SG11202006227TA - X-ray inspection device - Google Patents

X-ray inspection device

Info

Publication number
SG11202006227TA
SG11202006227TA SG11202006227TA SG11202006227TA SG11202006227TA SG 11202006227T A SG11202006227T A SG 11202006227TA SG 11202006227T A SG11202006227T A SG 11202006227TA SG 11202006227T A SG11202006227T A SG 11202006227TA SG 11202006227T A SG11202006227T A SG 11202006227TA
Authority
SG
Singapore
Prior art keywords
inspection device
ray inspection
ray
inspection
Prior art date
Application number
SG11202006227TA
Other languages
English (en)
Inventor
Naoki Matsushima
Kiyoshi Ogata
Kazuhiko Omote
Sei YOSHIHARA
Yoshiyasu Ito
Hiroshi Motono
Hideaki Takahashi
Akifusa HIGUCHI
Shiro Umegaki
Shigematsu Asano
Ryotaro YAMAGUCHI
Katsutaka HORADA
Original Assignee
Rigaku Denki Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Denki Co Ltd filed Critical Rigaku Denki Co Ltd
Publication of SG11202006227TA publication Critical patent/SG11202006227TA/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008—Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • G01N23/20016—Goniometers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/207—Diffractometry using detectors, e.g. using a probe in a central position and one or more displaceable detectors in circumferential positions
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/05—Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/056—Investigating materials by wave or particle radiation by diffraction, scatter or reflection diffraction
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3306—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object rotates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/33—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3308—Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts object translates
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/30—Accessories, mechanical or electrical features
    • G01N2223/331—Accessories, mechanical or electrical features rocking curve analysis
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/50—Detectors
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/611—Specific applications or type of materials patterned objects; electronic devices
    • G01N2223/6116—Specific applications or type of materials patterned objects; electronic devices semiconductor wafer
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/60—Specific applications or type of materials
    • G01N2223/645—Specific applications or type of materials quality control

Landscapes

  • Chemical & Material Sciences (AREA)
  • Crystallography & Structural Chemistry (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
SG11202006227TA 2017-12-28 2018-09-05 X-ray inspection device SG11202006227TA (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2017253019 2017-12-28
PCT/JP2018/032810 WO2019130663A1 (fr) 2017-12-28 2018-09-05 Dispositif d'inspection à rayons x

Publications (1)

Publication Number Publication Date
SG11202006227TA true SG11202006227TA (en) 2020-07-29

Family

ID=67063355

Family Applications (1)

Application Number Title Priority Date Filing Date
SG11202006227TA SG11202006227TA (en) 2017-12-28 2018-09-05 X-ray inspection device

Country Status (8)

Country Link
US (1) US11079345B2 (fr)
EP (1) EP3734261A4 (fr)
JP (1) JP6938054B2 (fr)
KR (1) KR102409643B1 (fr)
CN (1) CN111527400A (fr)
SG (1) SG11202006227TA (fr)
TW (1) TWI739034B (fr)
WO (1) WO2019130663A1 (fr)

Families Citing this family (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US11898971B2 (en) * 2019-06-24 2024-02-13 Sms Group Gmbh Controlling process parameters by means of radiographic online determination of material properties when producing metallic strips and sheets
JP7300718B2 (ja) * 2019-12-13 2023-06-30 株式会社リガク 制御装置、システム、方法およびプログラム
KR20230090144A (ko) * 2021-12-14 2023-06-21 주식회사 엘지에너지솔루션 전극조립체의 외경측정장치와 외경측정방법

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH0786484B2 (ja) * 1989-05-17 1995-09-20 株式会社フジクラ ゴニオメータヘッド
GB9216461D0 (en) * 1992-08-03 1992-09-16 Smith James A Eucentric goniometer or motion system
JP2630249B2 (ja) * 1994-02-16 1997-07-16 日本電気株式会社 全反射蛍光ｘ線分析装置
JPH1144662A (ja) * 1997-07-29 1999-02-16 Rigaku Corp 微小部ｘ線分析装置
JP2000258366A (ja) * 1999-03-05 2000-09-22 Rigaku Corp 微小部ｘ線回折装置
US6301330B1 (en) * 1999-07-30 2001-10-09 Hypernex, Inc. Apparatus and method for texture analysis on semiconductor wafers
JP2003294657A (ja) * 2002-03-29 2003-10-15 Asahi Kasei Corp 結晶歪み度合いの分析方法
JP3697246B2 (ja) * 2003-03-26 2005-09-21 株式会社リガク Ｘ線回折装置
DE602004012562T2 (de) 2003-06-13 2009-04-16 Osmic, Inc., Auburn Hills Strahlaufbereitungssystem
JP3912606B2 (ja) 2004-10-26 2007-05-09 株式会社リガク Ｘ線薄膜検査装置と、プロダクトウエーハの薄膜検査装置およびその方法
JP4784984B2 (ja) * 2006-04-10 2011-10-05 株式会社リガク Ｘ線回折装置とその制御方法
JP5963453B2 (ja) * 2011-03-15 2016-08-03 株式会社荏原製作所 検査装置
JP5346057B2 (ja) * 2011-04-26 2013-11-20 株式会社リガク Ｘ線分析装置の試料冷却装置及びｘ線分析装置
JP2013231700A (ja) * 2012-05-01 2013-11-14 Tokyo Electron Ltd Ｘ線検査方法及びｘ線検査装置
JP5998666B2 (ja) * 2012-06-14 2016-09-28 富士通株式会社 Ｘ線分析装置及びｘ線分析方法
US9417196B2 (en) * 2013-10-10 2016-08-16 Bruker Axs Inc. X-ray diffraction based crystal centering method using an active pixel array sensor in rolling shutter mode
JP2015184092A (ja) * 2014-03-24 2015-10-22 桑原　章二 Ｘ線分析装置
US10473598B2 (en) * 2014-10-14 2019-11-12 Rigaku Corporation X-ray thin film inspection device
JP6656519B2 (ja) 2016-06-15 2020-03-04 株式会社リガク Ｘ線回折装置
US10876978B2 (en) * 2016-07-15 2020-12-29 Rigaku Corporation X-ray inspecting device, X-ray thin film inspecting method, and method for measuring rocking curve

Also Published As

Publication number Publication date
JP6938054B2 (ja) 2021-09-22
EP3734261A1 (fr) 2020-11-04
TW201930865A (zh) 2019-08-01
KR20200099597A (ko) 2020-08-24
JPWO2019130663A1 (ja) 2020-12-17
EP3734261A4 (fr) 2021-09-08
WO2019130663A1 (fr) 2019-07-04
TWI739034B (zh) 2021-09-11
US11079345B2 (en) 2021-08-03
CN111527400A (zh) 2020-08-11
US20210063326A1 (en) 2021-03-04
KR102409643B1 (ko) 2022-06-16

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