SG115815A1 - Lithographic apparatus and device manufacturing method - Google Patents
Lithographic apparatus and device manufacturing methodInfo
- Publication number
- SG115815A1 SG115815A1 SG200501975A SG200501975A SG115815A1 SG 115815 A1 SG115815 A1 SG 115815A1 SG 200501975 A SG200501975 A SG 200501975A SG 200501975 A SG200501975 A SG 200501975A SG 115815 A1 SG115815 A1 SG 115815A1
- Authority
- SG
- Singapore
- Prior art keywords
- device manufacturing
- lithographic apparatus
- lithographic
- manufacturing
- Prior art date
Links
Classifications
-
- A—HUMAN NECESSITIES
- A47—FURNITURE; DOMESTIC ARTICLES OR APPLIANCES; COFFEE MILLS; SPICE MILLS; SUCTION CLEANERS IN GENERAL
- A47G—HOUSEHOLD OR TABLE EQUIPMENT
- A47G25/00—Household implements used in connection with wearing apparel; Dress, hat or umbrella holders
- A47G25/14—Clothing hangers, e.g. suit hangers
- A47G25/1407—Clothing hangers, e.g. suit hangers with identification means
- A47G25/1414—Clothing hangers, e.g. suit hangers with identification means connected to the hook member
- A47G25/1421—Clothing hangers, e.g. suit hangers with identification means connected to the hook member at the top
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70483—Information management; Active and passive control; Testing; Wafer monitoring, e.g. pattern monitoring
- G03F7/7055—Exposure light control in all parts of the microlithographic apparatus, e.g. pulse length control or light interruption
- G03F7/70575—Wavelength control, e.g. control of bandwidth, multiple wavelength, selection of wavelength or matching of optical components to wavelength
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/70—Microphotolithographic exposure; Apparatus therefor
- G03F7/70008—Production of exposure light, i.e. light sources
- G03F7/7005—Production of exposure light, i.e. light sources by multiple sources, e.g. light-emitting diodes [LED] or light source arrays
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US10/813,682 US7265366B2 (en) | 2004-03-31 | 2004-03-31 | Lithographic apparatus and device manufacturing method |
Publications (1)
Publication Number | Publication Date |
---|---|
SG115815A1 true SG115815A1 (en) | 2005-10-28 |
Family
ID=34887710
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG200501975A SG115815A1 (en) | 2004-03-31 | 2005-03-30 | Lithographic apparatus and device manufacturing method |
Country Status (7)
Country | Link |
---|---|
US (1) | US7265366B2 (ko) |
EP (1) | EP1582927A1 (ko) |
JP (1) | JP4429201B2 (ko) |
KR (1) | KR100695555B1 (ko) |
CN (1) | CN100520588C (ko) |
SG (1) | SG115815A1 (ko) |
TW (1) | TWI265384B (ko) |
Families Citing this family (9)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7265366B2 (en) * | 2004-03-31 | 2007-09-04 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7632012B2 (en) * | 2005-09-01 | 2009-12-15 | Siemens Energy, Inc. | Method of measuring in situ differential emissivity and temperature |
US9052615B2 (en) | 2008-08-29 | 2015-06-09 | Gigaphoton Inc. | Extreme ultraviolet light source apparatus |
JP5474522B2 (ja) * | 2009-01-14 | 2014-04-16 | ギガフォトン株式会社 | 極端紫外光源システム |
NL2004444A (en) | 2009-04-27 | 2010-10-28 | Asml Netherlands Bv | Lithographic apparatus and detector apparatus. |
CN101634815B (zh) * | 2009-08-31 | 2011-06-29 | 上海微电子装备有限公司 | 一种基于多个不同波长的对准方法 |
TWI448830B (zh) * | 2010-02-09 | 2014-08-11 | Asml Netherlands Bv | 微影裝置及元件製造方法 |
CN105372940A (zh) * | 2014-08-28 | 2016-03-02 | 上海微电子装备有限公司 | 用于光刻设备的光源切换装置 |
CN106773540A (zh) * | 2016-11-29 | 2017-05-31 | 四川大学 | 一种大面积纳米缝隙阵列及其制作方法 |
Family Cites Families (27)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPS6414918A (en) * | 1987-07-08 | 1989-01-19 | Nikon Corp | Stepper |
US5143854A (en) * | 1989-06-07 | 1992-09-01 | Affymax Technologies N.V. | Large scale photolithographic solid phase synthesis of polypeptides and receptor binding screening thereof |
JP3033135B2 (ja) * | 1990-06-13 | 2000-04-17 | 株式会社ニコン | 投影露光装置及び方法 |
JP3128827B2 (ja) * | 1990-12-26 | 2001-01-29 | 株式会社ニコン | 投影露光装置、並びに投影露光方法、及びその投影露光方法を用いたデバイス製造方法、及びそのデバイス製造方法により製造されたデバイス |
