SG149774A1 - Buried contact devices for nitride-based films and manufacture therof - Google Patents

Buried contact devices for nitride-based films and manufacture therof

Info

Publication number
SG149774A1
SG149774A1 SG200805369-6A SG2008053696A SG149774A1 SG 149774 A1 SG149774 A1 SG 149774A1 SG 2008053696 A SG2008053696 A SG 2008053696A SG 149774 A1 SG149774 A1 SG 149774A1
Authority
SG
Singapore
Prior art keywords
layer
contact
nitride
based films
manufacture
Prior art date
Application number
SG200805369-6A
Other languages
English (en)
Inventor
Kenneth Scott Alexander Butcher
Marie-Pierre Francoise Fouquet
Alanna Julia June Fernades
Original Assignee
Gallium Entpr Pty Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from AU2007903940A external-priority patent/AU2007903940A0/en
Application filed by Gallium Entpr Pty Ltd filed Critical Gallium Entpr Pty Ltd
Publication of SG149774A1 publication Critical patent/SG149774A1/en

Links

Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/74Making of localized buried regions, e.g. buried collector layers, internal connections substrate contacts
    • H01L21/743Making of internal connections, substrate contacts
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L21/00Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
    • H01L21/70Manufacture or treatment of devices consisting of a plurality of solid state components formed in or on a common substrate or of parts thereof; Manufacture of integrated circuit devices or of parts thereof
    • H01L21/71Manufacture of specific parts of devices defined in group H01L21/70
    • H01L21/74Making of localized buried regions, e.g. buried collector layers, internal connections substrate contacts
    • H01L21/746Making of localized buried regions, e.g. buried collector layers, internal connections substrate contacts for AIII-BV integrated circuits
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L23/00Details of semiconductor or other solid state devices
    • H01L23/52Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames
    • H01L23/535Arrangements for conducting electric current within the device in operation from one component to another, i.e. interconnections, e.g. wires, lead frames including internal interconnections, e.g. cross-under constructions
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/0001Technical content checked by a classifier
    • H01L2924/0002Not covered by any one of groups H01L24/00, H01L24/00 and H01L2224/00
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2924/00Indexing scheme for arrangements or methods for connecting or disconnecting semiconductor or solid-state bodies as covered by H01L24/00
    • H01L2924/10Details of semiconductor or other solid state devices to be connected
    • H01L2924/11Device type
    • H01L2924/12Passive devices, e.g. 2 terminal devices
    • H01L2924/1204Optical Diode
    • H01L2924/12044OLED
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L33/00Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof
    • H01L33/36Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes
    • H01L33/38Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape
    • H01L33/387Semiconductor devices having potential barriers specially adapted for light emission; Processes or apparatus specially adapted for the manufacture or treatment thereof or of parts thereof; Details thereof characterised by the electrodes with a particular shape with a plurality of electrode regions in direct contact with the semiconductor body and being electrically interconnected by another electrode layer

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Manufacturing & Machinery (AREA)
  • Led Devices (AREA)
  • Electrodes Of Semiconductors (AREA)
  • Semiconductor Lasers (AREA)
  • Bipolar Transistors (AREA)
SG200805369-6A 2007-07-20 2008-07-21 Buried contact devices for nitride-based films and manufacture therof SG149774A1 (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
AU2007903940A AU2007903940A0 (en) 2007-07-20 Buried contact devices for a nitride-based films and manufacture thereof

Publications (1)

Publication Number Publication Date
SG149774A1 true SG149774A1 (en) 2009-02-27

Family

ID=39884395

Family Applications (1)

Application Number Title Priority Date Filing Date
SG200805369-6A SG149774A1 (en) 2007-07-20 2008-07-21 Buried contact devices for nitride-based films and manufacture therof

Country Status (12)

Country Link
US (1) US20090020768A1 (fr)
EP (1) EP2017884A3 (fr)
JP (1) JP2009044149A (fr)
KR (1) KR20090009761A (fr)
CN (1) CN101604665A (fr)
AU (1) AU2008203209A1 (fr)
BR (1) BRPI0805314A2 (fr)
CA (1) CA2638191A1 (fr)
RU (1) RU2394305C2 (fr)
SG (1) SG149774A1 (fr)
TW (1) TW200915476A (fr)
ZA (1) ZA200806479B (fr)

