SG11202102254SA - Improved systems and methods for writing and reading data stored in a polymer - Google Patents
Improved systems and methods for writing and reading data stored in a polymerInfo
- Publication number
- SG11202102254SA SG11202102254SA SG11202102254SA SG11202102254SA SG11202102254SA SG 11202102254S A SG11202102254S A SG 11202102254SA SG 11202102254S A SG11202102254S A SG 11202102254SA SG 11202102254S A SG11202102254S A SG 11202102254SA SG 11202102254S A SG11202102254S A SG 11202102254SA
- Authority
- SG
- Singapore
- Prior art keywords
- writing
- polymer
- methods
- data stored
- reading data
- Prior art date
Links
- 229920000642 polymer Polymers 0.000 title 1
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/004—Reading or sensing circuits or methods
-
- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B11/00—Automatic controllers
- G05B11/01—Automatic controllers electric
- G05B11/36—Automatic controllers electric with provision for obtaining particular characteristics, e.g. proportional, integral, differential
- G05B11/42—Automatic controllers electric with provision for obtaining particular characteristics, e.g. proportional, integral, differential for obtaining a characteristic which is both proportional and time-dependent, e.g. P. I., P. I. D.
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/56—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency
- G11C11/5664—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using storage elements with more than two stable states represented by steps, e.g. of voltage, current, phase, frequency using organic memory material storage elements
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0009—RRAM elements whose operation depends upon chemical change
- G11C13/0014—RRAM elements whose operation depends upon chemical change comprising cells based on organic memory material
- G11C13/0016—RRAM elements whose operation depends upon chemical change comprising cells based on organic memory material comprising polymers
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0009—RRAM elements whose operation depends upon chemical change
- G11C13/0014—RRAM elements whose operation depends upon chemical change comprising cells based on organic memory material
- G11C13/0019—RRAM elements whose operation depends upon chemical change comprising cells based on organic memory material comprising bio-molecules
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C13/00—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00
- G11C13/0002—Digital stores characterised by the use of storage elements not covered by groups G11C11/00, G11C23/00, or G11C25/00 using resistive RAM [RRAM] elements
- G11C13/0021—Auxiliary circuits
- G11C13/0069—Writing or programming circuits or methods
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C25/00—Digital stores characterised by the use of flowing media; Storage elements therefor
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/021—Detection or location of defective auxiliary circuits, e.g. defective refresh counters in voltage or current generators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/02—Detection or location of defective auxiliary circuits, e.g. defective refresh counters
- G11C29/028—Detection or location of defective auxiliary circuits, e.g. defective refresh counters with adaption or trimming of parameters
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C29/12005—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details comprising voltage or current generators
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/70—Masking faults in memories by using spares or by reconfiguring
- G11C29/74—Masking faults in memories by using spares or by reconfiguring using duplex memories, i.e. using dual copies
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
- G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
- G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
- G11C2029/1206—Location of test circuitry on chip or wafer
Landscapes
- Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Computer Hardware Design (AREA)
- General Physics & Mathematics (AREA)
- Automation & Control Theory (AREA)