US5739898A (en) * | 1993-02-03 | 1998-04-14 | Nikon Corporation | Exposure method and apparatus |
JP3379200B2 (ja) * | 1994-03-25 | 2003-02-17 | 株式会社ニコン | 位置検出装置 |
JPH08264427A (ja) * | 1995-03-23 | 1996-10-11 | Nikon Corp | アライメント方法及びその装置 |
KR0186068B1 (ko) * | 1995-12-27 | 1999-04-01 | 문정환 | 리소그라피 장치의 위치 정렬 시스템 |
US5926298A (en) * | 1996-08-30 | 1999-07-20 | Lucent Technologies Inc. | Optical multiplexer/demultiplexer having a broadcast port |
JPH11251226A (ja) * | 1998-03-05 | 1999-09-17 | Nikon Corp | X線投影露光装置 |
US7329886B2 (en) * | 1998-05-05 | 2008-02-12 | Carl Zeiss Smt Ag | EUV illumination system having a plurality of light sources for illuminating an optical element |
DE19830438A1 (de) * | 1998-07-08 | 2000-01-13 | Zeiss Carl Fa | Verfahren zur Dekontamination von Mikrolithographie-Projektionsbelichtungsanlagen |
US6137574A (en) * | 1999-03-15 | 2000-10-24 | Zygo Corporation | Systems and methods for characterizing and correcting cyclic errors in distance measuring and dispersion interferometry |
US6724486B1 (en) * | 1999-04-28 | 2004-04-20 | Zygo Corporation | Helium- Neon laser light source generating two harmonically related, single- frequency wavelengths for use in displacement and dispersion measuring interferometry |
US6571057B2 (en) * | 2000-03-27 | 2003-05-27 | Nikon Corporation | Optical instrument, gas replacement method and cleaning method of optical instrument, exposure apparatus, exposure method and manufacturing method for devices |
US6764808B2 (en) * | 2002-02-27 | 2004-07-20 | Advanced Micro Devices, Inc. | Self-aligned pattern formation using wavelenghts |
CN100337089C (zh) * | 2002-09-20 | 2007-09-12 | Asml荷兰有限公司 | 器件检验 |
US20040207836A1 (en) * | 2002-09-27 | 2004-10-21 | Rajeshwar Chhibber | High dynamic range optical inspection system and method |
WO2004031854A2 (de) * | 2002-09-30 | 2004-04-15 | Carl Zeiss Smt Ag | Beleuchtungssystem für eine wellenlänge ≤ 193 nm mit sensoren zur bestimmung der ausleuchtung |
EP1434092A1 (en) * | 2002-12-23 | 2004-06-30 | ASML Netherlands B.V. | Lithographic apparatus, device manufacturing method, and device manufactured thereby |
TWI264620B (en) * | 2003-03-07 | 2006-10-21 | Asml Netherlands Bv | Lithographic apparatus and device manufacturing method |
EP1517183A1 (en) * | 2003-08-29 | 2005-03-23 | ASML Netherlands B.V. | Lithographic apparatus, device manufacturing method, and device manufactured thereby |
US7081992B2 (en) * | 2004-01-16 | 2006-07-25 | Euv Llc | Condenser optic with sacrificial reflective surface |
US7265366B2 (en) * | 2004-03-31 | 2007-09-04 | Asml Netherlands B.V. | Lithographic apparatus and device manufacturing method |
US7349082B2 (en) * | 2004-10-05 | 2008-03-25 | Asml Netherlands B.V. | Particle detection device, lithographic apparatus and device manufacturing method |
US7629697B2 (en) * | 2004-11-12 | 2009-12-08 | Asml Netherlands B.V. | Marker structure and method for controlling alignment of layers of a multi-layered substrate |
US7414722B2 (en) * | 2005-08-16 | 2008-08-19 | Asml Netherlands B.V. | Alignment measurement arrangement and alignment measurement method |
-
2004
- 2004-03-31 US US10/813,682 patent/US7265366B2/en not_active Expired - Fee Related
-
2005
- 2005-03-23 TW TW094108958A patent/TWI265384B/zh not_active IP Right Cessation
- 2005-03-30 EP EP05075741A patent/EP1582927A1/en not_active Withdrawn
- 2005-03-30 KR KR1020050026260A patent/KR100695555B1/ko not_active IP Right Cessation
- 2005-03-30 SG SG200501975A patent/SG115815A1/en unknown
- 2005-03-30 CN CNB2005100595681A patent/CN100520588C/zh not_active Expired - Fee Related
- 2005-03-30 JP JP2005098186A patent/JP4429201B2/ja not_active Expired - Fee Related
Also Published As
Publication number | Publication date |
---|---|
TWI265384B (en) | 2006-11-01 |
EP1582927A1 (en) | 2005-10-05 |
KR20060044966A (ko) | 2006-05-16 |
CN1677239A (zh) | 2005-10-05 |
TW200604752A (en) | 2006-02-01 |
US20050218342A1 (en) | 2005-10-06 |
US7265366B2 (en) | 2007-09-04 |
JP4429201B2 (ja) | 2010-03-10 |
CN100520588C (zh) | 2009-07-29 |
KR100695555B1 (ko) | 2007-03-14 |
JP2005294834A (ja) | 2005-10-20 |
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