Families Citing this family (47)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20070240631A1 (en) * 2006-04-14 2007-10-18 Applied Materials, Inc. Epitaxial growth of compound nitride semiconductor structures
US20080092819A1 (en) * 2006-10-24 2008-04-24 Applied Materials, Inc. Substrate support structure with rapid temperature change
US20080314311A1 (en) * 2007-06-24 2008-12-25 Burrows Brian H Hvpe showerhead design
US20090149008A1 (en) * 2007-10-05 2009-06-11 Applied Materials, Inc. Method for depositing group iii/v compounds
US20090194026A1 (en) * 2008-01-31 2009-08-06 Burrows Brian H Processing system for fabricating compound nitride semiconductor devices
JP4247413B1 (ja) * 2008-03-19 2009-04-02 株式会社 東北テクノアーチ デバイスの製造方法
US20100139554A1 (en) * 2008-12-08 2010-06-10 Applied Materials, Inc. Methods and apparatus for making gallium nitride and gallium aluminum nitride thin films
CA2653581A1 (fr) 2009-02-11 2010-08-11 Kenneth Scott Alexander Butcher Migration et depot chimique en phase vapeur assistes par plasma haute frequence
US8110889B2 (en) * 2009-04-28 2012-02-07 Applied Materials, Inc. MOCVD single chamber split process for LED manufacturing
US20110079251A1 (en) * 2009-04-28 2011-04-07 Olga Kryliouk Method for in-situ cleaning of deposition systems
CN102414797A (zh) * 2009-04-29 2012-04-11 应用材料公司 在HVPE中形成原位预GaN沉积层的方法
US9800017B1 (en) 2009-05-29 2017-10-24 Soraa Laser Diode, Inc. Laser device and method for a vehicle
US20110104843A1 (en) * 2009-07-31 2011-05-05 Applied Materials, Inc. Method of reducing degradation of multi quantum well (mqw) light emitting diodes
US20110027973A1 (en) * 2009-07-31 2011-02-03 Applied Materials, Inc. Method of forming led structures
KR20120055580A (ko) * 2009-08-03 2012-05-31 뉴포트 코포레이션 유전체 코팅을 이용한 고출력 led 디바이스 아키텍처 및 제조 방법
KR20120090996A (ko) * 2009-08-27 2012-08-17 어플라이드 머티어리얼스, 인코포레이티드 인-시튜 챔버 세정 후 프로세스 챔버의 제염 방법
US20110064545A1 (en) * 2009-09-16 2011-03-17 Applied Materials, Inc. Substrate transfer mechanism with preheating features
US20110076400A1 (en) * 2009-09-30 2011-03-31 Applied Materials, Inc. Nanocrystalline diamond-structured carbon coating of silicon carbide
CN102414846A (zh) * 2009-10-07 2012-04-11 应用材料公司 用于led制造的改良多腔室分离处理
US20110204376A1 (en) * 2010-02-23 2011-08-25 Applied Materials, Inc. Growth of multi-junction led film stacks with multi-chambered epitaxy system
US20110207256A1 (en) * 2010-02-24 2011-08-25 Applied Materials, Inc. In-situ acceptor activation with nitrogen and/or oxygen plasma treatment
US9076827B2 (en) 2010-09-14 2015-07-07 Applied Materials, Inc. Transfer chamber metrology for improved device yield
KR101935755B1 (ko) * 2010-12-20 2019-01-04 토소가부시키가이샤 금속 갈륨 침투 질화갈륨 성형물 및 이의 제조방법
KR20120099318A (ko) * 2011-01-26 2012-09-10 엘지이노텍 주식회사 발광 소자 및 그 제조방법
RU2479070C2 (ru) * 2011-02-03 2013-04-10 Государственное образовательное учреждение высшего профессионального образования "Российский университет дружбы народов" (РУДН) Светодиодный источник света
US8143147B1 (en) 2011-02-10 2012-03-27 Intermolecular, Inc. Methods and systems for forming thin films
US20120267658A1 (en) * 2011-04-20 2012-10-25 Invenlux Limited Large-area light-emitting device and method for fabricating the same
US9419182B2 (en) 2012-01-05 2016-08-16 Micron Technology, Inc. Solid-state radiation transducer devices having at least partially transparent buried-contact elements, and associated systems and methods
RU2512742C1 (ru) * 2012-12-06 2014-04-10 Федеральное Государственное Унитарное Предприятие "Научно-Производственное Предприятие "Пульсар" Биполярный транзистор
JP2015177132A (ja) * 2014-03-17 2015-10-05 ウシオ電機株式会社 半導体発光素子及びその製造方法
US10879673B2 (en) 2015-08-19 2020-12-29 Soraa Laser Diode, Inc. Integrated white light source using a laser diode and a phosphor in a surface mount device package
WO2017201363A1 (fr) * 2016-05-20 2017-11-23 Lumileds Llc Procédés d'utilisation de dépôt chimique en phase vapeur par plasma à distance (rp-cvd) et de dépôt par pulvérisation pour faire croître des couches dans des dispositifs électroluminescents
US10170604B2 (en) * 2016-08-08 2019-01-01 Atomera Incorporated Method for making a semiconductor device including a resonant tunneling diode with electron mean free path control layers
KR102582394B1 (ko) 2016-08-30 2023-09-26 삼성디스플레이 주식회사 반도체 장치
CN107293629A (zh) * 2017-07-31 2017-10-24 广东工业大学 一种紫外led外延芯片倒装结构及其制作方法
EP4071835A1 (fr) * 2017-11-07 2022-10-12 Gallium Enterprises Pty Ltd Couches p-(al,in)gan activées enfouies
WO2019180513A1 (fr) * 2018-03-19 2019-09-26 King Abdullah University Of Science And Technology Dispositifs optoélectroniques de nitrure iii et procédé de production
CN109216442A (zh) * 2018-09-11 2019-01-15 苏州汉骅半导体有限公司 半导体结构制造方法
KR20200049026A (ko) * 2018-10-31 2020-05-08 엘지이노텍 주식회사 표면발광 레이저소자 및 이를 포함하는 발광장치
US20210074880A1 (en) * 2018-12-18 2021-03-11 Bolb Inc. Light-output-power self-awareness light-emitting device
US11421843B2 (en) 2018-12-21 2022-08-23 Kyocera Sld Laser, Inc. Fiber-delivered laser-induced dynamic light system
US11239637B2 (en) 2018-12-21 2022-02-01 Kyocera Sld Laser, Inc. Fiber delivered laser induced white light system
US11884202B2 (en) 2019-01-18 2024-01-30 Kyocera Sld Laser, Inc. Laser-based fiber-coupled white light system
DE102019112762A1 (de) * 2019-05-15 2020-11-19 OSRAM Opto Semiconductors Gesellschaft mit beschränkter Haftung Bauelement mit vergrabenen dotierten bereichen und verfahren zur herstellung eines bauelements
RU196426U1 (ru) * 2019-12-27 2020-02-28 федеральное государственное автономное образовательное учреждение высшего образования "Национальный исследовательский университет ИТМО" (Университет ИТМО) Прозрачный гетеропереход на основе оксидов
CN114204414A (zh) * 2021-11-16 2022-03-18 深圳市德明利光电有限公司 一种光学路径可控高导热、低电阻的vcsel制作方法及vcsel
CN115881866B (zh) * 2023-03-03 2023-05-23 江西兆驰半导体有限公司 发光二极管外延片及其制备方法、led