- Apparatus Associated With Microorganisms And Enzymes (AREA)
- Investigating Or Analyzing Materials By The Use Of Electric Means (AREA)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201862728656P | 2018-09-07 | 2018-09-07 | |
| US201962842373P | 2019-05-02 | 2019-05-02 | |
| PCT/US2019/050021 WO2020051501A1 (en) | 2018-09-07 | 2019-09-06 | Improved systems and methods for writing and reading data stored in a polymer |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| SG11202102254SA true SG11202102254SA (en) | 2021-04-29 |
Family
ID=69722786
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| SG11202102254SA SG11202102254SA (en) | 2018-09-07 | 2019-09-06 | Improved systems and methods for writing and reading data stored in a polymer |
Country Status (9)
| Country | Link |
|---|---|
| US (3) | US11152061B2 (he) |
| EP (1) | EP3847649A4 (he) |
| JP (1) | JP7329876B2 (he) |
| KR (1) | KR20210055071A (he) |
| CN (1) | CN113302700A (he) |
| CA (1) | CA3111930A1 (he) |
| IL (1) | IL281279A (he) |
| SG (1) | SG11202102254SA (he) |
| WO (1) | WO2020051501A1 (he) |
Families Citing this family (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP3542295A4 (en) | 2016-11-16 | 2020-10-21 | Catalog Technologies, Inc. | SYSTEMS FOR NUCLEIC ACID-BASED DATA STORAGE |
| WO2019178551A1 (en) | 2018-03-16 | 2019-09-19 | Catalog Technologies, Inc. | Chemical methods for nucleic acid-based data storage |
| US12005704B2 (en) | 2018-05-16 | 2024-06-11 | Catalog Technologies, Inc. | Printer-finisher system for data storage in DNA |
| JP7329876B2 (ja) | 2018-09-07 | 2023-08-21 | イリディア・インコーポレイテッド | ポリマーに記憶されたデータの書込みおよび読出しのための改善されたシステムおよび方法 |
| US11837302B1 (en) | 2020-08-07 | 2023-12-05 | Iridia, Inc. | Systems and methods for writing and reading data stored in a polymer using nano-channels |
| US11545213B1 (en) | 2020-08-07 | 2023-01-03 | Iridia, Inc. | Systems and methods for writing and reading data stored in a polymer using nano-channels |
| US20230332140A1 (en) * | 2020-08-25 | 2023-10-19 | Molecular Assembiles, Inc. | Layered coding architectures for nucleic acid memory |
| CN113687976B (zh) * | 2021-08-27 | 2022-04-12 | 中国人民解放军军事科学院军事医学研究院 | 面向dna信息存储的编码和解码方法与装置 |
| CN116451780B (zh) * | 2022-01-05 | 2024-07-05 | 密码子（杭州）科技有限公司 | 用于在分子中存储信息的方法和设备 |
| WO2023168085A1 (en) * | 2022-03-04 | 2023-09-07 | Catalog Technologies, Inc. | Dna microarrays and component level sequencing for nucleic acid-based data storage and processing |
| WO2023232749A1 (en) * | 2022-05-31 | 2023-12-07 | Imec Vzw | Electrochemical synthesis system |
| WO2024048422A1 (ja) * | 2022-08-29 | 2024-03-07 | 国立大学法人大阪大学 | 分子メモリ、分子メモリの製造方法、分子メモリのデコード方法および分子メモリをデコードするためのデバイス |
Family Cites Families (32)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| SE518977C2 (sv) * | 1999-11-22 | 2002-12-17 | Transmode Systems Ab | Arrangemang för övervakning och/eller styrning av bithastigheten av datapulser |
| JP3478228B2 (ja) * | 2000-03-07 | 2003-12-15 | 日本電気株式会社 | 速度変換回路及びその制御方法 |
| JP2002196797A (ja) * | 2000-12-27 | 2002-07-12 | Toshiba Corp | 記録再生装置及びその記録再生方法 |
| US6646912B2 (en) * | 2001-06-05 | 2003-11-11 | Hewlett-Packard Development Company, Lp. | Non-volatile memory |
| EP1326357A1 (de) * | 2002-01-08 | 2003-07-09 | Siemens Aktiengesellschaft | Verfahren zur Prüfung und Aufrechterhaltung einer vorbestimmten physikalischen Bitrate einer Leitungsverbindung |
| US7616551B2 (en) * | 2003-11-25 | 2009-11-10 | Samsung Electronics Co., Ltd. | Molecular optoelectronic memory device |
| US20050283218A1 (en) * | 2004-06-22 | 2005-12-22 | Williams Michael S | Implantable chamber for biological induction or enhancement of muscle contraction |
| US7390540B2 (en) * | 2004-07-21 | 2008-06-24 | Hewlett-Packard Development Company, L.P. | Method for preparation of anisotropic materials |
| JP4251650B2 (ja) * | 2005-03-28 | 2009-04-08 | 株式会社カシオ日立モバイルコミュニケーションズ | 画像処理装置及びプログラム |
| US20080149832A1 (en) * | 2006-12-20 | 2008-06-26 | Miguel Zorn | Scanning Probe Microscope, Nanomanipulator with Nanospool, Motor, nucleotide cassette and Gaming application |
| DE112009000437T5 (de) | 2008-02-28 | 2011-03-17 | Electronic Bio Sciences, LLC, San Diego | System und Verfahren zum Verbessern der Sequenzierungsgenauigkeit eines Polymers |
