SG11202110193YA - Method of manufacturing semiconductor device, substrate processing apparatus device, and program - Google Patents
Method of manufacturing semiconductor device, substrate processing apparatus device, and programInfo
- Publication number
- SG11202110193YA SG11202110193YA SG11202110193YA SG11202110193YA SG11202110193YA SG 11202110193Y A SG11202110193Y A SG 11202110193YA SG 11202110193Y A SG11202110193Y A SG 11202110193YA SG 11202110193Y A SG11202110193Y A SG 11202110193YA SG 11202110193Y A SG11202110193Y A SG 11202110193YA
- Authority
- SG
- Singapore
- Prior art keywords
- program
- processing apparatus
- substrate processing
- manufacturing semiconductor
- semiconductor device
- Prior art date
Links
- 238000004519 manufacturing process Methods 0.000 title 1
- 239000004065 semiconductor Substances 0.000 title 1
- 239000000758 substrate Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67745—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber characterized by movements or sequence of movements of transfer devices
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67763—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading
- H01L21/67778—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations the wafers being stored in a carrier, involving loading and unloading involving loading and unloading of wafers
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
- H01L21/67103—Apparatus for thermal treatment mainly by conduction
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/02—Manufacture or treatment of semiconductor devices or of parts thereof
- H01L21/04—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer
- H01L21/18—Manufacture or treatment of semiconductor devices or of parts thereof the devices having potential barriers, e.g. a PN junction, depletion layer or carrier concentration layer the devices having semiconductor bodies comprising elements of Group IV of the Periodic Table or AIIIBV compounds with or without impurities, e.g. doping materials
- H01L21/30—Treatment of semiconductor bodies using processes or apparatus not provided for in groups H01L21/20 - H01L21/26
- H01L21/324—Thermal treatment for modifying the properties of semiconductor bodies, e.g. annealing, sintering
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67098—Apparatus for thermal treatment
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67748—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber horizontal transfer of a single workpiece
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/677—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations
- H01L21/67739—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber
- H01L21/67757—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere for conveying, e.g. between different workstations into and out of processing chamber vertical transfer of a batch of workpieces
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
PCT/JP2019/011456 WO2020188743A1 (ja) | 2019-03-19 | 2019-03-19 | 半導体装置の製造方法、基板処理装置および記録媒体 |
Publications (1)
Publication Number | Publication Date |
---|---|
SG11202110193YA true SG11202110193YA (en) | 2021-10-28 |
Family
ID=72520731
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
SG11202110193YA SG11202110193YA (en) | 2019-03-19 | 2019-03-19 | Method of manufacturing semiconductor device, substrate processing apparatus device, and program |
Country Status (6)
Country | Link |
---|---|
US (1) | US11990359B2 (ko) |
JP (1) | JP7214834B2 (ko) |
KR (1) | KR20210127738A (ko) |
SG (1) | SG11202110193YA (ko) |
TW (2) | TW202145428A (ko) |
WO (1) | WO2020188743A1 (ko) |
Families Citing this family (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
SG11202110193YA (en) | 2019-03-19 | 2021-10-28 | Kokusai Electric Corp | Method of manufacturing semiconductor device, substrate processing apparatus device, and program |
CN117276159A (zh) * | 2023-11-17 | 2023-12-22 | 合肥晶合集成电路股份有限公司 | 晶圆运送系统 |
Family Cites Families (16)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
JPH1012703A (ja) * | 1996-06-21 | 1998-01-16 | Sharp Corp | 移換え装置 |
US5943230A (en) * | 1996-12-19 | 1999-08-24 | Applied Materials, Inc. | Computer-implemented inter-chamber synchronization in a multiple chamber substrate processing system |
JPH10335426A (ja) * | 1997-06-05 | 1998-12-18 | Sony Corp | 半導体製造装置における基板移載機構 |
JP2004006508A (ja) * | 2002-05-31 | 2004-01-08 | Sharp Corp | 基板保持用治具および基板表面処理装置。 |
JP2007027159A (ja) | 2005-07-12 | 2007-02-01 | Hitachi Kokusai Electric Inc | 基板処理装置 |
JP2007311724A (ja) * | 2006-05-22 | 2007-11-29 | Sharp Corp | 基板搬送方法及び基板処理装置 |
JP2011060842A (ja) | 2009-09-07 | 2011-03-24 | Hitachi Kokusai Electric Inc | 基板処理装置、基板保持体、及び半導体装置の製造方法 |
US9006116B2 (en) * | 2011-06-03 | 2015-04-14 | Hitachi Kokusai Electric Inc. | Method of manufacturing semiconductor device, substrate processing method and substrate processing apparatus |
KR101215511B1 (ko) * | 2012-06-27 | 2012-12-26 | (주)이노시티 | 프로세스 챔버 및 기판 처리 장치 |
KR101390474B1 (ko) * | 2013-04-08 | 2014-05-07 | 주식회사 유진테크 | 기판처리장치 |
KR101557016B1 (ko) * | 2013-10-17 | 2015-10-05 | 주식회사 유진테크 | 기판 처리장치 |
JP6095825B2 (ja) | 2016-04-08 | 2017-03-15 | 株式会社日立国際電気 | 基板処理装置および半導体装置の製造方法 |
JP6710168B2 (ja) | 2016-04-19 | 2020-06-17 | 株式会社Kokusai Electric | 基板処理装置、装置管理コントローラ及びプログラム並びに半導体装置の製造方法 |
JP6747136B2 (ja) * | 2016-07-22 | 2020-08-26 | 東京エレクトロン株式会社 | 基板処理装置 |
JP6456893B2 (ja) | 2016-09-26 | 2019-01-23 | 株式会社Kokusai Electric | 半導体装置の製造方法、記録媒体および基板処理装置 |
SG11202110193YA (en) | 2019-03-19 | 2021-10-28 | Kokusai Electric Corp | Method of manufacturing semiconductor device, substrate processing apparatus device, and program |
-
2019
- 2019-03-19 SG SG11202110193YA patent/SG11202110193YA/en unknown
- 2019-03-19 JP JP2021506888A patent/JP7214834B2/ja active Active
- 2019-03-19 WO PCT/JP2019/011456 patent/WO2020188743A1/ja active Application Filing
- 2019-03-19 KR KR1020217029610A patent/KR20210127738A/ko not_active Application Discontinuation
-
2020
- 2020-02-05 TW TW110131290A patent/TW202145428A/zh unknown
- 2020-02-05 TW TW109103466A patent/TWI761758B/zh active
-
2021
- 2021-09-15 US US17/476,151 patent/US11990359B2/en active Active
Also Published As
Publication number | Publication date |
---|---|
CN113597666A (zh) | 2021-11-02 |
JP7214834B2 (ja) | 2023-01-30 |
US11990359B2 (en) | 2024-05-21 |
TW202101650A (zh) | 2021-01-01 |
KR20210127738A (ko) | 2021-10-22 |
US20220005717A1 (en) | 2022-01-06 |
JPWO2020188743A1 (ja) | 2021-12-09 |
WO2020188743A1 (ja) | 2020-09-24 |
TW202145428A (zh) | 2021-12-01 |
TWI761758B (zh) | 2022-04-21 |
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