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4378629A (en) * 1979-08-10 1983-04-05 Massachusetts Institute Of Technology Semiconductor embedded layer technology including permeable base transistor, fabrication method
US4292730A (en) * 1980-03-12 1981-10-06 Harris Corporation Method of fabricating mesa bipolar memory cell utilizing epitaxial deposition, substrate removal and special metallization
JPH04258182A (ja) * 1991-02-12 1992-09-14 Mitsubishi Electric Corp 半導体発光装置
US5905275A (en) * 1996-06-17 1999-05-18 Kabushiki Kaisha Toshiba Gallium nitride compound semiconductor light-emitting device
DE19715572A1 (de) * 1997-04-15 1998-10-22 Telefunken Microelectron Verfahren zum Herstellen von epitaktischen Schichten eines Verbindungshalbleiters auf einkristallinem Silizium und daraus hergestellte Leuchtdiode
JP2000058918A (ja) * 1998-08-07 2000-02-25 Murata Mfg Co Ltd 半導体発光素子
US6222207B1 (en) * 1999-05-24 2001-04-24 Lumileds Lighting, U.S. Llc Diffusion barrier for increased mirror reflectivity in reflective solderable contacts on high power LED chip
JP2001261498A (ja) * 2000-03-24 2001-09-26 Nikon Corp GaN系結晶成長用基板およびその用途
US6410940B1 (en) * 2000-06-15 2002-06-25 Kansas State University Research Foundation Micro-size LED and detector arrays for minidisplay, hyper-bright light emitting diodes, lighting, and UV detector and imaging sensor applications
JP2003008143A (ja) * 2001-06-18 2003-01-10 Sony Corp マルチビーム半導体レーザ素子
DE10203801A1 (de) * 2002-01-31 2003-08-21 Osram Opto Semiconductors Gmbh Halbleiterbauelement und Verfahren zu dessen Herstellung
AUPS240402A0 (en) 2002-05-17 2002-06-13 Macquarie Research Limited Gallium nitride
WO2006034540A1 (fr) 2004-09-27 2006-04-06 Gallium Enterprises Pty Ltd Procede et appareil de croissance d'un film de nitrure metallique de groupe (iii) et film de metallique de groupe (iii)
KR100631133B1 (ko) * 2005-05-31 2006-10-02 삼성전기주식회사 수직구조 질화물계 반도체 발광 다이오드
JP2007221029A (ja) * 2006-02-20 2007-08-30 Sony Corp 半導体発光素子およびその製造方法
JP2008283028A (ja) * 2007-05-11 2008-11-20 Fuji Xerox Co Ltd 面発光型半導体レーザ、面発光型半導体レーザの製造方法、モジュール、光源装置、情報処理装置、光送信装置、光空間伝送装置および光空間伝送システム。
KR20070118064A (ko) * 2007-11-24 2007-12-13 (주)제네라이트테크놀러지 매립전극 발광다이오드