| JP2012501681A (ja) | 2008-09-12 | 2012-01-26 | ジェンボールト コーポレイション | 生体分子の貯蔵および安定化のためのマトリックスおよび媒体 |
| US20110287414A1 (en) * | 2010-02-08 | 2011-11-24 | Genia Technologies, Inc. | Systems and methods for identifying a portion of a molecule |
| TWI462104B (zh) * | 2010-08-04 | 2014-11-21 | Silicon Motion Inc | 資料寫入方法及資料儲存裝置 |
| US20130001239A1 (en) * | 2011-06-28 | 2013-01-03 | H.B. Fuller Company | Automatic delivery of adhesive to an adhesive supply unit and systems therefore |
| US9582357B2 (en) * | 2012-03-29 | 2017-02-28 | Intel Corporation | Method and apparatus for treatment of state confidence data retrieved from a non-volatile memory array |
| JP2014020837A (ja) * | 2012-07-13 | 2014-02-03 | Panasonic Corp | ポリヌクレオチド配列決定方法 |
| US9759711B2 (en) * | 2013-02-05 | 2017-09-12 | Genia Technologies, Inc. | Nanopore arrays |
| US9164834B2 (en) * | 2013-05-06 | 2015-10-20 | Samsung Electronics Co., Ltd. | Semiconductor memory devices, memory systems including the same and method of writing data in the same |
| DE102013215055B4 (de) * | 2013-07-31 | 2021-01-28 | Infineon Technologies Ag | Schaltungsanordnung, Vorrichtung, Verfahren und Computerprogramm mit modifiziertem Fehlersyndrom zur Fehlererkennung von permanenten Fehlern in Speichern |
| US20160232103A1 (en) * | 2013-09-26 | 2016-08-11 | Mark A. Schmisseur | Block storage apertures to persistent memory |
| US9123424B2 (en) * | 2013-12-17 | 2015-09-01 | Sandisk Technologies Inc. | Optimizing pass voltage and initial program voltage based on performance of non-volatile memory |
| JP2015139420A (ja) | 2014-01-30 | 2015-08-03 | パナソニック株式会社 | 化学物質検出方法 |
| US10859562B2 (en) * | 2016-02-29 | 2020-12-08 | Iridia, Inc. | Methods, compositions, and devices for information storage |
| US10640822B2 (en) | 2016-02-29 | 2020-05-05 | Iridia, Inc. | Systems and methods for writing, reading, and controlling data stored in a polymer |
| US10438662B2 (en) | 2016-02-29 | 2019-10-08 | Iridia, Inc. | Methods, compositions, and devices for information storage |
| JP2019512480A (ja) | 2016-02-29 | 2019-05-16 | イリディア・インコーポレイテッドＩｒｉｄｉａ， Ｉｎｃ． | 情報保存のための方法、組成物およびデバイス |
| US9852800B2 (en) * | 2016-03-07 | 2017-12-26 | Sandisk Technologies Llc | Adaptive determination of program parameter using program of erase rate |
| EP3223515A1 (en) * | 2016-03-21 | 2017-09-27 | Thomson Licensing | Method for testing performance of a storage device and corresponding device |
| JP6725375B2 (ja) * | 2016-09-14 | 2020-07-15 | キオクシア株式会社 | メモリシステムおよび方法 |
| TWI827559B (zh) | 2017-10-30 | 2024-01-01 | 美商艾瑞迪亞公司 | 用於寫入、讀出以及控制儲存在聚合物中之數據之系統及方法 |
| JP7329876B2 (ja) * | 2018-09-07 | 2023-08-21 | イリディア・インコーポレイテッド | ポリマーに記憶されたデータの書込みおよび読出しのための改善されたシステムおよび方法 |
-
2019
- 2019-09-06 JP JP2021512603A patent/JP7329876B2/ja active Active
- 2019-09-06 KR KR1020217010033A patent/KR20210055071A/ko not_active Application Discontinuation
- 2019-09-06 CA CA3111930A patent/CA3111930A1/en active Pending
- 2019-09-06 CN CN201980073123.9A patent/CN113302700A/zh active Pending
- 2019-09-06 WO PCT/US2019/050021 patent/WO2020051501A1/en unknown
- 2019-09-06 SG SG11202102254SA patent/SG11202102254SA/en unknown
- 2019-09-06 EP EP19858030.0A patent/EP3847649A4/en active Pending
-
2020
- 2020-05-04 US US16/866,364 patent/US11152061B2/en active Active
-
2021
- 2021-03-04 IL IL281279A patent/IL281279A/he unknown
- 2021-10-15 US US17/451,064 patent/US11600324B2/en active Active
-
2023
- 2023-02-17 US US18/171,106 patent/US11923004B2/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| US11600324B2 (en) | 2023-03-07 |
| CN113302700A (zh) | 2021-08-24 |
| IL281279A (he) | 2021-04-29 |
| US20200265890A1 (en) | 2020-08-20 |
| EP3847649A4 (en) | 2022-08-31 |
| CA3111930A1 (en) | 2020-03-12 |
| JP7329876B2 (ja) | 2023-08-21 |
| KR20210055071A (ko) | 2021-05-14 |
| US20220036948A1 (en) | 2022-02-03 |
| WO2020051501A1 (en) | 2020-03-12 |
| JP2022500626A (ja) | 2022-01-04 |
| US11923004B2 (en) | 2024-03-05 |
| US20230207001A1 (en) | 2023-06-29 |
| US11152061B2 (en) | 2021-10-19 |
| EP3847649A1 (en) | 2021-07-14 |
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