 1997003173 A SG1997003173 A SG 1997003173A SG 1997003173 A SG1997003173 A SG 1997003173A SG 60109 A1 SG60109 A1 SG 60109A1
Authority
SG
Singapore
Prior art keywords
semiconductor device
resin composition
epoxy resin
device encapsulated
encapsulated therewith
Prior art date
Application number
SG1997003173A
Other languages
English (en)
Inventor
Noriaki Higuchi
Takaaki Fukumoto
Toshio Shobara
Eiichi Asano
Kazutoshi Tomiyoshi
Original Assignee
Mitsubishi Electric Corp
Shinetsu Chemical Co
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Mitsubishi Electric Corp, Shinetsu Chemical Co filed Critical Mitsubishi Electric Corp
Publication of SG60109A1 publication Critical patent/SG60109A1/en

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08LCOMPOSITIONS OF MACROMOLECULAR COMPOUNDS
    • C08L63/00Compositions of epoxy resins; Compositions of derivatives of epoxy resins
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • H01L23/293Organic, e.g. plastic
    • CCHEMISTRY; METALLURGY
    • C08ORGANIC MACROMOLECULAR COMPOUNDS; THEIR PREPARATION OR CHEMICAL WORKING-UP; COMPOSITIONS BASED THEREON
    • C08KUse of inorganic or non-macromolecular organic substances as compounding ingredients
    • C08K3/00Use of inorganic substances as compounding ingredients
    • C08K3/34Silicon-containing compounds
    • C08K3/36Silica
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01BCABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
    • H01B3/00Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties
    • H01B3/18Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties mainly consisting of organic substances
    • H01B3/30Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties mainly consisting of organic substances plastics; resins; waxes
    • H01B3/40Insulators or insulating bodies characterised by the insulating materials; Selection of materials for their insulating or dielectric properties mainly consisting of organic substances plastics; resins; waxes epoxy resins
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/28Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection
    • H01L23/29Encapsulations, e.g. encapsulating layers, coatings, e.g. for protection characterised by the material, e.g. carbon
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00

Landscapes

  • Chemical & Material Sciences (AREA)
  • Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • General Physics & Mathematics (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Health & Medical Sciences (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Engineering & Computer Science (AREA)
  • Medicinal Chemistry (AREA)
  • Polymers & Plastics (AREA)
  • Organic Chemistry (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Compositions Of Macromolecular Compounds (AREA)
  • Structures Or Materials For Encapsulating Or Coating Semiconductor Devices Or Solid State Devices (AREA)
  • Epoxy Resins (AREA)
SG1997003173A 1996-08-29 1997-08-29 Epoxy resin composition and semiconductor device encapsulated therewith SG60109A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP24702496 1996-08-29

Publications (1)

Publication Number Publication Date
SG60109A1 true SG60109A1 (en) 1999-02-22

Family

ID=17157278

Family Applications (1)

Application Number Title Priority Date Filing Date
SG1997003173A SG60109A1 (en) 1996-08-29 1997-08-29 Epoxy resin composition and semiconductor device encapsulated therewith

Country Status (8)

Country Link
US (1) US5940688A (ko)
EP (1) EP0827159B1 (ko)
KR (1) KR100251853B1 (ko)
CN (1) CN1139626C (ko)
DE (1) DE69722106T2 (ko)
MY (1) MY113659A (ko)
SG (1) SG60109A1 (ko)
TW (1) TW474968B (ko)