Also Published As

Publication number Publication date
US20090020768A1 (en) 2009-01-22
RU2394305C2 (ru) 2010-07-10
CA2638191A1 (fr) 2009-01-20
TW200915476A (en) 2009-04-01
EP2017884A2 (fr) 2009-01-21
ZA200806479B (en) 2009-04-29
RU2008129818A (ru) 2010-01-27
CN101604665A (zh) 2009-12-16
KR20090009761A (ko) 2009-01-23
AU2008203209A1 (en) 2009-02-05
EP2017884A3 (fr) 2011-03-23
JP2009044149A (ja) 2009-02-26
BRPI0805314A2 (pt) 2009-07-28

Similar Documents

Publication Publication Date Title
SG149774A1 (en) Buried contact devices for nitride-based films and manufacture therof
MY171189A (en) Solar cell having an emitter region with wide bandgap semiconductor material
WO2012054682A3 (fr) Redresseur de schottky amélioré
TW200636992A (en) Semiconductor device edge termination structure and method
WO2009128669A3 (fr) Dispositif électroluminescent et son procédé de fabrication
EP3614442A3 (fr) Dispositif de semiconducteur disposant d'une couche de semiconducteur d'oxyde et son procédé de fabrication
WO2008057392A3 (fr) Procédés de fabrication de dispositifs à semi-conducteurs comportant des régions implantées permettant d'établir un contact de faible résistance vers les couches enfouies et dispositifs associés
TW201614804A (en) Semiconductor device and method for manufacturing semiconductor device
TW201130057A (en) Semiconductor device and manufacturing method thereof
MX2010004731A (es) Dispositivos fotovoltaicos que incluyen peliculas semiconductoras impurificadas.
WO2015013628A3 (fr) Procédés de fabrication de dispositifs à jonctions noyées dans du carbure de silicium faisant appel à la formation d'un canal d'implantation ionique, et dispositifs à base de carbure de silicium comprenant des jonctions noyées
MX2015007998A (es) Emisor híbrido de celda solar con contacto posterior.
WO2007130188A3 (fr) Cellule solaire dotÉe de contacts à hÉtÉrojonction de semi-conducteurs dopÉs
WO2008105077A1 (fr) Dispositif semi-conducteur composé et son procédé de fabrication
TW200709415A (en) Gate pattern of semiconductor device and method for fabricating the same
WO2012044980A3 (fr) Matériaux à base d'arséniure de gallium utilisés dans des applications de transistor à couches minces
TW200731530A (en) Semiconductor devices and methods for fabricating the same
WO2008057438A3 (fr) Dispositifs à semi-conducteurs de commutation de puissance pourvus de dérivations de redressement à jonctions
TW200729516A (en) Semiconductor device and method for fabricating the same
TW201130173A (en) Semiconductor light emitting device and method for manufacturing same
EP2590233A3 (fr) Dispositif photovoltaïque et son procédé de fabrication
WO2009111305A3 (fr) Structure semi-conductrice constituée de silicium-germanium-carbone
WO2008103331A3 (fr) Dispositifs à semi-conducteurs à large écart énergétique
TW200729483A (en) Vertical organic transistor and fabricating method of the same
WO2010140091A3 (fr) Procédé permettant de former une couche diélectrique sur un dispositif électroluminescent à semi-conducteur