Families Citing this family (23)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3611066B2 (ja) * 1996-08-29 2005-01-19 株式会社ルネサステクノロジ 無機質充填剤及びエポキシ樹脂組成物の製造方法
US6221689B1 (en) * 1997-10-24 2001-04-24 Apack Technologies Inc. Method for improving the reliability of underfill process for a chip
JP3853979B2 (ja) * 1998-06-16 2006-12-06 日東電工株式会社 半導体装置の製法
US6376923B1 (en) * 1999-06-08 2002-04-23 Shin-Etsu Chemical Co., Ltd. Flip-chip type semiconductor device sealing material and flip-chip type semiconductor device
TWI257935B (en) * 1999-10-06 2006-07-11 Nitto Denko Corp Resin composition for sealing semiconductor and semiconductor device using the same and method for producing semiconductor device
JP3836649B2 (ja) 1999-11-22 2006-10-25 協和化学工業株式会社 半導体封止用樹脂組成物およびその成型品
US6670430B1 (en) 1999-12-17 2003-12-30 Henkel Loctite Corporation Thermosetting resin compositions comprising epoxy resins, adhesion promoters, and curatives based on the combination of nitrogen compounds and transition metal complexes
US6617399B2 (en) 1999-12-17 2003-09-09 Henkel Loctite Corporation Thermosetting resin compositions comprising epoxy resins, adhesion promoters, curatives based on the combination of nitrogen compounds and transition metal complexes, and polysulfide tougheners
EP1818975A3 (en) * 2000-02-25 2010-09-29 Ibiden Co., Ltd. Multilayer printed circuit board and multilayer printed circuit board manufacturing method
JP4438973B2 (ja) * 2000-05-23 2010-03-24 アムコア テクノロジー,インコーポレイテッド シート状樹脂組成物及びそれを用いた半導体装置の製造方法
KR101093471B1 (ko) 2000-09-25 2011-12-13 이비덴 가부시키가이샤 반도체소자,반도체소자의 제조방법,다층프린트배선판 및 다층프린트배선판의 제조방법
DE10144871A1 (de) * 2001-09-12 2003-03-27 Bosch Gmbh Robert Vergußmasse mit hoher thermischer Stabilität
EP1300439A1 (de) * 2001-09-26 2003-04-09 Abb Research Ltd. Füllstoff für die Verwendung in elektrischen Feststoff-Isolatoren
US6893736B2 (en) * 2001-11-19 2005-05-17 Henkel Corporation Thermosetting resin compositions useful as underfill sealants
US6951907B1 (en) 2001-11-19 2005-10-04 Henkel Corporation Composition of epoxy resin, secondary amine-functional adhesion promotor and curative of nitrogen-compound and transition metal complex
DE10208644A1 (de) * 2002-02-28 2003-09-11 Bakelite Ag Verfahren zur Herstellung und Verarbeitung von Epoxidharz-Formmassen
JP4421972B2 (ja) * 2004-04-30 2010-02-24 日東電工株式会社 半導体装置の製法
CN101208386B (zh) * 2005-08-02 2012-07-18 第一毛织株式会社 一种用于封装半导体设备的环氧树脂组合物
JP2007169602A (ja) * 2005-11-01 2007-07-05 Shin Etsu Chem Co Ltd 液状エポキシ樹脂組成物
JP2014091744A (ja) * 2012-10-31 2014-05-19 3M Innovative Properties Co アンダーフィル組成物、半導体装置およびその製造方法
KR101692668B1 (ko) * 2016-03-10 2017-01-04 (주)호전에이블 칙소성이 우수한 에폭시 플럭스 페이스트 조성물
MY177304A (en) * 2017-03-31 2020-09-11 Hitachi Chemical Co Ltd Protective material for electronic circuit, sealing material for protective material for electronic circuit, sealing method, and method for manufacturing semiconductor device
KR101965620B1 (ko) * 2017-11-07 2019-04-03 (주)호전에이블 방열성 에폭시 플럭스 필름 및 이를 이용한 솔더링 방법

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2864584B2 (ja) * 1989-12-05 1999-03-03 日立化成工業株式会社 半導体用エポキシ樹脂組成物および半導体装置の製造法
JP3080276B2 (ja) * 1992-09-24 2000-08-21 住友ベークライト株式会社 半導体封止用樹脂組成物

Also Published As

Publication number Publication date
KR19980019140A (ko) 1998-06-05
DE69722106T2 (de) 2004-04-01
EP0827159A3 (en) 1998-04-15
EP0827159A2 (en) 1998-03-04
US5940688A (en) 1999-08-17
EP0827159B1 (en) 2003-05-21
TW474968B (en) 2002-02-01
KR100251853B1 (ko) 2000-04-15
DE69722106D1 (de) 2003-06-26
CN1139626C (zh) 2004-02-25
MY113659A (en) 2002-04-30
CN1179444A (zh) 1998-04-22

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